DE69426185D1 - Halbleiterbauelement geschützt durch Dioden - Google Patents
Halbleiterbauelement geschützt durch DiodenInfo
- Publication number
- DE69426185D1 DE69426185D1 DE69426185T DE69426185T DE69426185D1 DE 69426185 D1 DE69426185 D1 DE 69426185D1 DE 69426185 T DE69426185 T DE 69426185T DE 69426185 T DE69426185 T DE 69426185T DE 69426185 D1 DE69426185 D1 DE 69426185D1
- Authority
- DE
- Germany
- Prior art keywords
- diodes
- semiconductor device
- device protected
- protected
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/111,326 US5399893A (en) | 1993-08-24 | 1993-08-24 | Diode protected semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69426185D1 true DE69426185D1 (de) | 2000-11-30 |
DE69426185T2 DE69426185T2 (de) | 2001-05-17 |
Family
ID=22337861
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69426185T Expired - Fee Related DE69426185T2 (de) | 1993-08-24 | 1994-07-28 | Halbleiterbauelement geschützt durch Dioden |
Country Status (4)
Country | Link |
---|---|
US (1) | US5399893A (de) |
EP (1) | EP0645817B1 (de) |
JP (1) | JPH0786522A (de) |
DE (1) | DE69426185T2 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7235862B2 (en) * | 2001-07-10 | 2007-06-26 | National Semiconductor Corporation | Gate-enhanced junction varactor |
US7081663B2 (en) | 2002-01-18 | 2006-07-25 | National Semiconductor Corporation | Gate-enhanced junction varactor with gradual capacitance variation |
JP2003322330A (ja) | 2002-04-30 | 2003-11-14 | Nippon Electric Glass Co Ltd | 燃焼装置窓用材料 |
JP2007312031A (ja) * | 2006-05-17 | 2007-11-29 | Matsushita Electric Ind Co Ltd | 電子デバイス |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA980012A (en) * | 1971-06-08 | 1975-12-16 | Ncr Corporation | Protective circuits |
JPS57130476A (en) * | 1981-02-05 | 1982-08-12 | Sony Corp | Semiconductor device |
US4498093A (en) * | 1981-09-14 | 1985-02-05 | At&T Bell Laboratories | High-power III-V semiconductor device |
JPS5851577A (ja) * | 1981-09-22 | 1983-03-26 | Matsushita Electric Ind Co Ltd | 半導体装置 |
JPS5944872A (ja) * | 1982-09-07 | 1984-03-13 | Toshiba Corp | 半導体装置 |
JPS62208655A (ja) * | 1986-02-20 | 1987-09-12 | Fujitsu Ltd | 半導体装置 |
US4990976A (en) * | 1987-11-24 | 1991-02-05 | Nec Corporation | Semiconductor device including a field effect transistor having a protective diode between source and drain thereof |
US5046044A (en) * | 1988-12-21 | 1991-09-03 | Texas Instruments Incorporated | SEU hardened memory cell |
JPH02234463A (ja) * | 1989-01-20 | 1990-09-17 | Siemens Ag | Esd保護構造 |
-
1993
- 1993-08-24 US US08/111,326 patent/US5399893A/en not_active Expired - Lifetime
-
1994
- 1994-07-28 EP EP94111746A patent/EP0645817B1/de not_active Expired - Lifetime
- 1994-07-28 DE DE69426185T patent/DE69426185T2/de not_active Expired - Fee Related
- 1994-08-05 JP JP6202903A patent/JPH0786522A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0645817A1 (de) | 1995-03-29 |
DE69426185T2 (de) | 2001-05-17 |
EP0645817B1 (de) | 2000-10-25 |
US5399893A (en) | 1995-03-21 |
JPH0786522A (ja) | 1995-03-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Free format text: SCHUMACHER & WILLSAU, PATENTANWALTSSOZIETAET, 80335 MUENCHEN |
|
8339 | Ceased/non-payment of the annual fee |