DE69326765D1 - Atmosphärendruck-ionenschnittstelle für einen massenspektrometer - Google Patents

Atmosphärendruck-ionenschnittstelle für einen massenspektrometer

Info

Publication number
DE69326765D1
DE69326765D1 DE69326765T DE69326765T DE69326765D1 DE 69326765 D1 DE69326765 D1 DE 69326765D1 DE 69326765 T DE69326765 T DE 69326765T DE 69326765 T DE69326765 T DE 69326765T DE 69326765 D1 DE69326765 D1 DE 69326765D1
Authority
DE
Germany
Prior art keywords
analyzer
atmospheric pressure
mass spectrometer
mass analyzer
pressure ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69326765T
Other languages
English (en)
Other versions
DE69326765T2 (de
Inventor
Alex Mordehai
Gerard Hoffman-La Hopfgartner
John Henion
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cornell Research Foundation Inc
Original Assignee
Cornell Research Foundation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cornell Research Foundation Inc filed Critical Cornell Research Foundation Inc
Publication of DE69326765D1 publication Critical patent/DE69326765D1/de
Application granted granted Critical
Publication of DE69326765T2 publication Critical patent/DE69326765T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7266—Nebulising, aerosol formation or ionisation by electric field, e.g. electrospray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724—Nebulising, aerosol formation or ionisation
    • G01N30/7246—Nebulising, aerosol formation or ionisation by pneumatic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7233—Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/7273—Desolvation chambers
DE69326765T 1992-05-29 1993-05-28 Atmosphärendruck-ionenschnittstelle für einen massenspektrometer Expired - Fee Related DE69326765T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US88969392A 1992-05-29 1992-05-29
US08/009,063 US5352892A (en) 1992-05-29 1993-01-26 Atmospheric pressure ion interface for a mass analyzer
PCT/US1993/004903 WO1993024209A1 (en) 1992-05-29 1993-05-28 Atmospheric pressure ion interface for a mass analyzer

Publications (2)

Publication Number Publication Date
DE69326765D1 true DE69326765D1 (de) 1999-11-18
DE69326765T2 DE69326765T2 (de) 2000-03-02

Family

ID=26678999

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69326765T Expired - Fee Related DE69326765T2 (de) 1992-05-29 1993-05-28 Atmosphärendruck-ionenschnittstelle für einen massenspektrometer

Country Status (6)

Country Link
US (1) US5352892A (de)
EP (1) EP0644796B1 (de)
JP (1) JPH07507418A (de)
AT (1) ATE185495T1 (de)
DE (1) DE69326765T2 (de)
WO (1) WO1993024209A1 (de)

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US5986259A (en) * 1996-04-23 1999-11-16 Hitachi, Ltd. Mass spectrometer
US5750993A (en) * 1996-05-09 1998-05-12 Finnigan Corporation Method of reducing noise in an ion trap mass spectrometer coupled to an atmospheric pressure ionization source
US5729014A (en) * 1996-07-11 1998-03-17 Varian Associates, Inc. Method for injection of externally produced ions into a quadrupole ion trap
ATE488025T1 (de) * 1996-09-10 2010-11-15 Perkinelmer Health Sci Inc Atmosphärendruckionenquelle
JP3648906B2 (ja) * 1997-02-14 2005-05-18 株式会社日立製作所 イオントラップ質量分析計を用いた分析装置
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US6753521B1 (en) * 2000-02-18 2004-06-22 Bruker Daltonics, Inc. Method and apparatus for a nanoelectrosprayer for use in mass spectrometry
US6777672B1 (en) * 2000-02-18 2004-08-17 Bruker Daltonics, Inc. Method and apparatus for a multiple part capillary device for use in mass spectrometry
US6570153B1 (en) * 2000-10-18 2003-05-27 Agilent Technologies, Inc. Tandem mass spectrometry using a single quadrupole mass analyzer
EP1330829B1 (de) 2000-10-23 2009-08-26 Simon Fraser University Verfahren und vorrichtung zur erzeugung eines diskreten teilchens
US6593569B2 (en) * 2001-02-08 2003-07-15 Thermo Finnigan Llc Collisional gas delivery apparatus and method
US6745449B2 (en) * 2001-11-06 2004-06-08 Raytheon Company Method and apparatus for making a lid with an optically transmissive window
GB0210930D0 (en) 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
JP5073168B2 (ja) * 2002-05-31 2012-11-14 ウオーターズ・テクノロジーズ・コーポレイシヨン 質量分析計用の高速組合せマルチモードイオン源
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WO2004057638A2 (en) * 2002-12-18 2004-07-08 Brigham Young University Method and apparatus for aerodynamic ion focusing
CA2470452C (en) 2003-06-09 2017-10-03 Ionics Mass Spectrometry Group, Inc. Mass spectrometer interface
US7385186B2 (en) * 2005-05-13 2008-06-10 Applera Corporation Methods of operating ion optics for mass spectrometry
WO2006127803A2 (en) * 2005-05-23 2006-11-30 Tsi Incorporated Instruments for measuring nanoparticle exposure
GB2443110A (en) * 2005-05-23 2008-04-23 Tsi Inc Instruments for measuring nanoparticle exposure
US7700913B2 (en) * 2006-03-03 2010-04-20 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
US8026477B2 (en) * 2006-03-03 2011-09-27 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
JP2009539115A (ja) * 2006-05-26 2009-11-12 イオンセンス インコーポレイテッド 表面イオン化技術で用いるための可撓性開放管採取システム
US8440965B2 (en) 2006-10-13 2013-05-14 Ionsense, Inc. Sampling system for use with surface ionization spectroscopy
WO2008046111A2 (en) * 2006-10-13 2008-04-17 Ionsense, Inc. A sampling system for containment and transfer of ions into a spectroscopy system
TWI320395B (en) * 2007-02-09 2010-02-11 Primax Electronics Ltd An automatic duplex document feeder with a function of releasing paper jam
US7868289B2 (en) * 2007-04-30 2011-01-11 Ionics Mass Spectrometry Group Inc. Mass spectrometer ion guide providing axial field, and method
US7595487B2 (en) 2007-08-24 2009-09-29 Georgia Tech Research Corporation Confining/focusing vortex flow transmission structure, mass spectrometry systems, and methods of transmitting particles, droplets, and ions
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US8338779B2 (en) * 2008-02-27 2012-12-25 Thermo Finnigan Llc Optimization of excitation voltage amplitude for collision induced dissociation of ions in an ion trap
US8039795B2 (en) * 2008-04-04 2011-10-18 Agilent Technologies, Inc. Ion sources for improved ionization
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US20100078553A1 (en) * 2008-09-30 2010-04-01 Advion Biosciences, Inc. Atmospheric pressure ionization (api) interface structures for a mass spectrometer
US20100154568A1 (en) * 2008-11-19 2010-06-24 Roth Michael J Analytical Instruments, Assemblies, and Methods
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WO2011161788A1 (ja) * 2010-06-24 2011-12-29 株式会社島津製作所 大気圧イオン化質量分析装置
US8822949B2 (en) 2011-02-05 2014-09-02 Ionsense Inc. Apparatus and method for thermal assisted desorption ionization systems
US8901488B1 (en) 2011-04-18 2014-12-02 Ionsense, Inc. Robust, rapid, secure sample manipulation before during and after ionization for a spectroscopy system
EP4181170A1 (de) 2013-09-20 2023-05-17 Micromass UK Limited Ioneneinlassanordnung
CN104752148B (zh) * 2013-12-30 2017-10-10 同方威视技术股份有限公司 电晕放电组件、离子迁移谱仪、利用电晕放电组件进行电晕放电的方法
EP3146322A1 (de) * 2014-05-22 2017-03-29 W. Henry Benner Instrumente zur messung der ionengrössenverteilung und -konzentration
US9337007B2 (en) 2014-06-15 2016-05-10 Ionsense, Inc. Apparatus and method for generating chemical signatures using differential desorption
US9899196B1 (en) 2016-01-12 2018-02-20 Jeol Usa, Inc. Dopant-assisted direct analysis in real time mass spectrometry
CN107543859B (zh) * 2017-03-22 2020-04-07 中国检验检疫科学研究院 一种玩具中4种初级芳香胺的快速筛查方法
US10636640B2 (en) 2017-07-06 2020-04-28 Ionsense, Inc. Apparatus and method for chemical phase sampling analysis
WO2019231859A1 (en) 2018-06-01 2019-12-05 Ionsense Inc. Apparatus and method for reducing matrix effects when ionizing a sample
JP2022553600A (ja) 2019-10-28 2022-12-26 イオンセンス インコーポレイテッド 拍動流大気リアルタイムイオン化
US11913861B2 (en) 2020-05-26 2024-02-27 Bruker Scientific Llc Electrostatic loading of powder samples for ionization
CN113686799A (zh) * 2021-09-14 2021-11-23 西安乐析医疗科技有限公司 一种同时测定平衡盐溶液中钾和钠含量的测定方法

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JP2753265B2 (ja) * 1988-06-10 1998-05-18 株式会社日立製作所 プラズマイオン化質量分析計

Also Published As

Publication number Publication date
JPH07507418A (ja) 1995-08-10
EP0644796A1 (de) 1995-03-29
WO1993024209A1 (en) 1993-12-09
US5352892A (en) 1994-10-04
ATE185495T1 (de) 1999-10-15
DE69326765T2 (de) 2000-03-02
EP0644796A4 (de) 1997-04-09
EP0644796B1 (de) 1999-10-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee