DE69228855T2 - Kondensator und Herstellungsverfahren - Google Patents

Kondensator und Herstellungsverfahren

Info

Publication number
DE69228855T2
DE69228855T2 DE69228855T DE69228855T DE69228855T2 DE 69228855 T2 DE69228855 T2 DE 69228855T2 DE 69228855 T DE69228855 T DE 69228855T DE 69228855 T DE69228855 T DE 69228855T DE 69228855 T2 DE69228855 T2 DE 69228855T2
Authority
DE
Germany
Prior art keywords
capacitor
manufacturing process
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69228855T
Other languages
English (en)
Other versions
DE69228855D1 (de
Inventor
Jaehong Ko
Sungtae Kim
Hyunbo Shin
Seonghun Kang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1019910020618A external-priority patent/KR950003240B1/ko
Priority claimed from KR1019920000158A external-priority patent/KR950013382B1/ko
Priority claimed from KR1019920000156A external-priority patent/KR960012255B1/ko
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Application granted granted Critical
Publication of DE69228855D1 publication Critical patent/DE69228855D1/de
Publication of DE69228855T2 publication Critical patent/DE69228855T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/86—Electrodes with an enlarged surface, e.g. formed by texturisation having horizontal extensions
    • H01L28/88—Electrodes with an enlarged surface, e.g. formed by texturisation having horizontal extensions made by patterning layers, e.g. by etching conductive layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
    • H01L28/92—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by patterning layers, e.g. by etching conductive layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/92—Capacitors with potential-jump barrier or surface barrier
    • H01L29/94—Metal-insulator-semiconductors, e.g. MOS
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03—Making the capacitor or connections thereto
    • H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/31—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
    • H10B12/318—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor the storage electrode having multiple segments
DE69228855T 1991-11-19 1992-11-17 Kondensator und Herstellungsverfahren Expired - Fee Related DE69228855T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR1019910020618A KR950003240B1 (ko) 1991-11-19 1991-11-19 반도체 장치 및 그의 제조방법
KR1019920000158A KR950013382B1 (ko) 1992-01-08 1992-01-08 커패시터 및 그 제조방법
KR1019920000156A KR960012255B1 (ko) 1992-01-08 1992-01-08 커패시터 및 그 제조방법

Publications (2)

Publication Number Publication Date
DE69228855D1 DE69228855D1 (de) 1999-05-12
DE69228855T2 true DE69228855T2 (de) 1999-09-16

Family

ID=27348787

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69228855T Expired - Fee Related DE69228855T2 (de) 1991-11-19 1992-11-17 Kondensator und Herstellungsverfahren

Country Status (5)

Country Link
US (1) US5350707A (de)
EP (2) EP0543616B1 (de)
JP (1) JPH0831574B2 (de)
DE (1) DE69228855T2 (de)
TW (2) TW396373B (de)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5350707A (en) * 1991-11-19 1994-09-27 Samsung Electronics Co., Ltd. Method for making a capacitor having an electrode surface with a plurality of trenches formed therein
JP2658824B2 (ja) * 1993-08-31 1997-09-30 日本電気株式会社 半導体装置の製造方法
US5656531A (en) * 1993-12-10 1997-08-12 Micron Technology, Inc. Method to form hemi-spherical grain (HSG) silicon from amorphous silicon
US5696014A (en) * 1994-03-11 1997-12-09 Micron Semiconductor, Inc. Method for increasing capacitance of an HSG rugged capacitor using a phosphine rich oxidation and subsequent wet etch
US5972771A (en) 1994-03-11 1999-10-26 Micron Technology, Inc. Enhancing semiconductor structure surface area using HSG and etching
US5427974A (en) * 1994-03-18 1995-06-27 United Microelectronics Corporation Method for forming a capacitor in a DRAM cell using a rough overlayer of tungsten
US5492848A (en) * 1994-03-18 1996-02-20 United Microelectronics Corp. Stacked capacitor process using silicon nodules
US5482885A (en) * 1994-03-18 1996-01-09 United Microelectronics Corp. Method for forming most capacitor using poly spacer technique
US5482882A (en) * 1994-03-18 1996-01-09 United Microelectronics Corporation Method for forming most capacitor using polysilicon islands
US5466627A (en) * 1994-03-18 1995-11-14 United Microelectronics Corporation Stacked capacitor process using BPSG precipitates
US5512768A (en) * 1994-03-18 1996-04-30 United Microelectronics Corporation Capacitor for use in DRAM cell using surface oxidized silicon nodules
TW236710B (de) * 1994-04-08 1994-12-21
US5763286A (en) * 1994-09-14 1998-06-09 Micron Semiconductor, Inc. Process for manufacturing a DRAM capacitor having an annularly-grooved, cup-shaped storage-node plate which stores charge on inner and outer surfaces
US5444013A (en) * 1994-11-02 1995-08-22 Micron Technology, Inc. Method of forming a capacitor
US6121081A (en) * 1994-11-15 2000-09-19 Micron Technology, Inc. Method to form hemi-spherical grain (HSG) silicon
US5726085A (en) * 1995-03-09 1998-03-10 Texas Instruments Inc Method of fabricating a dynamic random access memory (DRAM) cell capacitor using hemispherical grain (HSG) polysilicon and selective polysilicon etchback
US5981992A (en) * 1995-06-07 1999-11-09 International Business Machines Corporation Mechanical supports for very thin stacked capacitor plates
US6027970A (en) * 1996-05-17 2000-02-22 Micron Technology, Inc. Method of increasing capacitance of memory cells incorporating hemispherical grained silicon
US5849624A (en) * 1996-07-30 1998-12-15 Mircon Technology, Inc. Method of fabricating a bottom electrode with rounded corners for an integrated memory cell capacitor
US5679596A (en) * 1996-10-18 1997-10-21 Vanguard International Semiconductor Corporation Spot deposited polysilicon for the fabrication of high capacitance, DRAM devices
US5731235A (en) * 1996-10-30 1998-03-24 Micron Technology, Inc. Methods of forming a silicon nitrite film, a capacitor dielectric layer and a capacitor
US5723373A (en) * 1996-11-18 1998-03-03 Powerchip Semiconductor Corp. Method of making porous-Si capacitors for high density drams cell
US5937314A (en) 1997-02-28 1999-08-10 Micron Technology, Inc. Diffusion-enhanced crystallization of amorphous materials to improve surface roughness
TW375778B (en) * 1997-04-29 1999-12-01 Promos Technologies Inc Process for forming rugged polysilicon
US5920763A (en) * 1997-08-21 1999-07-06 Micron Technology, Inc. Method and apparatus for improving the structural integrity of stacked capacitors
US6025248A (en) * 1997-10-07 2000-02-15 Samsung Electronics Co., Ltd. Methods of forming capacitor electrodes including a capacitor electrode etch
US6159788A (en) * 1997-11-21 2000-12-12 United Microelectronics Corp. Method to increase DRAM cell capacitance
US6265263B1 (en) * 1998-02-19 2001-07-24 Texas Instruments - Acer Incorporated Method for forming a DRAM capacitor with porous storage node and rugged sidewalls
US6156597A (en) * 1998-06-09 2000-12-05 Promos Technologies, Inc. Additional buffer layer for eliminating ozone/tetraethylorthosilicate sensitivity on an arbitrary trench structure
US6833329B1 (en) 2000-06-22 2004-12-21 Micron Technology, Inc. Methods of forming oxide regions over semiconductor substrates
US6686298B1 (en) 2000-06-22 2004-02-03 Micron Technology, Inc. Methods of forming structures over semiconductor substrates, and methods of forming transistors associated with semiconductor substrates
US6660657B1 (en) * 2000-08-07 2003-12-09 Micron Technology, Inc. Methods of incorporating nitrogen into silicon-oxide-containing layers
DE10038378A1 (de) * 2000-08-07 2002-02-28 Infineon Technologies Ag Verfahren zur Herstellung von Kondensatorelektroden
US6689668B1 (en) 2000-08-31 2004-02-10 Samsung Austin Semiconductor, L.P. Methods to improve density and uniformity of hemispherical grain silicon layers
US6403455B1 (en) 2000-08-31 2002-06-11 Samsung Austin Semiconductor, L.P. Methods of fabricating a memory device
US6555430B1 (en) 2000-11-28 2003-04-29 International Business Machines Corporation Process flow for capacitance enhancement in a DRAM trench
DE10105686A1 (de) * 2001-02-08 2002-09-05 Infineon Technologies Ag Verfahren zum Herstellen einer Kondensatoranordnung für eine Halbleiterspeichereinrichtung
US6878585B2 (en) 2001-08-29 2005-04-12 Micron Technology, Inc. Methods of forming capacitors
US6723599B2 (en) 2001-12-03 2004-04-20 Micron Technology, Inc. Methods of forming capacitors and methods of forming capacitor dielectric layers
US6613642B2 (en) * 2001-12-13 2003-09-02 International Business Machines Corporation Method for surface roughness enhancement in semiconductor capacitor manufacturing
TWI297414B (en) * 2002-08-30 2008-06-01 Toppoly Optoelectronics Corp Storage capacitor structure for use in planar display and process for producing same
TWI242889B (en) * 2004-10-20 2005-11-01 Advanced Semiconductor Eng Integrated capacitor on packaging substrate
TW201222778A (en) * 2010-11-18 2012-06-01 Ind Tech Res Inst Trench capacitor structures and method of manufacturing the same
US8236645B1 (en) * 2011-02-07 2012-08-07 GlobalFoundries, Inc. Integrated circuits having place-efficient capacitors and methods for fabricating the same
TWI585795B (zh) * 2015-05-29 2017-06-01 力晶科技股份有限公司 電容器結構及其製造方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03101261A (ja) * 1989-09-14 1991-04-26 Sony Corp 容量素子の形成方法
US5366917A (en) * 1990-03-20 1994-11-22 Nec Corporation Method for fabricating polycrystalline silicon having micro roughness on the surface
KR930008580B1 (ko) * 1990-06-22 1993-09-09 현대전자산업 주식회사 표면적이 극대화된 실리콘층 및 그 제조방법
JP2692402B2 (ja) * 1991-02-26 1997-12-17 日本電気株式会社 半導体素子の製造方法
US5256587A (en) * 1991-03-20 1993-10-26 Goldstar Electron Co., Ltd. Methods of patterning and manufacturing semiconductor devices
US5223448A (en) * 1991-07-18 1993-06-29 Industrial Technology Research Institute Method for producing a layered capacitor structure for a dynamic random access memory device
KR940007391B1 (ko) * 1991-08-23 1994-08-16 삼성전자 주식회사 고집적 반도체 메모리장치의 제조방법
JPH0555505A (ja) * 1991-08-29 1993-03-05 Nec Corp 半導体メモリセルとその形成方法
US5350707A (en) * 1991-11-19 1994-09-27 Samsung Electronics Co., Ltd. Method for making a capacitor having an electrode surface with a plurality of trenches formed therein
US5204280A (en) * 1992-04-09 1993-04-20 International Business Machines Corporation Process for fabricating multiple pillars inside a dram trench for increased capacitor surface

Also Published As

Publication number Publication date
JPH0831574B2 (ja) 1996-03-27
US5350707A (en) 1994-09-27
EP0867927A3 (de) 1999-03-10
EP0543616A3 (en) 1993-08-18
EP0867927A2 (de) 1998-09-30
EP0543616A2 (de) 1993-05-26
TW353792B (en) 1999-03-01
EP0543616B1 (de) 1999-04-07
DE69228855D1 (de) 1999-05-12
TW396373B (en) 2000-07-01
JPH05226605A (ja) 1993-09-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee