DE958605T1 - Gegossenes loetballgitter mit flexibler schaltung und herstellungsverfahren - Google Patents

Gegossenes loetballgitter mit flexibler schaltung und herstellungsverfahren

Info

Publication number
DE958605T1
DE958605T1 DE0958605T DE97922331T DE958605T1 DE 958605 T1 DE958605 T1 DE 958605T1 DE 0958605 T DE0958605 T DE 0958605T DE 97922331 T DE97922331 T DE 97922331T DE 958605 T1 DE958605 T1 DE 958605T1
Authority
DE
Germany
Prior art keywords
cast
manufacturing process
flexible circuit
ball grid
cast ball
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE0958605T
Other languages
English (en)
Inventor
Bruce Freyman
Robert Darveaux
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Amkor Technology Inc
Original Assignee
Amkor Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Amkor Technology Inc filed Critical Amkor Technology Inc
Publication of DE958605T1 publication Critical patent/DE958605T1/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • H01L23/3128Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation the substrate having spherical bumps for external connection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49811Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
    • H01L23/49816Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/4985Flexible insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16237Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bonding area disposed in a recess of the surface of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8538Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/85399Material
    • H01L2224/854Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/06Polymers
    • H01L2924/078Adhesive characteristics other than chemical
    • H01L2924/07802Adhesive characteristics other than chemical not being an ohmic electrical conductor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
DE0958605T 1996-04-24 1997-04-23 Gegossenes loetballgitter mit flexibler schaltung und herstellungsverfahren Pending DE958605T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/637,578 US5859475A (en) 1996-04-24 1996-04-24 Carrier strip and molded flex circuit ball grid array
PCT/US1997/006371 WO1997040532A2 (en) 1996-04-24 1997-04-23 Molded flex circuit ball grid array and method of making

Publications (1)

Publication Number Publication Date
DE958605T1 true DE958605T1 (de) 2000-04-20

Family

ID=24556544

Family Applications (1)

Application Number Title Priority Date Filing Date
DE0958605T Pending DE958605T1 (de) 1996-04-24 1997-04-23 Gegossenes loetballgitter mit flexibler schaltung und herstellungsverfahren

Country Status (9)

Country Link
US (3) US5859475A (de)
EP (1) EP0958605A2 (de)
JP (1) JP2001526832A (de)
KR (1) KR20000010668A (de)
AU (1) AU2803497A (de)
CA (1) CA2252833A1 (de)
DE (1) DE958605T1 (de)
TW (1) TW335524B (de)
WO (1) WO1997040532A2 (de)

Families Citing this family (171)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3080579B2 (ja) * 1996-03-06 2000-08-28 富士機工電子株式会社 エアリア・グリッド・アレイ・パッケージの製造方法
US5852870A (en) * 1996-04-24 1998-12-29 Amkor Technology, Inc. Method of making grid array assembly
SG60099A1 (en) * 1996-08-16 1999-02-22 Sony Corp Semiconductor package and manufacturing method of lead frame
US5989935A (en) * 1996-11-19 1999-11-23 Texas Instruments Incorporated Column grid array for semiconductor packaging and method
FR2758630B1 (fr) * 1997-01-21 1999-04-09 Thomson Tubes Electroniques Procede de scellement etanche d'un detecteur de rayonnement a l'etat solide et detecteur obtenu par ce procede
KR100214552B1 (ko) * 1997-01-25 1999-08-02 구본준 캐리어프레임 및 서브스트레이트와 이들을 이용한 볼 그리드 어 레이 패키지의 제조방법
JP3483720B2 (ja) * 1997-02-12 2004-01-06 沖電気工業株式会社 半導体装置
JPH11163022A (ja) 1997-11-28 1999-06-18 Sony Corp 半導体装置、その製造方法及び電子機器
JP3638771B2 (ja) * 1997-12-22 2005-04-13 沖電気工業株式会社 半導体装置
US6310298B1 (en) * 1997-12-30 2001-10-30 Intel Corporation Printed circuit board substrate having solder mask-free edges
DE19800566A1 (de) * 1998-01-09 1999-07-15 Siemens Ag Verfahren zum Herstellen eines Halbleiterbauelementes und ein derart hergestelltes Halbleiterbauelement
US6380001B1 (en) * 1998-01-29 2002-04-30 Vlsi Technology, Inc. Flexible pin count package for semiconductor device
US6624505B2 (en) 1998-02-06 2003-09-23 Shellcase, Ltd. Packaged integrated circuits and methods of producing thereof
IL123207A0 (en) 1998-02-06 1998-09-24 Shellcase Ltd Integrated circuit device
US5982625A (en) * 1998-03-19 1999-11-09 Advanced Semiconductor Engineering, Inc. Semiconductor packaging device
US6166433A (en) * 1998-03-26 2000-12-26 Fujitsu Limited Resin molded semiconductor device and method of manufacturing semiconductor package
CN1236126A (zh) * 1998-05-18 1999-11-24 株式会社东芝 带应力衰减结构的薄型手提式电子装置
JP3020201B2 (ja) * 1998-05-27 2000-03-15 亜南半導体株式会社 ボールグリッドアレイ半導体パッケージのモールディング方法
US6351034B1 (en) 1998-06-01 2002-02-26 Micron Technology, Inc. Clip chip carrier
US8330270B1 (en) 1998-06-10 2012-12-11 Utac Hong Kong Limited Integrated circuit package having a plurality of spaced apart pad portions
US6229200B1 (en) 1998-06-10 2001-05-08 Asat Limited Saw-singulated leadless plastic chip carrier
US7270867B1 (en) 1998-06-10 2007-09-18 Asat Ltd. Leadless plastic chip carrier
US6872661B1 (en) * 1998-06-10 2005-03-29 Asat Ltd. Leadless plastic chip carrier with etch back pad singulation and die attach pad array
US6143981A (en) 1998-06-24 2000-11-07 Amkor Technology, Inc. Plastic integrated circuit package and method and leadframe for making the package
JP3492212B2 (ja) 1998-08-26 2004-02-03 新光電気工業株式会社 半導体装置用パッケージ及びその製造方法
TW434767B (en) * 1998-09-05 2001-05-16 Via Tech Inc Package architecture of ball grid array integrated circuit device
US6655022B1 (en) 1998-09-24 2003-12-02 Intel Corporation Implementing micro BGA assembly techniques for small die
FR2785072B1 (fr) * 1998-10-23 2001-01-19 St Microelectronics Sa Circuit electronique autocollant
US6543512B1 (en) * 1998-10-28 2003-04-08 Micron Technology, Inc. Carrier, method and system for handling semiconductor components
US5969783A (en) * 1998-12-11 1999-10-19 National Semiconductor Corporation Reflective liquid crystal display and connection assembly and method
DE19905055A1 (de) * 1999-02-08 2000-08-17 Siemens Ag Halbleiterbauelement mit einem Chipträger mit Öffnungen zur Kontaktierung
US6355199B1 (en) * 1999-02-12 2002-03-12 St. Assembly Test Services Pte Ltd Method of molding flexible circuit with molded stiffener
JP4151164B2 (ja) * 1999-03-19 2008-09-17 株式会社デンソー 半導体装置の製造方法
JP3844936B2 (ja) * 1999-03-26 2006-11-15 富士通株式会社 半導体装置
US6207476B1 (en) * 1999-06-10 2001-03-27 Vlsi Technology, Inc. Methods of packaging an integrated circuit and methods of forming an integrated circuit package
KR20010009350A (ko) * 1999-07-09 2001-02-05 윤종용 기판이 없는 칩 스케일 패키지 및 그 제조방법
JP2001102486A (ja) * 1999-07-28 2001-04-13 Seiko Epson Corp 半導体装置用基板、半導体チップ搭載基板、半導体装置及びその製造方法、回路基板並びに電子機器
SG87046A1 (en) * 1999-08-17 2002-03-19 Micron Technology Inc Multi-chip module with stacked dice
US6489557B2 (en) * 1999-08-30 2002-12-03 Intel Corporation Implementing micro BGA™ assembly techniques for small die
US6356452B1 (en) * 1999-10-13 2002-03-12 Micron Technology, Inc. Soldermask opening to prevent delamination
US6331451B1 (en) 1999-11-05 2001-12-18 Amkor Technology, Inc. Methods of making thin integrated circuit device packages with improved thermal performance and substrates for making the packages
US6580159B1 (en) 1999-11-05 2003-06-17 Amkor Technology, Inc. Integrated circuit device packages and substrates for making the packages
US6384890B1 (en) 1999-11-15 2002-05-07 National Semiconductor Corporation Connection assembly for reflective liquid crystal projection with branched PCB display
US6395580B1 (en) * 1999-11-29 2002-05-28 Taiwan Semiconductor Manufacturing Company, Ltd. Backside failure analysis for BGA package
US7019410B1 (en) * 1999-12-21 2006-03-28 Micron Technology, Inc. Die attach material for TBGA or flexible circuitry
US6326554B1 (en) * 2000-03-23 2001-12-04 Motorola, Inc. Surface mount flexible interconnect and component carrier
US6441481B1 (en) * 2000-04-10 2002-08-27 Analog Devices, Inc. Hermetically sealed microstructure package
US6452268B1 (en) * 2000-04-26 2002-09-17 Siliconware Precision Industries Co., Ltd. Integrated circuit package configuration having an encapsulating body with a flanged portion and an encapsulating mold for molding the encapsulating body
US6469372B2 (en) * 2000-05-16 2002-10-22 Texas Instruments Incorporated Matched thermal expansion carrier tape assemblage for semiconductor devices
US6400033B1 (en) 2000-06-01 2002-06-04 Amkor Technology, Inc. Reinforcing solder connections of electronic devices
US6318354B1 (en) * 2000-06-06 2001-11-20 Uni-Tek System, Inc. Singulation system for a BGA product
JP2002009097A (ja) * 2000-06-22 2002-01-11 Oki Electric Ind Co Ltd 半導体装置とその製造方法
JP4477202B2 (ja) * 2000-07-12 2010-06-09 ローム株式会社 半導体装置およびその製造方法
US6597188B1 (en) 2000-09-11 2003-07-22 St Assembly Test Service Ltd. Ground land for singulated ball grid array
US6815621B2 (en) * 2000-10-02 2004-11-09 Samsung Electronics Co., Ltd. Chip scale package, printed circuit board, and method of designing a printed circuit board
JP2002118201A (ja) * 2000-10-05 2002-04-19 Hitachi Ltd 半導体装置およびその製造方法
US6552436B2 (en) * 2000-12-08 2003-04-22 Motorola, Inc. Semiconductor device having a ball grid array and method therefor
EP1356718A4 (de) * 2000-12-21 2009-12-02 Tessera Tech Hungary Kft Verpackte integrierte schaltungen und verfahren zu ihrer herstellung
KR100401148B1 (ko) * 2001-02-06 2003-10-10 앰코 테크놀로지 코리아 주식회사 반도체 패키지 제조용 부재
KR100716871B1 (ko) * 2001-04-11 2007-05-09 앰코 테크놀로지 코리아 주식회사 반도체패키지용 캐리어프레임 및 이를 이용한반도체패키지와 그 제조 방법
US6429513B1 (en) 2001-05-25 2002-08-06 Amkor Technology, Inc. Active heat sink for cooling a semiconductor chip
US6562656B1 (en) * 2001-06-25 2003-05-13 Thin Film Module, Inc. Cavity down flip chip BGA
US6730536B1 (en) 2001-06-28 2004-05-04 Amkor Technology, Inc. Pre-drilled image sensor package fabrication method
US7154166B2 (en) * 2001-08-15 2006-12-26 Texas Instruments Incorporated Low profile ball-grid array package for high power
US6856007B2 (en) * 2001-08-28 2005-02-15 Tessera, Inc. High-frequency chip packages
US6599779B2 (en) * 2001-09-24 2003-07-29 St Assembly Test Service Ltd. PBGA substrate for anchoring heat sink
US6569709B2 (en) * 2001-10-15 2003-05-27 Micron Technology, Inc. Assemblies including stacked semiconductor devices separated a distance defined by adhesive material interposed therebetween, packages including the assemblies, and methods
US6737750B1 (en) 2001-12-07 2004-05-18 Amkor Technology, Inc. Structures for improving heat dissipation in stacked semiconductor packages
SG104291A1 (en) * 2001-12-08 2004-06-21 Micron Technology Inc Die package
US6617524B2 (en) * 2001-12-11 2003-09-09 Motorola, Inc. Packaged integrated circuit and method therefor
US7332819B2 (en) * 2002-01-09 2008-02-19 Micron Technology, Inc. Stacked die in die BGA package
US6552430B1 (en) * 2002-01-30 2003-04-22 Texas Instruments Incorporated Ball grid array substrate with improved traces formed from copper based metal
US7336139B2 (en) * 2002-03-18 2008-02-26 Applied Micro Circuits Corporation Flexible interconnect cable with grounded coplanar waveguide
US6797891B1 (en) 2002-03-18 2004-09-28 Applied Micro Circuits Corporation Flexible interconnect cable with high frequency electrical transmission line
US8847696B2 (en) * 2002-03-18 2014-09-30 Qualcomm Incorporated Flexible interconnect cable having signal trace pairs and ground layer pairs disposed on opposite sides of a flexible dielectric
US6867668B1 (en) 2002-03-18 2005-03-15 Applied Micro Circuits Corporation High frequency signal transmission from the surface of a circuit substrate to a flexible interconnect cable
KR100510486B1 (ko) * 2002-04-08 2005-08-26 삼성전자주식회사 양면 반도체 칩을 위한 반도체 패키지 및 그 제조방법
US6800948B1 (en) * 2002-07-19 2004-10-05 Asat Ltd. Ball grid array package
US6979594B1 (en) 2002-07-19 2005-12-27 Asat Ltd. Process for manufacturing ball grid array package
US6987032B1 (en) * 2002-07-19 2006-01-17 Asat Ltd. Ball grid array package and process for manufacturing same
CN1672260A (zh) * 2002-07-31 2005-09-21 奥斯兰姆奥普托半导体有限责任公司 可表面安装的半导体器件及其制造方法
US7732914B1 (en) 2002-09-03 2010-06-08 Mclellan Neil Cavity-type integrated circuit package
US20040061241A1 (en) * 2002-09-30 2004-04-01 Osburn Edward P. Semiconductor device power interconnect striping
US7005736B2 (en) * 2002-09-30 2006-02-28 Intel Corporation Semiconductor device power interconnect striping
US7033664B2 (en) 2002-10-22 2006-04-25 Tessera Technologies Hungary Kft Methods for producing packaged integrated circuit devices and packaged integrated circuit devices produced thereby
US7723210B2 (en) * 2002-11-08 2010-05-25 Amkor Technology, Inc. Direct-write wafer level chip scale package
US6905914B1 (en) 2002-11-08 2005-06-14 Amkor Technology, Inc. Wafer level package and fabrication method
US7387827B2 (en) * 2002-12-17 2008-06-17 Intel Corporation Interconnection designs and materials having improved strength and fatigue life
US7423340B2 (en) * 2003-01-21 2008-09-09 Siliconware Precision Industries Co., Ltd. Semiconductor package free of substrate and fabrication method thereof
US7271493B2 (en) * 2003-01-21 2007-09-18 Siliconware Precision Industries Co., Ltd. Semiconductor package free of substrate and fabrication method thereof
US20050184368A1 (en) * 2003-01-21 2005-08-25 Huang Chien P. Semiconductor package free of substrate and fabrication method thereof
US20050194665A1 (en) * 2003-01-21 2005-09-08 Huang Chien P. Semiconductor package free of substrate and fabrication method thereof
US7342318B2 (en) * 2003-01-21 2008-03-11 Siliconware Precision Industries Co., Ltd. Semiconductor package free of substrate and fabrication method thereof
TWI241000B (en) * 2003-01-21 2005-10-01 Siliconware Precision Industries Co Ltd Semiconductor package and fabricating method thereof
US6946744B2 (en) * 2003-04-24 2005-09-20 Power-One Limited System and method of reducing die attach stress and strain
US6683789B1 (en) * 2003-04-28 2004-01-27 Motorola, Inc. Electronic control module for a removable connector and methods of assembling same
US6972480B2 (en) * 2003-06-16 2005-12-06 Shellcase Ltd. Methods and apparatus for packaging integrated circuit devices
WO2005004195A2 (en) * 2003-07-03 2005-01-13 Shellcase Ltd. Method and apparatus for packaging integrated circuit devices
US7372151B1 (en) 2003-09-12 2008-05-13 Asat Ltd. Ball grid array package and process for manufacturing same
WO2005031862A1 (en) * 2003-09-26 2005-04-07 Tessera, Inc. Structure and method of making sealed capped chips
US20050067681A1 (en) * 2003-09-26 2005-03-31 Tessera, Inc. Package having integral lens and wafer-scale fabrication method therefor
US20050139984A1 (en) * 2003-12-19 2005-06-30 Tessera, Inc. Package element and packaged chip having severable electrically conductive ties
US20050189622A1 (en) * 2004-03-01 2005-09-01 Tessera, Inc. Packaged acoustic and electromagnetic transducer chips
JPWO2005114730A1 (ja) * 2004-05-20 2008-03-27 スパンション エルエルシー 半導体装置の製造方法および半導体装置
US7233057B2 (en) * 2004-05-28 2007-06-19 Nokia Corporation Integrated circuit package with optimized mold shape
KR100640580B1 (ko) * 2004-06-08 2006-10-31 삼성전자주식회사 측면이 봉지재로 감싸진 반도체 패키지 및 그 제조방법
DE102004029587B4 (de) * 2004-06-18 2006-05-24 Infineon Technologies Ag Substratbasiertes BGA-Gehäuse, insbesondere FBGA-Gehäuse
US7595225B1 (en) 2004-10-05 2009-09-29 Chun Ho Fan Leadless plastic chip carrier with contact standoff
US7358119B2 (en) * 2005-01-12 2008-04-15 Asat Ltd. Thin array plastic package without die attach pad and process for fabricating the same
US8610262B1 (en) 2005-02-18 2013-12-17 Utac Hong Kong Limited Ball grid array package with improved thermal characteristics
US20080157306A1 (en) * 2005-02-23 2008-07-03 Ki-Bum Sung Lead Frame
US8143095B2 (en) * 2005-03-22 2012-03-27 Tessera, Inc. Sequential fabrication of vertical conductive interconnects in capped chips
US7348663B1 (en) 2005-07-15 2008-03-25 Asat Ltd. Integrated circuit package and method for fabricating same
US7566853B2 (en) * 2005-08-12 2009-07-28 Tessera, Inc. Image sensor employing a plurality of photodetector arrays and/or rear-illuminated architecture
US7410830B1 (en) 2005-09-26 2008-08-12 Asat Ltd Leadless plastic chip carrier and method of fabricating same
US20070120240A1 (en) * 2005-11-29 2007-05-31 3M Innovative Properties Company Circuit substrate and method of manufacture
US7572681B1 (en) 2005-12-08 2009-08-11 Amkor Technology, Inc. Embedded electronic component package
US7936062B2 (en) * 2006-01-23 2011-05-03 Tessera Technologies Ireland Limited Wafer level chip packaging
US20070190747A1 (en) * 2006-01-23 2007-08-16 Tessera Technologies Hungary Kft. Wafer level packaging to lidded chips
US20080002460A1 (en) * 2006-03-01 2008-01-03 Tessera, Inc. Structure and method of making lidded chips
US7531899B2 (en) * 2006-04-17 2009-05-12 Agilent Technologies, Inc. Ball grid array package
US7902660B1 (en) 2006-05-24 2011-03-08 Amkor Technology, Inc. Substrate for semiconductor device and manufacturing method thereof
US7985621B2 (en) * 2006-08-31 2011-07-26 Ati Technologies Ulc Method and apparatus for making semiconductor packages
TWI336502B (en) * 2006-09-27 2011-01-21 Advanced Semiconductor Eng Semiconductor package and semiconductor device and the method of making the same
US8604605B2 (en) 2007-01-05 2013-12-10 Invensas Corp. Microelectronic assembly with multi-layer support structure
US8937372B2 (en) * 2007-03-21 2015-01-20 Stats Chippac Ltd. Integrated circuit package system with molded strip protrusion
TWI335070B (en) * 2007-03-23 2010-12-21 Advanced Semiconductor Eng Semiconductor package and the method of making the same
US20080246139A1 (en) * 2007-04-03 2008-10-09 Don Craven Polar hybrid grid array package
US8344505B2 (en) 2007-08-29 2013-01-01 Ati Technologies Ulc Wafer level packaging of semiconductor chips
TWI473553B (zh) * 2008-07-03 2015-02-11 Advanced Semiconductor Eng 晶片封裝結構
US7989950B2 (en) * 2008-08-14 2011-08-02 Stats Chippac Ltd. Integrated circuit packaging system having a cavity
KR101013561B1 (ko) * 2008-12-30 2011-02-14 주식회사 하이닉스반도체 적층 반도체 패키지
US20100171206A1 (en) * 2009-01-07 2010-07-08 Chi-Chih Chu Package-on-Package Device, Semiconductor Package, and Method for Manufacturing The Same
US8012797B2 (en) * 2009-01-07 2011-09-06 Advanced Semiconductor Engineering, Inc. Method for forming stackable semiconductor device packages including openings with conductive bumps of specified geometries
TWI499024B (zh) * 2009-01-07 2015-09-01 Advanced Semiconductor Eng 堆疊式多封裝構造裝置、半導體封裝構造及其製造方法
US20110048786A1 (en) * 2009-08-31 2011-03-03 Samsung Electro-Mechanics Co., Ltd. Printed circuit board having a bump and a method of manufacturing the same
TWI469283B (zh) * 2009-08-31 2015-01-11 Advanced Semiconductor Eng 封裝結構以及封裝製程
US8796561B1 (en) 2009-10-05 2014-08-05 Amkor Technology, Inc. Fan out build up substrate stackable package and method
US8198131B2 (en) 2009-11-18 2012-06-12 Advanced Semiconductor Engineering, Inc. Stackable semiconductor device packages
US8937381B1 (en) 2009-12-03 2015-01-20 Amkor Technology, Inc. Thin stackable package and method
US9691734B1 (en) 2009-12-07 2017-06-27 Amkor Technology, Inc. Method of forming a plurality of electronic component packages
TWI408785B (zh) 2009-12-31 2013-09-11 Advanced Semiconductor Eng 半導體封裝結構
US8569894B2 (en) 2010-01-13 2013-10-29 Advanced Semiconductor Engineering, Inc. Semiconductor package with single sided substrate design and manufacturing methods thereof
TWI419283B (zh) 2010-02-10 2013-12-11 Advanced Semiconductor Eng 封裝結構
TWI411075B (zh) 2010-03-22 2013-10-01 Advanced Semiconductor Eng 半導體封裝件及其製造方法
US8278746B2 (en) 2010-04-02 2012-10-02 Advanced Semiconductor Engineering, Inc. Semiconductor device packages including connecting elements
US8624374B2 (en) 2010-04-02 2014-01-07 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with fan-out and with connecting elements for stacking and manufacturing methods thereof
US8324511B1 (en) 2010-04-06 2012-12-04 Amkor Technology, Inc. Through via nub reveal method and structure
US8294276B1 (en) 2010-05-27 2012-10-23 Amkor Technology, Inc. Semiconductor device and fabricating method thereof
US8440554B1 (en) 2010-08-02 2013-05-14 Amkor Technology, Inc. Through via connected backside embedded circuit features structure and method
TWI423355B (zh) * 2010-08-04 2014-01-11 矽品精密工業股份有限公司 晶片尺寸封裝件及其製法
US8531014B2 (en) * 2010-09-27 2013-09-10 Infineon Technologies Ag Method and system for minimizing carrier stress of a semiconductor device
US8487445B1 (en) 2010-10-05 2013-07-16 Amkor Technology, Inc. Semiconductor device having through electrodes protruding from dielectric layer
TWI451546B (zh) 2010-10-29 2014-09-01 Advanced Semiconductor Eng 堆疊式封裝結構、其封裝結構及封裝結構之製造方法
US8791501B1 (en) 2010-12-03 2014-07-29 Amkor Technology, Inc. Integrated passive device structure and method
US8390130B1 (en) 2011-01-06 2013-03-05 Amkor Technology, Inc. Through via recessed reveal structure and method
TWI445155B (zh) 2011-01-06 2014-07-11 Advanced Semiconductor Eng 堆疊式封裝結構及其製造方法
US20120193802A1 (en) * 2011-02-01 2012-08-02 Chin-Tien Chiu Glob top semiconductor package
JP5919625B2 (ja) * 2011-02-22 2016-05-18 富士通株式会社 半導体装置及びその製造方法、電源装置
US9171792B2 (en) 2011-02-28 2015-10-27 Advanced Semiconductor Engineering, Inc. Semiconductor device packages having a side-by-side device arrangement and stacking functionality
US8367475B2 (en) 2011-03-25 2013-02-05 Broadcom Corporation Chip scale package assembly in reconstitution panel process format
US8552548B1 (en) 2011-11-29 2013-10-08 Amkor Technology, Inc. Conductive pad on protruding through electrode semiconductor device
US9129943B1 (en) 2012-03-29 2015-09-08 Amkor Technology, Inc. Embedded component package and fabrication method
US9048298B1 (en) 2012-03-29 2015-06-02 Amkor Technology, Inc. Backside warpage control structure and fabrication method
US8736062B2 (en) * 2012-08-16 2014-05-27 Infineon Technologies Ag Pad sidewall spacers and method of making pad sidewall spacers
KR101563909B1 (ko) 2014-08-19 2015-10-28 앰코 테크놀로지 코리아 주식회사 패키지 온 패키지 제조 방법
TWI569368B (zh) * 2015-03-06 2017-02-01 恆勁科技股份有限公司 封裝基板、包含該封裝基板的封裝結構及其製作方法
US9769926B2 (en) * 2015-04-23 2017-09-19 Dell Products L.P. Breakout via system
US10535611B2 (en) 2015-11-20 2020-01-14 Apple Inc. Substrate-less integrated components
JP6702410B2 (ja) * 2016-04-11 2020-06-03 株式会社村田製作所 モジュール
US10304716B1 (en) * 2017-12-20 2019-05-28 Powertech Technology Inc. Package structure and manufacturing method thereof

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5072283A (en) * 1988-04-12 1991-12-10 Bolger Justin C Pre-formed chip carrier cavity package
US5023202A (en) * 1989-07-14 1991-06-11 Lsi Logic Corporation Rigid strip carrier for integrated circuits
US5045921A (en) * 1989-12-26 1991-09-03 Motorola, Inc. Pad array carrier IC device using flexible tape
US5170328A (en) * 1990-04-24 1992-12-08 Delco Electronics Corporation Packaging for molded carriers of integrated circuits
US5261155A (en) * 1991-08-12 1993-11-16 International Business Machines Corporation Method for bonding flexible circuit to circuitized substrate to provide electrical connection therebetween using different solders
US5203075A (en) * 1991-08-12 1993-04-20 Inernational Business Machines Method of bonding flexible circuit to cicuitized substrate to provide electrical connection therebetween using different solders
US5133495A (en) * 1991-08-12 1992-07-28 International Business Machines Corporation Method of bonding flexible circuit to circuitized substrate to provide electrical connection therebetween
US5468994A (en) * 1992-12-10 1995-11-21 Hewlett-Packard Company High pin count package for semiconductor device
US5355283A (en) * 1993-04-14 1994-10-11 Amkor Electronics, Inc. Ball grid array with via interconnection
US5420460A (en) * 1993-08-05 1995-05-30 Vlsi Technology, Inc. Thin cavity down ball grid array package based on wirebond technology
US5397921A (en) * 1993-09-03 1995-03-14 Advanced Semiconductor Assembly Technology Tab grid array
JPH07142627A (ja) * 1993-11-18 1995-06-02 Fujitsu Ltd 半導体装置及びその製造方法
US5679978A (en) * 1993-12-06 1997-10-21 Fujitsu Limited Semiconductor device having resin gate hole through substrate for resin encapsulation
US5477082A (en) * 1994-01-11 1995-12-19 Exponential Technology, Inc. Bi-planar multi-chip module
TW272311B (de) * 1994-01-12 1996-03-11 At & T Corp
US5506756A (en) * 1994-01-25 1996-04-09 Intel Corporation Tape BGA package die-up/die down
JPH0883866A (ja) * 1994-07-15 1996-03-26 Shinko Electric Ind Co Ltd 片面樹脂封止型半導体装置の製造方法及びこれに用いるキャリアフレーム
JPH08107127A (ja) * 1994-10-03 1996-04-23 Hitachi Cable Ltd 半導体装置
US5701032A (en) * 1994-10-17 1997-12-23 W. L. Gore & Associates, Inc. Integrated circuit package
US5581122A (en) * 1994-10-25 1996-12-03 Industrial Technology Research Institute Packaging assembly with consolidated common voltage connections for integrated circuits
US5661086A (en) * 1995-03-28 1997-08-26 Mitsui High-Tec, Inc. Process for manufacturing a plurality of strip lead frame semiconductor devices
US5705851A (en) * 1995-06-28 1998-01-06 National Semiconductor Corporation Thermal ball lead integrated package
KR100201380B1 (ko) * 1995-11-15 1999-06-15 김규현 Bga 반도체 패키지의 열방출 구조
KR0178255B1 (ko) * 1995-11-17 1999-03-20 황인길 Bga 반도체 패키지의 pcb캐리어 프레임 및 그 제조방법
US5674785A (en) * 1995-11-27 1997-10-07 Micron Technology, Inc. Method of producing a single piece package for semiconductor die
KR100192760B1 (ko) * 1996-02-29 1999-06-15 황인길 메탈 캐리어 프레임을 이용한 bag반도체 패키지의 제조방법 및 그반도체 패키지
US5852870A (en) * 1996-04-24 1998-12-29 Amkor Technology, Inc. Method of making grid array assembly
DE29621837U1 (de) * 1996-12-16 1997-02-27 Siemens Ag Trägerelement für Halbleiterchips

Also Published As

Publication number Publication date
US5859475A (en) 1999-01-12
WO1997040532A2 (en) 1997-10-30
AU2803497A (en) 1997-11-12
US6124637A (en) 2000-09-26
TW335524B (en) 1998-07-01
KR20000010668A (ko) 2000-02-25
JP2001526832A (ja) 2001-12-18
US5985695A (en) 1999-11-16
EP0958605A2 (de) 1999-11-24
WO1997040532A3 (en) 1998-02-26
CA2252833A1 (en) 1997-10-30

Similar Documents

Publication Publication Date Title
DE958605T1 (de) Gegossenes loetballgitter mit flexibler schaltung und herstellungsverfahren
DE69718693D1 (de) Elektronisches Bauteil und Herstellungsverfahren
DE69812570T2 (de) Gerät mit Leiterplatte und dessen Zusammenbauverfahren
DE69935701D1 (de) Schalterstruktur und Herstellverfahren
DE69615437T2 (de) Integrierte Schaltungsanordnung und Herstellungsverfahren
DE69730775D1 (de) Logische Schaltung und zugehöriges Herstellungsverfahren
DE69517903D1 (de) Kugelgelenk und Herstellungsverfahren
GB9710514D0 (en) Electronic devices and their manufacture
DE69511925D1 (de) CMOS-Schaltungen mit geringer Verlustleistung
FI964878A (fi) Matalatehoinen magnetometripiiri
GB9626344D0 (en) Electronic devices and their manufacture
DE69728919D1 (de) Schaltungsplatine und Halbleiterbauteil mit dieser
DE69510239T2 (de) Takraw ball
GB2288075B (en) Circuit boards and their manufacture
DE69704287T2 (de) Elektrolumineszenz-Vorrichtung und Herstellungsverfahren
DE69624463T2 (de) Tennisball
DE69737189D1 (de) Elektronische geräte und deren herstellung
DE69503957T2 (de) SE-Fe-B Magneten und ihrer Herstellungsverfahren
DE69517038D1 (de) Backofen mit luftumwälzung
DE69126047D1 (de) Schaltkreis zur Serialisierung und Deserialisierung
DE69836201D1 (de) Funkgerät mit Schlaf-Schaltung und -Verfahren
DE69526300D1 (de) Schaltkreis und seine Wirkungsweise
DE69739619D1 (de) Halbleiteranordnung und Herstellungsverfahren
KR950026800U (ko) 형상과 모양을 임의로 변화시킬 수 있는 회전놀이기구
DE9407076U1 (de) Ballspiel