DE69227473T2 - System zur Durchschaltung von elektrischen Kontakten - Google Patents

System zur Durchschaltung von elektrischen Kontakten

Info

Publication number
DE69227473T2
DE69227473T2 DE69227473T DE69227473T DE69227473T2 DE 69227473 T2 DE69227473 T2 DE 69227473T2 DE 69227473 T DE69227473 T DE 69227473T DE 69227473 T DE69227473 T DE 69227473T DE 69227473 T2 DE69227473 T2 DE 69227473T2
Authority
DE
Germany
Prior art keywords
electrical contacts
connecting electrical
contacts
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69227473T
Other languages
English (en)
Other versions
DE69227473D1 (de
Inventor
David A Johnson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/639,126 external-priority patent/US5069629A/en
Application filed by Individual filed Critical Individual
Publication of DE69227473D1 publication Critical patent/DE69227473D1/de
Application granted granted Critical
Publication of DE69227473T2 publication Critical patent/DE69227473T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/24—Connections using contact members penetrating or cutting insulation or cable strands
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
    • H05K7/103—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by sliding, e.g. DIP carriers
    • H05K7/1046—J-shaped leads
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
    • H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
DE69227473T 1991-01-09 1992-01-08 System zur Durchschaltung von elektrischen Kontakten Expired - Lifetime DE69227473T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/639,126 US5069629A (en) 1991-01-09 1991-01-09 Electrical interconnect contact system
US07/801,694 US5207584A (en) 1991-01-09 1991-12-02 Electrical interconnect contact system

Publications (2)

Publication Number Publication Date
DE69227473D1 DE69227473D1 (de) 1998-12-10
DE69227473T2 true DE69227473T2 (de) 1999-04-15

Family

ID=27093271

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69227473T Expired - Lifetime DE69227473T2 (de) 1991-01-09 1992-01-08 System zur Durchschaltung von elektrischen Kontakten

Country Status (8)

Country Link
US (1) US5207584A (de)
EP (1) EP0498530B1 (de)
JP (1) JP2675710B2 (de)
KR (1) KR100215015B1 (de)
CA (1) CA2059117C (de)
DE (1) DE69227473T2 (de)
ES (1) ES2125883T3 (de)
SG (1) SG47018A1 (de)

Families Citing this family (40)

