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1949-08-27 |
1953-10-20 |
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1956-05-09 |
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1958-12-29 |
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1958-12-29 |
1964-02-25 |
Coulter Electronics |
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1959-08-19 |
1966-07-05 |
Coulter Electronics |
Particle analyzing device
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1962-07-05 |
1967-01-17 |
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Aperture tube structure for particle study apparatus
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1964-03-26 |
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1965-11-26 |
1969-05-13 |
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1966-02-23 |
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1966-05-23 |
1970-03-24 |
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1966-05-23 |
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Coulter Electronics |
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1968-11-02 |
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1969-05-12 |
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Coulter Electronics |
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1969-11-06 |
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1970-10-27 |
1972-10-24 |
Coulter Electronics |
Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
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1970-12-24 |
1972-10-24 |
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1971-02-08 |
1974-01-01 |
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Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
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1971-03-10 |
1974-02-19 |
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1971-03-26 |
1973-01-30 |
Coulter Electronics |
Electronic particle analyzing apparatus with improved aperture tube
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1971-04-05 |
1973-11-06 |
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Scanner element for coulter particle apparatus
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1971-04-07 |
1973-07-17 |
Coulter Electronics |
Self-cleaning aperture tube for coulter study apparatus
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1971-04-09 |
1973-01-09 |
Coulter Electronics |
Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
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1971-04-09 |
1973-01-09 |
Coulter Electronics |
Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
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1971-07-22 |
1973-12-25 |
Coulter Electronics |
Noise discriminating circuitry and method for electronic particle study apparatus
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1971-08-20 |
1973-06-12 |
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Particle sensing apparatus, method and flow direction collar therefor
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1972-09-26 |
1976-04-06 |
Coulter Electronics, Inc. |
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1972-03-27 |
1976-04-06 |
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Methods and apparatuses for correcting coincidence count inaccuracies in a coulter type of particle analyzer
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1972-05-09 |
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Particle study apparatus having improved particle resolution means
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1973-05-07 |
1975-01-28 |
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Particle analyzing method and apparatus having pulse amplitude modification for particle volume linearization
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1973-05-07 |
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1973-06-04 |
1975-03-18 |
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Hydrodynamic focusing method and apparatus
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1973-08-13 |
1977-04-19 |
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Particle detector independent of errors caused by changes of electrolyte conductivity and electrode polarization
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1973-08-13 |
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Electrical sensing circuitry for particle analyzing device
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1973-09-26 |
1975-08-26 |
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Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
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1973-09-26 |
1976-09-07 |
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Particle analyzing system
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1973-10-12 |
1975-12-02 |
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Potential sensing cell analyzer
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1973-10-15 |
1976-06-01 |
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Particle size distribution analyzation employing trailing edge differentiation
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1974-02-12 |
1976-02-03 |
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Method and apparatus for generating error corrected signals
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1974-02-19 |
1976-02-24 |
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Particle analyzer of the coulter type including coincidence error correction circuitry
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1974-07-02 |
1977-02-22 |
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Method and apparatus for providing primary coincidence correction during particle analysis utilizing time generation techniques
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1974-11-04 |
1976-06-15 |
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Method and system for cleaning an aperture in a particle study device
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1974-12-02 |
1976-10-19 |
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Method and apparatus for correcting total particle volume error due to particle coincidence
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1975-04-30 |
1977-03-29 |
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Aperture module for use in particle testing apparatus
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1976-10-28 |
1980-01-22 |
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Method and apparatus for correlating measurements of tandem sensing zones
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1977-03-23 |
1979-08-21 |
Becton, Dickinson And Company |
Particle counting apparatus utilizing various fluid resistors to maintain proper pressure differentials
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CH614781A5
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1977-06-27 |
1979-12-14 |
Contraves Ag |
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1977-08-01 |
1979-06-05 |
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Flow-through type particle analyzing apparatus
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1977-11-11 |
1986-04-17 |
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Vorrichtung zur Messung bestimmter Eigenschaften in einer Partikelsuspension suspendierter Partikel
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1978-05-18 |
1984-02-28 |
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Particle length and volume comeasurement with controlled orientation
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1978-06-28 |
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1978-09-13 |
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Transducer for measuring particles suspended in a fluid
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1978-11-03 |
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The United States Of America As Represented By The United States Department Of Energy |
Apparatus for measuring resistance change only in a cell analyzer and method for calibrating it
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1980-11-24 |
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1981-03-23 |
1984-03-20 |
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1981-04-30 |
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Debris alarm
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Field focused particle sensing zone
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1981-08-31 |
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Elongate particle sensing aperture
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1981-11-30 |
1984-05-22 |
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Analog debris alarm
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1981-12-02 |
1985-05-07 |
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Particle analyzing and sorting apparatus
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1982-05-03 |
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Cell breakdown
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1982-12-20 |
1984-08-15 |
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1983-10-14 |
1987-12-01 |
Sequoia-Turner Corporation |
Particulate matter analyzing apparatus and method
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1985-01-08 |
1986-07-19 |
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粒子検出器
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1985-05-31 |
1987-01-28 |
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Analysing and editing electrical pulses
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Apparatus for determining the characteristics of particles suspended in liquids
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1986-05-05 |
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Particle counter having electrodes and circuitry mounted on the pane of the orifice
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1986-10-03 |
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Lodged debris detector for a particle analyzer
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1986-10-21 |
1988-12-13 |
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Particle analyzer for measuring the resistance and reactance of a particle
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1987-03-13 |
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1989-05-18 |
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Apparatus for particle determination in liquid metals
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1989-05-31 |
1990-11-20 |
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Isolation circuit for blood cell counter
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Abbott Laboratories |
Method of making count probe with removable count wafer
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1993-12-23 |
1995-03-28 |
Abbott Laboratories |
Mechanical capture of count wafer for particle analysis
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1994-05-09 |
1995-11-14 |
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1996-01-05 |
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Verfahren und Vorrichtung zur Bestimmung von Parametern von Partikeln in Elektrolyten
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