DE69530367D1 - Kontrolle eines Mikroskopprobenträgers - Google Patents

Kontrolle eines Mikroskopprobenträgers

Info

Publication number
DE69530367D1
DE69530367D1 DE69530367T DE69530367T DE69530367D1 DE 69530367 D1 DE69530367 D1 DE 69530367D1 DE 69530367 T DE69530367 T DE 69530367T DE 69530367 T DE69530367 T DE 69530367T DE 69530367 D1 DE69530367 D1 DE 69530367D1
Authority
DE
Germany
Prior art keywords
checking
microscope carrier
microscope
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69530367T
Other languages
English (en)
Other versions
DE69530367T2 (de
Inventor
Ralph Lance Carter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Ltd
Original Assignee
PerkinElmer Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Ltd filed Critical PerkinElmer Ltd
Application granted granted Critical
Publication of DE69530367D1 publication Critical patent/DE69530367D1/de
Publication of DE69530367T2 publication Critical patent/DE69530367T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
DE69530367T 1995-03-06 1995-03-06 Kontrolle eines Mikroskopprobenträgers Expired - Lifetime DE69530367T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP95301428A EP0731371B1 (de) 1995-03-06 1995-03-06 Kontrolle eines Mikroskopprobenträgers

Publications (2)

Publication Number Publication Date
DE69530367D1 true DE69530367D1 (de) 2003-05-22
DE69530367T2 DE69530367T2 (de) 2004-02-19

Family

ID=8221110

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69530367T Expired - Lifetime DE69530367T2 (de) 1995-03-06 1995-03-06 Kontrolle eines Mikroskopprobenträgers

Country Status (4)

Country Link
US (1) US6006140A (de)
EP (1) EP0731371B1 (de)
JP (1) JP3962104B2 (de)
DE (1) DE69530367T2 (de)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0819964B1 (de) * 1996-07-16 2004-02-04 Perkin-Elmer Limited Kontrolle einer Mikroskopblende
JP4136017B2 (ja) * 1996-09-19 2008-08-20 シスメックス株式会社 粒子分析装置
DE19649605A1 (de) * 1996-11-29 1998-06-04 Deutsches Krebsforsch Fluoreszenzkorrelationsspektroskopiemodul für ein Mikroskop
AU1097299A (en) * 1997-10-17 1999-05-10 Accumed International, Inc. High-precision computer-aided microscope system
JP3381777B2 (ja) * 1998-06-24 2003-03-04 株式会社島津製作所 赤外顕微鏡
AU1182401A (en) * 1999-10-15 2001-04-23 Cellavision Ab Microscope and method for manufacturing a composite image with a high resolution
DE10024686A1 (de) * 2000-05-18 2001-11-22 Zeiss Carl Jena Gmbh Optisches Beobachtungsgerät mit einer Einrichtung zum Einbringen visuell wahrnehmbarer Informationen in den Beobachtungsstrahlengang
EP1184702B1 (de) * 2000-08-29 2011-12-21 PerkinElmer Singapore Pte. Ltd. Mikroskop für Infrarotabbildung
US7560697B2 (en) 2000-08-29 2009-07-14 Perkinelmer Singapore Pte. Ltd. Detector array and cross-talk linearity connection
DE60044580D1 (de) 2000-08-29 2010-08-05 Perkinelmer Singapore Pte Ltd Mikroskop für Infrarotabbildung
US6992819B2 (en) 2000-12-01 2006-01-31 Auburn University High-resolution optical microscope for quick detection of pathogens
WO2002061485A2 (en) * 2000-12-01 2002-08-08 Auburn University High-resolution optical microscope
SE517626C3 (sv) 2001-04-12 2002-09-04 Cellavision Ab Förfarande vid mikroskopering för att söka av och positionera ett objekt, där bilder tas och sammanfogas i samma bildkoordinatsystem för att noggrant kunna ställa in mikroskopbordet
US6771043B2 (en) * 2001-05-09 2004-08-03 Makita Corporation Power tools
JP2003032524A (ja) * 2001-07-16 2003-01-31 Olympus Optical Co Ltd 顕微鏡用デジタルカメラ
GB0120170D0 (en) * 2001-08-17 2001-10-10 Perkin Elmer Int Cv Scanning IR microscope
US20030081216A1 (en) * 2001-11-01 2003-05-01 Martin Ebert Graphical user interface for sample positioning
US7158294B2 (en) * 2001-12-18 2007-01-02 Olympus Optical Co., Ltd. Laser scanning confocal microscope apparatus, image recording method, and recording medium
JP4551071B2 (ja) * 2003-09-19 2010-09-22 オリンパス株式会社 顕微鏡用電動ステージ制御システム、該制御装置、及び該制御方法
DE102004002518B4 (de) * 2003-11-21 2016-06-02 Carl Zeiss Meditec Ag Videosystem und Verfahren zum Betrieb eines Videosystems
US7078696B2 (en) * 2004-02-13 2006-07-18 Thermo Electron Scientific Instruments Corporation Microspectrometer system with selectable aperturing
US7199712B2 (en) * 2004-06-17 2007-04-03 Tafas Triantafyllos P System for automatically locating and manipulating positions on an object
JP4976387B2 (ja) * 2005-06-13 2012-07-18 トライパス イメージング インコーポレイテッド 顕微鏡画像取得装置を用いた、スライド上のサンプル中の対象物の位置を再検索するためのシステムおよび方法
US7692775B2 (en) * 2005-07-14 2010-04-06 Chemimage Corporation Time and space resolved standoff hyperspectral IED explosives LIDAR detection
JPWO2007074923A1 (ja) * 2005-12-27 2009-06-04 オリンパス株式会社 発光測定装置並びに発光測定方法
CN101351735B (zh) * 2005-12-27 2010-12-08 奥林巴斯株式会社 获取生物源样本的图像的装置和方法
DE102006031177A1 (de) 2006-07-06 2008-01-10 Carl Zeiss Microimaging Gmbh Verfahren und Vorrichtung zur Erzeugung eines Bildes einer dünnen Schicht eines Objekts
WO2008084246A1 (en) * 2007-01-11 2008-07-17 Renishaw Plc A sample positioning apparatus
US20080239478A1 (en) * 2007-03-29 2008-10-02 Tafas Triantafyllos P System for automatically locating and manipulating positions on an object
US8379193B2 (en) 2008-08-27 2013-02-19 Chemimage Corporation SWIR targeted agile raman (STAR) system for on-the-move detection of emplace explosives
US8994934B1 (en) 2010-11-10 2015-03-31 Chemimage Corporation System and method for eye safe detection of unknown targets
US9323250B2 (en) 2011-01-28 2016-04-26 Intouch Technologies, Inc. Time-dependent navigation of telepresence robots
US9098611B2 (en) 2012-11-26 2015-08-04 Intouch Technologies, Inc. Enhanced video interaction for a user interface of a telepresence network
US20120306998A1 (en) * 2011-06-01 2012-12-06 Merrill Ii Dennis E Macro Area Camera for an Infrared (IR) Microscope
US8743358B2 (en) 2011-11-10 2014-06-03 Chemimage Corporation System and method for safer detection of unknown materials using dual polarized hyperspectral imaging and Raman spectroscopy
US9361021B2 (en) 2012-05-22 2016-06-07 Irobot Corporation Graphical user interfaces including touchpad driving interfaces for telemedicine devices
WO2013176758A1 (en) 2012-05-22 2013-11-28 Intouch Technologies, Inc. Clinical workflows utilizing autonomous and semi-autonomous telemedicine devices
US9052290B2 (en) 2012-10-15 2015-06-09 Chemimage Corporation SWIR targeted agile raman system for detection of unknown materials using dual polarization
US9952100B2 (en) * 2013-01-21 2018-04-24 Sciaps, Inc. Handheld LIBS spectrometer
DE102013008452B4 (de) * 2013-05-17 2018-06-21 Carl Zeiss Meditec Ag Operationsmikroskop mit Positionierhilfe
CN103399015B (zh) * 2013-08-14 2015-10-14 宁波江丰生物信息技术有限公司 病理切片扫描仪及其载片平台定位精度测量方法及装置
US9651424B2 (en) 2015-02-26 2017-05-16 Sciaps, Inc. LIBS analyzer sample presence detection system and method
US10209196B2 (en) 2015-10-05 2019-02-19 Sciaps, Inc. LIBS analysis system and method for liquids
US9939383B2 (en) 2016-02-05 2018-04-10 Sciaps, Inc. Analyzer alignment, sample detection, localization, and focusing method and system
CN107121192A (zh) * 2017-06-20 2017-09-01 四川双利合谱科技有限公司 一种镜头扫描模式高光谱成像系统及旋翼无人机

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4202037A (en) * 1977-04-22 1980-05-06 Der Loos Hendrik Van Computer microscope apparatus and method for superimposing an electronically-produced image from the computer memory upon the image in the microscope's field of view
US4146788A (en) * 1977-12-12 1979-03-27 Mirkin Georgy R Method and apparatus for quantitative structural analysis of solids
US4465371A (en) * 1979-08-06 1984-08-14 Grumman Aerospace Corporation Optical flaw detection method and apparatus
EP0147493B1 (de) * 1983-12-28 1988-09-07 International Business Machines Corporation Verfahren und Ausrüstung zur automatischen Ausrichtung eines Objekts bezogen auf eine Referenz
US4700298A (en) * 1984-09-14 1987-10-13 Branko Palcic Dynamic microscope image processing scanner
US4672559A (en) * 1984-12-26 1987-06-09 E. I. Du Pont De Nemours And Company Method for operating a microscopical mapping system
US4845552A (en) * 1987-08-20 1989-07-04 Bruno Jaggi Quantitative light microscope using a solid state detector in the primary image plane
US4902132A (en) * 1988-06-13 1990-02-20 Hipple Cancer Research Corporation Automated capillary scanning system
JPH0245734A (ja) * 1988-08-05 1990-02-15 Mitsubishi Heavy Ind Ltd 自動組織解析処理装置
US5480804A (en) * 1989-06-28 1996-01-02 Kirin Beverage Corporation Method of and apparatus for detecting microorganisms
JP2925647B2 (ja) * 1990-04-16 1999-07-28 オリンパス光学工業株式会社 顕微鏡変倍装置
US5655029A (en) * 1990-11-07 1997-08-05 Neuromedical Systems, Inc. Device and method for facilitating inspection of a specimen
US5262967A (en) * 1991-07-15 1993-11-16 Braun Intertec Engineering, Inc. System for testing and inspecting concrete
DE69221126T2 (de) * 1992-04-30 1997-11-13 Becton Dickinson Co Verfahren und Vorrichtung zur Steuerung von Koordinatenverschiebungen einer Plattform
US5426302A (en) * 1993-04-28 1995-06-20 Board Of Regents, University Of Texas Optically guided macroscopic-scan-range/nanometer resolution probing system
DE4340914A1 (de) * 1993-11-27 1995-06-08 Bruker Analytische Messtechnik Verfahren zur routinemäßigen Identifikation von Kunststoffen
US5506416A (en) * 1994-05-25 1996-04-09 Rizvi; Syed A. Microscopic internal reflection infrared spectroscopy to examine the surface of a trace amount of material

Also Published As

Publication number Publication date
JP3962104B2 (ja) 2007-08-22
DE69530367T2 (de) 2004-02-19
JPH08286114A (ja) 1996-11-01
US6006140A (en) 1999-12-21
EP0731371B1 (de) 2003-04-16
EP0731371A1 (de) 1996-09-11

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