DE69312975T2 - System zur Bestimmung der Topographie einer gekrümmten Oberfläche - Google Patents

System zur Bestimmung der Topographie einer gekrümmten Oberfläche

Info

Publication number
DE69312975T2
DE69312975T2 DE69312975T DE69312975T DE69312975T2 DE 69312975 T2 DE69312975 T2 DE 69312975T2 DE 69312975 T DE69312975 T DE 69312975T DE 69312975 T DE69312975 T DE 69312975T DE 69312975 T2 DE69312975 T2 DE 69312975T2
Authority
DE
Germany
Prior art keywords
topography
determining
curved surface
curved
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69312975T
Other languages
English (en)
Other versions
DE69312975D1 (de
Inventor
Franciscus Hermanus Ma Jongsma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EUCLID MEDICAL INSTR Inc
Original Assignee
EUCLID MEDICAL INSTR Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EUCLID MEDICAL INSTR Inc filed Critical EUCLID MEDICAL INSTR Inc
Publication of DE69312975D1 publication Critical patent/DE69312975D1/de
Application granted granted Critical
Publication of DE69312975T2 publication Critical patent/DE69312975T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/107—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for determining the shape or measuring the curvature of the cornea
DE69312975T 1992-01-15 1993-01-15 System zur Bestimmung der Topographie einer gekrümmten Oberfläche Expired - Fee Related DE69312975T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL9200071A NL9200071A (nl) 1992-01-15 1992-01-15 Inrichting voor het bepalen van de topografie van een gekromd oppervlak.

Publications (2)

Publication Number Publication Date
DE69312975D1 DE69312975D1 (de) 1997-09-18
DE69312975T2 true DE69312975T2 (de) 1998-03-05

Family

ID=19860300

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69312975T Expired - Fee Related DE69312975T2 (de) 1992-01-15 1993-01-15 System zur Bestimmung der Topographie einer gekrümmten Oberfläche

Country Status (7)

Country Link
US (1) US5406342A (de)
EP (1) EP0551955B1 (de)
JP (1) JP2599876B2 (de)
DE (1) DE69312975T2 (de)
DK (1) DK0551955T3 (de)
ES (1) ES2108203T3 (de)
NL (1) NL9200071A (de)

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DE102010060448A1 (de) * 2010-11-09 2012-05-10 Eberhard Lange Projektionsvorrichtung zum Projizieren eines zu projizierenden Objekts
DE102015001365A1 (de) * 2015-02-03 2016-08-04 EnShape GmbH Verfahren zur 3d-vermessung von flüssigkeiten und gelen

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US5867250A (en) * 1996-05-03 1999-02-02 Baron; William S. Apparatus and method for optically mapping front and back surface topographies of an object
US5735283A (en) * 1996-10-09 1998-04-07 Snook; Richard Kieth Surgical keratometer system for measuring surface topography of a cornea during surgery
US6079831A (en) 1997-04-24 2000-06-27 Orbtek, Inc. Device and method for mapping the topography of an eye using elevation measurements in combination with slope measurements
US5864383A (en) * 1997-04-24 1999-01-26 Orbtek, Inc. Single-curvature placido plate
DE19815201A1 (de) * 1998-04-04 1999-10-07 Link Johann & Ernst Gmbh & Co Meßanordnung zur Erfassung von Dimensionen von Prüflingen, vorzugsweise von Hohlkörpern, insbesondere von Bohrungen in Werkstücken, sowie Verfahren zur Messung solcher Dimensionen
US6024449A (en) * 1998-07-13 2000-02-15 Smith; Robert F. High speed topography measurement of semi-diffuse objects
JP2000292135A (ja) * 1999-04-07 2000-10-20 Minolta Co Ltd ３次元情報入力カメラ
JP4651253B2 (ja) * 1999-07-28 2011-03-16 ヴィスクス インコーポレイテッド レーザー切除のための水和及び地形計測
US6639685B1 (en) 2000-02-25 2003-10-28 General Motors Corporation Image processing method using phase-shifted fringe patterns and curve fitting
WO2001073690A2 (en) * 2000-03-29 2001-10-04 Provar Inc. System and method for georeferencing digital raster maps
US7038681B2 (en) * 2000-03-29 2006-05-02 Sourceprose Corporation System and method for georeferencing maps
US7148898B1 (en) * 2000-03-29 2006-12-12 Sourceprose Corporation System and method for synchronizing raster and vector map images
SE0003904L (sv) * 2000-05-05 2001-11-06 Roger Tuomas Sätt att mäta ytråhet
FR2817042B1 (fr) * 2000-11-22 2003-06-20 Saint Gobain Procede et dispositif d'analyse de la surface d'un substrat
DE10061326A1 (de) 2000-12-08 2002-06-27 Bioshape Ag Verfahren und Vorrichtung zur Topologieermittlung von biologischem Gewebe
JP3519698B2 (ja) * 2001-04-20 2004-04-19 照明 與語 ３次元形状測定方法
DE10132309B4 (de) * 2001-07-06 2006-09-21 Geometrie Concern Verwaltungs- Und Beteiligungsgesellschaft Mbh Visuelles Kontrollverfahren und Kontrollsystem
US6575573B2 (en) 2001-10-17 2003-06-10 Carl Zeiss Ophthalmic Systems, Inc. Method and apparatus for measuring a corneal profile of an eye
US7164817B2 (en) 2002-05-24 2007-01-16 Hoya Corporation Optical switch and optical add/drop multiplexer using the same
WO2003100498A1 (fr) 2002-05-24 2003-12-04 Hoya Corporation Commutateur optique et unite optique de derivation/insertion l'utilisant
EP1516156B1 (de) 2002-05-30 2019-10-23 AMO Manufacturing USA, LLC Verfolgen der torsionalen augenorientierung und -position
US7083609B2 (en) * 2002-06-13 2006-08-01 Visx, Incorporated Corneal topography-based target warping
US7133137B2 (en) * 2002-06-27 2006-11-07 Visx, Incorporated Integrated scanning and ocular tomography system and method
US7458683B2 (en) * 2003-06-16 2008-12-02 Amo Manufacturing Usa, Llc Methods and devices for registering optical measurement datasets of an optical system
US7481536B2 (en) * 2004-02-19 2009-01-27 Amo Manufacturing Usa, Llc Methods and systems for differentiating left and right eye images
US7369253B2 (en) * 2004-10-13 2008-05-06 Akrometrix, Llc Systems and methods for measuring sample surface flatness of continuously moving samples
US7866820B2 (en) * 2006-02-14 2011-01-11 Vision Optimization, Llc Corneo-scleral topography system
DE102006028238B3 (de) * 2006-06-20 2007-07-19 Benecke-Kaliko Ag Verfahren zur Analyse der Reflexionseigenschaften
DE102007017611A1 (de) 2007-04-12 2008-10-16 SCHRÜNDER, Stephan Verfahren und System zur Augenvermessung
EP2040061A1 (de) * 2007-09-24 2009-03-25 Koninklijke Philips Electronics N.V. Vorrichtung und Verfahren zur Beobachtung der Oberfläche einer Probe
WO2009094510A1 (en) * 2008-01-25 2009-07-30 Cyberoptics Corporation Multi-source sensor for three-dimensional imaging using phased structured light
US8059280B2 (en) * 2008-01-31 2011-11-15 Cyberoptics Corporation Method for three-dimensional imaging using multi-phase structured light
CA2731811C (en) * 2008-04-04 2016-12-13 Amo Wavefront Sciences, Llc Registering multiple ophthalmic datasets
US9504376B2 (en) 2009-12-22 2016-11-29 Amo Wavefront Sciences, Llc Optical diagnosis using measurement sequence
JP5743433B2 (ja) * 2010-06-03 2015-07-01 株式会社マクシス・シントー 三次元形状計測装置
GB201010244D0 (en) * 2010-06-18 2010-07-21 Hyde John Line and image capture for 3D applications independent of high ambient lighting conditions
WO2013082466A1 (en) 2011-11-30 2013-06-06 Amo Development, Llc. System and method for ophthalmic surface measurements based on sequential estimates
WO2015054672A1 (en) * 2013-10-10 2015-04-16 The Regents Of The University Of California Ocular cellscope apparatus
EP3065622B1 (de) * 2013-11-08 2019-06-12 Precision Ocular Metrology, LLC Vermessung der augenoberfläche
CN105890876B (zh) * 2014-12-10 2018-07-06 青岛理工大学 正弦光强靶标光学信号发生方法及系统
WO2016123448A2 (en) * 2015-01-30 2016-08-04 Catanzariti Scott Paul Systems and method for mapping the ocular surface usually obstructed by the eyelids
WO2017125528A1 (en) 2016-01-20 2017-07-27 Eaglet Eye B.V. Improved eye surface topographer
WO2017180965A1 (en) 2016-04-15 2017-10-19 The Regents Of The University Of California Retinal cellscope apparatus
WO2020102658A2 (en) * 2018-11-16 2020-05-22 Carestream Dental Llc Laser projection system
WO2021003444A2 (en) * 2019-07-02 2021-01-07 Nikon Corporation Metrology for additive manufacturing
CN110897608B (zh) * 2019-12-15 2022-05-03 深圳市具安科技有限公司 斑马鱼眼动分析方法、装置及计算机设备

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FR2254781A1 (en) * 1973-12-18 1975-07-11 Schaeffer Bernard Rastered photogrammetry technique - involves projecting image of rastered object through second raster
FR2292213A1 (fr) * 1974-11-21 1976-06-18 Cem Comp Electro Mec Procede et dispositif permettant de determiner le signe des lignes de niveau d'un objet
FR2337329A1 (fr) * 1975-12-29 1977-07-29 Cem Comp Electro Mec Procede et dispositif optiques pour la comparaison des coordonnees spatiales des points des enveloppes de plusieurs objets tridimensionnels
JPS61219804A (ja) * 1985-03-27 1986-09-30 Hitachi Ltd 線状物体の高さ測定方法
JPS6345113A (ja) * 1986-08-13 1988-02-26 Catalysts & Chem Ind Co Ltd 低濁度および低粘度のシリカゾル
US4722600A (en) * 1986-10-14 1988-02-02 Chiang Fu Pen Apparatus and method for measuring strain
JPH02119837A (ja) * 1988-10-28 1990-05-07 Kowa Co 眼科測定方法および装置
JPH02271208A (ja) * 1989-04-13 1990-11-06 Nippondenso Co Ltd ３次元形状測定装置
DE4007502A1 (de) * 1990-03-09 1991-09-12 Zeiss Carl Fa Verfahren und vorrichtung zur beruehrungslosen vermessung von objektoberflaechen
DE4007500A1 (de) * 1990-03-09 1991-09-12 Zeiss Carl Fa Verfahren und vorrichtung zur beruehrungslosen vermessung von objektoberflaechen

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010060448A1 (de) * 2010-11-09 2012-05-10 Eberhard Lange Projektionsvorrichtung zum Projizieren eines zu projizierenden Objekts
DE102010060448B4 (de) * 2010-11-09 2021-07-01 Eberhard Lange Projektionsvorrichtung zum Projizieren eines zu projizierenden Objekts
DE102015001365A1 (de) * 2015-02-03 2016-08-04 EnShape GmbH Verfahren zur 3d-vermessung von flüssigkeiten und gelen

Also Published As

Publication number Publication date
ES2108203T3 (es) 1997-12-16
EP0551955A1 (de) 1993-07-21
DE69312975D1 (de) 1997-09-18
JPH0771934A (ja) 1995-03-17
EP0551955B1 (de) 1997-08-13
JP2599876B2 (ja) 1997-04-16
US5406342A (en) 1995-04-11
NL9200071A (nl) 1993-08-02
DK0551955T3 (da) 1998-03-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee