DE69923288D1 - Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger - Google Patents

Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger

Info

Publication number
DE69923288D1
DE69923288D1 DE69923288T DE69923288T DE69923288D1 DE 69923288 D1 DE69923288 D1 DE 69923288D1 DE 69923288 T DE69923288 T DE 69923288T DE 69923288 T DE69923288 T DE 69923288T DE 69923288 D1 DE69923288 D1 DE 69923288D1
Authority
DE
Germany
Prior art keywords
module
test device
testing
contactless communication
data carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69923288T
Other languages
English (en)
Other versions
DE69923288T2 (de
Inventor
Andreas Muehlberger
Johann Vorreiter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE69923288D1 publication Critical patent/DE69923288D1/de
Publication of DE69923288T2 publication Critical patent/DE69923288T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/0095—Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
DE69923288T 1998-08-21 1999-08-05 Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger Expired - Lifetime DE69923288T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP98890248 1998-08-21
EP98890248 1998-08-21
PCT/EP1999/005774 WO2000011485A1 (en) 1998-08-21 1999-08-05 Test device for testing a module for a data carrier intended for contactless communication

Publications (2)

Publication Number Publication Date
DE69923288D1 true DE69923288D1 (de) 2005-02-24
DE69923288T2 DE69923288T2 (de) 2005-12-01

Family

ID=8237190

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69923288T Expired - Lifetime DE69923288T2 (de) 1998-08-21 1999-08-05 Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger

Country Status (6)

Country Link
US (1) US6275043B1 (de)
EP (1) EP1047947B1 (de)
JP (1) JP4306966B2 (de)
AT (1) ATE287543T1 (de)
DE (1) DE69923288T2 (de)
WO (1) WO2000011485A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1116157A1 (de) 1999-08-04 2001-07-18 Koninklijke Philips Electronics N.V. Kommunikationsgerät und transponder
JP2003535342A (ja) 2000-05-29 2003-11-25 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 試験動作結果を示す表示手段を有するデータキャリアモジュール
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
US6724205B1 (en) * 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7028529B2 (en) * 2003-04-28 2006-04-18 Sonora Medical Systems, Inc. Apparatus and methods for testing acoustic probes and systems
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
JP2007517231A (ja) 2003-12-24 2007-06-28 カスケード マイクロテック インコーポレイテッド アクティブ・ウェハプローブ
WO2006031646A2 (en) 2004-09-13 2006-03-23 Cascade Microtech, Inc. Double sided probing structures
US7164353B2 (en) * 2004-12-22 2007-01-16 Avery Dennison Corporation Method and system for testing RFID devices
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
DE202007018733U1 (de) * 2006-06-09 2009-03-26 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
CN105592492B (zh) * 2015-12-18 2019-02-26 重庆邮电大学 高层协议栈一致性测试平台及测试方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619066A (en) * 1990-05-15 1997-04-08 Dallas Semiconductor Corporation Memory for an electronic token
AT395224B (de) 1990-08-23 1992-10-27 Mikron Ges Fuer Integrierte Mi Kontaktloses, induktives datenuebertragungssystem
JPH05129994A (ja) * 1991-11-01 1993-05-25 Matsushita Electric Ind Co Ltd 電磁誘導交信試験装置
DE19601511C1 (de) * 1996-01-17 1997-08-21 Pronet Netzwerkloesungen Fuer Verfahren und Vorrichtung zum Parametrieren einer Datenträgerleseeinrichtung
KR100489716B1 (ko) * 1996-11-05 2005-09-12 코닌클리케 필립스 일렉트로닉스 엔.브이. 동기식복조기를갖는비접촉식데이터송수신장치
EP0845751B1 (de) 1996-12-02 2004-01-02 Texas Instruments Deutschland Gmbh Transpondersystem
EP0910899B1 (de) * 1997-01-21 2005-04-20 Koninklijke Philips Electronics N.V. Transponderkommunikationseinrichtung
DE69831711T2 (de) * 1997-01-21 2006-06-29 Koninklijke Philips Electronics N.V. Transpondernachrichtenübertragungsgerät

Also Published As

Publication number Publication date
DE69923288T2 (de) 2005-12-01
US6275043B1 (en) 2001-08-14
ATE287543T1 (de) 2005-02-15
WO2000011485A1 (en) 2000-03-02
EP1047947A1 (de) 2000-11-02
JP4306966B2 (ja) 2009-08-05
EP1047947B1 (de) 2005-01-19
JP2002523940A (ja) 2002-07-30

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Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN

8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL