DE69314683D1 - Verfahren und Gerät zum Prüfen von Ein-/Ausgabeverbindungen des Randsteckverbinders einer Schaltkreiskarte mit Boundary Scan - Google Patents
Verfahren und Gerät zum Prüfen von Ein-/Ausgabeverbindungen des Randsteckverbinders einer Schaltkreiskarte mit Boundary ScanInfo
- Publication number
- DE69314683D1 DE69314683D1 DE69314683T DE69314683T DE69314683D1 DE 69314683 D1 DE69314683 D1 DE 69314683D1 DE 69314683 T DE69314683 T DE 69314683T DE 69314683 T DE69314683 T DE 69314683T DE 69314683 D1 DE69314683 D1 DE 69314683D1
- Authority
- DE
- Germany
- Prior art keywords
- boundary scan
- stem
- output connections
- input
- chain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Revoked
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
- G01R31/318513—Test of Multi-Chip-Moduls
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US84406092A | 1992-03-02 | 1992-03-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69314683D1 true DE69314683D1 (de) | 1997-11-27 |
DE69314683T2 DE69314683T2 (de) | 1998-02-19 |
Family
ID=25291699
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69314683T Revoked DE69314683T2 (de) | 1992-03-02 | 1993-02-17 | Verfahren und Gerät zum Prüfen von Ein-/Ausgabeverbindungen des Randsteckverbinders einer Schaltkreiskarte mit Boundary Scan |
Country Status (6)
Country | Link |
---|---|
US (1) | US5331274A (de) |
EP (1) | EP0560500B1 (de) |
JP (1) | JPH0618620A (de) |
KR (1) | KR970002061B1 (de) |
DE (1) | DE69314683T2 (de) |
TW (1) | TW253097B (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5390191A (en) * | 1992-01-31 | 1995-02-14 | Sony Corporation | Apparatus and method for testing the interconnection between integrated circuits |
GB9217728D0 (en) * | 1992-08-20 | 1992-09-30 | Texas Instruments Ltd | Method of testing interconnections between integrated circuits in a circuit |
JP2727930B2 (ja) * | 1993-10-04 | 1998-03-18 | 日本電気株式会社 | バウンダリスキャンテスト回路 |
JP3479653B2 (ja) * | 1993-10-15 | 2003-12-15 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | テスト装置 |
US5513189A (en) * | 1994-05-25 | 1996-04-30 | Tandem Computers, Incorporated | Boundary scan system with improved error reporting using sentinel bit patterns |
US5574730A (en) * | 1995-01-31 | 1996-11-12 | Unisys Corporation | Bussed test access port interface and method for testing and controlling system logic boards |
US5604754A (en) * | 1995-02-27 | 1997-02-18 | International Business Machines Corporation | Validating the synchronization of lock step operated circuits |
US5852617A (en) * | 1995-12-08 | 1998-12-22 | Samsung Electronics Co., Ltd. | Jtag testing of buses using plug-in cards with Jtag logic mounted thereon |
US5774477A (en) | 1995-12-22 | 1998-06-30 | Lucent Technologies Inc. | Method and apparatus for pseudorandom boundary-scan testing |
DE69739438D1 (de) * | 1996-02-06 | 2009-07-16 | Ericsson Telefon Ab L M | Anordnung und verfahren zur prüfung von integrierten schaltungseinrichtungen |
US5787094A (en) * | 1996-06-06 | 1998-07-28 | International Business Machines Corporation | Test and diagnostics for a self-timed parallel interface |
US6539510B1 (en) * | 1997-08-12 | 2003-03-25 | Xilinx, Inc. | Interface board for receiving modular interface cards |
KR100512162B1 (ko) * | 1998-03-31 | 2005-11-11 | 삼성전자주식회사 | 마이크로프로세서의에뮬레이션모드를위한바운더리스캔스탠다드인터페이스회로 |
US6441627B1 (en) * | 1998-10-26 | 2002-08-27 | Micron Technology, Inc. | Socket test device for detecting characteristics of socket signals |
US7071679B1 (en) | 2003-05-23 | 2006-07-04 | Xilinx, Inc. | Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces |
GB2405945B (en) * | 2003-09-11 | 2006-10-25 | Agilent Technologies Inc | Printed circuit board assembly test apparatus |
