DE69822830D1 - Verfahren und vorrichtung zur bestimmung und charakterisierung von teilchen - Google Patents

Verfahren und vorrichtung zur bestimmung und charakterisierung von teilchen

Info

Publication number
DE69822830D1
DE69822830D1 DE69822830T DE69822830T DE69822830D1 DE 69822830 D1 DE69822830 D1 DE 69822830D1 DE 69822830 T DE69822830 T DE 69822830T DE 69822830 T DE69822830 T DE 69822830T DE 69822830 D1 DE69822830 D1 DE 69822830D1
Authority
DE
Germany
Prior art keywords
determining
characterizing particles
characterizing
particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69822830T
Other languages
English (en)
Other versions
DE69822830T2 (de
Inventor
Donnie Graham
J Dunstan
Gerry Graham
Ted Britton
Geoffrey Harfield
S King
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beckman Coulter Inc
Original Assignee
Coulter International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/887,588 external-priority patent/US6111398A/en
Application filed by Coulter International Corp filed Critical Coulter International Corp
Publication of DE69822830D1 publication Critical patent/DE69822830D1/de
Application granted granted Critical
Publication of DE69822830T2 publication Critical patent/DE69822830T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G01N15/13
    • G01N2015/1019
    • G01N2015/135
DE69822830T 1997-07-03 1998-07-02 Verfahren und vorrichtung zur bestimmung und charakterisierung von teilchen Expired - Lifetime DE69822830T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US08/887,588 US6111398A (en) 1997-07-03 1997-07-03 Method and apparatus for sensing and characterizing particles
US887588 1997-07-03
US108997 1998-07-01
US09/108,997 US6175227B1 (en) 1997-07-03 1998-07-01 Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
PCT/US1998/013911 WO1999001743A1 (en) 1997-07-03 1998-07-02 Method and apparatus for sensing and characterizing particles

Publications (2)

Publication Number Publication Date
DE69822830D1 true DE69822830D1 (de) 2004-05-06
DE69822830T2 DE69822830T2 (de) 2005-03-24

Family

ID=26806530

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69822830T Expired - Lifetime DE69822830T2 (de) 1997-07-03 1998-07-02 Verfahren und vorrichtung zur bestimmung und charakterisierung von teilchen

Country Status (6)

Country Link
US (1) US6175227B1 (de)
EP (1) EP0993600B1 (de)
JP (1) JP4112637B2 (de)
CN (1) CN1160549C (de)
DE (1) DE69822830T2 (de)
WO (1) WO1999001743A1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6259242B1 (en) * 1999-05-26 2001-07-10 Coulter International Corp. Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles
US6624621B2 (en) * 2000-04-03 2003-09-23 Howard L. North, Jr. Particle counter volume sensor
KR100338346B1 (ko) * 2000-05-24 2002-05-30 박호군 막여과 시간에 따른 막오염 진행 추이를 동시에연속적으로 모니터링하기 위한 막여과 장치 및 방법
US20030015045A1 (en) * 2001-07-23 2003-01-23 Takehito Yoshida Particle counting method and particle counter
JP4704036B2 (ja) * 2002-06-11 2011-06-15 ケムパック エイ/エス 液体中に懸濁された粒子を特徴付けるための使い捨てカートリッジ
JP2005529327A (ja) * 2002-06-11 2005-09-29 ケムパック エイ/エス 液体中に懸濁された粒子を特徴付けるための使い捨てカートリッジ
US20040069638A1 (en) * 2002-09-30 2004-04-15 The Regents Of The University Of California Electrophoretic/electrochemical devices with nanometer-scale metallic components
DK1565873T3 (da) * 2002-11-18 2013-09-08 Iris Int Inc Partikelekstraktion til et automatisk strømningsmikroskop
US7405562B2 (en) 2004-07-23 2008-07-29 Yehya Ghallab Magnetic field imaging detection apparatus
WO2006019242A1 (en) * 2004-08-17 2006-02-23 Korea Advanced Institute Of Science And Technology Device and method for measuring fine particle concentration
US7397232B2 (en) * 2005-10-21 2008-07-08 The University Of Akron Coulter counter having a plurality of channels
US20070202495A1 (en) * 2006-02-06 2007-08-30 Michael Mayer Use of resistive-pulse sensing with submicrometer pores or nanopores for the detection of the assembly of submicrometer or nanometer sized objects
CN101750477A (zh) * 2008-12-05 2010-06-23 深圳迈瑞生物医疗电子股份有限公司 微孔排堵装置、方法和粒子分析装置
EP2422181A1 (de) * 2009-04-24 2012-02-29 Beckman Coulter, Inc. Verfahren zur charakterisierung von partikeln
JP5456653B2 (ja) * 2010-12-13 2014-04-02 日本光電工業株式会社 血液測定装置
FR2971337B1 (fr) * 2011-02-04 2013-03-01 Horiba Abx Sas Dispositif et procede de mesures multiparametriques de microparticules dans un fluide
US9423336B2 (en) 2013-01-24 2016-08-23 Beckman Coulter, Inc. Systems and methods for particle sensing and characterization
CN103163375B (zh) * 2013-02-19 2015-04-22 中国科学院电工研究所 一种固液导体接触电阻测量方法
WO2016139809A1 (ja) * 2015-03-05 2016-09-09 株式会社日立製作所 粒子分析装置及び粒子分析方法
CN106769698B (zh) * 2016-12-29 2019-08-06 迪瑞医疗科技股份有限公司 一种基于电阻抗原理的血细胞异常脉冲信号识别处理方法
JP6925040B2 (ja) * 2018-08-27 2021-08-25 アイポア株式会社 分析装置、及び、分析方法
JPWO2021079598A1 (de) * 2019-10-25 2021-04-29
CN113433038B (zh) * 2021-05-31 2022-11-01 昆明理工大学 一种新的混合纳米流体粒子组合的选择方法

Family Cites Families (81)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2656508A (en) 1949-08-27 1953-10-20 Wallace H Coulter Means for counting particles suspended in a fluid
BE562451A (de) 1956-05-09
NL240601A (de) 1958-12-29
US3122431A (en) 1958-12-29 1964-02-25 Coulter Electronics Method of making a scanner element for particle analyzers
US3259842A (en) 1959-08-19 1966-07-05 Coulter Electronics Particle analyzing device
US3299354A (en) 1962-07-05 1967-01-17 Coulter Electronics Aperture tube structure for particle study apparatus
NL137000C (de) 1964-03-26
US3444464A (en) 1965-11-26 1969-05-13 Coulter Electronics Multiple aperture fittings for particle analyzing apparatus
US3668531A (en) 1966-02-23 1972-06-06 Coulter Electronics Pulse analyzing apparatus
US3502974A (en) 1966-05-23 1970-03-24 Coulter Electronics Signal modulated apparatus for generating and detecting resistive and reactive changes in a modulated current path for particle classification and analysis
US3502973A (en) 1966-05-23 1970-03-24 Coulter Electronics Collating apparatus for pairs of electrical pulses produced by particle analyzing apparatus
US3810010A (en) 1968-11-02 1974-05-07 Telefunken Patent Particle analysis method and apparatus wherein liquid containing particles is sucked into a constricted flow path
US3603875A (en) 1969-05-12 1971-09-07 Coulter Electronics Particle analyzing method and apparatus employing multiple apertures and multiple channels per aperture
BE758383A (nl) 1969-11-06 1971-04-16 Coulter Electronics Aftastelement en doorboord plaatje voor het electronisch tellenen sorteren van deeltjes
US3701029A (en) 1970-10-27 1972-10-24 Coulter Electronics Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
US3700867A (en) 1970-12-24 1972-10-24 Coulter Electronics Axial trajectory sensor for electronic particle study apparatus and method
US3783391A (en) 1971-02-08 1974-01-01 Coulter Electronics Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
US3793587A (en) 1971-03-10 1974-02-19 Licentia Gmbh Particle volume and cross-section measurement
US3714565A (en) 1971-03-26 1973-01-30 Coulter Electronics Electronic particle analyzing apparatus with improved aperture tube
US3771058A (en) 1971-04-05 1973-11-06 Coulter Electronics Scanner element for coulter particle apparatus
US3746976A (en) 1971-04-07 1973-07-17 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus
US3710263A (en) 1971-04-09 1973-01-09 Coulter Electronics Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
US3710264A (en) 1971-04-09 1973-01-09 Coulter Electronics Axial trajectory sensor having gating means controlled by pulse duration measuring for electronic particle study apparatus and method
US3781674A (en) 1971-07-22 1973-12-25 Coulter Electronics Noise discriminating circuitry and method for electronic particle study apparatus
US3739268A (en) 1971-08-20 1973-06-12 Iit Res Inst Particle sensing apparatus, method and flow direction collar therefor
US3949197A (en) 1972-09-26 1976-04-06 Coulter Electronics, Inc. Methods and apparatuses for correcting coincidence count errors in a particle analyzer having a sensing zone through which the particles flow
US3949198A (en) 1972-03-27 1976-04-06 Coulter Electronics, Inc. Methods and apparatuses for correcting coincidence count inaccuracies in a coulter type of particle analyzer
US3790883A (en) 1972-05-09 1974-02-05 Coulter Electronics Particle study apparatus having improved particle resolution means
US3863159A (en) 1973-05-07 1975-01-28 Coulter Electronics Particle analyzing method and apparatus having pulse amplitude modification for particle volume linearization
US3863160A (en) 1973-05-07 1975-01-28 Edward Neal Doty Method and apparatus for finding the center amplitude of each pulse of a train of random amplitude asymmetric pulses
US3871770A (en) 1973-06-04 1975-03-18 Nuclear Data Inc Hydrodynamic focusing method and apparatus
US4019134A (en) 1973-08-13 1977-04-19 Coulter Electronics, Inc. Particle detector independent of errors caused by changes of electrolyte conductivity and electrode polarization
US3944917A (en) 1973-08-13 1976-03-16 Coulter Electronics, Inc. Electrical sensing circuitry for particle analyzing device
US3902115A (en) 1973-09-26 1975-08-26 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
US3979669A (en) 1973-09-26 1976-09-07 Coulter Electronics, Inc. Particle analyzing system
US3924180A (en) 1973-10-12 1975-12-02 Us Energy Potential sensing cell analyzer
US3961249A (en) 1973-10-15 1976-06-01 Coulter Electronics, Inc. Particle size distribution analyzation employing trailing edge differentiation
US3936739A (en) 1974-02-12 1976-02-03 Coulter Electronics, Inc. Method and apparatus for generating error corrected signals
US3940691A (en) 1974-02-19 1976-02-24 Coulter Electronics, Inc. Particle analyzer of the coulter type including coincidence error correction circuitry
US4009443A (en) 1974-07-02 1977-02-22 Coulter Electronics, Inc. Method and apparatus for providing primary coincidence correction during particle analysis utilizing time generation techniques
US3963984A (en) 1974-11-04 1976-06-15 Coulter Electronics, Inc. Method and system for cleaning an aperture in a particle study device
US3987391A (en) 1974-12-02 1976-10-19 Coulter Electronics, Inc. Method and apparatus for correcting total particle volume error due to particle coincidence
US4014611A (en) 1975-04-30 1977-03-29 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4184766A (en) 1976-10-28 1980-01-22 Coulter Electronics, Inc. Method and apparatus for correlating measurements of tandem sensing zones
US4165484A (en) 1977-03-23 1979-08-21 Becton, Dickinson And Company Particle counting apparatus utilizing various fluid resistors to maintain proper pressure differentials
CH614781A5 (de) 1977-06-27 1979-12-14 Contraves Ag
US4157498A (en) 1977-08-01 1979-06-05 Miles Laboratories, Inc. Flow-through type particle analyzing apparatus
DE2750447C2 (de) 1977-11-11 1986-04-17 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Vorrichtung zur Messung bestimmter Eigenschaften in einer Partikelsuspension suspendierter Partikel
US4434398A (en) 1978-05-18 1984-02-28 Particle Data, Inc. Porous passage means and method for particle analyzing systems
US4290011A (en) 1978-05-18 1981-09-15 Particle Data, Inc. Particle length and volume comeasurement with controlled orientation
DE2828232C2 (de) 1978-06-28 1986-04-17 Kernforschungsanlage Jülich GmbH, 5170 Jülich Vorrichtung zur Bestimmung des dielektrischen Durchbruches und der Größe von als Umhüllung eine Membran aufweisenden Partikeln
US4491786A (en) 1978-09-13 1985-01-01 Coulter Electronics, Inc. Transducer for measuring particles suspended in a fluid
US4224567A (en) 1978-11-03 1980-09-23 The United States Of America As Represented By The United States Department Of Energy Apparatus for measuring resistance change only in a cell analyzer and method for calibrating it
US4395676A (en) 1980-11-24 1983-07-26 Coulter Electronics, Inc. Focused aperture module
US4438390A (en) 1981-03-23 1984-03-20 Coulter Electronics, Inc. Tandem sensing zones for improved signal-to-noise ratio in particle analyzer
US4412175A (en) 1981-04-30 1983-10-25 Coulter Electronics, Inc. Debris alarm
US4420720A (en) * 1981-06-29 1983-12-13 Coulter Electronics, Inc. Field focused particle sensing zone
US4484134A (en) 1981-08-31 1984-11-20 Coulter Electrnonics, Inc. Elongate particle sensing aperture
US4450435A (en) 1981-11-30 1984-05-22 Bobby Dencil James Analog debris alarm
US4515274A (en) 1981-12-02 1985-05-07 Coulter Corporation Particle analyzing and sorting apparatus
US4510438A (en) 1982-02-16 1985-04-09 Coulter Electronics, Inc. Coincidence correction in particle analysis system
US4525666A (en) 1982-05-03 1985-06-25 Coulter Electronics, Inc. Cell breakdown
DD212588A1 (de) * 1982-12-20 1984-08-15 Norbert Lenk Messduese zur erfassung der in einem elektrolyten suspendierten teilchen
US4710021A (en) 1983-10-14 1987-12-01 Sequoia-Turner Corporation Particulate matter analyzing apparatus and method
JPS61160038A (ja) * 1985-01-08 1986-07-19 Sumitomo Electric Ind Ltd 粒子検出器
GB2177804A (en) 1985-05-31 1987-01-28 Coulter Electronics Analysing and editing electrical pulses
US4778657A (en) * 1985-09-10 1988-10-18 Kernforschungszentrum Karlsruhe Gmbh Apparatus for determining the characteristics of particles suspended in liquids
US4760328A (en) 1986-05-05 1988-07-26 Integrated Ionics, Inc. Particle counter having electrodes and circuitry mounted on the pane of the orifice
US4775833A (en) 1986-10-03 1988-10-04 Coulter Electronics, Inc. Lodged debris detector for a particle analyzer
US4791355A (en) 1986-10-21 1988-12-13 Coulter Electronics Inc. Particle analyzer for measuring the resistance and reactance of a particle
KR970007077B1 (ko) 1987-03-13 1997-05-02 코울터 일렉트로닉스 인커퍼레이티드 광산란 기술을 이용한 다중-부분식별 분석 방법
CS272965B1 (en) * 1987-06-18 1991-02-12 Rudolf Ing Butas Conducting sensor for measuring lenght and number of fibres in water suspension
CA1328679C (en) * 1989-05-18 1994-04-19 Raynald Hachey Apparatus for particle determination in liquid metals
US4972137A (en) 1989-05-31 1990-11-20 Coulter Electronics, Inc. Isolation circuit for blood cell counter
JP2965688B2 (ja) 1990-11-30 1999-10-18 シスメックス株式会社 粒子検出装置
JP3707620B2 (ja) 1993-05-14 2005-10-19 コールター インターナショナル コーポレイション 光散乱技術を使用した網赤血球分析方法と装置
US5432992A (en) 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
US5402062A (en) 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
JPH07301595A (ja) 1994-05-09 1995-11-14 Toa Medical Electronics Co Ltd 粒子測定装置およびその粒子測定方法
DE19601054C1 (de) * 1996-01-05 1997-04-10 Inst Bioprozess Analysenmesst Verfahren und Vorrichtung zur Bestimmung von Parametern von Partikeln in Elektrolyten
SE507956C2 (sv) * 1996-11-20 1998-08-03 Medonic Ab Utspädnings- och mätanordning för partikelräkning

Also Published As

Publication number Publication date
CN1160549C (zh) 2004-08-04
EP0993600A1 (de) 2000-04-19
DE69822830T2 (de) 2005-03-24
JP2002508077A (ja) 2002-03-12
US6175227B1 (en) 2001-01-16
CN1261957A (zh) 2000-08-02
WO1999001743A1 (en) 1999-01-14
JP4112637B2 (ja) 2008-07-02
EP0993600B1 (de) 2004-03-31

Similar Documents

Publication Publication Date Title
DE69822830D1 (de) Verfahren und vorrichtung zur bestimmung und charakterisierung von teilchen
DE69822687D1 (de) Vorrichtung und Verfahren zur Zusammenfassung
DE69532091D1 (de) Verfahren und Vorrichtung zur Durchführung von Messungen
DE69836540D1 (de) Verfahren und vorrichtung zur ausführung von bildverbesserungen
DE69840531D1 (de) Vorrichtung und verfahren zur ermittlung des gesichtsfeldes
DE69907878D1 (de) Verfahren und vorrichtung zur elektrokoagulation von flüssigkeiten
DE69524077D1 (de) Vorrichtung und verfahren zur bestimmung der teilchengrössenverteilung
DE69534399D1 (de) Verfahren und Gerät zur Bestimmung von Merkmalpunkten
DE69700253T2 (de) Verfahren und Vorrichtung zur Bestimmung der Konzentration eines Bestandteils
DE69733463D1 (de) Vorrichtung und verfahren zur rahmung von paketen
DE59805342D1 (de) Verfahren und vorrichtung zur bearbeitung von bildobjekten
DE69812098D1 (de) Verfahren und vorrichtung zur verwaltung von hash-codierten objekten
DE69619611T2 (de) Verfahren und Vorrichtung zur Bestimmung der petrologischen Eigenschaften von Schichtgesteinen
DE59706787D1 (de) Verfahren und vorrichtung zur bestimmung der räumlichen koordinaten von gegenständen
DE69825764D1 (de) Vorrichtung und verfahren zur trennung von flüssigkeiten unterschiedicher dichte
DE69920581D1 (de) Verfahren und Vorrichtung zur Charakterisierung von Oberflächeneffekten
DE59610934D1 (de) Vorrichtung und verfahren zur steifigkeitsmessung von flachen sendungen
DE69709558T2 (de) Vorrichtung und Verfahren zur Verbesserung von Teilchenoberflächen
DE69714891D1 (de) Verfahren und Vorrichtung zur Vorbereitung von Handschuhen
DE69406683T2 (de) Verfahren und vorrichtung zur bestimmung der formeigenschaften von teilchen
DE69942498D1 (de) Verfahren und Vorrichtung zur Modifizierung von Partikeloberflächen
DE69618801D1 (de) Vorrichtung und verfahren zur bestimmung der partikelgrösse bei geringer konzentration
DE69713583D1 (de) Vorrichtung und verfahren zur charakterisierung von gekräuseltem fasermaterial
DE69503266T2 (de) Verfahren und Vorrichtung zur Aufbereitung von Sand
DE59802666D1 (de) Verfahren und vorrichtung zur lageerkennung von anschlüssen und/oder kanten von bauelementen

Legal Events

Date Code Title Description
8364 No opposition during term of opposition