DE69636589D1 - Verbesserungen in oder in Beziehung auf integrierte Schaltungen - Google Patents
Verbesserungen in oder in Beziehung auf integrierte SchaltungenInfo
- Publication number
- DE69636589D1 DE69636589D1 DE69636589T DE69636589T DE69636589D1 DE 69636589 D1 DE69636589 D1 DE 69636589D1 DE 69636589 T DE69636589 T DE 69636589T DE 69636589 T DE69636589 T DE 69636589T DE 69636589 D1 DE69636589 D1 DE 69636589D1
- Authority
- DE
- Germany
- Prior art keywords
- relation
- integrated circuits
- circuits
- integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/46—Means for plasticising or homogenising the moulding material or forcing it into the mould
- B29C45/462—Injection of preformed charges of material
- B29C45/463—Injection of preformed charges of material using packaged or wrapped charges
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14639—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
- B29C45/14655—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
- H01L21/566—Release layers for moulds, e.g. release layers, layers against residue during moulding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49558—Insulating layers on lead frames, e.g. bridging members
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14639—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components
- B29C45/14655—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame
- B29C2045/14663—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles for obtaining an insulating effect, e.g. for electrical components connected to or mounted on a carrier, e.g. lead frame the mould cavity walls being lined with a film, e.g. release film
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00015—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed as prior art
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01046—Palladium [Pd]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12043—Photo diode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US434137 | 1995-05-02 | ||
US08/434,137 US5949132A (en) | 1995-05-02 | 1995-05-02 | Dambarless leadframe for molded component encapsulation |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69636589D1 true DE69636589D1 (de) | 2006-11-16 |
DE69636589T2 DE69636589T2 (de) | 2007-08-09 |
Family
ID=23722960
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69636589T Expired - Fee Related DE69636589T2 (de) | 1995-05-02 | 1996-04-30 | Verbesserungen in oder in Beziehung auf integrierte Schaltungen |
Country Status (5)
Country | Link |
---|---|
US (2) | US5949132A (de) |
EP (1) | EP0747942B1 (de) |
JP (1) | JPH09107061A (de) |
DE (1) | DE69636589T2 (de) |
SG (1) | SG44042A1 (de) |
Families Citing this family (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6048483A (en) * | 1996-07-23 | 2000-04-11 | Apic Yamada Corporation | Resin sealing method for chip-size packages |
US6962829B2 (en) * | 1996-10-31 | 2005-11-08 | Amkor Technology, Inc. | Method of making near chip size integrated circuit package |
JP3282988B2 (ja) * | 1997-05-01 | 2002-05-20 | アピックヤマダ株式会社 | 樹脂モールド方法及び樹脂モールド装置 |
JP3017470B2 (ja) | 1997-07-11 | 2000-03-06 | アピックヤマダ株式会社 | 樹脂モールド方法及び樹脂モールド装置 |
US6214273B1 (en) * | 1997-09-30 | 2001-04-10 | Texas Instruments Incorporated | Molding method with the use of modified runners |
JP3017485B2 (ja) * | 1998-01-23 | 2000-03-06 | アピックヤマダ株式会社 | 半導体装置の樹脂封止方法及び樹脂封止装置 |
JP3447948B2 (ja) * | 1998-03-25 | 2003-09-16 | 松下電器産業株式会社 | 樹脂封止型半導体装置の製造方法 |
US6126062A (en) * | 1998-04-02 | 2000-10-03 | Micron Technology, Inc. | Non-conductive and self-leveling leadframe clamp insert for wirebonding integrated circuits |
US6634538B2 (en) | 1998-04-02 | 2003-10-21 | Micron Technology, Inc. | Non-conductive and self-leveling leadframe clamp insert for wirebonding integrated circuits |
NL1008924C2 (nl) * | 1998-04-17 | 1999-10-19 | 3P Licensing Bv | Eenheidsdosering voor omhullingsmateriaal, een daarvoor bestemde verpakking en een werkwijze voor het vervaardigen daarvan. |
DE69904812T2 (de) * | 1998-04-17 | 2003-10-30 | 3P Licensing Bv | Verpackung für einkapselungsmaterial |
NL1010503C2 (nl) * | 1998-11-06 | 2000-05-09 | 3P Licensing Bv | Folieverpakking voor een eenheidsdosering omhullingsmateriaal. |
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JP4443715B2 (ja) * | 1999-12-27 | 2010-03-31 | 日東電工株式会社 | 半導体の樹脂封止方法及び半導体樹脂封止用離型フィルム |
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JP3403699B2 (ja) * | 2000-05-31 | 2003-05-06 | 宮崎沖電気株式会社 | 半導体装置および半導体装置の製造方法 |
SG112799A1 (en) | 2000-10-09 | 2005-07-28 | St Assembly Test Services Ltd | Leaded semiconductor packages and method of trimming and singulating such packages |
US6686258B2 (en) | 2000-11-02 | 2004-02-03 | St Assembly Test Services Ltd. | Method of trimming and singulating leaded semiconductor packages |
CA2437221C (en) * | 2001-02-05 | 2009-05-05 | 3Dm Technologies, Inc. | Processes for forming plastic, apparatuses for forming plastic, and articles made therefrom |
US6472251B1 (en) | 2001-04-09 | 2002-10-29 | Delphi Technologies, Inc. | Method for integrated circuit packaging |
DE10158770B4 (de) * | 2001-11-29 | 2006-08-03 | Infineon Technologies Ag | Leiterrahmen und Bauelement mit einem Leiterrahmen |
US7595017B2 (en) * | 2002-01-31 | 2009-09-29 | Stmicroelectronics, Inc. | Method for using a pre-formed film in a transfer molding process for an integrated circuit |
US6750082B2 (en) | 2002-09-13 | 2004-06-15 | Advanpack Solutions Pte. Ltd. | Method of assembling a package with an exposed die backside with and without a heatsink for flip-chip |
US7498665B2 (en) * | 2005-05-05 | 2009-03-03 | Stats Chippac Ltd. | Integrated circuit leadless package system |
US20080157297A1 (en) * | 2006-12-29 | 2008-07-03 | Takahiko Kudoh | Stress-Resistant Leadframe and Method |
JP2008218776A (ja) * | 2007-03-06 | 2008-09-18 | Renesas Technology Corp | 半導体装置 |
US20080290481A1 (en) * | 2007-05-25 | 2008-11-27 | Takahiko Kudoh | Semiconductor Device Package Leadframe |
JP4778494B2 (ja) * | 2007-11-05 | 2011-09-21 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
US8754513B1 (en) * | 2008-07-10 | 2014-06-17 | Marvell International Ltd. | Lead frame apparatus and method for improved wire bonding |
JP5693956B2 (ja) * | 2008-07-10 | 2015-04-01 | シーマ電子株式会社 | リードフレームおよびその製造方法 |
US20100188078A1 (en) * | 2009-01-28 | 2010-07-29 | Andrea Foletto | Magnetic sensor with concentrator for increased sensing range |
CN102371646A (zh) * | 2010-08-11 | 2012-03-14 | 联想(北京)有限公司 | 一种工件的制备方法 |
US20120315728A1 (en) * | 2011-06-10 | 2012-12-13 | Shanghai Kaihong Electronic Company Limited | Saw Type Package without Exposed Pad |
US20120315727A1 (en) * | 2011-06-10 | 2012-12-13 | Shanghai Kaihong Electronic Company Limited | Thin Power Package |
US8629539B2 (en) | 2012-01-16 | 2014-01-14 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having non-conductive die paddle |
US10234513B2 (en) | 2012-03-20 | 2019-03-19 | Allegro Microsystems, Llc | Magnetic field sensor integrated circuit with integral ferromagnetic material |
US9666788B2 (en) * | 2012-03-20 | 2017-05-30 | Allegro Microsystems, Llc | Integrated circuit package having a split lead frame |
US9494660B2 (en) | 2012-03-20 | 2016-11-15 | Allegro Microsystems, Llc | Integrated circuit package having a split lead frame |
US9812588B2 (en) | 2012-03-20 | 2017-11-07 | Allegro Microsystems, Llc | Magnetic field sensor integrated circuit with integral ferromagnetic material |
US9411025B2 (en) | 2013-04-26 | 2016-08-09 | Allegro Microsystems, Llc | Integrated circuit package having a split lead frame and a magnet |
US10505102B2 (en) | 2016-04-04 | 2019-12-10 | Infineon Technologies Ag | Semiconductor device for sensing a magnetic field including an encapsulation material defining a through-hole |
US9978669B2 (en) | 2016-06-30 | 2018-05-22 | Nxp Usa, Inc. | Packaged semiconductor device having a lead frame and inner and outer leads and method for forming |
US10921391B2 (en) | 2018-08-06 | 2021-02-16 | Allegro Microsystems, Llc | Magnetic field sensor with spacer |
JP7134926B2 (ja) * | 2019-07-10 | 2022-09-12 | Towa株式会社 | 樹脂成形装置、及び樹脂成形品の製造方法 |
US10991644B2 (en) | 2019-08-22 | 2021-04-27 | Allegro Microsystems, Llc | Integrated circuit package having a low profile |
CN110923689A (zh) * | 2019-11-20 | 2020-03-27 | 苏州胜利精密制造科技股份有限公司 | 一种精密金属模具保护方法及结构 |
US11621181B2 (en) * | 2020-05-05 | 2023-04-04 | Asmpt Singapore Pte. Ltd. | Dual-sided molding for encapsulating electronic devices |
CN112117250B (zh) * | 2020-09-07 | 2022-07-01 | 矽磐微电子(重庆)有限公司 | 芯片封装结构及其制作方法 |
CN116666229A (zh) * | 2023-08-02 | 2023-08-29 | 西安畅榜电子科技有限公司 | 一种芯片框及其加工方法 |
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JPH0637242A (ja) * | 1992-07-20 | 1994-02-10 | Nec Kyushu Ltd | リードフレーム |
JPH0730037A (ja) * | 1993-05-11 | 1995-01-31 | Sumitomo Metal Mining Co Ltd | リードフレーム |
JPH0730054A (ja) * | 1993-07-15 | 1995-01-31 | Toppan Printing Co Ltd | リードフレームの製造方法 |
FR2715503B1 (fr) * | 1994-01-26 | 1996-04-05 | Commissariat Energie Atomique | Substrat pour composants intégrés comportant une couche mince et son procédé de réalisation. |
NL9400119A (nl) * | 1994-01-27 | 1995-09-01 | 3P Licensing Bv | Werkwijze voor het met een hardende kunststof omhullen van een electronische component, electronische componenten met kunststofomhulling verkregen door middel van deze werkwijze en matrijs voor het uitvoeren der werkwijze. |
-
1995
- 1995-05-02 US US08/434,137 patent/US5949132A/en not_active Expired - Lifetime
-
1996
- 1996-04-15 US US08/632,253 patent/US5891377A/en not_active Expired - Lifetime
- 1996-04-30 DE DE69636589T patent/DE69636589T2/de not_active Expired - Fee Related
- 1996-04-30 EP EP96303044A patent/EP0747942B1/de not_active Expired - Lifetime
- 1996-05-02 SG SG1996009670A patent/SG44042A1/en unknown
- 1996-05-02 JP JP8111773A patent/JPH09107061A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0747942A3 (de) | 1998-07-29 |
US5891377A (en) | 1999-04-06 |
JPH09107061A (ja) | 1997-04-22 |
EP0747942A2 (de) | 1996-12-11 |
EP0747942B1 (de) | 2006-10-04 |
SG44042A1 (en) | 1997-11-14 |
US5949132A (en) | 1999-09-07 |
DE69636589T2 (de) | 2007-08-09 |
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