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US5749738A (en) * 1991-01-09 1998-05-12 Johnstech International Corporation Electrical interconnect contact system
US5634801A (en) * 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
US5336094A (en) * 1993-06-30 1994-08-09 Johnstech International Corporation Apparatus for interconnecting electrical contacts
US5645433A (en) * 1994-05-09 1997-07-08 Johnstech International Corporation Contacting system for electrical devices
US5594355A (en) * 1994-07-19 1997-01-14 Delta Design, Inc. Electrical contactor apparatus for testing integrated circuit devices
US5609489A (en) * 1994-12-21 1997-03-11 Hewlett-Packard Company Socket for contacting an electronic circuit during testing
CA2169003A1 (en) * 1995-02-07 1996-08-08 David A. Johnson Apparatus for providing controlled impedance in an electrical contact
US6203329B1 (en) 1995-07-07 2001-03-20 Johnstech International Corporation Impedance controlled interconnection device
US5791912A (en) * 1995-12-01 1998-08-11 Riechelmann; Bernd Contactor with multiple redundant connecting paths
US5899755A (en) * 1996-03-14 1999-05-04 Johnstech International Corporation Integrated circuit test socket with enhanced noise imminity
DE19618717C1 (de) * 1996-05-09 1998-01-15 Multitest Elektronische Syst Elektrische Verbindungseinrichtung
JP2849070B2 (ja) * 1996-08-02 1999-01-20 山一電機株式会社 Ｉｃソケット
US5984690A (en) * 1996-11-12 1999-11-16 Riechelmann; Bernd Contactor with multiple redundant connecting paths
US6019612A (en) * 1997-02-10 2000-02-01 Kabushiki Kaisha Nihon Micronics Electrical connecting apparatus for electrically connecting a device to be tested
US5888075A (en) * 1997-02-10 1999-03-30 Kabushiki Kaisha Nihon Micronics Auxiliary apparatus for testing device
SG88739A1 (en) * 1997-05-15 2002-05-21 Nihon Micronics Kk Auxiliary apparatus for testing device
MY128129A (en) * 1997-09-16 2007-01-31 Tan Yin Leong Electrical contactor for testing integrated circuit devices
US6529025B1 (en) * 1997-09-18 2003-03-04 Johnstech International Corporation Electrical continuity enhancement for sockets/contactors
US6597190B2 (en) 2000-09-29 2003-07-22 Intel Corporation Method and apparatus for testing electronic devices
WO2002027335A2 (en) * 2000-09-29 2002-04-04 Intel Corporation A method and an apparatus for testing electronic devices
US6854981B2 (en) * 2002-06-03 2005-02-15 Johnstech International Corporation Small pin connecters
US7059866B2 (en) * 2003-04-23 2006-06-13 Johnstech International Corporation integrated circuit contact to test apparatus
US7173442B2 (en) * 2003-08-25 2007-02-06 Delaware Capital Formation, Inc. Integrated printed circuit board and test contactor for high speed semiconductor testing
JP4965427B2 (ja) * 2005-02-08 2012-07-04 株式会社日本マイクロニクス 電気的接続装置
JP4472002B2 (ja) * 2005-04-21 2010-06-02 株式会社日本マイクロニクス 電気的接続装置
US7445465B2 (en) * 2005-07-08 2008-11-04 Johnstech International Corporation Test socket
US7639026B2 (en) * 2006-02-24 2009-12-29 Johnstech International Corporation Electronic device test set and contact used therein
TW200743268A (en) * 2006-05-02 2007-11-16 Hon Hai Prec Ind Co Ltd Electrical connector
US7737708B2 (en) * 2006-05-11 2010-06-15 Johnstech International Corporation Contact for use in testing integrated circuits
US7586056B2 (en) * 2006-09-15 2009-09-08 Shin-Etsu Polymer Co., Ltd Resin molded body, receiving jig and method for manufacturing push button switch member
JP2009043591A (ja) * 2007-08-09 2009-02-26 Yamaichi Electronics Co Ltd Ｉｃソケット
US7695286B2 (en) 2007-09-18 2010-04-13 Delaware Capital Formation, Inc. Semiconductor electromechanical contact
JP5029969B2 (ja) * 2008-11-12 2012-09-19 山一電機株式会社 電気接続装置
US9274141B1 (en) 2013-01-22 2016-03-01 Johnstech International Corporation Low resistance low wear test pin for test contactor
EP2990182B1 (de) * 2014-08-28 2018-10-24 Dukane IAS, LLC Ultraschallschweisssystem -und verfahren mittels eines servomotors mit verzögerter bewegung
US10114039B1 (en) * 2015-04-24 2018-10-30 Johnstech International Corporation Selectively geometric shaped contact pin for electronic component testing and method of fabrication
US9343830B1 (en) * 2015-06-08 2016-05-17 Xcerra Corporation Integrated circuit chip tester with embedded micro link
CN105807213A (zh) * 2016-05-30 2016-07-27 青岛港湾职业技术学院 一种用于扁平引脚芯片的测试装置
MX2020007325A (es) * 2017-09-25 2021-01-29 Johnstech Int Corporation Contactor de alto grado de aislamiento con clavija de prueba y carcasa para probar circuitos integrados.
US10746703B2 (en) * 2018-11-13 2020-08-18 Dukane Ias, Llc Automated ultrasonic press systems and methods for welding physically variant components

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2495846A1 (fr) * 1980-12-05 1982-06-11 Cii Honeywell Bull Dispositif de connexion electrique a haute densite de contacts
US4511197A (en) * 1983-08-01 1985-04-16 Amp Incorporated High density contact assembly
US4593961A (en) * 1984-12-20 1986-06-10 Amp Incorporated Electrical compression connector
US4793814A (en) * 1986-07-21 1988-12-27 Rogers Corporation Electrical circuit board interconnect
WO1987004568A1 (en) * 1986-01-15 1987-07-30 Rogers Corporation Electrical circuit board interconnect
US4998886A (en) * 1989-07-07 1991-03-12 Teledyne Kinetics High density stacking connector
US5049084A (en) * 1989-12-05 1991-09-17 Rogers Corporation Electrical circuit board interconnect
US5061192A (en) * 1990-12-17 1991-10-29 International Business Machines Corporation High density connector
US5069629A (en) * 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
US5139427A (en) * 1991-09-23 1992-08-18 Amp Incorporated Planar array connector and flexible contact therefor
US5137456A (en) * 1991-11-04 1992-08-11 International Business Machines Corporation High density, separable connector and contact for use therein

Also Published As

Publication number Publication date
SG47018A1 (en) 1998-03-20
EP0498530B1 (de) 1998-11-04
JPH05174880A (ja) 1993-07-13
CA2059117A1 (en) 1992-07-10
DE69227473D1 (de) 1998-12-10
EP0498530A2 (de) 1992-08-12
EP0498530A3 (en) 1994-11-30
US5207584A (en) 1993-05-04
JP2675710B2 (ja) 1997-11-12
KR920015666A (ko) 1992-08-27
CA2059117C (en) 2000-07-25
ES2125883T3 (es) 1999-03-16
KR100215015B1 (ko) 1999-08-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: PUSCHMANN & BORCHERT, 82041 OBERHACHING