DE102008019861A1 (de) | 2008-04-17 | 2009-10-29 | Göpel electronic GmbH | Verfahren zum Steuern von Anschlusspins eines emulationsfähigen Bausteins und Anordnung zur Durchführung des Verfahrens |
JP5407257B2 (ja) * | 2008-10-01 | 2014-02-05 | 富士通株式会社 | 回路試験装置及び回路試験システム |
KR101222737B1 (ko) * | 2010-09-27 | 2013-01-15 | 삼성전기주식회사 | 내장형 기판의 경계 스캔 테스트 장치 및 그 방법 |
RU2560967C1 (ru) * | 2014-05-26 | 2015-08-20 | Акционерное Общество "НПО "Орион" (АО "НПЦ "Орион") | Способ коррекции топологии бис |
DE102014010528A1 (de) | 2014-07-18 | 2016-02-18 | Mahle International Gmbh | Pleuel sowie Baueinheit aus einem Kolben und einem Pleuel |
CN108152720A (zh) * | 2016-12-06 | 2018-06-12 | 英业达科技有限公司 | 测试非边界扫描芯片及其周边线路的系统及其方法 |
CN110007217B (zh) * | 2019-05-22 | 2021-06-25 | 哈尔滨工业大学(威海) | 一种低功耗边界扫描测试方法 |
TWI773402B (zh) * | 2021-06-24 | 2022-08-01 | 英業達股份有限公司 | 提高邊界掃描測試的腳位測試涵蓋率系統及其方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3854125A (en) * | 1971-06-15 | 1974-12-10 | Instrumentation Engineering | Automated diagnostic testing system |
JPS60223250A (ja) * | 1984-04-19 | 1985-11-07 | Toshiba Corp | 情報伝送装置 |
NL8502476A (nl) * | 1985-09-11 | 1987-04-01 | Philips Nv | Werkwijze voor het testen van dragers met meerdere digitaal-werkende geintegreerde schakelingen, drager voorzien van zulke schakelingen, geintegreerde schakeling geschikt voor het aanbrengen op zo'n drager, en testinrichting voor het testen van zulke dragers. |
US4710931A (en) * | 1985-10-23 | 1987-12-01 | Texas Instruments Incorporated | Partitioned scan-testing system |
NL8801362A (nl) * | 1988-05-27 | 1989-12-18 | Philips Nv | Elektronische module bevattende een eerste substraatelement met een funktioneel deel, alsmede een tweede substraatelement voor het testen van een interkonnektiefunktie, voet bevattende zo een tweede substraatelement, substraatelement te gebruiken als zo een tweede substraatelement en elektronisch apparaat bevattende een plaat met gedrukte bedrading en ten minste twee zulke elektronische modules. |
US4963824A (en) * | 1988-11-04 | 1990-10-16 | International Business Machines Corporation | Diagnostics of a board containing a plurality of hybrid electronic components |
GB8826921D0 (en) * | 1988-11-17 | 1988-12-21 | Datatrace Ltd | Circuit testing |
US5029166A (en) * | 1989-05-31 | 1991-07-02 | At&T Bell Laboratories | Method and apparatus for testing circuit boards |
US5056093A (en) * | 1989-08-09 | 1991-10-08 | Texas Instruments Incorporated | System scan path architecture |
US5115435A (en) * | 1989-10-19 | 1992-05-19 | Ncr Corporation | Method and apparatus for bus executed boundary scanning |
US5155732A (en) * | 1990-10-09 | 1992-10-13 | At&T Bell Laboratories | Method and apparatus for data transfer to and from devices through a boundary-scan test access port |
US5132635A (en) * | 1991-03-05 | 1992-07-21 | Ast Research, Inc. | Serial testing of removable circuit boards on a backplane bus |
US5173377A (en) * | 1991-10-28 | 1992-12-22 | Globe-Union Inc. | Apparatus for electrically connecting cell modules of a metal oxide-hydrogen battery |
-
1993
- 1993-01-21 TW TW082100460A patent/TW253097B/zh active
- 1993-02-16 JP JP5048747A patent/JPH0618620A/ja active Pending
- 1993-02-17 DE DE69314683T patent/DE69314683T2/de not_active Revoked
- 1993-02-17 EP EP93301123A patent/EP0560500B1/de not_active Revoked
- 1993-02-27 KR KR1019930003049A patent/KR970002061B1/ko not_active IP Right Cessation
- 1993-06-24 US US08/080,480 patent/US5331274A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
TW253097B (de) | 1995-08-01 |
EP0560500A1 (de) | 1993-09-15 |
KR970002061B1 (ko) | 1997-02-21 |
KR930020167A (ko) | 1993-10-19 |
EP0560500B1 (de) | 1997-10-22 |
DE69314683T2 (de) | 1998-02-19 |
JPH0618620A (ja) | 1994-01-28 |
US5331274A (en) | 1994-07-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8363 | Opposition against the patent | ||
8331 | Complete revocation |