DE69831900D1 - Programmier-Modus- Auswahl mit JTAG Schaltungen - Google Patents
Programmier-Modus- Auswahl mit JTAG SchaltungenInfo
- Publication number
- DE69831900D1 DE69831900D1 DE69831900T DE69831900T DE69831900D1 DE 69831900 D1 DE69831900 D1 DE 69831900D1 DE 69831900 T DE69831900 T DE 69831900T DE 69831900 T DE69831900 T DE 69831900T DE 69831900 D1 DE69831900 D1 DE 69831900D1
- Authority
- DE
- Germany
- Prior art keywords
- pins
- jtag
- user
- programming mode
- technique
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/1731—Optimisation thereof
- H03K19/1732—Optimisation thereof by limitation or reduction of the pin/gate ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17736—Structural details of routing resources
- H03K19/17744—Structural details of routing resources for input/output signals
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
- H03K19/177—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components arranged in matrix form
- H03K19/17748—Structural details of configuration resources
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Applications Claiming Priority (16)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US4927597P | 1997-06-10 | 1997-06-10 | |
US4924397P | 1997-06-10 | 1997-06-10 | |
US5299097P | 1997-06-10 | 1997-06-10 | |
US4924597P | 1997-06-10 | 1997-06-10 | |
US4924697P | 1997-06-10 | 1997-06-10 | |
US4924797P | 1997-06-10 | 1997-06-10 | |
US52990P | 1997-06-10 | ||
US49275P | 1997-06-10 | ||
US49243P | 1997-06-10 | ||
US49247P | 1997-06-10 | ||
US49245P | 1997-06-10 | ||
US49246P | 1997-06-10 | ||
US4947897P | 1997-06-13 | 1997-06-13 | |
US5095397P | 1997-06-13 | 1997-06-13 | |
US50953P | 1997-06-13 | ||
US49478P | 1997-06-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69831900D1 true DE69831900D1 (de) | 2005-11-24 |
DE69831900T2 DE69831900T2 (de) | 2006-05-24 |
Family
ID=27574345
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69831900T Expired - Lifetime DE69831900T2 (de) | 1997-06-10 | 1998-06-10 | Programmier-Modus-Auswahl mit JTAG Schaltungen |
Country Status (4)
Country | Link |
---|---|
US (3) | US6421812B1 (de) |
EP (1) | EP0884599B1 (de) |
JP (1) | JPH1172541A (de) |
DE (1) | DE69831900T2 (de) |
Families Citing this family (58)
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JP2000065899A (ja) * | 1998-08-14 | 2000-03-03 | Sony Corp | 半導体装置およびそのデータ書き換え方法 |
US6158034A (en) * | 1998-12-03 | 2000-12-05 | Atmel Corporation | Boundary scan method for terminating or modifying integrated circuit operating modes |
US6044025A (en) * | 1999-02-04 | 2000-03-28 | Xilinx, Inc. | PROM with built-in JTAG capability for configuring FPGAs |
US6487674B1 (en) * | 2000-03-08 | 2002-11-26 | Cirrus Logic, Inc. | Single wire interface for an analog to digital converter |
US6651155B1 (en) * | 2000-07-28 | 2003-11-18 | Altera Corporation | Apparatus and method for translating a programmable logic device programmer object file |
WO2002063473A1 (fr) * | 2001-02-02 | 2002-08-15 | Hitachi, Ltd | Procede de developpement d'un systeme de traitement de donnees et tableau d'evaluation |
JP3459821B2 (ja) * | 2001-05-08 | 2003-10-27 | 松下電器産業株式会社 | マイクロプロセッサ |
US6918027B2 (en) * | 2001-07-30 | 2005-07-12 | Hewlett-Packard Development Company, L.P. | System and method for in-system programming through an on-system JTAG bridge of programmable logic devices on multiple circuit boards of a system |
US6883109B2 (en) * | 2001-07-30 | 2005-04-19 | Hewlett-Packard Development Company, L.P. | Method for accessing scan chains and updating EEPROM-resident FPGA code through a system management processor and JTAG bus |
US20030023793A1 (en) * | 2001-07-30 | 2003-01-30 | Mantey Paul J. | Method and apparatus for in-system programming through a common connection point of programmable logic devices on multiple circuit boards of a system |
US20040225783A1 (en) * | 2001-07-30 | 2004-11-11 | Erickson Michael John | Bus to multiple jtag bus bridge |
US6954929B2 (en) * | 2001-07-30 | 2005-10-11 | Hewlett-Packard Development Company, L.P. | Method for just-in-time updating of programming parts |
JP2003046299A (ja) * | 2001-08-02 | 2003-02-14 | Fuji Mach Mfg Co Ltd | 回路基板作業システムおよび状態設定方法 |
GB2379524A (en) * | 2001-09-06 | 2003-03-12 | Nec Technologies | Multiplexing pins on an ASIC |
JP4856848B2 (ja) * | 2001-10-11 | 2012-01-18 | アルテラ コーポレイション | プログラマブルロジックリソース上のエラー検出 |
US6948007B2 (en) * | 2001-12-20 | 2005-09-20 | Hewlett-Packard Development Company, L.P. | Method and apparatus for configuring integrated circuit devices |
US6925583B1 (en) * | 2002-01-09 | 2005-08-02 | Xilinx, Inc. | Structure and method for writing from a JTAG device with microcontroller to a non-JTAG device |
US7127708B2 (en) * | 2002-03-28 | 2006-10-24 | Lucent Technologies Inc. | Concurrent in-system programming of programmable devices |
US6948147B1 (en) * | 2003-04-03 | 2005-09-20 | Xilinx, Inc. | Method and apparatus for configuring a programmable logic device using a master JTAG port |
US7191265B1 (en) | 2003-04-29 | 2007-03-13 | Cisco Technology, Inc. | JTAG and boundary scan automatic chain selection |
US7506210B1 (en) | 2003-06-26 | 2009-03-17 | Xilinx, Inc. | Method of debugging PLD configuration using boundary scan |
US8923307B2 (en) * | 2003-07-14 | 2014-12-30 | Broadcom Corporation | Method and system for an integrated dual port gigabit ethernet controller chip |
US7343470B1 (en) | 2003-09-26 | 2008-03-11 | Altera Corporation | Techniques for sequentially transferring data from a memory device through a parallel interface |
US20080201503A1 (en) * | 2003-12-05 | 2008-08-21 | Mckim James B | Communications System for Implementation of Synchronous, Multichannel, Galvanically Isolated Instrumentation Devices |
US8892791B2 (en) | 2003-12-05 | 2014-11-18 | Keysight Technologies, Inc. | Communications system for implementation of synchronous, multichannel, galvanically isolated instrumentation devices |
US7328377B1 (en) | 2004-01-27 | 2008-02-05 | Altera Corporation | Error correction for programmable logic integrated circuits |
US7284172B2 (en) * | 2004-04-30 | 2007-10-16 | International Business Machines Corporation | Access method for embedded JTAG TAP controller instruction registers |
JP4228305B2 (ja) * | 2004-05-06 | 2009-02-25 | 横河電機株式会社 | テストシステム |
US7420791B1 (en) * | 2004-08-09 | 2008-09-02 | Intersil Americas Inc. | Fault signature system for power management integrated circuits |
US7480843B1 (en) * | 2004-09-29 | 2009-01-20 | Xilinx, Inc. | Configuration access from a boundary-scannable device |
US7500162B2 (en) * | 2005-06-02 | 2009-03-03 | Cpu Technology, Inc. | Sourcing internal signals to output pins of an integrated circuit through sequential multiplexing |
US7747933B2 (en) * | 2005-07-21 | 2010-06-29 | Micron Technology, Inc. | Method and apparatus for detecting communication errors on a bus |
US7406642B1 (en) * | 2005-10-03 | 2008-07-29 | Altera Corporation | Techniques for capturing signals at output pins in a programmable logic integrated circuit |
KR100707297B1 (ko) | 2005-12-01 | 2007-04-12 | (주)알파칩스 | 시스템 버스를 이용한 제이티에이지 테스트 장치 |
US7913220B2 (en) * | 2006-12-04 | 2011-03-22 | Fujitsu Limited | Coordinated-design supporting apparatus, coordinated-design supporting method, computer product, and printed-circuit-board manufacturing method |
EP1930823A3 (de) * | 2006-12-04 | 2011-06-08 | Fujitsu Limited | Vorrichtung zur Unterstutzung von Schaltungsentwurf, Verfahren zur Unterstutzung von Schaltungsentwurf, Computerprogramm und Herstellungsverfahren für einen gedruckten Schaltkreis |
US8176457B2 (en) * | 2006-12-04 | 2012-05-08 | Fujitsu Limited | Apparatus and method updating diagram of circuit based on pin swap performed in package design with respect to PLD |
US8255844B2 (en) * | 2006-12-04 | 2012-08-28 | Fujitsu Limited | Coordinated-design supporting apparatus, coordinated-design supporting method, computer product, printed-circuit-board manufacturing method, circuit-design supporting apparatus, circuit-design supporting method, computer product, and printed-circuit-board manufacturing method |
EP1930825A3 (de) * | 2006-12-04 | 2011-06-29 | Fujitsu Limited | Vorrichtung zur Unterstützung von Schaltungsentwurf, Verfahren zur Unterstützung von Schaltungsentwurf, Computerprogramm und Herstellungsverfahren für einen gedruckten Schaltkreis |
JP2008310792A (ja) * | 2007-05-11 | 2008-12-25 | Nec Electronics Corp | テスト回路 |
US9164945B2 (en) * | 2008-12-01 | 2015-10-20 | Micron Technology, Inc. | Devices, systems, and methods to synchronize parallel processing of a single data stream |
