DE69415641D1 - Vorrichtung zur Dünnschichtdickenmessung - Google Patents

Vorrichtung zur Dünnschichtdickenmessung

Info

Publication number
DE69415641D1
DE69415641D1 DE69415641T DE69415641T DE69415641D1 DE 69415641 D1 DE69415641 D1 DE 69415641D1 DE 69415641 T DE69415641 T DE 69415641T DE 69415641 T DE69415641 T DE 69415641T DE 69415641 D1 DE69415641 D1 DE 69415641D1
Authority
DE
Germany
Prior art keywords
thin film
film thickness
measuring thin
measuring
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69415641T
Other languages
English (en)
Other versions
DE69415641T2 (de
Inventor
Moshe Finarov
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nova Ltd
Original Assignee
Nova Measuring Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nova Measuring Instruments Ltd filed Critical Nova Measuring Instruments Ltd
Publication of DE69415641D1 publication Critical patent/DE69415641D1/de
Application granted granted Critical
Publication of DE69415641T2 publication Critical patent/DE69415641T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
    • G01B11/065—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization using one or more discrete wavelengths
DE69415641T 1993-11-09 1994-10-17 Vorrichtung zur Dünnschichtdickenmessung Expired - Lifetime DE69415641T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL10754993A IL107549A (en) 1993-11-09 1993-11-09 Device for measuring the thickness of thin films

Publications (2)

Publication Number Publication Date
DE69415641D1 true DE69415641D1 (de) 1999-02-11
DE69415641T2 DE69415641T2 (de) 1999-07-29

Family

ID=11065433

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69415641T Expired - Lifetime DE69415641T2 (de) 1993-11-09 1994-10-17 Vorrichtung zur Dünnschichtdickenmessung

Country Status (5)

Country Link
US (2) US5517312A (de)
EP (1) EP0652415B1 (de)
JP (1) JP3697279B2 (de)
DE (1) DE69415641T2 (de)
IL (1) IL107549A (de)

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EP0652415B1 (de) 1998-12-30
IL107549A (en) 1996-01-31
JP3697279B2 (ja) 2005-09-21
US5517312A (en) 1996-05-14
EP0652415A1 (de) 1995-05-10
IL107549A0 (en) 1994-02-27
JPH07198342A (ja) 1995-08-01
USRE41906E1 (en) 2010-11-02
DE69415641T2 (de) 1999-07-29

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