DE69230474D1 - Herstellung von hochpräzisen elektronischen komponenten mit hochreinen flüssigkeiten - Google Patents

Herstellung von hochpräzisen elektronischen komponenten mit hochreinen flüssigkeiten

Info

Publication number
DE69230474D1
DE69230474D1 DE69230474T DE69230474T DE69230474D1 DE 69230474 D1 DE69230474 D1 DE 69230474D1 DE 69230474 T DE69230474 T DE 69230474T DE 69230474 T DE69230474 T DE 69230474T DE 69230474 D1 DE69230474 D1 DE 69230474D1
Authority
DE
Germany
Prior art keywords
manufacture
electronic components
precision electronic
purity liquids
liquids
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69230474T
Other languages
English (en)
Other versions
DE69230474T2 (de
Inventor
R Clark
Stephen Baird
Joe Hoffman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Air Liquide America Corp
Original Assignee
Air Liquide America Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Air Liquide America Corp filed Critical Air Liquide America Corp
Publication of DE69230474D1 publication Critical patent/DE69230474D1/de
Application granted granted Critical
Publication of DE69230474T2 publication Critical patent/DE69230474T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67023Apparatus for fluid treatment for general liquid treatment, e.g. etching followed by cleaning
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00Cleaning and liquid contact with solids
    • Y10S134/902Semiconductor wafer
DE69230474T 1991-03-19 1992-03-17 Herstellung von hochpräzisen elektronischen komponenten mit hochreinen flüssigkeiten Expired - Fee Related DE69230474T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/672,665 US5242468A (en) 1991-03-19 1991-03-19 Manufacture of high precision electronic components with ultra-high purity liquids
PCT/US1992/002167 WO1992016306A2 (en) 1991-03-19 1992-03-17 Manufacture of high precision electronic components with ultra-high purity liquids

Publications (2)

Publication Number Publication Date
DE69230474D1 true DE69230474D1 (de) 2000-01-27
DE69230474T2 DE69230474T2 (de) 2000-07-27

Family

ID=24699507

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69230474T Expired - Fee Related DE69230474T2 (de) 1991-03-19 1992-03-17 Herstellung von hochpräzisen elektronischen komponenten mit hochreinen flüssigkeiten

Country Status (8)

Country Link
US (3) US5242468A (de)
EP (1) EP0693974B1 (de)
JP (2) JP3001634B2 (de)
KR (1) KR0182281B1 (de)
DE (1) DE69230474T2 (de)
MY (1) MY107019A (de)
TW (1) TW199233B (de)
WO (1) WO1992016306A2 (de)

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5370269A (en) * 1990-09-17 1994-12-06 Applied Chemical Solutions Process and apparatus for precise volumetric diluting/mixing of chemicals
JPH05212274A (ja) * 1991-11-12 1993-08-24 Submicron Syst Inc 化学処理システム
JP3074366B2 (ja) * 1993-02-22 2000-08-07 東京エレクトロン株式会社 処理装置
US5496778A (en) * 1994-01-07 1996-03-05 Startec Ventures, Inc. Point-of-use ammonia purification for electronic component manufacture
US6350425B2 (en) 1994-01-07 2002-02-26 Air Liquide America Corporation On-site generation of ultra-high-purity buffered-HF and ammonium fluoride
US5846386A (en) * 1994-01-07 1998-12-08 Startec Ventures, Inc. On-site ammonia purification for semiconductor manufacture
US5632866A (en) * 1994-01-12 1997-05-27 Fsi International, Inc. Point-of-use recycling of wafer cleaning substances
US5722447A (en) * 1994-04-29 1998-03-03 Texas Instruments Incorporated Continuous recirculation fluid delivery system and method
JP3411421B2 (ja) * 1995-03-31 2003-06-03 松下電器産業株式会社 スピンドルモータ用スラスト板の製造方法
US5671591A (en) * 1995-05-01 1997-09-30 Ashland, Inc. Integrated container moulding and filling facility
US6416676B1 (en) 1995-05-24 2002-07-09 National Semiconductor Corporation Deionized water degasification for semiconductor fabrication
EP0831978B1 (de) * 1995-06-05 2001-02-28 Air Liquide America Corporation Vor ort ammoniak reinigung für halbleiterherstellung
EP0830316A1 (de) * 1995-06-05 1998-03-25 Startec Ventures, Inc. Reinigung von ammonia an der verbrauchsstelle für die herstellung von elektronischen bauteilen
CN1080703C (zh) * 1995-06-05 2002-03-13 斯塔泰克文切斯公司 超高纯氨制备系统、高精密电子元件制造系统及其生产线上工作站供应高纯氨试剂的方法
EP0836719A4 (de) * 1995-06-05 1999-08-18 Startec Ventures Inc Verfahren und system zum örtlichen mischen von extrem hochreinen chemikalien für die halbleiterherstellung
US6001223A (en) * 1995-07-07 1999-12-14 Air Liquide America Corporation On-site ammonia purification for semiconductor manufacture
US6050283A (en) * 1995-07-07 2000-04-18 Air Liquide America Corporation System and method for on-site mixing of ultra-high-purity chemicals for semiconductor processing
US5716535A (en) * 1996-03-05 1998-02-10 Micron Technology, Inc. Methods and etchants for etching oxides of silicon with low selectivity
US5644921A (en) * 1996-05-22 1997-07-08 Air Products And Chemicals, Inc. Ultra high purity delivery system for liquefied compressed gases
US6132522A (en) * 1996-07-19 2000-10-17 Cfmt, Inc. Wet processing methods for the manufacture of electronic components using sequential chemical processing
JP3188843B2 (ja) * 1996-08-28 2001-07-16 ステラケミファ株式会社 微細加工表面処理剤及び微細加工表面処理方法
JP3507317B2 (ja) * 1996-12-20 2004-03-15 富士通株式会社 蒸留装置及び蒸留方法
US5871813A (en) * 1997-03-05 1999-02-16 Applied Materials, Inc. Apparatus and method for controlling process chamber pressure
US6007641A (en) * 1997-03-14 1999-12-28 Vlsi Technology, Inc. Integrated-circuit manufacture method with aqueous hydrogen-fluoride and nitric-acid oxide etch
KR20010012709A (ko) * 1997-06-13 2001-02-26 월터 알란 이. 반도체 웨이퍼 처리방법
US6159866A (en) * 1998-03-02 2000-12-12 Applied Materials, Inc. Method for insitu vapor generation for forming an oxide on a substrate
US5971368A (en) 1997-10-29 1999-10-26 Fsi International, Inc. System to increase the quantity of dissolved gas in a liquid and to maintain the increased quantity of dissolved gas in the liquid until utilized
JP3920429B2 (ja) 1997-12-02 2007-05-30 株式会社ルネサステクノロジ 位相シフトフォトマスクの洗浄方法および洗浄装置
US6085762A (en) * 1998-03-30 2000-07-11 The Regents Of The University Of California Apparatus and method for providing pulsed fluids
US6224252B1 (en) 1998-07-07 2001-05-01 Air Products And Chemicals, Inc. Chemical generator with controlled mixing and concentration feedback and adjustment
US6085548A (en) 1998-08-24 2000-07-11 Air Products And Chemicals, Inc. Control vent system for ultra-high purity delivery system for liquefied compressed gases
US6235641B1 (en) 1998-10-30 2001-05-22 Fsi International Inc. Method and system to control the concentration of dissolved gas in a liquid
JP2000228387A (ja) * 1998-12-01 2000-08-15 Tadahiro Omi ウエット洗浄装置
US6406551B1 (en) 1999-05-14 2002-06-18 Fsi International, Inc. Method for treating a substrate with heat sensitive agents
JP2001274154A (ja) 2000-01-18 2001-10-05 Applied Materials Inc 成膜方法、成膜装置、半導体装置及びその製造方法
JP4548555B2 (ja) * 2000-03-09 2010-09-22 三菱瓦斯化学株式会社 高純度アンモニア水の製造方法
US6372022B1 (en) * 2000-08-10 2002-04-16 Air Liquide America Corporation Ionic purifier
JP3878452B2 (ja) * 2001-10-31 2007-02-07 株式会社ルネサステクノロジ 半導体集積回路装置の製造方法
US7067015B2 (en) * 2002-10-31 2006-06-27 Texas Instruments Incorporated Modified clean chemistry and megasonic nozzle for removing backside CMP slurries
US6969466B1 (en) * 2002-12-24 2005-11-29 Puritan Products, Inc. Purification of ammonia
US7229601B2 (en) * 2004-02-06 2007-06-12 Seh-America, Inc. Ammonia reclamation system
US7293609B2 (en) * 2004-10-20 2007-11-13 Halliburton Energy Services, Inc. Treatment fluids comprising vitrified shale and methods of using such fluids in subterranean formations
KR100706822B1 (ko) * 2005-10-17 2007-04-12 삼성전자주식회사 절연 물질 제거용 조성물, 이를 이용한 절연막의 제거 방법및 기판의 재생 방법
US8790533B2 (en) 2010-04-23 2014-07-29 Postech Academy-Industry Foundation Method of etching semiconductor nanocrystals
US10343907B2 (en) * 2014-03-28 2019-07-09 Asm Ip Holding B.V. Method and system for delivering hydrogen peroxide to a semiconductor processing chamber
DE102015106556A1 (de) 2015-04-28 2016-11-17 MP Technology GmbH Verfahren zur Reinigung von Materialoberflächen
US20160296902A1 (en) 2016-06-17 2016-10-13 Air Liquide Electronics U.S. Lp Deterministic feedback blender
WO2019181475A1 (ja) * 2018-03-22 2019-09-26 富士フイルム株式会社 ろ過装置、精製装置、薬液の製造方法
KR102405561B1 (ko) * 2018-03-22 2022-06-08 후지필름 가부시키가이샤 여과 장치, 정제 장치, 및 약액의 제조 방법
WO2019181435A1 (ja) * 2018-03-22 2019-09-26 富士フイルム株式会社 ろ過装置、精製装置、薬液の製造方法
EP4065313A4 (de) 2019-11-27 2023-08-02 Diversified Fluid Solutions, LLC Bedarfsabhängiges inline-mischen und zuführen von chemikalien

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3663382A (en) * 1969-08-19 1972-05-16 Du Pont Process of recovering hydrogen fluoride free of arsenic by distillation
US3760822A (en) * 1972-03-22 1973-09-25 A Evans Machine for cleaning semiconductive wafers
US3869313A (en) * 1973-05-21 1975-03-04 Allied Chem Apparatus for automatic chemical processing of workpieces, especially semi-conductors
JPS609129A (ja) * 1983-06-29 1985-01-18 Fujitsu Ltd ウエツト処理装置
US4778532A (en) * 1985-06-24 1988-10-18 Cfm Technologies Limited Partnership Process and apparatus for treating wafers with process fluids
US4911761A (en) * 1984-05-21 1990-03-27 Cfm Technologies Research Associates Process and apparatus for drying surfaces
DE3650465T2 (de) * 1985-02-09 1996-09-12 Asahi Chemical Ind Durchlässige Polymer-Membran für die Gastrocknung
US4788043A (en) * 1985-04-17 1988-11-29 Tokuyama Soda Kabushiki Kaisha Process for washing semiconductor substrate with organic solvent
US4749440A (en) * 1985-08-28 1988-06-07 Fsi Corporation Gaseous process and apparatus for removing films from substrates
JPS6259522A (ja) * 1985-09-09 1987-03-16 Mitsubishi Metal Corp アンモニア水製造装置
JPS62213127A (ja) * 1986-03-13 1987-09-19 Nec Corp 半導体ウエハ−の洗浄装置
US4828660A (en) * 1986-10-06 1989-05-09 Athens Corporation Method and apparatus for the continuous on-site chemical reprocessing of ultrapure liquids
US4855023A (en) * 1986-10-06 1989-08-08 Athens, Inc. Method and apparatus for the continuous on-site chemical reprocessing of ultrapure liquids used in semiconductor wafer cleaning
JPS63152603A (ja) * 1986-12-17 1988-06-25 Showa Highpolymer Co Ltd 光硬化可能な樹脂組成物
JP2528854B2 (ja) * 1987-01-27 1996-08-28 多摩化学工業株式会社 高純度薬品の製造方法及びその装置
DE3884435T2 (de) * 1987-03-25 1994-02-17 Hitachi Ltd Verfahren zur Erzeugung hochreinen Wassers und Verfahren zur Verwendung dieses Wassers.
JPS63283027A (ja) * 1987-05-15 1988-11-18 Toshiba Corp 半導体の洗浄方法
JPS6434407A (en) * 1987-07-30 1989-02-03 Toray Industries Porous membrane of polytetrafluoroethylene-base resin and production thereof
DE3728693A1 (de) * 1987-08-27 1989-03-09 Wacker Chemitronic Verfahren und vorrichtung zum aetzen von halbleiteroberflaechen
JPH0819541B2 (ja) * 1987-10-09 1996-02-28 株式会社日立製作所 複極式水電解槽の運転方法
JPH0714468B2 (ja) * 1987-10-20 1995-02-22 ダイセル化学工業株式会社 超純水製造用中空糸膜の製造方法
JPH01160289A (ja) * 1987-12-17 1989-06-23 Sony Corp ディジタル映像信号の伝送方式
US5235995A (en) * 1989-03-27 1993-08-17 Semitool, Inc. Semiconductor processor apparatus with dynamic wafer vapor treatment and particulate volatilization
US4980032A (en) * 1988-08-12 1990-12-25 Alameda Instruments, Inc. Distillation method and apparatus for reprocessing sulfuric acid
US5061348A (en) * 1988-08-12 1991-10-29 Alameda Instruments Sulfuric acid reprocessor with continuous purge of second distillation vessel
US4936955A (en) * 1988-08-12 1990-06-26 Alameda Instruments, Inc. Hydrofluoric acid reprocessing for semiconductor standards
JPH07111963B2 (ja) * 1988-09-12 1995-11-29 株式会社スガイ 基板の洗浄乾燥装置
JPH07110482B2 (ja) * 1988-09-19 1995-11-29 株式会社マキタ 大入れルータ
US4900395A (en) * 1989-04-07 1990-02-13 Fsi International, Inc. HF gas etching of wafers in an acid processor
US5000795A (en) * 1989-06-16 1991-03-19 At&T Bell Laboratories Semiconductor wafer cleaning method and apparatus
JPH03129732A (ja) * 1989-07-19 1991-06-03 Matsushita Electric Ind Co Ltd 半導体の処理方法
US4985228A (en) * 1990-07-17 1991-01-15 E. I. Du Pont De Nemours And Company Purification of hydrogen peroxide

Also Published As

Publication number Publication date
JP3001634B2 (ja) 2000-01-24
JP2000124093A (ja) 2000-04-28
WO1992016306A2 (en) 1992-10-01
TW199233B (de) 1993-02-01
KR0182281B1 (ko) 1999-04-15
JPH06504164A (ja) 1994-05-12
JP3351770B2 (ja) 2002-12-03
DE69230474T2 (de) 2000-07-27
EP0693974B1 (de) 1999-12-22
US5242468A (en) 1993-09-07
EP0693974A1 (de) 1996-01-31
USRE37972E1 (en) 2003-02-04
MY107019A (en) 1995-08-30
EP0693974A4 (de) 1994-04-22
USRE36290E (en) 1999-09-07
WO1992016306A3 (en) 1992-12-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee