DE706582T1 - Zusammensetzung und verfahren zum polieren - Google Patents

Zusammensetzung und verfahren zum polieren

Info

Publication number
DE706582T1
DE706582T1 DE0706582T DE94918171T DE706582T1 DE 706582 T1 DE706582 T1 DE 706582T1 DE 0706582 T DE0706582 T DE 0706582T DE 94918171 T DE94918171 T DE 94918171T DE 706582 T1 DE706582 T1 DE 706582T1
Authority
DE
Germany
Prior art keywords
composition
anion
silica
methods
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE0706582T
Other languages
English (en)
Inventor
Gregory Brancaleoni
Lee Melbourne Cook
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rodel Inc
Original Assignee
Rodel Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=22074607&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE706582(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Rodel Inc filed Critical Rodel Inc
Publication of DE706582T1 publication Critical patent/DE706582T1/de
Pending legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F1/00—Etching metallic material by chemical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/32115—Planarisation
    • H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09G—POLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00—Polishing compositions
    • C09G1/02—Polishing compositions containing abrasives or grinding agents
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/31051—Planarisation of the insulating layers
    • H01L21/31053—Planarisation of the insulating layers involving a dielectric removal step
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S451/00—Abrading
    • Y10S451/905—Metal lap
DE0706582T 1993-05-26 1994-05-25 Zusammensetzung und verfahren zum polieren Pending DE706582T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/067,234 US5391258A (en) 1993-05-26 1993-05-26 Compositions and methods for polishing
PCT/US1994/006091 WO1994028194A1 (en) 1993-05-26 1994-05-25 Improved compositions and methods for polishing

Publications (1)

Publication Number Publication Date
DE706582T1 true DE706582T1 (de) 1996-10-24

Family

ID=22074607

Family Applications (2)

Application Number Title Priority Date Filing Date
DE0706582T Pending DE706582T1 (de) 1993-05-26 1994-05-25 Zusammensetzung und verfahren zum polieren
DE69427165T Expired - Lifetime DE69427165T3 (de) 1993-05-26 1994-05-25 Zusammensetzung und verfahren zum polieren

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69427165T Expired - Lifetime DE69427165T3 (de) 1993-05-26 1994-05-25 Zusammensetzung und verfahren zum polieren

Country Status (11)

Country Link
US (2) US5391258A (de)
EP (1) EP0706582B9 (de)
JP (1) JP2819196B2 (de)
KR (1) KR100222768B1 (de)
CN (1) CN1053933C (de)
AT (1) ATE200916T1 (de)
DE (2) DE706582T1 (de)
MY (1) MY110381A (de)
SG (1) SG48220A1 (de)
TW (1) TW329434B (de)
WO (1) WO1994028194A1 (de)

Families Citing this family (186)

* Cited by examiner, † Cited by third party
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US5391258A (en) 1995-02-21
KR100222768B1 (ko) 1999-10-01
EP0706582A1 (de) 1996-04-17
KR960702540A (ko) 1996-04-27
TW329434B (en) 1998-04-11
ATE200916T1 (de) 2001-05-15
CN1053933C (zh) 2000-06-28
JPH08510437A (ja) 1996-11-05
EP0706582A4 (de) 1997-06-11
EP0706582B2 (de) 2004-03-17
DE69427165T3 (de) 2004-09-09
MY110381A (en) 1998-04-30
SG48220A1 (en) 1998-04-17
CN1124504A (zh) 1996-06-12
DE69427165D1 (de) 2001-06-07
JP2819196B2 (ja) 1998-10-30
DE69427165T2 (de) 2001-11-29
EP0706582B1 (de) 2001-05-02
US5476606A (en) 1995-12-19
EP0706582B9 (de) 2004-11-03

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