DE69730367D1 - Bildsignalausleseschaltung mit Offset-Korrektur - Google Patents

Bildsignalausleseschaltung mit Offset-Korrektur

Info

Publication number
DE69730367D1
DE69730367D1 DE69730367T DE69730367T DE69730367D1 DE 69730367 D1 DE69730367 D1 DE 69730367D1 DE 69730367 T DE69730367 T DE 69730367T DE 69730367 T DE69730367 T DE 69730367T DE 69730367 D1 DE69730367 D1 DE 69730367D1
Authority
DE
Germany
Prior art keywords
image signal
offset correction
readout circuit
signal readout
correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69730367T
Other languages
English (en)
Other versions
DE69730367T2 (de
Inventor
Travis N Blalock
Richard A Baumgartner
Thomas Hornak
David Beard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aptina Imaging Corp
Original Assignee
Agilent Technologies Inc
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc, Hewlett Packard Co filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE69730367D1 publication Critical patent/DE69730367D1/de
Publication of DE69730367T2 publication Critical patent/DE69730367T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
    • H03F1/303—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters using a switching device
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
    • H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
    • H03F3/087—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light with IC amplifier blocks
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/677—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction for reducing the column or line fixed pattern noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/701—Line sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/767—Horizontal readout lines, multiplexers or registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/249—A switch coupled in the input circuit of an amplifier being controlled by a circuit, e.g. feedback circuitry being controlling the switch
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45212—Indexing scheme relating to differential amplifiers the differential amplifier being designed to have a reduced offset
DE69730367T 1996-01-25 1997-01-13 Bildsignalausleseschaltung mit Offset-Korrektur Expired - Lifetime DE69730367T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US591076 1996-01-25
US08/591,076 US5703353A (en) 1996-01-25 1996-01-25 Offset removal and spatial frequency band filtering circuitry for photoreceiver signals

Publications (2)

Publication Number Publication Date
DE69730367D1 true DE69730367D1 (de) 2004-09-30
DE69730367T2 DE69730367T2 (de) 2005-09-01

Family

ID=24364959

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69730367T Expired - Lifetime DE69730367T2 (de) 1996-01-25 1997-01-13 Bildsignalausleseschaltung mit Offset-Korrektur
DE69737665T Expired - Lifetime DE69737665T2 (de) 1996-01-25 1997-01-13 Signalübertragungsschaltung mit Offset-Korrektur

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69737665T Expired - Lifetime DE69737665T2 (de) 1996-01-25 1997-01-13 Signalübertragungsschaltung mit Offset-Korrektur

Country Status (4)

Country Link
US (2) US5703353A (de)
EP (2) EP1175090B1 (de)
JP (2) JP3956242B2 (de)
DE (2) DE69730367T2 (de)

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US6256016B1 (en) 1997-06-05 2001-07-03 Logitech, Inc. Optical detection system, device, and method utilizing optical matching
US6025935A (en) * 1997-12-31 2000-02-15 Peripheral Imaging Corporation Charge storage image scanner having equalizing pre-charge and reset improvements
US6233368B1 (en) * 1998-03-18 2001-05-15 Agilent Technologies, Inc. CMOS digital optical navigation chip
US6002124A (en) * 1998-03-20 1999-12-14 Hewlett-Packard Company Portable image scanner with optical position sensors
US6188058B1 (en) 1998-09-17 2001-02-13 Agilent Technologies Inc. System for taking displacement measurements having photosensors with imaged pattern arrangement
US6118132A (en) * 1998-09-17 2000-09-12 Agilent Technologies System for measuring the velocity, displacement and strain on a moving surface or web of material
US6304826B1 (en) * 1999-02-05 2001-10-16 Syscan, Inc. Self-calibration method and circuit architecture of image sensor
US6246050B1 (en) 1999-03-08 2001-06-12 Hewlett-Packard Company Optical encoders using non-patterned targets
US6633332B1 (en) 1999-05-13 2003-10-14 Hewlett-Packard Development Company, L.P. Digital camera system and method capable of performing document scans
US6362465B1 (en) 1999-06-14 2002-03-26 Hewlett-Packard Company Optical scanning system and method capable of receiving inputs from a user
US6975355B1 (en) 2000-02-22 2005-12-13 Pixim, Inc. Multiple sampling via a time-indexed method to achieve wide dynamic ranges
US6312124B1 (en) 1999-10-27 2001-11-06 Hewlett-Packard Company Solid and semi-flexible body inkjet printing system
US6297984B1 (en) * 1999-12-29 2001-10-02 Tower Semiconductor Ltd. Structure and method for protecting integrated circuits during plasma processing
US7161578B1 (en) 2000-08-02 2007-01-09 Logitech Europe S.A. Universal presentation device
US7035932B1 (en) * 2000-10-27 2006-04-25 Eric Morgan Dowling Federated multiprotocol communication
US6781570B1 (en) 2000-11-09 2004-08-24 Logitech Europe S.A. Wireless optical input device
US6657487B2 (en) 2001-02-05 2003-12-02 Em(Us) Design, Inc Photodetector preamplifier circuit having a rotating input stage
US7333083B1 (en) 2001-05-10 2008-02-19 Logitech Europe S.A. Optical based performance improvement for an optical illumination configuration
US6617565B2 (en) * 2001-11-06 2003-09-09 Omnivision Technologies, Inc. CMOS image sensor with on-chip pattern recognition
US6788875B1 (en) 2002-04-08 2004-09-07 Logitech Europe S.A. Suspension system for use in an optical displacement detection system
US7131751B1 (en) 2002-04-12 2006-11-07 Logitech, Inc. Attachment system for use in an optical illumination system
US6876233B1 (en) 2003-02-15 2005-04-05 Medtronics, Inc. DC cancellation apparatus and method
US7515188B2 (en) * 2004-07-16 2009-04-07 Micron Technology, Inc. Method and system for reducing mismatch between reference and intensity paths in analog to digital converters in CMOS active pixel sensors
KR100790259B1 (ko) 2005-12-14 2008-01-02 매그나칩 반도체 유한회사 아날로그 디지털 컨버터, 이를 구비한 시모스 이미지 센서및 아날로그 옵셋 제거방법
JP4978022B2 (ja) * 2006-02-16 2012-07-18 富士通セミコンダクター株式会社 演算増幅器
JP5495864B2 (ja) * 2010-03-08 2014-05-21 キヤノン株式会社 光電変換装置
JP5360270B2 (ja) * 2011-12-07 2013-12-04 凸版印刷株式会社 液晶表示装置

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US3937874A (en) * 1975-01-09 1976-02-10 General Electric Company Offset voltage correction circuit for multiple video channel imager
US4409483A (en) * 1980-10-07 1983-10-11 Westinghouse Electric Corp. Radiant energy differential sensor system
US4400729A (en) * 1980-12-03 1983-08-23 Jones George R Pseudo-DC restore application to staring array detectors
DE3049043A1 (de) * 1980-12-24 1982-07-15 Robert Bosch Gmbh, 7000 Stuttgart Verfahren und anordnung zur unterdrueckung des niederfrequenten rauschens bei ausgangssignalen von halbleiter- sensoren
JPS6152012A (ja) * 1984-08-22 1986-03-14 Hitachi Ltd 差動増幅回路
US4884039A (en) * 1988-09-09 1989-11-28 Texas Instruments Incorporated Differential amplifier with low noise offset compensation
US4940981A (en) * 1989-02-08 1990-07-10 Burr-Brown Corporation Dual analog-to-digital converter with single successive approximation register
JP2931088B2 (ja) * 1990-11-30 1999-08-09 キヤノン株式会社 マルチチップ型光電変換装置
US5149980A (en) * 1991-11-01 1992-09-22 Hewlett-Packard Company Substrate advance measurement system using cross-correlation of light sensor array signals
JPH05219440A (ja) * 1992-02-07 1993-08-27 Olympus Optical Co Ltd 画像入力装置
JP2988795B2 (ja) * 1992-05-29 1999-12-13 シャープ株式会社 受光増幅装置
US5352884A (en) * 1993-04-14 1994-10-04 General Electric Corporation Method and apparatus for providing offset for light detector
FR2728420B1 (fr) * 1994-12-16 1997-01-24 Thomson Csf Procede de compensation electronique des non-uniformites dans la detection d'images, en particulier infrarouge, et circuit de correction pour sa mise en oeuvre

Also Published As

Publication number Publication date
DE69737665T2 (de) 2007-12-27
EP0786899A2 (de) 1997-07-30
EP0786899A3 (de) 1998-10-14
JP4027308B2 (ja) 2007-12-26
US5703353A (en) 1997-12-30
JP3956242B2 (ja) 2007-08-08
DE69737665D1 (de) 2007-06-06
US5900625A (en) 1999-05-04
JP2004120801A (ja) 2004-04-15
DE69730367T2 (de) 2005-09-01
EP0786899B1 (de) 2004-08-25
EP1175090B1 (de) 2007-04-25
EP1175090A1 (de) 2002-01-23
JPH10136149A (ja) 1998-05-22

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, TE

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8327 Change in the person/name/address of the patent owner

Owner name: AVAGO TECHNOLOGIES SENSOR IP (SINGAPORE) PTE. LTD.

8327 Change in the person/name/address of the patent owner

Owner name: MICRON TECHNOLOGY, INC., BOISE, ID., US

8327 Change in the person/name/address of the patent owner

Owner name: APTINA IMAGING CORP., GRAND CAYMAN, CAYMAN ISL, KY