DE69912072D1 - Verfahren zur schnellen automatischen spektralen anpassung - Google Patents

Verfahren zur schnellen automatischen spektralen anpassung

Info

Publication number
DE69912072D1
DE69912072D1 DE69912072T DE69912072T DE69912072D1 DE 69912072 D1 DE69912072 D1 DE 69912072D1 DE 69912072 T DE69912072 T DE 69912072T DE 69912072 T DE69912072 T DE 69912072T DE 69912072 D1 DE69912072 D1 DE 69912072D1
Authority
DE
Germany
Prior art keywords
quick automatic
spectral adjustment
automatic spectral
adjustment
quick
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69912072T
Other languages
English (en)
Other versions
DE69912072T2 (de
Inventor
Christopher Webb
V Wilson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Inc
Original Assignee
Varian Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Inc filed Critical Varian Inc
Application granted granted Critical
Publication of DE69912072D1 publication Critical patent/DE69912072D1/de
Publication of DE69912072T2 publication Critical patent/DE69912072T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J2003/283Investigating the spectrum computer-interfaced
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J2003/2866Markers; Calibrating of scan
DE69912072T 1998-06-12 1999-04-28 Verfahren zur schnellen automatischen spektralen anpassung Expired - Lifetime DE69912072T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US8914898P 1998-06-12 1998-06-12
US89148P 1998-06-12
US158648 1998-09-22
US09/158,648 US6137104A (en) 1998-06-12 1998-09-22 Fast automated spectral fitting method
PCT/US1999/009193 WO1999064829A1 (en) 1998-06-12 1999-04-28 Fast automated spectral fitting method

Publications (2)

Publication Number Publication Date
DE69912072D1 true DE69912072D1 (de) 2003-11-20
DE69912072T2 DE69912072T2 (de) 2004-06-24

Family

ID=26780291

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69912072T Expired - Lifetime DE69912072T2 (de) 1998-06-12 1999-04-28 Verfahren zur schnellen automatischen spektralen anpassung

Country Status (7)

Country Link
US (1) US6137104A (de)
EP (1) EP1004005B1 (de)
JP (1) JP4372352B2 (de)
KR (1) KR20010022815A (de)
AU (1) AU742485B2 (de)
DE (1) DE69912072T2 (de)
WO (1) WO1999064829A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2678513B1 (fr) * 1991-07-03 1995-06-30 Laboratoires Hygiene Dietetique Pansement cicatrisant.
US6714663B1 (en) * 1999-11-09 2004-03-30 Lockheed Martin Corp. Method and software-implemented apparatus for ground plane estimation in multi-dimensional data
US6687630B2 (en) * 2001-06-29 2004-02-03 Teradyne, Inc. Low leakage technique for determining power spectra of non-coherently sampled data
TWI246725B (en) * 2002-10-31 2006-01-01 Tokyo Electron Ltd Method and apparatus for detecting endpoint
US7127372B2 (en) * 2005-02-24 2006-10-24 Itt Manufacturing Enterprises, Inc. Retro-regression residual remediation for spectral/signal identification
DE102006000805B4 (de) * 2006-01-03 2016-09-01 Spectro Analytical Instruments Gmbh & Co. Kg Verfahren zur Korrektur von spektralen Störungen in der ICP Emissionsspektroskopie (OES)
US7400398B2 (en) 2006-05-09 2008-07-15 Environmental Systems Products Holdings Inc. Remote emissions sensing system and method incorporating spectral matching by data interpolation
AU2008355778B2 (en) * 2008-04-28 2015-02-12 Agency For Science, Technology And Research (A*Star) A method and system for concentration detection
US8090558B1 (en) * 2008-06-09 2012-01-03 Kla-Tencor Corporation Optical parametric model optimization
CN104048927B (zh) * 2014-06-27 2016-05-25 上海理工大学 检测苹果可溶性固体含量的方法
JP6476040B2 (ja) * 2015-03-31 2019-02-27 株式会社日立ハイテクサイエンス シーケンシャル型icp発光分光分析装置および測定波長補正方法
CN105954263A (zh) * 2016-07-12 2016-09-21 湖南永清环保研究院有限责任公司 干扰系数法测定锰片中铅含量方法
GB201817028D0 (en) * 2018-10-19 2018-12-05 Renishaw Plc Spectroscopic apparatus and methods
WO2023116481A1 (en) * 2021-12-21 2023-06-29 Thermo Fisher Scientific (Bremen) Gmbh Peak position measurement offset in a two-dimensional optical spectrum
CN116661138A (zh) * 2023-06-09 2023-08-29 中国科学院长春光学精密机械与物理研究所 一种光栅光谱仪的光学设计方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5784162A (en) * 1993-08-18 1998-07-21 Applied Spectral Imaging Ltd. Spectral bio-imaging methods for biological research, medical diagnostics and therapy
US5251006A (en) * 1991-03-07 1993-10-05 Nirsystems Incorporated Automatic spectrophotometer calibration system
EP0535700B1 (de) * 1991-10-04 1997-03-26 The Perkin-Elmer Corporation Verfahren und Gerät zur Spektrenvergleichung
US5303165A (en) * 1992-02-12 1994-04-12 The Perkin-Elmer Corporation Standardizing and calibrating a spectrometric instrument
US5596407A (en) * 1995-06-07 1997-01-21 Varian Associates, Inc Optical detector for echelle spectrometer

Also Published As

Publication number Publication date
WO1999064829A1 (en) 1999-12-16
DE69912072T2 (de) 2004-06-24
US6137104A (en) 2000-10-24
EP1004005A1 (de) 2000-05-31
JP4372352B2 (ja) 2009-11-25
AU3668699A (en) 1999-12-30
KR20010022815A (ko) 2001-03-26
JP2002517746A (ja) 2002-06-18
EP1004005B1 (de) 2003-10-15
AU742485B2 (en) 2002-01-03

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