US8224611B2 (en) * | 2009-03-11 | 2012-07-17 | Kavlico Corporation | One pin calibration assembly and method for sensors |
US7884644B1 (en) | 2010-02-21 | 2011-02-08 | Altera Corporation | Techniques for adjusting level shifted signals |
US9450585B2 (en) | 2011-04-20 | 2016-09-20 | Microchip Technology Incorporated | Selecting four signals from sixteen inputs |
US20120268162A1 (en) * | 2011-04-21 | 2012-10-25 | Microchip Technology Incorporated | Configurable logic cells |
US8719957B2 (en) | 2011-04-29 | 2014-05-06 | Altera Corporation | Systems and methods for detecting and mitigating programmable logic device tampering |
US8461863B2 (en) | 2011-04-29 | 2013-06-11 | Altera Corporation | Method and apparatus for securing a programmable device using a kill switch |
US8736299B1 (en) | 2011-04-29 | 2014-05-27 | Altera Corporation | Setting security features of programmable logic devices |
US8862798B1 (en) | 2011-12-02 | 2014-10-14 | Altera Corporation | Fast parallel-to-serial memory data transfer system and method |
US9357649B2 (en) | 2012-05-08 | 2016-05-31 | Inernational Business Machines Corporation | 276-pin buffered memory card with enhanced memory system interconnect |
US9519315B2 (en) | 2013-03-12 | 2016-12-13 | International Business Machines Corporation | 276-pin buffered memory card with enhanced memory system interconnect |
CN104425037B (zh) | 2013-08-19 | 2019-07-12 | 恩智浦美国有限公司 | 可重配置电路及其解码器 |
JP5845328B2 (ja) * | 2014-09-19 | 2016-01-20 | スパンション エルエルシー | 電圧レギュレータを有する集積回路装置 |
CN105988075B (zh) | 2015-02-17 | 2019-12-20 | 恩智浦美国有限公司 | 用于扫描测试的增强状态监视器 |
KR20180041319A (ko) * | 2016-10-14 | 2018-04-24 | 엘에스산전 주식회사 | 펄스 신호 인식 장치 |
US10902933B2 (en) | 2018-08-31 | 2021-01-26 | Nvidia Corporation | Test system for executing built-in self-test in deployment for automotive applications |
US11935637B2 (en) | 2019-09-27 | 2024-03-19 | Insulet Corporation | Onboarding and total daily insulin adaptivity |
CN112711284B (zh) * | 2019-10-25 | 2024-03-26 | 马克西姆综合产品公司 | 包括多用途引脚的电压调节系统、智能引脚管理器和方法 |
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US3783254A (en) | 1972-10-16 | 1974-01-01 | Ibm | Level sensitive logic system |
US3761695A (en) | 1972-10-16 | 1973-09-25 | Ibm | Method of level sensitive testing a functional logic system |
US3806891A (en) | 1972-12-26 | 1974-04-23 | Ibm | Logic circuit for scan-in/scan-out |
US4488259A (en) | 1982-10-29 | 1984-12-11 | Ibm Corporation | On chip monitor |
JPS59161744A (ja) | 1983-03-04 | 1984-09-12 | Hitachi Ltd | 情報処理装置のスキヤン方式 |
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US5644496A (en) | 1989-08-15 | 1997-07-01 | Advanced Micro Devices, Inc. | Programmable logic device with internal time-constant multiplexing of signals from external interconnect buses |
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FR2753274B1 (fr) | 1996-09-10 | 1998-11-27 | Sgs Thomson Microelectronics | Circuit comprenant des moyens de test structurel sans plot de test dedie au test |
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US6134707A (en) * | 1996-11-14 | 2000-10-17 | Altera Corporation | Apparatus and method for in-system programming of integrated circuits containing programmable elements |
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US5991908A (en) * | 1997-09-29 | 1999-11-23 | Xilinx, Inc. | Boundary scan chain with dedicated programmable routing |
-
1998
- 1998-06-09 US US09/094,186 patent/US6421812B1/en not_active Expired - Lifetime
- 1998-06-09 US US09/094,226 patent/US6314550B1/en not_active Expired - Lifetime
- 1998-06-09 JP JP10160240A patent/JPH1172541A/ja not_active Withdrawn
- 1998-06-10 DE DE69831900T patent/DE69831900T2/de not_active Expired - Lifetime
- 1998-06-10 EP EP98304614A patent/EP0884599B1/de not_active Expired - Lifetime
-
2002
- 2002-06-19 US US10/175,980 patent/US6681378B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0884599B1 (de) | 2005-10-19 |
EP0884599A1 (de) | 1998-12-16 |
DE69831900T2 (de) | 2006-05-24 |
JPH1172541A (ja) | 1999-03-16 |
US6681378B2 (en) | 2004-01-20 |
US6314550B1 (en) | 2001-11-06 |
US20020157078A1 (en) | 2002-10-24 |
US6421812B1 (en) | 2002-07-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |