DE69323531D1 - Ungleichförmigkeitsausgleich mit grossem Dynamikbereich für infrarote Bildebenematrizen - Google Patents

Ungleichförmigkeitsausgleich mit grossem Dynamikbereich für infrarote Bildebenematrizen

Info

Publication number
DE69323531D1
DE69323531D1 DE69323531T DE69323531T DE69323531D1 DE 69323531 D1 DE69323531 D1 DE 69323531D1 DE 69323531 T DE69323531 T DE 69323531T DE 69323531 T DE69323531 T DE 69323531T DE 69323531 D1 DE69323531 D1 DE 69323531D1
Authority
DE
Germany
Prior art keywords
dynamic range
image plane
infrared image
large dynamic
uniformity compensation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69323531T
Other languages
English (en)
Other versions
DE69323531T2 (de
Inventor
Gary M Lindgren
Joseph A Spagnolia
Anthony J Kay
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Application granted granted Critical
Publication of DE69323531D1 publication Critical patent/DE69323531D1/de
Publication of DE69323531T2 publication Critical patent/DE69323531T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/33—Transforming infrared radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53—Reference sources, e.g. standard lamps; Black bodies
DE69323531T 1992-12-07 1993-12-07 Ungleichförmigkeitsausgleich mit grossem Dynamikbereich für infrarote Bildebenematrizen Expired - Lifetime DE69323531T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US98630492A 1992-12-07 1992-12-07

Publications (2)

Publication Number Publication Date
DE69323531D1 true DE69323531D1 (de) 1999-03-25
DE69323531T2 DE69323531T2 (de) 1999-06-17

Family

ID=25532280

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69323531T Expired - Lifetime DE69323531T2 (de) 1992-12-07 1993-12-07 Ungleichförmigkeitsausgleich mit grossem Dynamikbereich für infrarote Bildebenematrizen

Country Status (10)

Country Link
US (1) US5420421A (de)
EP (1) EP0601534B1 (de)
JP (1) JP2661865B2 (de)
AU (1) AU656492B2 (de)
CA (1) CA2110368C (de)
DE (1) DE69323531T2 (de)
ES (1) ES2127779T3 (de)
IL (1) IL107828A (de)
NO (1) NO934422L (de)
TR (1) TR28036A (de)

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GB2303988A (en) * 1995-07-31 1997-03-05 Secr Defence Thermal imaging system with detector array calibration mode
GB2317779B8 (en) * 1995-07-31 2000-01-31 Sec Dep For Defence Defence Re Thermal sensing system having a fast response calibration device
JP3212874B2 (ja) * 1996-04-19 2001-09-25 日本電気株式会社 ボロメータ型赤外線撮像装置
GB2314227B (en) * 1996-06-14 1998-12-23 Simage Oy Calibration method and system for imaging devices
US5994701A (en) * 1996-10-15 1999-11-30 Nippon Avonics Co., Ltd. Infrared sensor device with temperature correction function
DE19715983C1 (de) * 1997-04-17 1998-09-24 Aeg Infrarot Module Gmbh Verfahren zum Korrigieren der Grauwerte von Bildern einer digitalen Infrarot-Kamera
US6184529B1 (en) 1998-01-28 2001-02-06 Lockheed Martin Corporation Methods and apparatus for performing scene based uniformity correction in imaging systems
NL1013296C2 (nl) * 1999-10-14 2001-04-18 Hollandse Signaalapparaten Bv Detectieinrichting voorzien van offsetcompensatie.
US6433333B1 (en) * 2000-03-03 2002-08-13 Drs Sensors & Targeting Systems, Inc. Infrared sensor temperature compensated response and offset correction
AU2001255178A1 (en) * 2000-03-17 2001-10-03 Infrared Components Corp. Method and apparatus for correction of microbolometer output
GB0008662D0 (en) * 2000-04-07 2000-05-31 Innovation Tk Limited Calibration techniques in telecine machines
DE10064184C1 (de) * 2000-12-22 2002-04-04 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Bilderzeugung unter Verwendung mehrerer Belichtungszeiten
US6683310B2 (en) 2001-06-18 2004-01-27 Honeywell International Inc. Readout technique for microbolometer array
GB2384934A (en) * 2002-02-02 2003-08-06 Qinetiq Ltd Calibration of thermal imaging detector
US6737639B2 (en) * 2002-03-27 2004-05-18 Raytheon Company Display uniformity calibration system and method for a staring forward looking infrared sensor
US7443431B2 (en) 2002-09-13 2008-10-28 Eastman Kodak Company Fixed pattern noise removal in CMOS imagers across various operational conditions
WO2004027459A2 (en) * 2002-09-20 2004-04-01 Bae Systems Information And Electronic Systems Integration Inc Front lens shutter mount for uniformity correction
US6969856B1 (en) 2003-06-19 2005-11-29 The United States Of America As Represented By The Secretary Of The Navy Two band imaging system
DE10340515B4 (de) * 2003-09-03 2007-04-19 Carl Zeiss Optronics Gmbh Verfahren und Einrichtung zur Inhomogenitätskorrektur und Kalibrierung von optronischen Kameras mit Hilfe aufgenommener Bilder und Darstellen physikalischer Größen
DE10343496B4 (de) * 2003-09-19 2015-08-06 Siemens Aktiengesellschaft Korrektur eines von einem digitalen Röntgendetektor aufgenommenen Röntgenbildes sowie Kalibrierung des Röntgendetektors
US7899271B1 (en) 2004-09-15 2011-03-01 Raytheon Company System and method of moving target based calibration of non-uniformity compensation for optical imagers
US7463753B2 (en) * 2004-09-15 2008-12-09 Raytheon Company FLIR-to-missile boresight correlation and non-uniformity compensation of the missile seeker
US7218705B2 (en) * 2005-06-25 2007-05-15 General Electric Systems, methods and apparatus to offset correction of X-ray images
DE102005047595A1 (de) * 2005-10-05 2007-04-12 Carl Zeiss Sms Gmbh Verfahren zur Ermittlung der Empfindlichkeit von Sensorarrays
US7920982B2 (en) * 2008-01-15 2011-04-05 Raytheon Company Optical distortion calibration for electro-optical sensors
US8124937B2 (en) * 2009-01-15 2012-02-28 Raytheon Company System and method for athermal operation of a focal plane array
US7949241B2 (en) * 2009-09-29 2011-05-24 Raytheon Company Anamorphic focal array
US8610062B2 (en) 2011-03-24 2013-12-17 Raytheon Company Apparatus and method for multi-spectral imaging
US9143703B2 (en) * 2011-06-10 2015-09-22 Flir Systems, Inc. Infrared camera calibration techniques
CN102829873B (zh) * 2012-08-20 2014-06-25 南京理工大学 红外热像仪非均匀性评价装置
SE536679C2 (sv) 2012-11-01 2014-05-20 Flir Systems Ab Förfarande för mappning vid upptagning av videoflöden medelst kamera
CN103076097A (zh) * 2013-01-06 2013-05-01 河北汉光重工有限责任公司 基于参照源的分段线性非均匀矫正方法
KR101407723B1 (ko) * 2014-02-06 2014-06-13 엘아이지넥스원 주식회사 적외선 영상 보정 장치
KR101418110B1 (ko) * 2014-02-06 2014-08-06 엘아이지넥스원 주식회사 적외선 영상 보정 방법
CN104748865B (zh) * 2015-03-30 2018-01-05 北京空间机电研究所 一种用于红外图像的多点组合校正方法
JP2016219914A (ja) * 2015-05-15 2016-12-22 日本電気株式会社 赤外線撮像装置、及びその制御方法
CN105716720B (zh) * 2016-02-03 2019-05-31 姜志富 红外图像非均匀性校正方法及装置
DE102018001076A1 (de) 2018-02-10 2019-08-14 Diehl Defence Gmbh & Co. Kg Verfahren zur Bestimmung von Kennlinienkorrekturfaktoren eines im infraroten Spektralbereich abbildenden Matrixdetektors
CN108519161B (zh) * 2018-04-10 2019-11-26 中国科学院上海技术物理研究所 一种红外焦平面非均匀性校正方法
CN110686781B (zh) * 2019-04-12 2024-04-09 福建鼎泰康医疗设备有限公司 一种温度校准方法及装置
CN110595626A (zh) * 2019-09-18 2019-12-20 深圳市一体医疗科技有限公司 一种红外探测器系统及成像方法
CN113865722B (zh) * 2021-09-28 2023-04-07 北京环境特性研究所 基于漫反射金属板的面阵制冷红外热像仪校正方法

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JPS57132031A (en) * 1981-02-09 1982-08-16 Fujitsu Ltd Correction system for output of infrared ray detecting elenent
JPS62298732A (ja) * 1986-06-18 1987-12-25 Nec Corp 赤外撮像装置
JP2565260B2 (ja) * 1987-10-17 1996-12-18 ソニー株式会社 固体撮像装置用画像欠陥補正装置
JPH06105186B2 (ja) * 1988-08-18 1994-12-21 富士電機株式会社 センサアレイの検出値出力方式
US4975864A (en) * 1989-01-26 1990-12-04 Hughes Aircraft Company Scene based nonuniformity compensation for starting focal plane arrays
US5128884A (en) * 1989-12-18 1992-07-07 Prager Kenneth E Black body calibration using image processing techniques
JPH04109128A (ja) * 1990-08-29 1992-04-10 Chino Corp 放射温度計
JPH0726871B2 (ja) * 1991-03-19 1995-03-29 日本アビオニクス株式会社 赤外線センサ信号処理回路

Also Published As

Publication number Publication date
DE69323531T2 (de) 1999-06-17
NO934422D0 (no) 1993-12-06
AU5220793A (en) 1994-06-16
NO934422L (no) 1994-06-08
AU656492B2 (en) 1995-02-02
CA2110368C (en) 1999-11-23
JP2661865B2 (ja) 1997-10-08
EP0601534A1 (de) 1994-06-15
ES2127779T3 (es) 1999-05-01
IL107828A (en) 1996-09-04
EP0601534B1 (de) 1999-02-17
CA2110368A1 (en) 1994-06-08
TR28036A (tr) 1995-12-11
US5420421A (en) 1995-05-30
JPH06235663A (ja) 1994-08-23
IL107828A0 (en) 1994-07-31

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