DE69432546D1 - Metallgehäuse für Halbleiterbauelement und Verfahren zu seiner Herstellung - Google Patents
Metallgehäuse für Halbleiterbauelement und Verfahren zu seiner HerstellungInfo
- Publication number
- DE69432546D1 DE69432546D1 DE69432546T DE69432546T DE69432546D1 DE 69432546 D1 DE69432546 D1 DE 69432546D1 DE 69432546 T DE69432546 T DE 69432546T DE 69432546 T DE69432546 T DE 69432546T DE 69432546 D1 DE69432546 D1 DE 69432546D1
- Authority
- DE
- Germany
- Prior art keywords
- production
- semiconductor device
- metal housing
- housing
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002184 metal Substances 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4817—Conductive parts for containers, e.g. caps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/043—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
- H01L23/045—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body the other leads having an insulating passage through the base
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/043—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
- H01L23/047—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body the other leads being parallel to the base
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/06—Containers; Seals characterised by the material of the container or its electrical properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/02208—Mountings; Housings characterised by the shape of the housings
- H01S5/02216—Butterfly-type, i.e. with electrode pins extending horizontally from the housings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
- H01S5/02469—Passive cooling, e.g. where heat is removed by the housing as a whole or by a heat pipe without any active cooling element like a TEC
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25381893 | 1993-09-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69432546D1 true DE69432546D1 (de) | 2003-05-28 |
DE69432546T2 DE69432546T2 (de) | 2003-11-20 |
Family
ID=17256568
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69432546T Expired - Lifetime DE69432546T2 (de) | 1993-09-16 | 1994-09-16 | Metallgehäuse für Halbleiterbauelement und Verfahren zu seiner Herstellung |
Country Status (3)
Country | Link |
---|---|
US (1) | US5574959A (de) |
EP (2) | EP1282166A3 (de) |
DE (1) | DE69432546T2 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19614006A1 (de) * | 1996-04-09 | 1997-10-16 | Basf Ag | Verfahren zur Herstellung von Granulat und Formteilen aus Hartmetall- oder Cermet-Materialien |
US5831290A (en) * | 1997-02-25 | 1998-11-03 | Quarton, Inc. | Laser diode mounting structure |
KR100217032B1 (ko) * | 1997-06-14 | 1999-09-01 | 박호군 | 구리 용침용 텅스텐 골격 구조 제조 방법 및 이를 이용한 텅스텐-구리 복합재료 제조 방법 |
KR100215547B1 (ko) * | 1997-06-14 | 1999-08-16 | 박원훈 | 마이크로파 소자용 텅스텐-구리 밀폐 패키지용 용기 및 그의 제조 방법 |
US6319459B1 (en) | 1999-10-18 | 2001-11-20 | Kemet Electronics Corporation | Removal of organic acid based binders from powder metallurgy compacts |
US6405785B1 (en) | 2000-01-28 | 2002-06-18 | Mold-Masters Limited | Injection molding component with heating element and method of making |
US6838046B2 (en) * | 2001-05-14 | 2005-01-04 | Honeywell International Inc. | Sintering process and tools for use in metal injection molding of large parts |
JP2003052185A (ja) | 2001-05-30 | 2003-02-21 | Canon Inc | 電力変換器およびそれを用いる光起電力素子モジュール並びに発電装置 |
US6770114B2 (en) | 2001-12-19 | 2004-08-03 | Honeywell International Inc. | Densified sintered powder and method |
GB2387714A (en) * | 2002-04-19 | 2003-10-22 | Denselight Semiconductors Pte | Mount for a semiconductor device |
US7063815B2 (en) * | 2003-12-05 | 2006-06-20 | Agency For Science, Technology And Research | Production of composite materials by powder injection molding and infiltration |
CA2554564A1 (en) * | 2004-02-04 | 2005-08-25 | Gkn Sinter Metals, Inc. | Sheet material infiltration of powder metal parts |
US7186369B1 (en) * | 2004-08-04 | 2007-03-06 | The United States Of America As Represented By The Secretary Of The Navy | Method of forming a part made of a molybdenum-copper composite material |
US7341093B2 (en) * | 2005-02-11 | 2008-03-11 | Llc 2 Holdings Limited, Llc | Copper-based alloys and their use for infiltration of powder metal parts |
US20100111745A1 (en) * | 2007-01-31 | 2010-05-06 | Urevich David J | Method of producing composite materials through metal injection molding |
DE102007048617A1 (de) * | 2007-10-10 | 2009-04-16 | Robert Bosch Gmbh | Lasermodul |
KR101000684B1 (ko) * | 2007-10-11 | 2010-12-10 | 세종대학교산학협력단 | 이산화티타늄 나노튜브분말 및 이를 이용한 고압수소저장탱크 삽입용 판형 필름의 제조방법 |
FR2985855B1 (fr) * | 2012-01-17 | 2014-11-21 | Soc Fr Detecteurs Infrarouges Sofradir | Procede pour la realisation de traversees electriques etanches au travers d'un boitier d'encapsulation et boitier d'encapsulation muni d'au moins l'une de ces traversees electriques |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2137829B2 (de) * | 1970-08-01 | 1975-11-13 | Institutul De Cercetari Metalurgice Icem, Bukarest | Verfahren zur Herstellung des Werkstoffes für eine Funkenerosions-Elektrode |
US3929476A (en) * | 1972-05-05 | 1975-12-30 | Minnesota Mining & Mfg | Precision molded refractory articles and method of making |
US4431449A (en) * | 1977-09-26 | 1984-02-14 | Minnesota Mining And Manufacturing Company | Infiltrated molded articles of spherical non-refractory metal powders |
GB1603855A (en) * | 1978-05-10 | 1981-12-02 | Johnson Matthey Co Ltd | Resin-impregnated sintered silver articles |
US4373127A (en) * | 1980-02-06 | 1983-02-08 | Minnesota Mining And Manufacturing Company | EDM Electrodes |
US4327156A (en) * | 1980-05-12 | 1982-04-27 | Minnesota Mining And Manufacturing Company | Infiltrated powdered metal composite article |
US4554218A (en) * | 1981-11-05 | 1985-11-19 | Minnesota Mining And Manufacturing Company | Infiltrated powered metal composite article |
US4491558A (en) * | 1981-11-05 | 1985-01-01 | Minnesota Mining And Manufacturing Company | Austenitic manganese steel-containing composite article |
JPS6048550B2 (ja) * | 1981-12-31 | 1985-10-28 | 豊信 水谷 | 高温溶融金属用耐蝕性塗料 |
JPS5921032A (ja) * | 1982-07-26 | 1984-02-02 | Sumitomo Electric Ind Ltd | 半導体装置用基板 |
JPS59143347A (ja) * | 1983-02-03 | 1984-08-16 | Sumitomo Electric Ind Ltd | 半導体基板材料の製造方法 |
US4710223A (en) * | 1986-03-21 | 1987-12-01 | Rockwell International Corporation | Infiltrated sintered articles |
US5017526A (en) * | 1986-05-08 | 1991-05-21 | Lanxide Technology Company, Lp | Methods of making shaped ceramic composites |
AU615964B2 (en) * | 1987-09-28 | 1991-10-17 | Fine Particle Technology Corp. | Copper-tungsten metal mixture and process |
EP0340957B1 (de) * | 1988-04-30 | 1994-03-16 | Toyota Jidosha Kabushiki Kaisha | Verfahren zur Herstellung von Verbundmetall unter Beschleunigung der Infiltration des Matrix-Metalls durch feine Teilchen eines dritten Materials |
IT1230629B (it) * | 1988-11-11 | 1991-10-28 | Nuova Samin Spa | Procedimento per la produzione di materiali compositi a matrice metallica a contenuto di rinforzo controllato |
JP2746279B2 (ja) * | 1990-06-18 | 1998-05-06 | 日本タングステン 株式会社 | 半導体装置用基板材料及びその製造方法 |
US5342573A (en) * | 1991-04-23 | 1994-08-30 | Sumitomo Electric Industries, Ltd. | Method of producing a tungsten heavy alloy product |
JPH05222402A (ja) * | 1992-02-12 | 1993-08-31 | Sumitomo Electric Ind Ltd | タングステン重合金製品の製造方法 |
-
1994
- 1994-09-16 DE DE69432546T patent/DE69432546T2/de not_active Expired - Lifetime
- 1994-09-16 US US08/306,955 patent/US5574959A/en not_active Expired - Lifetime
- 1994-09-16 EP EP02023598A patent/EP1282166A3/de not_active Withdrawn
- 1994-09-16 EP EP94402072A patent/EP0645804B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0645804B1 (de) | 2003-04-23 |
EP0645804A2 (de) | 1995-03-29 |
EP1282166A3 (de) | 2003-03-05 |
EP0645804A3 (de) | 1996-05-29 |
DE69432546T2 (de) | 2003-11-20 |
US5574959A (en) | 1996-11-12 |
EP1282166A2 (de) | 2003-02-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69536084D1 (de) | Halbleiterbauelement und Verfahren zu seiner Herstellung | |
DE69333294D1 (de) | Halbleiteranordnung und Verfahren zu seiner Herstellung | |
DE69429799D1 (de) | Verfahren und einrichtung für mikrobische reduktion | |
DE69432546D1 (de) | Metallgehäuse für Halbleiterbauelement und Verfahren zu seiner Herstellung | |
DE69331534T2 (de) | Halbleiter-Speicherbauteil und Verfahren zu seiner Herstellung | |
DE69117724D1 (de) | Gehäuse für Anzeigevorrichtung und Verfahren zu dessen Herstellung | |
DE69410071D1 (de) | Gewindeelement und Verfahren zu seiner Herstellung | |
DE69632388D1 (de) | Elektronisches gerät und verfahren zu seiner herstellung | |
DE59307966D1 (de) | Verfahren und Vorrichtung für eine interlace-progressiv-Wandlung | |
DE69327860T2 (de) | Verbindungshalbleiterbauelement und Verfahren zu seiner Herstellung | |
DE69421209D1 (de) | Chipartiger Schaltungsbauteil und Verfahren zu seiner Herstellung | |
DE69404588T2 (de) | Elektronisches Bauelement und Verfahren zu seiner Herstellung | |
DE69331677T2 (de) | Halbleiter-Speicherbauteil und Verfahren zu seiner Herstellung | |
DE69226349D1 (de) | Stabilisator und Abstandshalter für eine Halbleiteranordnung und Verfahren zu seiner Herstellung | |
DE59209470D1 (de) | Halbleiterbauelement und Verfahren zu seiner Herstellung | |
DE69033900T2 (de) | Halbleiteranordnung und Verfahren zu seiner Herstellung | |
DE69625132D1 (de) | Halbleitervorrichtung und Verfahren für ihre Herstellung | |
DE69509563T2 (de) | Elektronisches Bauelement und Verfahren zu seiner Herstellung | |
DE69510526T2 (de) | Gleitbauteil und Verfahren zu seiner Herstellung | |
DE19530577B4 (de) | Gehäuse für mikroelektronische Bauelemente und Verfahren zu seiner Herstellung | |
DE69330600T2 (de) | Federstahldrähte und Verfahren für ihre Herstellung | |
DE69329620T2 (de) | Verbindervorrichtung und verfahren zu seiner herstellung | |
DE69531127D1 (de) | Halbleitervorrichtung und Verfahren zu deren Herstellung | |
DE69819693D1 (de) | Metallacetylid-verbindung und verfahren zu seiner herstellung | |
DE69520699T2 (de) | Elektrisches Bauelement und Verfahren zu seiner Herstellung |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |