DE69936914D1 - Verfahren zur automatischen inspektion optisch transparenter planarer gegenstände - Google Patents

Verfahren zur automatischen inspektion optisch transparenter planarer gegenstände

Info

Publication number
DE69936914D1
DE69936914D1 DE69936914T DE69936914T DE69936914D1 DE 69936914 D1 DE69936914 D1 DE 69936914D1 DE 69936914 T DE69936914 T DE 69936914T DE 69936914 T DE69936914 T DE 69936914T DE 69936914 D1 DE69936914 D1 DE 69936914D1
Authority
DE
Germany
Prior art keywords
opaque
clear
optically transparent
straddled
automatic inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69936914T
Other languages
English (en)
Inventor
Peter Winston Sites
Anthony Scott Nelms
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Northrop Grumman Corp
Original Assignee
Northrop Grumman Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Northrop Grumman Corp filed Critical Northrop Grumman Corp
Application granted granted Critical
Publication of DE69936914D1 publication Critical patent/DE69936914D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
DE69936914T 1998-04-06 1999-04-05 Verfahren zur automatischen inspektion optisch transparenter planarer gegenstände Expired - Lifetime DE69936914D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/055,536 US6011620A (en) 1998-04-06 1998-04-06 Method and apparatus for the automatic inspection of optically transmissive planar objects
PCT/US1999/007423 WO1999051971A1 (en) 1998-04-06 1999-04-05 Method and apparatus for the automatic inspection of optically transmissive planar objects

Publications (1)

Publication Number Publication Date
DE69936914D1 true DE69936914D1 (de) 2007-10-04

Family

ID=21998505

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69936914T Expired - Lifetime DE69936914D1 (de) 1998-04-06 1999-04-05 Verfahren zur automatischen inspektion optisch transparenter planarer gegenstände

Country Status (5)

Country Link
US (1) US6011620A (de)
EP (1) EP1070243B1 (de)
AT (1) ATE371185T1 (de)
DE (1) DE69936914D1 (de)
WO (1) WO1999051971A1 (de)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000003198A1 (en) * 1998-07-08 2000-01-20 Ppt Vision, Inc. Machine vision and semiconductor handling
US6956963B2 (en) * 1998-07-08 2005-10-18 Ismeca Europe Semiconductor Sa Imaging for a machine-vision system
US7353954B1 (en) * 1998-07-08 2008-04-08 Charles A. Lemaire Tray flipper and method for parts inspection
JP3330089B2 (ja) * 1998-09-30 2002-09-30 株式会社大協精工 ゴム製品の検査方法及び装置
CA2252308C (en) 1998-10-30 2005-01-04 Image Processing Systems, Inc. Glass inspection system
SE514090C2 (sv) * 1999-04-12 2000-12-18 Photonic Systems Ab Förfarande och system för detektering av föroreningar i ett transparent material
US6788411B1 (en) * 1999-07-08 2004-09-07 Ppt Vision, Inc. Method and apparatus for adjusting illumination angle
US6633377B1 (en) * 2000-04-20 2003-10-14 Image Processing Systems Inc. Dark view inspection system for transparent media
US6501546B1 (en) 2000-05-05 2002-12-31 Photon Dynamics Canada Inc. Inspection system for edges of glass
US6501554B1 (en) 2000-06-20 2002-12-31 Ppt Vision, Inc. 3D scanner and method for measuring heights and angles of manufactured parts
US6512239B1 (en) 2000-06-27 2003-01-28 Photon Dynamics Canada Inc. Stereo vision inspection system for transparent media
SE520095C2 (sv) * 2000-09-28 2003-05-27 Semyre Photonic Systems Ab Luftkyld kylvalsanordning för avsyningsutrustning
JP4073646B2 (ja) * 2001-06-28 2008-04-09 富士フイルム株式会社 シート体検査装置および方法
US6532064B1 (en) * 2001-10-16 2003-03-11 Baader-Canpolar Inc. Automatic inspection apparatus and method for simultaneous detection of anomalies in a 3-dimensional translucent object
US6909502B2 (en) * 2001-12-27 2005-06-21 General Electric Method and apparatus for measuring ripple and distortion in a transparent material
US7142295B2 (en) * 2003-03-05 2006-11-28 Corning Incorporated Inspection of transparent substrates for defects
WO2005013209A2 (en) * 2003-08-01 2005-02-10 Cummins-Allison Corp. Currency processing device and method
US20050211500A1 (en) * 2004-03-26 2005-09-29 Wendt Alan C Fibrous faced ceiling panel
EP1598662A1 (de) * 2004-05-17 2005-11-23 Total Petrochemicals Research Feluy Verfahren zur Quantifizierung der optischen Eigenschaften von Kunststoff Formteile
GB2415776B (en) * 2004-06-28 2009-01-28 Carglass Luxembourg Sarl Zug Investigation of vehicle glazing panels
US7339664B2 (en) 2004-09-29 2008-03-04 General Electric Company System and method for inspecting a light-management film and method of making the light-management film
US20060092276A1 (en) * 2004-10-28 2006-05-04 Ariglio James A Inspection system and method for identifying surface and body defects in a glass sheet
JP4628824B2 (ja) * 2005-03-10 2011-02-09 富士フイルム株式会社 フイルムの欠陥検査装置及びフイルムの製造方法
EP1886257A1 (de) * 2005-05-11 2008-02-13 Optosecurity Inc. Verfahren und system zum prüfen von gepäckstücken, frachtcontainern oder personen
US20070041613A1 (en) * 2005-05-11 2007-02-22 Luc Perron Database of target objects suitable for use in screening receptacles or people and method and apparatus for generating same
US7991242B2 (en) 2005-05-11 2011-08-02 Optosecurity Inc. Apparatus, method and system for screening receptacles and persons, having image distortion correction functionality
US7899232B2 (en) * 2006-05-11 2011-03-01 Optosecurity Inc. Method and apparatus for providing threat image projection (TIP) in a luggage screening system, and luggage screening system implementing same
US8494210B2 (en) * 2007-03-30 2013-07-23 Optosecurity Inc. User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
EP2126552A4 (de) * 2007-02-16 2016-04-20 3M Innovative Properties Co Verfahren und vorrichtung für die beleuchtung von material zur automatischen inspektion
CN101576492A (zh) * 2008-05-09 2009-11-11 鸿富锦精密工业（深圳）有限公司 镀膜基片检测装置及镀膜基片检测方法
KR102067367B1 (ko) 2011-09-07 2020-02-11 라피스캔 시스템스, 인코포레이티드 적하목록 데이터를 이미징/검출 프로세싱에 통합시킨 x-선 검사 방법
CN103257467B (zh) * 2013-05-10 2017-02-08 京东方科技集团股份有限公司 一种液晶显示器模组检测装置
JP2017502295A (ja) * 2013-12-23 2017-01-19 コーニング インコーポレイテッド 非イメージングコヒーレントラインスキャナシステムおよび光学検査方法
US10126247B2 (en) 2015-07-30 2018-11-13 Zeon Chemicals L.P. Rubber crumb inspection system
US10210625B2 (en) * 2015-10-30 2019-02-19 Industrial Technology Research Institute Measurement system comprising angle adjustment module
EP3420563A4 (de) 2016-02-22 2020-03-11 Rapiscan Systems, Inc. Systeme und verfahren zum erkennen von bedrohungen und schmuggelware in ladungen
KR102499831B1 (ko) * 2016-05-23 2023-02-14 코닝 인코포레이티드 글라스 시트의 무중력 형상 예측 방법 및 무중력 형상 기반 글라스 시트 품질 관리 방법
JP6389977B1 (ja) * 2018-06-05 2018-09-12 株式会社ヒューテック 欠陥検査装置
CN114212482A (zh) * 2021-12-08 2022-03-22 天津福莱迪科技发展有限公司 一种集成下光源与透明皮带的精准定位装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3492490A (en) * 1966-12-19 1970-01-27 Transmarine Corp Integrator circuit for security validation
FR2500630A1 (fr) * 1981-02-25 1982-08-27 Leser Jacques Procede pour la recherche des defauts des feuilles de verre et dispositif mettant en oeuvre ce procede
JPS5867093A (ja) * 1981-10-19 1983-04-21 株式会社東芝 印刷回路基板検査方法及びその装置
DE3880700D1 (de) * 1987-02-04 1993-06-09 Hoefliger Harro Verpackung Verfahren und vorrichtung zum feststellen von fremdkoerpern in fluiden.
JPH0627717B2 (ja) * 1988-04-13 1994-04-13 株式会社キリンテクノシステム 壜の胴部検査装置
EP0344617B1 (de) * 1988-05-30 1995-08-02 Kabushiki Kaisha Kirin Techno System Verfahren und Vorrichtung zur Prüfung der Seitenwände von Flaschen
DE3937559A1 (de) * 1989-09-02 1991-03-14 Flachglas Ag Verfahren zum ermitteln von optischen fehlern in scheiben aus einem transparenten material, insbesondere aus glas
FR2668599B1 (fr) * 1990-10-31 1992-12-31 Saint Gobain Vitrage Int Procede et dispositif de mesure de la qualite optique d'un vitrage.
FR2688310A1 (fr) * 1992-03-03 1993-09-10 Saint Gobain Vitrage Int Procede et dispositif de controle de la transparence d'un vitrage feuillete.
US5243400A (en) * 1992-04-27 1993-09-07 Owens-Brockway Glass Container Inc. Inspection of transparent containers
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3178644B2 (ja) * 1995-02-10 2001-06-25 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3003562B2 (ja) * 1995-04-25 2000-01-31 関西日本電気株式会社 蛍光面検査装置
DE19643017C1 (de) * 1996-10-18 1998-04-23 Innomess Ges Fuer Messtechnik Verfahren für die Ermittlung von optischen Fehlern in großflächigen Scheiben
US5715051A (en) * 1996-10-21 1998-02-03 Medar, Inc. Method and system for detecting defects in optically transmissive coatings formed on optical media substrates

Also Published As

Publication number Publication date
EP1070243A1 (de) 2001-01-24
US6011620A (en) 2000-01-04
EP1070243B1 (de) 2007-08-22
ATE371185T1 (de) 2007-09-15
WO1999051971A1 (en) 1999-10-14

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