EP1309996A2 - Elektrische baugruppe und verfahren zur herstellung der elektrischen baugruppe - Google Patents
Elektrische baugruppe und verfahren zur herstellung der elektrischen baugruppeInfo
- Publication number
- EP1309996A2 EP1309996A2 EP01956355A EP01956355A EP1309996A2 EP 1309996 A2 EP1309996 A2 EP 1309996A2 EP 01956355 A EP01956355 A EP 01956355A EP 01956355 A EP01956355 A EP 01956355A EP 1309996 A2 EP1309996 A2 EP 1309996A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- electrical assembly
- gel
- areas
- electrical
- protective layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
- H05K3/284—Applying non-metallic protective coatings for encapsulating mounted components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/16—Fillings or auxiliary members in containers or encapsulations, e.g. centering rings
- H01L23/18—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device
- H01L23/24—Fillings characterised by the material, its physical or chemical properties, or its arrangement within the complete device solid or gel at the normal operating temperature of the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3135—Double encapsulation or coating and encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19107—Disposition of discrete passive components off-chip wires
Definitions
- the invention is based on an electrical assembly or a method according to the category of the independent claims. From the German patent application with the file number 19722355.9 it is already known to use a silicone gel as a covering layer to protect the electronic circuit. Under certain
- Operating conditions of the electronic module can be caused by mechanical effects of the gel on the bond wires, damage to the bond wires up to complete interruptions of the wires in the course of the module service life and thus result in a functional failure of the module.
- different failure mechanisms can occur.
- the gel mass which may not be chosen to be arbitrarily low due to the requirement for complete coverage of the components to be protected, can be excited to violent resonance vibrations when the module is subjected to high shaking loads, such as occur, for example, when mounting a unit in turn transfer to the bond wires.
- the resulting cyclic movement of the bond wires then leads to mechanical disruption and interruption of the bond wires.
- electrical modules have the advantage that a protective layer can be provided which is optimized with regard to mechanical and thermal resilience. There are no constructive measures on the electrical assembly itself and no additional ones
- the 35 measures listed in the dependent claims are advantageous developments and Improvements to the electrical assembly specified in the independent claims or methods for producing an electrical assembly possible. It is particularly advantageous to produce first areas around mechanically sensitive and / or corrosion-sensitive elements from a soft material, so that they are protected against moisture without mechanically damaging them when the temperature changes, since the soft gel can flow sufficiently around the bonding wires, while
- L0 complementary hard second areas protect the entire protective layer against harmful resonance vibrations and potentially resulting bond damage. If the first areas are covered by the second, the first areas are additionally countered
- a simple delimitation between the first and second regions can advantageously be made by using a thixotropic gel, that is to say a gel that is in motion
- This thixotropic gel type introduced first can be introduced in the desired areas in a simple manner, for example via a mobile, flexibly adjustable dispensing device. The desired localization of the different types of gel can thus be achieved without additional design effort, and both gel areas can be cured in a common heating step without the two areas mixing.
- a thixotropic soft gel type in bond wire areas or a thixotropic hard gel type in bondless areas can be distributed and then the other gel type can be poured into the free areas of the module interior.
- FIG. 1 shows an arrangement known from the prior art
- FIG. 2 shows an arrangement.
- first and Figure 2 shows a second embodiment of the invention.
- FIG. 1 shows a cross-sectional side view of an electrical assembly known from the prior art.
- the base plate 1 of the housing is surrounded by a frame 2 which has a plug part 3 on one side.
- This plug part 3 is used to make contact with an electronic circuit 4 which is connected to the plug part via thick wire bonds 6 (only one of these is shown in the drawing)
- Circuit 4 is a bare semiconductor chip 7, which is electrically connected to the circuit via thin wire bonds 5.
- the housing is filled with Silkongel 8 to the extent that all bond wires from the surrounding air
- silicone gel serves to protect the electronic circuit in order to protect unhoused chips and bonding wires from the effects of moisture, the 35 components to be protected being completely covered with gel must be so that adequate moisture protection is guaranteed.
- a cover cap can be attached over the housing frame, which protects the elements of the module interior from mechanical damage, but which, without the silicone gel, does not provide adequate moisture protection for the internal components of the module.
- the hardness of the gel can be adjusted in a medium range so that the one described above is too
- the assembly has a filling of the space delimited by the housing frame and the base plate 1 with first areas -5 10 made of soft silicone gel and, delimited by a transition area 12 from the first areas, with second areas 11 made of hard silicone gel.
- the first areas are arranged around the areas of the electronic circuit in which bond wire connections are located -
- the gel protective layer is produced by filling the areas provided with bond wire connections with a thixotropic soft gel, then the 55 remaining areas are poured out with liquid hard gel.
- the terms "soft” and “hard” refer to the consistency after curing, which can be achieved by heating the entire arrangement after filling with the two gel types, both areas curing 5 simultaneously.
- FIG. 3 also shows an electrical assembly which is identical except for the filling with silicone gel for illustration in FIG. 1. Instead of a homogeneous silicone gel layer 8 has
- first areas 10 made of soft silicone gel and, delimited by a transition area 13 from the first areas, with second areas 11
- This arrangement is produced by first filling in thixotropic hard gel in areas outside of bond wire connections. The remaining areas are then poured out with liquid soft gel. This is followed by a hardening step by heating the entire arrangement, in which both types of gel harden together.
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10038508A DE10038508A1 (de) | 2000-08-08 | 2000-08-08 | Elektrische Baugruppe und Verfahren zur Herstellung der elektrischen Baugruppe |
DE10038508 | 2000-08-08 | ||
PCT/DE2001/002753 WO2002013585A2 (de) | 2000-08-08 | 2001-07-20 | Elektrische baugruppe und verfahren zur herstellung der elektrischen baugruppe |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1309996A2 true EP1309996A2 (de) | 2003-05-14 |
Family
ID=7651605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP01956355A Withdrawn EP1309996A2 (de) | 2000-08-08 | 2001-07-20 | Elektrische baugruppe und verfahren zur herstellung der elektrischen baugruppe |
Country Status (5)
Country | Link |
---|---|
US (1) | US6919507B2 (de) |
EP (1) | EP1309996A2 (de) |
JP (1) | JP2004506317A (de) |
DE (1) | DE10038508A1 (de) |
WO (1) | WO2002013585A2 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4151207B2 (ja) * | 2000-08-10 | 2008-09-17 | 株式会社デンソー | 半導体装置 |
DE10217099A1 (de) * | 2002-04-17 | 2003-11-06 | Delphi Tech Inc | Elektrische Anschlussvorrichtung |
US20050066746A1 (en) * | 2003-06-13 | 2005-03-31 | Dan Winter | Meter transmitter/receiver and method of manufacturing same for use in a water-containing environment |
EP2416064B1 (de) * | 2010-08-06 | 2012-12-19 | FHF Funke + Huster Fernsig GmbH | Elektrische Signal-Schaltungsanordnung, vorzugsweise elektrische Signal-Leuchtenanordnung |
US8482908B2 (en) | 2011-10-14 | 2013-07-09 | Badger Meter, Inc. | Electronic meter register and method having a bottom formed by sealing material |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5087961A (en) * | 1987-01-28 | 1992-02-11 | Lsi Logic Corporation | Semiconductor device package |
US4739449A (en) | 1987-06-30 | 1988-04-19 | Kaufman Lance R | Circuit package with thermal expansion relief chimney |
US5386342A (en) * | 1992-01-30 | 1995-01-31 | Lsi Logic Corporation | Rigid backplane formed from a moisture resistant insulative material used to protect a semiconductor device |
JPH065742A (ja) * | 1992-06-22 | 1994-01-14 | Mitsubishi Electric Corp | 半導体装置、その封止に用いられる樹脂および半導体装置の製造方法 |
JPH077107A (ja) * | 1993-06-17 | 1995-01-10 | Shinko Electric Ind Co Ltd | 半導体装置 |
DE4405710A1 (de) * | 1994-02-23 | 1995-08-24 | Bosch Gmbh Robert | Vorrichtung mit einer Trägerplatte und Verfahren zum Aufbringen eines Passivierungsgels |
EP0703613A3 (de) * | 1994-09-26 | 1996-06-05 | Motorola Inc | Schutz elektronischer Bauelemente in saurer und basischer Umgebung |
DE4446527A1 (de) * | 1994-12-24 | 1996-06-27 | Ixys Semiconductor Gmbh | Leistungshalbleitermodul |
DE19722355A1 (de) * | 1997-05-28 | 1998-12-03 | Bosch Gmbh Robert | Verfahren zur Herstellung elektrischer Baugruppen und elektrische Baugruppe |
DE19929754C2 (de) * | 1999-06-29 | 2001-08-16 | Siemens Ag | Verguß einer bestückten Baugruppe mit vibrationsdämpfender Gießmasse |
JP3663120B2 (ja) * | 2000-09-04 | 2005-06-22 | 株式会社日立製作所 | 自動車用エンジンコントロールユニットの実装構造及び実装方法 |
-
2000
- 2000-08-08 DE DE10038508A patent/DE10038508A1/de not_active Ceased
-
2001
- 2001-07-20 EP EP01956355A patent/EP1309996A2/de not_active Withdrawn
- 2001-07-20 JP JP2002518130A patent/JP2004506317A/ja active Pending
- 2001-07-20 US US10/343,882 patent/US6919507B2/en not_active Expired - Fee Related
- 2001-07-20 WO PCT/DE2001/002753 patent/WO2002013585A2/de active Application Filing
Non-Patent Citations (1)
Title |
---|
See references of WO0213585A2 * |
Also Published As
Publication number | Publication date |
---|---|
DE10038508A1 (de) | 2002-02-21 |
WO2002013585A3 (de) | 2002-04-18 |
WO2002013585A2 (de) | 2002-02-14 |
US20040041276A1 (en) | 2004-03-04 |
US6919507B2 (en) | 2005-07-19 |
JP2004506317A (ja) | 2004-02-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP2422367B1 (de) | Gekapselte schaltungsvorrichtung für substrate mit absorptionsschicht sowie verfahren zu herstellung derselben | |
DE10045043B4 (de) | Halbleiterbauteil und Verfahren zu dessen Herstellung | |
DE112011103926T5 (de) | Halbleitervorrichtung und Verfahren zum Herstellen einer Halbleitervorrichtung | |
DE10239866B3 (de) | Verfahren zur Herstellung eines Halbleiterbauelements | |
DE102018207532B4 (de) | Halbleitereinrichtung | |
DE102011003195B4 (de) | Bauteil und Verfahren zum Herstellen eines Bauteils | |
DE102012224355A1 (de) | Leistungsmodul | |
DE112012002165T5 (de) | Leistungshalbleitermodul und Verfahren zu dessen Herstellung | |
DE19813525A1 (de) | Integriertes Halbleiterbauelement | |
DE102011083927A1 (de) | Leistungsmodul und Verfahren zur Herstellung desselben | |
DE4126043A1 (de) | Halbleiterbauelement | |
DE10251530A1 (de) | Stapelanordnung eines Speichermoduls | |
WO2013087243A1 (de) | Elektrisches bauelement und verfahren zur herstellung eines elektrischen bauelements | |
DE112017007982B4 (de) | Leistungs-Halbleitervorrichtung und Herstellungsverfahren einer Leistungs-Halbleitervorrichtung | |
DE102015221062B4 (de) | Halbleiterschaltungsanordnung mit gepresstem gel und montageverfahren | |
EP1309996A2 (de) | Elektrische baugruppe und verfahren zur herstellung der elektrischen baugruppe | |
EP0251260A1 (de) | Leistungshalbleitermodul | |
EP0676042B1 (de) | Druckmessumformer | |
EP0169356B1 (de) | Wechsellastbeständiges, schaltbares Halbleiterbauelement | |
DE10161936A1 (de) | Elektroniksteuereinheit | |
DE10345377B4 (de) | Halbleitermodul und Verfahren zur Herstellung eines Halbleitermoduls | |
DE2237536A1 (de) | Halbleiter-druckwandler | |
DE112017004390T5 (de) | Leistungsmodul und verfahren zu dessen herstellung | |
DE10238581B4 (de) | Halbleiterbauelement | |
EP1565937A1 (de) | Leistungshalbleitermodul |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20030310 |
|
AK | Designated contracting states |
Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR |
|
RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: TOPP, RAINER Inventor name: REYES TELLO, LAURA Inventor name: BARTELS, ARNE |
|
RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: BARTELS, ARNE Inventor name: TOPP, RAINER Inventor name: REYES TELLO, LAURA |
|
RBV | Designated contracting states (corrected) |
Designated state(s): DE FR GB IT |
|
17Q | First examination report despatched |
Effective date: 20110217 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20110628 |