DE69618344T2 - Schaltung um redundante Daten einer Redundanzschaltung innerhalb einer Speicheranordnung durch zeitgeteilte Annäherung zu übertragen - Google Patents
Schaltung um redundante Daten einer Redundanzschaltung innerhalb einer Speicheranordnung durch zeitgeteilte Annäherung zu übertragenInfo
- Publication number
- DE69618344T2 DE69618344T2 DE69618344T DE69618344T DE69618344T2 DE 69618344 T2 DE69618344 T2 DE 69618344T2 DE 69618344 T DE69618344 T DE 69618344T DE 69618344 T DE69618344 T DE 69618344T DE 69618344 T2 DE69618344 T2 DE 69618344T2
- Authority
- DE
- Germany
- Prior art keywords
- circuit
- approximation
- divided
- time
- redundant data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
- G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP96830323A EP0811917B1 (de) | 1996-06-06 | 1996-06-06 | Schaltung um redundante Daten einer Redundanzschaltung innerhalb einer Speicheranordnung durch zeitgeteilte Annäherung zu übertragen |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69618344D1 DE69618344D1 (de) | 2002-02-07 |
DE69618344T2 true DE69618344T2 (de) | 2002-08-14 |
Family
ID=8225929
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69618344T Expired - Fee Related DE69618344T2 (de) | 1996-06-06 | 1996-06-06 | Schaltung um redundante Daten einer Redundanzschaltung innerhalb einer Speicheranordnung durch zeitgeteilte Annäherung zu übertragen |
Country Status (3)
Country | Link |
---|---|
US (1) | US5864562A (de) |
EP (1) | EP0811917B1 (de) |
DE (1) | DE69618344T2 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2850953B2 (ja) * | 1996-07-30 | 1999-01-27 | 日本電気株式会社 | 半導体装置 |
US6157948A (en) * | 1996-09-11 | 2000-12-05 | Matsushita Electric Industrial Co., Ltd. | Program reception/execution apparatus which can start execution of program even when only part of program is received, and program transmitter for it |
US6609144B1 (en) * | 1998-05-04 | 2003-08-19 | Matsushita Electric Industrial Co., Ltd. | Program reception/execution apparatus that can commence execution of a machine program having only received the program in part, and a program transmission apparatus that enables such execution |
US20070136640A1 (en) * | 2005-12-14 | 2007-06-14 | Jarrar Anis M | Defect detection and repair in an embedded random access memory |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4495603A (en) * | 1980-07-31 | 1985-01-22 | Varshney Ramesh C | Test system for segmented memory |
US4628480A (en) * | 1983-10-07 | 1986-12-09 | United Technologies Automotive, Inc. | Arrangement for optimized utilization of I/O pins |
JPS62222500A (ja) * | 1986-03-20 | 1987-09-30 | Fujitsu Ltd | 半導体記憶装置 |
EP0389203A3 (de) * | 1989-03-20 | 1993-05-26 | Fujitsu Limited | Halbleiterspeichergerät beinhaltend Information, die die Anwesenheit mangelhafter Speicherzellen anzeigt |
EP0668562B1 (de) * | 1994-02-17 | 1998-08-05 | STMicroelectronics S.r.l. | Verfahren zur Programmierung von Redundanzregistern in einer Spaltenredundanzschaltung für einen Halbleiterspeicherbaustein |
-
1996
- 1996-06-06 EP EP96830323A patent/EP0811917B1/de not_active Expired - Lifetime
- 1996-06-06 DE DE69618344T patent/DE69618344T2/de not_active Expired - Fee Related
-
1997
- 1997-06-05 US US08/869,859 patent/US5864562A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5864562A (en) | 1999-01-26 |
EP0811917A1 (de) | 1997-12-10 |
DE69618344D1 (de) | 2002-02-07 |
EP0811917B1 (de) | 2002-01-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |