DE69712759D1 - Wirbelstromprüftechnik - Google Patents
WirbelstromprüftechnikInfo
- Publication number
- DE69712759D1 DE69712759D1 DE69712759T DE69712759T DE69712759D1 DE 69712759 D1 DE69712759 D1 DE 69712759D1 DE 69712759 T DE69712759 T DE 69712759T DE 69712759 T DE69712759 T DE 69712759T DE 69712759 D1 DE69712759 D1 DE 69712759D1
- Authority
- DE
- Germany
- Prior art keywords
- eddy current
- current testing
- testing
- eddy
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP96201978 | 1996-07-12 | ||
PCT/EP1997/003815 WO1998002714A1 (en) | 1996-07-12 | 1997-07-11 | Eddy current inspection technique |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69712759D1 true DE69712759D1 (de) | 2002-06-27 |
DE69712759T2 DE69712759T2 (de) | 2002-12-19 |
Family
ID=8224185
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69712759T Expired - Lifetime DE69712759T2 (de) | 1996-07-12 | 1997-07-11 | Wirbelstromprüftechnik |
Country Status (9)
Country | Link |
---|---|
US (1) | US6291992B1 (de) |
EP (1) | EP0910784B1 (de) |
JP (1) | JP4263244B2 (de) |
CN (2) | CN1250931C (de) |
DE (1) | DE69712759T2 (de) |
ES (1) | ES2177994T3 (de) |
NO (1) | NO331373B1 (de) |
RU (1) | RU2183008C2 (de) |
WO (1) | WO1998002714A1 (de) |
Families Citing this family (68)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6392421B1 (en) | 1998-06-11 | 2002-05-21 | Em-Tech Llc | Spectral EM frequency metallic thickness measurement using metallic transparencies |
AUPP813499A0 (en) * | 1999-01-13 | 1999-02-04 | Rock Solid Research Pty. Ltd. | A subsurface pipeline inspection probe |
US6573706B2 (en) * | 1999-11-18 | 2003-06-03 | Intellijoint Systems Ltd. | Method and apparatus for distance based detection of wear and the like in joints |
KR100448444B1 (ko) * | 1999-12-29 | 2004-09-13 | 주식회사 포스코 | 위상배열방식의 와전류 감지기에 의한 압연강판의 두께와형상 및 평평도 측정장치 |
US6549006B2 (en) * | 2000-04-07 | 2003-04-15 | Cuong Duy Le | Eddy current measurements of thin-film metal coatings using a selectable calibration standard |
US6762604B2 (en) | 2000-04-07 | 2004-07-13 | Cuong Duy Le | Standalone eddy current measuring system for thickness estimation of conductive films |
US6741076B2 (en) | 2000-04-07 | 2004-05-25 | Cuong Duy Le | Eddy current measuring system for monitoring and controlling a CMP process |
US20030210041A1 (en) * | 2000-04-07 | 2003-11-13 | Le Cuong Duy | Eddy current measuring system for monitoring and controlling a chemical vapor deposition (CVD) process |
US6538435B2 (en) * | 2000-08-24 | 2003-03-25 | Shell Oil Company | Method for detecting an anomaly in an object of electrically conductive material along first and second direction at inspection points |
US6593737B2 (en) * | 2000-08-24 | 2003-07-15 | Shell Oil Company | Method for measuring the wall thickness of an electrically conductive object |
US6707296B2 (en) * | 2000-08-24 | 2004-03-16 | Shell Oil Company | Method for detecting cracks in electrically conducting material |
US7019518B2 (en) | 2000-10-16 | 2006-03-28 | Amini Bijan K | Non-contacting apparatus and method for measurement of ferromagnetic metal thickness |
JP2004516473A (ja) | 2000-12-21 | 2004-06-03 | シエル・インターナシヨネイル・リサーチ・マーチヤツピイ・ベー・ウイ | 電気伝導性物体の物質特性の測定 |
DE10102577C1 (de) * | 2001-01-20 | 2002-06-20 | Univ Braunschweig Tech | Verfahren zur Zustandserkennung von elektrisch leitfähigen länglichen Spanngliedern |
WO2002088627A1 (en) * | 2001-05-01 | 2002-11-07 | Em-Tech Llc | Measurements of coating on metal |
KR100435989B1 (ko) * | 2001-12-01 | 2004-06-23 | (주)에스엔아이 | 와전류센서가 구비되는 측정장치 |
WO2003050471A1 (en) * | 2001-12-10 | 2003-06-19 | Em-Tech Llc | Apparatus and method for the measurement of electrical properties of materials through non-magnetizable materials |
WO2003073040A2 (en) * | 2002-02-26 | 2003-09-04 | Shell Internationale Research Maatschappij B.V. | Measurement method for determining a surface profile |
US7309618B2 (en) * | 2002-06-28 | 2007-12-18 | Lam Research Corporation | Method and apparatus for real time metal film thickness measurement |
US20040011462A1 (en) * | 2002-06-28 | 2004-01-22 | Lam Research Corporation | Method and apparatus for applying differential removal rates to a surface of a substrate |
US7128803B2 (en) * | 2002-06-28 | 2006-10-31 | Lam Research Corporation | Integration of sensor based metrology into semiconductor processing tools |
US7205166B2 (en) * | 2002-06-28 | 2007-04-17 | Lam Research Corporation | Method and apparatus of arrayed, clustered or coupled eddy current sensor configuration for measuring conductive film properties |
US7084621B2 (en) * | 2002-09-25 | 2006-08-01 | Lam Research Corporation | Enhancement of eddy current based measurement capabilities |
AU2003300579B2 (en) | 2002-12-19 | 2006-09-28 | Tuv Rheinland Sonovation Holding B.V. | Monitoring wall thickness |
US20050007108A1 (en) * | 2003-07-11 | 2005-01-13 | Teodor Dogaru | Probes and methods for detecting defects in metallic structures |
US20050066739A1 (en) * | 2003-09-26 | 2005-03-31 | Lam Research Corporation | Method and apparatus for wafer mechanical stress monitoring and wafer thermal stress monitoring |
US7005851B2 (en) * | 2003-09-30 | 2006-02-28 | General Electric Company | Methods and apparatus for inspection utilizing pulsed eddy current |
JP4394415B2 (ja) * | 2003-10-24 | 2010-01-06 | 非破壊検査株式会社 | 電磁波パルスによる板厚相対比較方法及び板厚相対比較装置 |
US7214941B2 (en) * | 2004-12-16 | 2007-05-08 | The Gillette Company | Crack detection in razor blades |
DE102005051536A1 (de) * | 2005-04-27 | 2006-11-09 | Micro-Epsilon Messtechnik Gmbh & Co Kg | Berührungslos arbeitender Wirbelstromsensor und Verfahren zur Detektion von Messobjekten |
US7282909B2 (en) * | 2005-06-29 | 2007-10-16 | Lam Research Corporation | Methods and apparatus for determining the thickness of a conductive layer on a substrate |
AU2006316479B2 (en) | 2005-11-23 | 2010-02-18 | Shell Internationale Research Maatschappij B.V. | A process for sequestration of carbon dioxide by mineral carbonation |
KR100696991B1 (ko) * | 2006-01-25 | 2007-03-20 | 한국원자력연구소 | 투자율 측정법을 이용하여 증기발생기 전열관의 와전류를탐상하는 장치 및 방법 |
FR2900471B1 (fr) | 2006-04-26 | 2008-12-26 | Snecma Sa | Mesure des epaisseurs de paroi, notamment d'aube, par courants de foucault |
AU2007298994A1 (en) | 2006-09-21 | 2008-03-27 | Shell Internationale Research Maatschappij B.V. | Inspection of an electrically conductive object using eddy currents |
GB2450112B (en) * | 2007-06-12 | 2010-12-08 | Ge Inspection Technologies Ltd | Automatic lift-off compensation for pulsed eddy current inspection |
JP5017038B2 (ja) * | 2007-09-26 | 2012-09-05 | 株式会社日立製作所 | 渦流検査装置及び渦流検査方法 |
JP5011056B2 (ja) * | 2007-10-10 | 2012-08-29 | 株式会社日立製作所 | 渦流検査プローブ及び渦流検査装置 |
JP2010019565A (ja) * | 2008-07-08 | 2010-01-28 | Hitachi-Ge Nuclear Energy Ltd | 渦電流探傷プローブ |
KR100931935B1 (ko) * | 2008-10-07 | 2009-12-15 | (주)레이나 | Pec를 이용한 결함 측정장치를 이용한 측정방법 |
JP2010185832A (ja) * | 2009-02-13 | 2010-08-26 | Tlv Co Ltd | パルス渦流探傷装置 |
JP5106704B2 (ja) * | 2009-03-17 | 2012-12-26 | エービービー エービー | 金属製の物体に設けられた金属層の厚さを測定するための方法および装置 |
JP5188466B2 (ja) * | 2009-06-30 | 2013-04-24 | 株式会社日立製作所 | パルス励磁型渦電流探傷方法及びこれを用いたパルス励磁型渦電流探傷装置 |
JP5513821B2 (ja) * | 2009-09-17 | 2014-06-04 | 株式会社荏原製作所 | 渦電流センサ、研磨装置、めっき装置、研磨方法、めっき方法 |
CN101788260B (zh) * | 2010-03-18 | 2011-12-28 | 清华大学 | 一种金属薄膜厚度的电涡流测量方法 |
CN101915805B (zh) * | 2010-07-12 | 2012-04-04 | 哈尔滨工业大学深圳研究生院 | 一种基于小波分析的夹芯板超声波检伤方法及应用 |
US9057146B2 (en) * | 2010-08-24 | 2015-06-16 | Varian Semiconductor Equipment Associates, Inc. | Eddy current thickness measurement apparatus |
CA2813745C (en) * | 2010-10-14 | 2014-08-19 | Halliburton Energy Services, Inc. | Method for measuring remote field eddy current thickness in multiple tubular configuration |
CA2833330C (en) * | 2011-05-10 | 2016-04-19 | Bell Helicopter Textron Inc. | System and method for measuring wrinkle depth in a composite structure |
EP2574911B1 (de) * | 2011-09-29 | 2014-03-26 | ABB Technology AG | Verfahren und Anordnung zur Rissdetektion in einem metallischen Material |
JP5922633B2 (ja) * | 2013-10-22 | 2016-05-24 | 三菱重工業株式会社 | 渦電流探傷プローブ、及び、渦電流探傷方法 |
JP6385763B2 (ja) * | 2014-09-16 | 2018-09-05 | 株式会社東芝 | レーザ溶接装置及びレーザ溶接方法 |
US10073058B2 (en) | 2015-02-11 | 2018-09-11 | Structural Integrity Associates | Dynamic pulsed eddy current probe |
US10895555B2 (en) | 2015-03-30 | 2021-01-19 | Structural Integrity Associates, Inc. | System for in-line inspection using a dynamic pulsed eddy current probe and method thereof |
CN104880375A (zh) * | 2015-05-11 | 2015-09-02 | 广东正德材料表面科技有限公司 | 一种涂层磨损控制装置及其应用仪器 |
US10767470B2 (en) | 2015-08-20 | 2020-09-08 | Halliburton Energy Services, Inc. | Inspection of wellbore conduits using a distributed sensor system |
US9880130B2 (en) | 2015-12-15 | 2018-01-30 | Eddyfi Ndt Inc. | Pulsed eddy current testing with dual-purpose coils |
CN105737727B (zh) * | 2016-02-25 | 2019-03-19 | 珠海格力电器股份有限公司 | 一种电涡流传感器的探头及电涡流传感器 |
BR112018068469A2 (pt) | 2016-05-13 | 2019-01-22 | Halliburton Energy Services Inc | método e sistema de detecção de defeitos eletromagnéticos. |
US11306577B2 (en) | 2017-06-08 | 2022-04-19 | Halliburton Energy Services, Inc. | Calibrating electromagnetic corrosion detection tools via core saturation |
JP2019039677A (ja) * | 2017-08-22 | 2019-03-14 | 九州電力株式会社 | 保温配管探傷装置及び保温配管探傷方法 |
CN111337569A (zh) * | 2020-04-16 | 2020-06-26 | 中国科学院海洋研究所 | 一种新型的脉冲近场、远场组合式涡流传感器 |
CN111929359B (zh) * | 2020-09-25 | 2023-08-04 | 北方民族大学 | 一种环形螺线管线圈激励的分层缺陷涡流检测探头及方法 |
WO2022061475A1 (en) * | 2020-09-28 | 2022-03-31 | Atomic Energy Of Canada Limited / Énergie Atomique Du Canada Limitée | Deep electromagnetic rebar probe |
KR20220060880A (ko) * | 2020-11-05 | 2022-05-12 | 주식회사 엘지에너지솔루션 | 전지 셀의 균열 검사를 위한 와전류 센서 및 이를 포함하는 전지 셀의 균열 검출 시스템 |
RU2765897C1 (ru) * | 2021-04-12 | 2022-02-04 | Федеральное государственное бюджетное учреждение науки Институт проблем управления им. В.А. Трапезникова Российской академии наук | Способ измерения длины металлической трубы |
DE102021211836A1 (de) | 2021-09-30 | 2023-03-30 | Robert Bosch Gesellschaft mit beschränkter Haftung | Messeinrichtung |
NL1044407B1 (nl) | 2022-08-30 | 2024-03-12 | Sixpec B V | Wervelstroomsonde met focusserende werking voor niet-destructief testen. |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1698481B1 (de) | 1963-02-18 | 1969-09-04 | Claus Colani | Vorrichtung zur Untersuchung eines relativ homogenen,gegebenenfalls eine gewisse elektrische Leitfaehigkeit aufweisenden Mediums |
US3532969A (en) | 1968-02-20 | 1970-10-06 | Nat Lead Co | Method for magnetically measuring wall thickness of metal pipes and plate structures |
US3707672A (en) | 1971-06-02 | 1972-12-26 | Westinghouse Electric Corp | Weapon detector utilizing the pulsed field technique to detect weapons on the basis of weapons thickness |
US3940689A (en) * | 1974-05-14 | 1976-02-24 | Schlumberger Technology Corporation | Combined eddy current and leakage field detector for well bore piping using a unique magnetizer core structure |
GB1567600A (en) * | 1975-10-15 | 1980-05-21 | British Gas Corp | Lipe line inspection equipment |
US4271393A (en) * | 1978-12-29 | 1981-06-02 | The Boeing Company | Apparatus and method for eddy current detection of subsurface discontinuities in conductive bodies |
US4418574A (en) | 1981-11-20 | 1983-12-06 | Texaco Inc. | Magnetic method and apparatus for measuring wall thickness |
US4553095A (en) * | 1982-06-10 | 1985-11-12 | Westinghouse Electric Corp. | Eddy current thickness gauge with constant magnetic bias |
GB8303587D0 (en) | 1983-02-09 | 1983-03-16 | Chapman Cash Processing Ltd | Coin discriminating apparatus |
US4600356A (en) * | 1984-01-27 | 1986-07-15 | Gas Research Institute | Underground pipeline and cable detector and process |
US4710712A (en) | 1984-04-11 | 1987-12-01 | Pa Incorporated | Method and apparatus for measuring defects in ferromagnetic elements |
US4629985A (en) | 1984-04-11 | 1986-12-16 | Pa Incorporated | Method and apparatus for measuring defects in tubular members |
SE451886B (sv) | 1986-10-10 | 1987-11-02 | Sten Linder | Sett och anordning for beroringsfri metning av storheter hos eller i anslutning till elektriskt ledande material |
US4843319A (en) * | 1987-12-17 | 1989-06-27 | Atlantic Richfield Company | Transient electromagnetic method for detecting corrosion on conductive containers having variations in jacket thickness |
US4843320A (en) * | 1987-12-17 | 1989-06-27 | Atlantic Richfield Company | Transient electromagnetic method for detecting corrosion on conductive containers |
US4990851A (en) * | 1987-12-17 | 1991-02-05 | Atlantic Richfield Company | Transient electromagnetic method for detecting irregularities on conductive containers |
US4929898A (en) * | 1987-12-17 | 1990-05-29 | Atlantic Richfield | Transient electromagnetic method for detecting irregularities on conductive containers |
US4839593A (en) * | 1987-12-17 | 1989-06-13 | Atlantic Richfield Company | Transient electromagnetic method for directly detecting corrosion on conductive containers |
GB8807301D0 (en) * | 1988-03-26 | 1988-04-27 | Philpot Electronics Ltd | Detector |
GB8828675D0 (en) * | 1988-12-08 | 1989-01-11 | Protovale Oxford Ltd | Instrument for locating & measuring reinforcing bars |
US4929896A (en) * | 1988-12-29 | 1990-05-29 | Atlantic Richfield Company | Transient electromagnetic method for detecting irregularies on conductive containers having variations in jacket thickness |
US5233297A (en) * | 1990-08-06 | 1993-08-03 | Atlantic Richfield Company | Transient electromagnetic method and apparatus for inspecting conductive objects utilizing sensors that move during inspection |
US5434506A (en) * | 1992-11-09 | 1995-07-18 | The Babcock & Wilcox Company | Eddy current inspection with stationary magnetic fields and scanning sensor arrays |
JPH06186207A (ja) * | 1992-12-17 | 1994-07-08 | Nuclear Fuel Ind Ltd | 渦電流探傷プローブ |
US5461313A (en) * | 1993-06-21 | 1995-10-24 | Atlantic Richfield Company | Method of detecting cracks by measuring eddy current decay rate |
US5446382A (en) * | 1993-06-23 | 1995-08-29 | The Babcock & Wilcox Company | Eddy current probe having one yoke within another yoke for increased inspection depth, sensitivity and discrimination |
-
1997
- 1997-06-30 US US08/885,989 patent/US6291992B1/en not_active Expired - Lifetime
- 1997-07-11 JP JP50562298A patent/JP4263244B2/ja not_active Expired - Fee Related
- 1997-07-11 CN CN03158751.8A patent/CN1250931C/zh not_active Expired - Fee Related
- 1997-07-11 EP EP97934475A patent/EP0910784B1/de not_active Expired - Lifetime
- 1997-07-11 DE DE69712759T patent/DE69712759T2/de not_active Expired - Lifetime
- 1997-07-11 RU RU99102691/28A patent/RU2183008C2/ru not_active IP Right Cessation
- 1997-07-11 CN CNB971962723A patent/CN1155795C/zh not_active Expired - Lifetime
- 1997-07-11 ES ES97934475T patent/ES2177994T3/es not_active Expired - Lifetime
- 1997-07-11 WO PCT/EP1997/003815 patent/WO1998002714A1/en active IP Right Grant
-
1999
- 1999-01-11 NO NO19990105A patent/NO331373B1/no not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN1544932A (zh) | 2004-11-10 |
CN1250931C (zh) | 2006-04-12 |
CN1225167A (zh) | 1999-08-04 |
RU2183008C2 (ru) | 2002-05-27 |
CN1155795C (zh) | 2004-06-30 |
DE69712759T2 (de) | 2002-12-19 |
NO990105D0 (no) | 1999-01-11 |
EP0910784A1 (de) | 1999-04-28 |
JP4263244B2 (ja) | 2009-05-13 |
WO1998002714A1 (en) | 1998-01-22 |
EP0910784B1 (de) | 2002-05-22 |
US6291992B1 (en) | 2001-09-18 |
NO990105L (no) | 1999-01-11 |
ES2177994T3 (es) | 2002-12-16 |
JP2000514559A (ja) | 2000-10-31 |
NO331373B1 (no) | 2011-12-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: JUNG, SCHIRDEWAHN, GRUENBERG, SCHNEIDER PATENTANWAELTE |
|
8328 | Change in the person/name/address of the agent |
Representative=s name: ADVOTEC. PATENT- UND RECHTSANWAELTE, 80538 MUENCHE |