DE69517072D1 - Halbleiter-Speichereinrichtung-Prüfschaltung mit Datenverschlüsslungfunktion - Google Patents

Halbleiter-Speichereinrichtung-Prüfschaltung mit Datenverschlüsslungfunktion

Info

Publication number
DE69517072D1
DE69517072D1 DE69517072T DE69517072T DE69517072D1 DE 69517072 D1 DE69517072 D1 DE 69517072D1 DE 69517072 T DE69517072 T DE 69517072T DE 69517072 T DE69517072 T DE 69517072T DE 69517072 D1 DE69517072 D1 DE 69517072D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
test circuit
data encryption
encryption function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69517072T
Other languages
English (en)
Other versions
DE69517072T2 (de
Inventor
Takashi Ohsawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE69517072D1 publication Critical patent/DE69517072D1/de
Application granted granted Critical
Publication of DE69517072T2 publication Critical patent/DE69517072T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
DE69517072T 1994-02-24 1995-02-22 Halbleiter-Speichereinrichtung-Prüfschaltung mit Datenverschlüsslungfunktion Expired - Fee Related DE69517072T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6026647A JPH07235200A (ja) 1994-02-24 1994-02-24 半導体記憶装置

Publications (2)

Publication Number Publication Date
DE69517072D1 true DE69517072D1 (de) 2000-06-29
DE69517072T2 DE69517072T2 (de) 2000-11-02

Family

ID=12199243

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69517072T Expired - Fee Related DE69517072T2 (de) 1994-02-24 1995-02-22 Halbleiter-Speichereinrichtung-Prüfschaltung mit Datenverschlüsslungfunktion

Country Status (6)

Country Link
US (1) US5748641A (de)
EP (1) EP0669623B1 (de)
JP (1) JPH07235200A (de)
KR (1) KR0159453B1 (de)
CN (1) CN1050924C (de)
DE (1) DE69517072T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2751461B1 (fr) * 1996-07-22 1998-11-06 Sgs Thomson Microelectronics Dispositif de controle de finalite de test
JPH10223000A (ja) * 1997-02-04 1998-08-21 Mitsubishi Electric Corp 半導体記憶装置
KR100269319B1 (ko) * 1997-12-29 2000-10-16 윤종용 동시칼럼선택라인활성화회로를구비하는반도체메모리장치및칼럼선택라인제어방법
JPH11203889A (ja) * 1998-01-19 1999-07-30 Mitsubishi Electric Corp 半導体記憶装置
KR100265764B1 (ko) * 1998-02-02 2000-10-02 윤종용 다수군의 데이터 입출력 채널들 중 어느 일군이 선택되어 테스트되는 반도체 메모리장치
DE19904375C2 (de) 1999-02-03 2001-01-04 Siemens Ag Verfahren zur Funktionsüberprüfung von Speicherzellen eines integrierten Halbleiterspeichers
DE19922155A1 (de) * 1999-05-12 2000-11-23 Giesecke & Devrient Gmbh Speicheranordnung mit Adreßverwürfelung
KR100442603B1 (ko) * 2001-03-20 2004-08-02 삼성전자주식회사 고속 패킷 데이터 전송 이동통신시스템에서 패킷 데이터채널 및 패킷 데이터 제어 채널을 스크램블링하기 위한장치 및 방법
US6941499B1 (en) * 2001-06-18 2005-09-06 Taiwan Semiconductor Manufacturing Company Method to verify the performance of BIST circuitry for testing embedded memory
KR100463238B1 (ko) * 2002-04-04 2004-12-29 주식회사 하이닉스반도체 반도체 메모리 소자
JP4623355B2 (ja) * 2003-04-01 2011-02-02 ソニー株式会社 半導体記憶装置及び半導体記憶装置の記憶再生方法
DE10322541A1 (de) * 2003-05-19 2004-12-16 Infineon Technologies Ag Speicherbaustein mit integrierter Adressscramblereinheit und Verfahren zum Verscrambeln einer Adresse in einem integrierten Speicher
DE102007009526B4 (de) 2007-02-27 2017-08-24 Infineon Technologies Ag Vorrichtung zum Speichern eines binären Zustandes
US8429330B2 (en) * 2008-09-12 2013-04-23 Sandisk Technologies Inc. Method for scrambling data in which scrambling data and scrambled data are stored in corresponding non-volatile memory locations
US8145855B2 (en) 2008-09-12 2012-03-27 Sandisk Technologies Inc. Built in on-chip data scrambler for non-volatile memory
US8375225B1 (en) 2009-12-11 2013-02-12 Western Digital Technologies, Inc. Memory protection
US9236143B2 (en) * 2011-12-28 2016-01-12 Intel Corporation Generic address scrambler for memory circuit test engine
US9246519B2 (en) * 2012-11-08 2016-01-26 Avago Technologies General Ip (Singapore) Pte. Ltd. Test pattern optimization for LDPC based flawscan

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5859649A (ja) * 1981-10-02 1983-04-08 Nec Corp 信号発生回路
CA1259680A (en) * 1986-05-06 1989-09-19 Mosaid Technologies Inc. Digital signal scrambler
JPS6447972A (en) * 1987-08-19 1989-02-22 Nec Corp Memory ic testing circuit
JPH01308979A (ja) * 1988-06-07 1989-12-13 Mitsubishi Electric Corp Ｉｃ試験装置
US5134584A (en) * 1988-07-22 1992-07-28 Vtc Incorporated Reconfigurable memory

Also Published As

Publication number Publication date
CN1050924C (zh) 2000-03-29
KR0159453B1 (ko) 1999-02-01
US5748641A (en) 1998-05-05
JPH07235200A (ja) 1995-09-05
EP0669623B1 (de) 2000-05-24
CN1118519A (zh) 1996-03-13
EP0669623A1 (de) 1995-08-30
DE69517072T2 (de) 2000-11-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee