DE69942020D1 - Plasmabehandlungsgerät - Google Patents
PlasmabehandlungsgerätInfo
- Publication number
- DE69942020D1 DE69942020D1 DE69942020T DE69942020T DE69942020D1 DE 69942020 D1 DE69942020 D1 DE 69942020D1 DE 69942020 T DE69942020 T DE 69942020T DE 69942020 T DE69942020 T DE 69942020T DE 69942020 D1 DE69942020 D1 DE 69942020D1
- Authority
- DE
- Germany
- Prior art keywords
- chamber
- gas
- plasma
- treatment device
- plasma treatment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000009832 plasma treatment Methods 0.000 title 1
- 230000008021 deposition Effects 0.000 abstract 2
- 230000004907 flux Effects 0.000 abstract 1
- 230000007935 neutral effect Effects 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3266—Magnetic control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/334—Etching
- H01J2237/3343—Problems associated with etching
- H01J2237/3348—Problems associated with etching control of ion bombardment energy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
- H01L21/30655—Plasma etching; Reactive-ion etching comprising alternated and repeated etching and passivation steps, e.g. Bosch process
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9827196.8A GB9827196D0 (en) | 1998-12-11 | 1998-12-11 | Plasma processing apparatus |
GBGB9901869.9A GB9901869D0 (en) | 1999-01-29 | 1999-01-29 | Plasma processing apparatus |
GBGB9908459.2A GB9908459D0 (en) | 1999-04-14 | 1999-04-14 | Plasma processing apparatus |
PCT/GB1999/004168 WO2000036631A1 (en) | 1998-12-11 | 1999-12-10 | Plasma processing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69942020D1 true DE69942020D1 (de) | 2010-04-01 |
Family
ID=27269583
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69942020T Expired - Lifetime DE69942020D1 (de) | 1998-12-11 | 1999-12-10 | Plasmabehandlungsgerät |
Country Status (7)
Country | Link |
---|---|
US (1) | US7491649B2 (de) |
EP (1) | EP1055250B1 (de) |
JP (1) | JP4714309B2 (de) |
KR (2) | KR100829288B1 (de) |
AT (1) | ATE458261T1 (de) |
DE (1) | DE69942020D1 (de) |
WO (1) | WO2000036631A1 (de) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE69942020D1 (de) | 1998-12-11 | 2010-04-01 | Surface Technology Systems Plc | Plasmabehandlungsgerät |
DE19933841A1 (de) * | 1999-07-20 | 2001-02-01 | Bosch Gmbh Robert | Vorrichtung und Verfahren zum Ätzen eines Substrates mittels eines induktiv gekoppelten Plasmas |
DE10024883A1 (de) | 2000-05-19 | 2001-11-29 | Bosch Gmbh Robert | Plasmaätzanlage |
GB0100958D0 (en) * | 2001-01-13 | 2001-02-28 | Surface Technology Systems Ltd | Plasma processing apparatus |
DE10209763A1 (de) * | 2002-03-05 | 2003-10-02 | Bosch Gmbh Robert | Vorrichtung und Verfahren zum anisotropen Plasmaätzen eines Substrates, insbesondere eines Siliziumkörpers |
US6846747B2 (en) * | 2002-04-09 | 2005-01-25 | Unaxis Usa Inc. | Method for etching vias |
US6876154B2 (en) | 2002-04-24 | 2005-04-05 | Trikon Holdings Limited | Plasma processing apparatus |
US6905626B2 (en) * | 2002-07-24 | 2005-06-14 | Unaxis Usa Inc. | Notch-free etching of high aspect SOI structures using alternating deposition and etching and pulsed plasma |
GB2396053B (en) * | 2002-10-23 | 2006-03-29 | Bosch Gmbh Robert | Device and process for anisotropic plasma etching of a substrate,in particular a silicon body |
DE112005001429T5 (de) * | 2004-06-18 | 2007-04-26 | Innovalight, Inc., St. Paul | Verfahren und Vorrichtung zum Bilden von Nanopartikeln unter Verwendung von Hochfrequenzplasmen |
JP2009545101A (ja) * | 2006-07-20 | 2009-12-17 | アビザ テクノロジー リミティド | プラズマ源 |
WO2008009898A1 (en) | 2006-07-20 | 2008-01-24 | Aviza Technology Limited | Ion sources |
EP2044609B1 (de) | 2006-07-20 | 2011-01-12 | SPP Process Technology Systems UK Limited | Ionenabscheidungsvorrichtung |
US7309646B1 (en) | 2006-10-10 | 2007-12-18 | Lam Research Corporation | De-fluoridation process |
JP4855506B2 (ja) * | 2009-09-15 | 2012-01-18 | 住友精密工業株式会社 | プラズマエッチング装置 |
US20110177694A1 (en) * | 2010-01-15 | 2011-07-21 | Tokyo Electron Limited | Switchable Neutral Beam Source |
US8802545B2 (en) * | 2011-03-14 | 2014-08-12 | Plasma-Therm Llc | Method and apparatus for plasma dicing a semi-conductor wafer |
FR2984594A1 (fr) | 2011-12-20 | 2013-06-21 | St Microelectronics Crolles 2 | Procede de realisation d'une tranchee profonde dans un substrat de composant microelectronique |
US9484214B2 (en) * | 2014-02-19 | 2016-11-01 | Lam Research Corporation | Systems and methods for improving wafer etch non-uniformity when using transformer-coupled plasma |
KR102203973B1 (ko) | 2014-04-01 | 2021-01-18 | 에베 그룹 에. 탈너 게엠베하 | 기질의 표면 처리를 위한 방법 및 장치 |
KR102465801B1 (ko) * | 2015-05-22 | 2022-11-14 | 주식회사 히타치하이테크 | 플라스마 처리 장치 및 그것을 이용한 플라스마 처리 방법 |
KR102334378B1 (ko) * | 2015-09-23 | 2021-12-02 | 삼성전자 주식회사 | 유전체 윈도우, 그 윈도우를 포함한 플라즈마 공정 시스템, 및 그 시스템을 이용한 반도체 소자 제조방법 |
DE102018114159A1 (de) | 2018-06-13 | 2019-12-19 | Nippon Kornmeyer Carbon Group Gmbh | Plasmaboot zur Aufnahme von Wafern mit regulierter Plasmaabscheidung |
US10714329B2 (en) * | 2018-09-28 | 2020-07-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Pre-clean for contacts |
Family Cites Families (63)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS601952B2 (ja) * | 1980-01-25 | 1985-01-18 | 三菱電機株式会社 | プラズマエツチング装置 |
GB2105729B (en) | 1981-09-15 | 1985-06-12 | Itt Ind Ltd | Surface processing of a substrate material |
DE3272669D1 (en) * | 1982-03-18 | 1986-09-25 | Ibm Deutschland | Plasma-reactor and its use in etching and coating substrates |
JPH0770509B2 (ja) | 1982-10-08 | 1995-07-31 | 株式会社日立製作所 | ドライプロセス装置 |
JPS6139521A (ja) * | 1984-03-28 | 1986-02-25 | Anelva Corp | プラズマ表面処理装置 |
CA1260365A (en) | 1985-05-06 | 1989-09-26 | Lee Chen | Anisotropic silicon etching in fluorinated plasma |
DE3615361C2 (de) | 1986-05-06 | 1994-09-01 | Santos Pereira Ribeiro Car Dos | Vorrichtung zur Oberflächenbehandlung von Werkstücken |
KR900007687B1 (ko) | 1986-10-17 | 1990-10-18 | 가부시기가이샤 히다찌세이사꾸쇼 | 플라즈마처리방법 및 장치 |
JP2631650B2 (ja) * | 1986-12-05 | 1997-07-16 | アネルバ株式会社 | 真空装置 |
US4740267A (en) * | 1987-02-20 | 1988-04-26 | Hughes Aircraft Company | Energy intensive surface reactions using a cluster beam |
US4740268A (en) * | 1987-05-04 | 1988-04-26 | Motorola Inc. | Magnetically enhanced plasma system |
JPH01283020A (ja) | 1988-05-06 | 1989-11-14 | Toshiba Corp | 超電導機器 |
JPH01238020A (ja) * | 1988-03-18 | 1989-09-22 | Hitachi Ltd | プラズマ処理装置、及びその処理システム |
JPH0227718A (ja) | 1988-07-15 | 1990-01-30 | Mitsubishi Electric Corp | プラズマ処理方法およびそれに用いるプラズマ処理装置 |
JP2918892B2 (ja) | 1988-10-14 | 1999-07-12 | 株式会社日立製作所 | プラズマエッチング処理方法 |
JPH02118055A (ja) | 1988-10-26 | 1990-05-02 | Victor Co Of Japan Ltd | 磁気ヘッド用磁性合金 |
US4943345A (en) | 1989-03-23 | 1990-07-24 | Board Of Trustees Operating Michigan State University | Plasma reactor apparatus and method for treating a substrate |
US5556501A (en) | 1989-10-03 | 1996-09-17 | Applied Materials, Inc. | Silicon scavenger in an inductively coupled RF plasma reactor |
JP2573702B2 (ja) * | 1989-12-19 | 1997-01-22 | 三菱電機株式会社 | プラズマエッチング装置 |
JPH03229859A (ja) * | 1990-02-05 | 1991-10-11 | Nippon Steel Corp | プラズマ処理装置 |
JPH0775226B2 (ja) | 1990-04-10 | 1995-08-09 | インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン | プラズマ処理方法及び装置 |
US6545420B1 (en) * | 1990-07-31 | 2003-04-08 | Applied Materials, Inc. | Plasma reactor using inductive RF coupling, and processes |
JPH04240725A (ja) * | 1991-01-24 | 1992-08-28 | Sumitomo Electric Ind Ltd | エッチング方法 |
JPH04253328A (ja) | 1991-01-29 | 1992-09-09 | Hitachi Ltd | 表面処理装置 |
DE4118973C2 (de) | 1991-06-08 | 1999-02-04 | Fraunhofer Ges Forschung | Vorrichtung zur plasmaunterstützten Bearbeitung von Substraten und Verwendung dieser Vorrichtung |
JPH05326452A (ja) * | 1991-06-10 | 1993-12-10 | Kawasaki Steel Corp | プラズマ処理装置及び方法 |
JPH0562796A (ja) | 1991-09-04 | 1993-03-12 | Sumitomo Metal Ind Ltd | マイクロ波プラズマ装置 |
US5368685A (en) * | 1992-03-24 | 1994-11-29 | Hitachi, Ltd. | Dry etching apparatus and method |
JP3084497B2 (ja) * | 1992-03-25 | 2000-09-04 | 東京エレクトロン株式会社 | SiO2膜のエッチング方法 |
US5333655A (en) | 1992-09-15 | 1994-08-02 | Nuovopignone Industrie Meccaniche E Fonderia Spa | System for effective vapor recovery without seal members in fuel filling installations |
US5318806A (en) * | 1992-10-02 | 1994-06-07 | Becton, Dickinson And Company | Tube having regions of different surface chemistry and method therefor |
JP3217875B2 (ja) * | 1992-11-05 | 2001-10-15 | 株式会社日立製作所 | エッチング装置 |
DE4241045C1 (de) | 1992-12-05 | 1994-05-26 | Bosch Gmbh Robert | Verfahren zum anisotropen Ätzen von Silicium |
JP3234321B2 (ja) | 1993-01-11 | 2001-12-04 | 三菱電機株式会社 | プラズマ反応装置の使用方法と基板のプラズマ処理方法とその処理法を利用した半導体装置の製造方法 |
KR940023322A (ko) | 1993-03-17 | 1994-10-22 | 가나이 쯔도무 | 마이크로파 플라즈마 처리장치 |
US5421934A (en) * | 1993-03-26 | 1995-06-06 | Matsushita Electric Industrial Co., Ltd. | Dry-etching process simulator |
JP3327618B2 (ja) | 1993-03-29 | 2002-09-24 | アネルバ株式会社 | プラズマ処理装置 |
US5391281A (en) | 1993-04-09 | 1995-02-21 | Materials Research Corp. | Plasma shaping plug for control of sputter etching |
JP3172788B2 (ja) * | 1993-05-14 | 2001-06-04 | 日本電信電話株式会社 | 中性粒子加工方法およびその装置 |
JPH07169746A (ja) | 1993-12-14 | 1995-07-04 | Ebara Corp | 低エネルギー中性粒子線を用いた微細加工装置 |
JPH07221079A (ja) | 1994-01-31 | 1995-08-18 | Sony Corp | プラズマ装置およびこれを用いたドライエッチング方法 |
JP3365067B2 (ja) | 1994-02-10 | 2003-01-08 | ソニー株式会社 | プラズマ装置およびこれを用いたプラズマ処理方法 |
US5783100A (en) | 1994-03-16 | 1998-07-21 | Micron Display Technology, Inc. | Method of high density plasma etching for semiconductor manufacture |
JP3202877B2 (ja) * | 1994-08-30 | 2001-08-27 | 東京エレクトロン株式会社 | プラズマアッシング装置 |
JPH08279493A (ja) | 1995-04-04 | 1996-10-22 | Anelva Corp | プラズマ処理装置 |
JPH08288259A (ja) | 1995-04-18 | 1996-11-01 | Sony Corp | ヘリコン波プラズマ装置およびこれを用いたドライエッチング方法 |
JPH0992643A (ja) * | 1995-09-28 | 1997-04-04 | Toshiba Corp | プラズマ処理装置及びプラズマ処理方法 |
JP3561080B2 (ja) * | 1996-04-23 | 2004-09-02 | 松下電器産業株式会社 | プラズマ処理装置及びプラズマ処理方法 |
GB9616225D0 (en) | 1996-08-01 | 1996-09-11 | Surface Tech Sys Ltd | Method of surface treatment of semiconductor substrates |
DE69725245T2 (de) * | 1996-08-01 | 2004-08-12 | Surface Technoloy Systems Plc | Verfahren zur Ätzung von Substraten |
DE19637964A1 (de) | 1996-09-18 | 1998-03-19 | Diehl Ident Gmbh | Einrichtung zum induktiven hochfrequenten Datenaustausch |
JP4013271B2 (ja) * | 1997-01-16 | 2007-11-28 | 日新電機株式会社 | 物品表面処理方法及び装置 |
JP2959508B2 (ja) | 1997-02-14 | 1999-10-06 | 日新電機株式会社 | プラズマ発生装置 |
DE19706682C2 (de) * | 1997-02-20 | 1999-01-14 | Bosch Gmbh Robert | Anisotropes fluorbasiertes Plasmaätzverfahren für Silizium |
JP3582287B2 (ja) | 1997-03-26 | 2004-10-27 | 株式会社日立製作所 | エッチング装置 |
JPH10270428A (ja) | 1997-03-27 | 1998-10-09 | Mitsubishi Electric Corp | プラズマ処理装置 |
US5968275A (en) | 1997-06-25 | 1999-10-19 | Lam Research Corporation | Methods and apparatus for passivating a substrate in a plasma reactor |
US6109347A (en) | 1997-07-03 | 2000-08-29 | Baker Hughes Incorporated | One-trip, thru-tubing, window-milling system |
US6093332A (en) * | 1998-02-04 | 2000-07-25 | Lam Research Corporation | Methods for reducing mask erosion during plasma etching |
EP1156516A4 (de) | 1998-09-30 | 2004-06-16 | Tokyo Electron Ltd | Verfahren und vorrichtung zur plasmabehandlung |
DE69942020D1 (de) | 1998-12-11 | 2010-04-01 | Surface Technology Systems Plc | Plasmabehandlungsgerät |
FR2799921B1 (fr) | 1999-10-19 | 2002-01-11 | Metal Process | Procede de production d'un plasma par decharges a barriere multipolaire de type capacitif, et dispositif pour la mise en oeuvre d'un tel procede |
DE10024699A1 (de) * | 2000-05-18 | 2001-11-29 | Bosch Gmbh Robert | Plasmaätzanlage |
-
1999
- 1999-12-10 DE DE69942020T patent/DE69942020D1/de not_active Expired - Lifetime
- 1999-12-10 EP EP99958406A patent/EP1055250B1/de not_active Expired - Lifetime
- 1999-12-10 KR KR1020077011424A patent/KR100829288B1/ko active IP Right Grant
- 1999-12-10 AT AT99958406T patent/ATE458261T1/de not_active IP Right Cessation
- 1999-12-10 WO PCT/GB1999/004168 patent/WO2000036631A1/en active Application Filing
- 1999-12-10 KR KR1020007008638A patent/KR100768610B1/ko active IP Right Grant
- 1999-12-10 JP JP2000588789A patent/JP4714309B2/ja not_active Expired - Lifetime
-
2005
- 2005-03-16 US US11/080,964 patent/US7491649B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20070060164A (ko) | 2007-06-12 |
JP4714309B2 (ja) | 2011-06-29 |
ATE458261T1 (de) | 2010-03-15 |
WO2000036631A1 (en) | 2000-06-22 |
KR20010040750A (ko) | 2001-05-15 |
EP1055250B1 (de) | 2010-02-17 |
KR100768610B1 (ko) | 2007-10-18 |
KR100829288B1 (ko) | 2008-05-13 |
EP1055250A1 (de) | 2000-11-29 |
US20050159010A1 (en) | 2005-07-21 |
US7491649B2 (en) | 2009-02-17 |
JP2002532896A (ja) | 2002-10-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |