US20030000775A1 - Lift pin actuating mechanism for semiconductor processing chamber - Google Patents

Lift pin actuating mechanism for semiconductor processing chamber Download PDF

Info

Publication number
US20030000775A1
US20030000775A1 US09/895,441 US89544101A US2003000775A1 US 20030000775 A1 US20030000775 A1 US 20030000775A1 US 89544101 A US89544101 A US 89544101A US 2003000775 A1 US2003000775 A1 US 2003000775A1
Authority
US
United States
Prior art keywords
lift pin
movement
base
assembly
processing chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
US09/895,441
Other versions
US6767176B2 (en
Inventor
Joseph Yudovsky
Salvador Umotoy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Priority to US09/895,441 priority Critical patent/US6767176B2/en
Assigned to APPLIED MATERIALS, INC. reassignment APPLIED MATERIALS, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: UMOTOY, SALVADOR P., YUDOVSKY, JOSEPH
Publication of US20030000775A1 publication Critical patent/US20030000775A1/en
Application granted granted Critical
Publication of US6767176B2 publication Critical patent/US6767176B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67748Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling

Definitions

  • the present invention relates to semiconductor manufacturing of thin substrates or wafers and, more particularly, to the transfer and loading of semiconductor wafers, glass plates and the like into and out of processing chambers.
  • Semiconductor manufacturing generally requires that a number of different processes be applied to a substrate such as a wafer. Typically, each process is applied to a wafer in a different chamber dedicated to a respective process. Thus the manufacturing process involves not only a sequence of processes carried out in the respective chambers, but also transporting wafers among the processing chambers, and loading and unloading wafers into and out of the processing chambers. Most semiconductor processing is carried out in chambers configured to process one wafer at a time, in a very high vacuum capable environment. Thus, a process to be performed in a particular chamber cannot be carried out while wafers are being loaded into or removed from the processing chamber. Consequently, reducing the time required to load and unload wafers into and out of processing chambers is a significant factor in maximizing manufacturing throughput.
  • a lift pin/actuating assembly includes a lift pin and an actuating mechanism having an actuator configured to generate movement by the lift pin along a first axis, and a translation mechanism coupled to the actuator and configured to translate movement of the actuator along the first axis into movement by the lift pin along a second axis.
  • a method of operating a substrate lift pin includes applying vertical actuation to the pin, moving the pin vertically a first distance, contacting a vertical motion stop after moving the first distance, and translating further vertical actuation into horizontal movement of the pin.
  • a lift pin/actuating assembly for a semiconductor processing chamber includes a lift pin adapted to hold a semiconductor substrate in the processing chamber. Also included in the lift pin/actuating assembly are a base on which the lift pin is mounted, a first mechanism adapted to raise and lower the base, and a second mechanism adapted to convert vertical motion of the base into pivoting motion of the lift pin.
  • a method of operating a semiconductor processing chamber includes providing a lift pin, mounting the lift pin so that it extends upwardly into the processing chamber, lowering a base on which the lift pin is mounted, and converting the lowering motion of the base into pivoting motion of the lift pin.
  • FIG. 1 is a somewhat schematic cross-sectional view of a processing chamber provided in accordance with an aspect of the invention, showing a lift pin in storage position;
  • FIG. 2 is a view similar to FIG. 1, showing the lift pin in a retracted position
  • FIGS. 3 ( a )- 3 ( l ) are partial cross-sectional views of the processing chamber of FIGS. 1 and 2, showing an exemplary sequence of steps for a substrate exchange procedure.
  • An embodiment of the invention includes a lift pin/actuating assembly that employs a single actuator and a translation mechanism configured to translate actuation along a first axis into movement along a second axis (“movement along an axis” should be understood to include linear motion in the direction of the axis, or pivotal motion about the axis.)
  • the actuating assembly is configured to allow actuation along the first axis to result in a predetermined range of lift pin movement along the first axis. Beyond the predetermined range of lift pin movement, further actuation along the first axis is translated into movement along the second axis.
  • the translation mechanism may include a motion stop which defines the predetermined range of lift pin movement and a motion translator (e.g., a lever or an appropriately configured link such as a four bar link, etc.).
  • FIGS. 1 - 3 ( l ) An aspect of the invention that employs a vertical motion actuator, a vertical motion stop, and a lever configured to translate vertical linear motion into horizontal pivoting motion is shown and described with reference to FIGS. 1 - 3 ( l ).
  • FIG. 1 is a schematic cross-sectional view of a semiconductor processing chamber 10 provided in accordance with an aspect of the invention.
  • the processing chamber 10 includes an enclosure 12 defined by side wall 14 , chamber floor 16 and chamber top 18 .
  • a heated pedestal 20 is mounted in the processing chamber 10 on a shaft 22 .
  • a lift mechanism 24 is associated with the shaft 22 to selectively raise and lower the pedestal 20 .
  • the pedestal 20 is provided to support a wafer in the chamber 10 during processing.
  • Conventional lift pins (of which only one pin 26 is shown) are provided to selectively lift a wafer from the pedestal 20 or to deposit a wafer on pedestal 20 .
  • the lift pins are raised and lowered via a lift plate 28 and a lift mechanism 30 .
  • Reference numeral 32 represents a robot blade that has entered the processing chamber 10 via a slit valve 34 while carrying a wafer 36 .
  • a so-called “showerhead” 38 is suspended from the chamber top 18 and allows process gas to flow toward the pedestal 20 during processing.
  • a plurality of lift pins, and associated actuating mechanisms are provided to define a wafer storage position within the enclosure 12 .
  • the actuating mechanism 42 is positioned below the floor 16 of the processing chamber 10 , and the lift pin 40 extends into the enclosure 12 via an opening 43 in the floor 16 .
  • the lift pin 40 has a horizontally extending upper section 44 , on which a wafer is supported during storage.
  • the lift pin 40 may be mounted directly to a lever 48 or may be held in a holder 46 which in turn is mounted on the lever 48 .
  • the lift pin 40 may be fixedly coupled to the lever 48 such that the angle therebetween remains fixed.
  • the lever 48 is mounted by means of a pivot 50 on a moveable base 52 .
  • a lift mechanism or actuator 54 is associated with the base 52 to selectively raise and lower the base 52 .
  • a spring 56 is connected between the base 52 and a free end 58 of the lever 48 .
  • the spring 56 biases the free end 58 of the lever 48 in a downward direction (counter-clockwise about the pivot 50 in FIG. 1).
  • a step 60 on the base 52 defines a horizontal position of the lever 48 by limiting the downward motion of the lever 48 relative to the base 52 .
  • a stop 62 is suspended from the chamber floor 16 and is positioned under the free end 58 of the lever 48 .
  • a bellows 64 accommodates translational and angular motion of the lift pin 40 and its holder 46 while preventing particles from the external environment from entering the enclosure 12 via the opening 43 .
  • a controller (not shown) is associated with processing chamber 10 to control operation of lift mechanisms 24 , 30 , 54 , slit valve 34 , and other components of processing chamber 10 which are not shown.
  • the inventive lift pin/actuating assembly is shown in its storage position in FIG. 1. Because of the relative positioning of the base 52 and the stop 62 , stop 62 does not come into play when the base is positioned as shown in FIG. 1, and the position of the lever 48 , as biased downwardly by the spring 56 , is determined by the step 60 of the base 52 .
  • Lever 48 is in substantially a horizontal orientation
  • lift pin 40 is in substantially a vertical orientation with the upper section 44 of lift pin 40 obstructing a path of travel of pedestal 20 .
  • Lift pin 40 is shown in its retracted position in FIG. 2.
  • the base 52 is moved downwardly from the position shown in FIG. 1.
  • the movement of base 52 in the downward direction is actuated by lifting mechanism 54 .
  • the stop 62 comes in contact with the free end 58 of the lever 48 , pushing the free end 58 of the lever 48 upwardly relative to the base 52 , against the biasing force of the spring 56 .
  • base 52 may be considered to have two ranges of movement. In a first range of movement at and above its position in FIG. 1, movement of base 52 raises or lowers lift pin 40 without pivoting lift pin 40 (as the lever 58 does not contact the stop 62 ). In a second range of movement between its respective positions in FIGS. 1 and 2, movement of base 52 results in pivoting of lift pin 40 (as the lever 58 contacts the stop 62 and pivots in response to contact therewith).
  • FIGS. 3 ( a )- 3 ( l ) illustrate steps performed during an exemplary wafer exchange operation with respect to the processing chamber 10 .
  • FIG. 3( a ) shows a condition that is in effect at a time when processing of wafer 36 is complete. It will be observed that wafer 36 is supported on the pedestal 20 in a processing position near the top of the processing chamber. The lift pin 40 is in its retracted (non-storage) position so that it does not obstruct the path of travel of the pedestal 20 .
  • the lift pin 40 is actuated, i.e. moved from its retracted position (FIG. 3( b ), FIG. 2) to its storage position (FIG. 3( c ), FIG. 1).
  • the lift pin 40 is no longer inclined, but rather is upright or vertical and hence positioned to support the wafer 36 on the upper section 44 of the lift pin 40 . From the foregoing discussion of FIGS. 1 and 2, it will be recognized that the pivoting of the lift pin 40 from its retracted position to its storage position is accomplished by raising the base 52 so as to free the lever 48 from contact with the stop 62 , thereby leaving lever 48 free to pivot downwardly in response to the biasing force of spring 56 .
  • lift pin 26 is lowered to place the new wafer 36 ′ on the pedestal 20 , as shown in FIG. 3( h ).
  • the robot blade 32 then reenters the processing chamber 10 , this time without a wafer being carried on the robot blade 32 .
  • the resulting condition is shown in FIG. 3( i ).
  • Lift pin 40 which supports the processed wafer 36 , is then lowered (by lowering the base 52 ) to place the wafer 36 on the robot blade 32 (FIG. 3( j )).
  • the robot blade 32 is then retracted from the processing chamber 10 , carrying the processed wafer 36 out of the chamber 10 .
  • the exchange of wafers is now complete, resulting in the condition shown in FIG.
  • Lift pin 40 is then moved from its storage position to its retracted position (FIG. 3( l )), by further lowering the base 52 to cause stop 62 to contact and pivot lever 48 (and the lift pin 40 fixedly coupled thereto), so that the path of travel of the pedestal 20 is no longer obstructed by the lift pin 40 . Accordingly, the pedestal 20 supporting the wafer 36 ′ may be raised to the processing position, which was initially shown in FIG. 3( a ).
  • the invention has been illustrated in the context of a chemical vapor deposition (CVD) chamber.
  • the invention may also be applied in a physical vapor deposition (PVD) chamber, an etching chamber, a photolithography chamber, a loadlock chamber, a degassing chamber, a heating chamber, a cooling chamber or at any location where substrates are exchanged.
  • PVD physical vapor deposition
  • the invention may also be employed in connection with substrates other than semiconductor wafers (e.g., glass plates and the like).
  • FIGS. 1 - 3 ( l ) is merely exemplary and that the configuration of the lift pin/actuating assembly may vary and still function in accordance with the invention.
  • a horizontal actuator may move the lift pin to the retracted position, contact a motion stop and translate further horizontal actuation into vertical motion.
  • the specific operation of the assembly may change and still function in accordance with the invention.
  • the position of the stop and the motion translator may be reversed such that the motion translator is raised to contact the stop, rather than lowered to contact the stop, etc.

Abstract

A set of lift pins defines a storage location for a substrate in a substrate processing chamber. Each lift pin has an actuating mechanism including a translating mechanism that translates vertical actuation into horizontal motion. The actuating mechanism may include a base, a mechanism adapted to raise and lower the base, and a lever pivotally mounted on the base. The lift pin may be fixedly mounted on the lever. A stop may be adjacent the base and adapted to engage the lever to pivot the lever as the base is lowered.

Description

    FIELD OF THE INVENTION
  • The present invention relates to semiconductor manufacturing of thin substrates or wafers and, more particularly, to the transfer and loading of semiconductor wafers, glass plates and the like into and out of processing chambers. [0001]
  • BACKGROUND OF THE INVENTION
  • Semiconductor manufacturing generally requires that a number of different processes be applied to a substrate such as a wafer. Typically, each process is applied to a wafer in a different chamber dedicated to a respective process. Thus the manufacturing process involves not only a sequence of processes carried out in the respective chambers, but also transporting wafers among the processing chambers, and loading and unloading wafers into and out of the processing chambers. Most semiconductor processing is carried out in chambers configured to process one wafer at a time, in a very high vacuum capable environment. Thus, a process to be performed in a particular chamber cannot be carried out while wafers are being loaded into or removed from the processing chamber. Consequently, reducing the time required to load and unload wafers into and out of processing chambers is a significant factor in maximizing manufacturing throughput. [0002]
  • It is therefore desirable to provide for rapid and reliable transfer of wafers to and from processing chambers. It is also desirable that chamber components which aid in the transfer of wafers be simple and inexpensive to manufacture. [0003]
  • SUMMARY OF THE INVENTION
  • According to a first aspect of the invention, a lift pin/actuating assembly includes a lift pin and an actuating mechanism having an actuator configured to generate movement by the lift pin along a first axis, and a translation mechanism coupled to the actuator and configured to translate movement of the actuator along the first axis into movement by the lift pin along a second axis. [0004]
  • According to a second aspect of the invention, a method of operating a substrate lift pin includes applying vertical actuation to the pin, moving the pin vertically a first distance, contacting a vertical motion stop after moving the first distance, and translating further vertical actuation into horizontal movement of the pin. [0005]
  • According to a third aspect of the invention, a lift pin/actuating assembly for a semiconductor processing chamber includes a lift pin adapted to hold a semiconductor substrate in the processing chamber. Also included in the lift pin/actuating assembly are a base on which the lift pin is mounted, a first mechanism adapted to raise and lower the base, and a second mechanism adapted to convert vertical motion of the base into pivoting motion of the lift pin. [0006]
  • According to a fourth aspect of the invention, a method of operating a semiconductor processing chamber includes providing a lift pin, mounting the lift pin so that it extends upwardly into the processing chamber, lowering a base on which the lift pin is mounted, and converting the lowering motion of the base into pivoting motion of the lift pin. [0007]
  • Other objects, features and advantages of the present invention will become more fully apparent from the following detailed description of the preferred embodiments, the appended claims and the accompanying drawings.[0008]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a somewhat schematic cross-sectional view of a processing chamber provided in accordance with an aspect of the invention, showing a lift pin in storage position; [0009]
  • FIG. 2 is a view similar to FIG. 1, showing the lift pin in a retracted position; and [0010]
  • FIGS. [0011] 3(a)-3(l) are partial cross-sectional views of the processing chamber of FIGS. 1 and 2, showing an exemplary sequence of steps for a substrate exchange procedure.
  • DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
  • An embodiment of the invention includes a lift pin/actuating assembly that employs a single actuator and a translation mechanism configured to translate actuation along a first axis into movement along a second axis (“movement along an axis” should be understood to include linear motion in the direction of the axis, or pivotal motion about the axis.) The actuating assembly is configured to allow actuation along the first axis to result in a predetermined range of lift pin movement along the first axis. Beyond the predetermined range of lift pin movement, further actuation along the first axis is translated into movement along the second axis. The translation mechanism may include a motion stop which defines the predetermined range of lift pin movement and a motion translator (e.g., a lever or an appropriately configured link such as a four bar link, etc.). [0012]
  • An aspect of the invention that employs a vertical motion actuator, a vertical motion stop, and a lever configured to translate vertical linear motion into horizontal pivoting motion is shown and described with reference to FIGS. [0013] 1-3(l).
  • FIG. 1 is a schematic cross-sectional view of a [0014] semiconductor processing chamber 10 provided in accordance with an aspect of the invention. The processing chamber 10 includes an enclosure 12 defined by side wall 14, chamber floor 16 and chamber top 18.
  • A [0015] heated pedestal 20 is mounted in the processing chamber 10 on a shaft 22. A lift mechanism 24 is associated with the shaft 22 to selectively raise and lower the pedestal 20. The pedestal 20 is provided to support a wafer in the chamber 10 during processing.
  • Conventional lift pins (of which only one [0016] pin 26 is shown) are provided to selectively lift a wafer from the pedestal 20 or to deposit a wafer on pedestal 20. The lift pins are raised and lowered via a lift plate 28 and a lift mechanism 30.
  • [0017] Reference numeral 32 represents a robot blade that has entered the processing chamber 10 via a slit valve 34 while carrying a wafer 36. A so-called “showerhead” 38 is suspended from the chamber top 18 and allows process gas to flow toward the pedestal 20 during processing.
  • In accordance with an aspect of the invention, a plurality of lift pins, and associated actuating mechanisms, are provided to define a wafer storage position within the [0018] enclosure 12. For clarity, only one lift pin 40 and its associated actuating mechanism 42 are shown. Note in the exemplary embodiment shown, the actuating mechanism 42 is positioned below the floor 16 of the processing chamber 10, and the lift pin 40 extends into the enclosure 12 via an opening 43 in the floor 16. The lift pin 40 has a horizontally extending upper section 44, on which a wafer is supported during storage. The lift pin 40 may be mounted directly to a lever 48 or may be held in a holder 46 which in turn is mounted on the lever 48. The lift pin 40 may be fixedly coupled to the lever 48 such that the angle therebetween remains fixed. The lever 48 is mounted by means of a pivot 50 on a moveable base 52. A lift mechanism or actuator 54 is associated with the base 52 to selectively raise and lower the base 52.
  • A [0019] spring 56 is connected between the base 52 and a free end 58 of the lever 48. The spring 56 biases the free end 58 of the lever 48 in a downward direction (counter-clockwise about the pivot 50 in FIG. 1). A step 60 on the base 52 defines a horizontal position of the lever 48 by limiting the downward motion of the lever 48 relative to the base 52. A stop 62 is suspended from the chamber floor 16 and is positioned under the free end 58 of the lever 48. A bellows 64 accommodates translational and angular motion of the lift pin 40 and its holder 46 while preventing particles from the external environment from entering the enclosure 12 via the opening 43.
  • Those who are skilled in the art will appreciate that a controller (not shown) is associated with [0020] processing chamber 10 to control operation of lift mechanisms 24, 30, 54, slit valve 34, and other components of processing chamber 10 which are not shown.
  • The inventive lift pin/actuating assembly is shown in its storage position in FIG. 1. Because of the relative positioning of the [0021] base 52 and the stop 62, stop 62 does not come into play when the base is positioned as shown in FIG. 1, and the position of the lever 48, as biased downwardly by the spring 56, is determined by the step 60 of the base 52. Lever 48 is in substantially a horizontal orientation, and lift pin 40 is in substantially a vertical orientation with the upper section 44 of lift pin 40 obstructing a path of travel of pedestal 20.
  • [0022] Lift pin 40 is shown in its retracted position in FIG. 2. To move the lift pin 40 from its storage position (FIG. 1) to its retracted position (FIG. 2) the base 52 is moved downwardly from the position shown in FIG. 1. The movement of base 52 in the downward direction is actuated by lifting mechanism 54. As the base 52 is moved downwardly, the stop 62 comes in contact with the free end 58 of the lever 48, pushing the free end 58 of the lever 48 upwardly relative to the base 52, against the biasing force of the spring 56. The lever 48, in response to contact with stop 62, thus pivots on pivot 50, causing holder 46 and lift pin 40 to be inclined or tilted from the vertical, thereby bringing lift pin 40 to its retracted position shown in FIG. 2. In its retracted position lift pin 40 does not obstruct the path of travel of pedestal 20.
  • It will be recognized from FIGS. 1 and 2 that [0023] base 52 may be considered to have two ranges of movement. In a first range of movement at and above its position in FIG. 1, movement of base 52 raises or lowers lift pin 40 without pivoting lift pin 40 (as the lever 58 does not contact the stop 62). In a second range of movement between its respective positions in FIGS. 1 and 2, movement of base 52 results in pivoting of lift pin 40 (as the lever 58 contacts the stop 62 and pivots in response to contact therewith).
  • With the lift [0024] pin actuating mechanism 42 shown in FIGS. 1 and 2, a single lift mechanism or actuator 54 is employed both to translate the lift pin 40 in a vertical direction and to impart angular motion to the lift pin 40 (by means of the interaction between the lever 48 and the stop 62). That is, the single lift mechanism 54 both raises and lowers lift pin 40 and pivots lift pin 40 between the storage position and the retracted position. Consequently, the inventive actuating mechanism 42 provides a relatively simple and cost effective arrangement for both raising and pivoting the lift pin 40.
  • FIGS. [0025] 3(a)-3(l) illustrate steps performed during an exemplary wafer exchange operation with respect to the processing chamber 10.
  • FIG. 3([0026] a) shows a condition that is in effect at a time when processing of wafer 36 is complete. It will be observed that wafer 36 is supported on the pedestal 20 in a processing position near the top of the processing chamber. The lift pin 40 is in its retracted (non-storage) position so that it does not obstruct the path of travel of the pedestal 20.
  • After the condition of FIG. 3([0027] a), the pedestal 20 is lowered and the lift pin 26 lifts the wafer 36 from the pedestal 20, to produce the position shown in FIG. 3(b). The pedestal 20 is now in a loading position.
  • Next, the [0028] lift pin 40 is actuated, i.e. moved from its retracted position (FIG. 3(b), FIG. 2) to its storage position (FIG. 3(c), FIG. 1). The lift pin 40 is no longer inclined, but rather is upright or vertical and hence positioned to support the wafer 36 on the upper section 44 of the lift pin 40. From the foregoing discussion of FIGS. 1 and 2, it will be recognized that the pivoting of the lift pin 40 from its retracted position to its storage position is accomplished by raising the base 52 so as to free the lever 48 from contact with the stop 62, thereby leaving lever 48 free to pivot downwardly in response to the biasing force of spring 56.
  • Next, the [0029] lift pin 40 is raised (by further raising the base 52) so that the lift pin 40 lifts the wafer 36 from the lift pin 26. The resulting position is shown in FIG. 3(d). In the condition shown in FIG. 3(d) the wafer 36 is held in a storage position by the upper section 44 of the lift pin 40.
  • At the next step, [0030] robot blade 32 enters the chamber 10 carrying a new wafer 36′ which is to be processed in the chamber. The resulting condition is shown in FIG. 3(e). The lift pin 26 is then raised to lift the wafer 36′ from the robot blade 32 (FIG. 3(f)). The robot blade 32 then retracts from the processing chamber 10, to result in the condition shown in FIG. 3(g).
  • At the next step of the exchange operation, [0031] lift pin 26 is lowered to place the new wafer 36′ on the pedestal 20, as shown in FIG. 3(h). The robot blade 32 then reenters the processing chamber 10, this time without a wafer being carried on the robot blade 32. The resulting condition is shown in FIG. 3(i). Lift pin 40, which supports the processed wafer 36, is then lowered (by lowering the base 52) to place the wafer 36 on the robot blade 32 (FIG. 3(j)). The robot blade 32 is then retracted from the processing chamber 10, carrying the processed wafer 36 out of the chamber 10. The exchange of wafers is now complete, resulting in the condition shown in FIG. 3(k). Lift pin 40 is then moved from its storage position to its retracted position (FIG. 3(l)), by further lowering the base 52 to cause stop 62 to contact and pivot lever 48 (and the lift pin 40 fixedly coupled thereto), so that the path of travel of the pedestal 20 is no longer obstructed by the lift pin 40. Accordingly, the pedestal 20 supporting the wafer 36′ may be raised to the processing position, which was initially shown in FIG. 3(a).
  • The foregoing description discloses only a preferred embodiment of the invention; modifications of the above disclosed apparatus and method which fall within the scope of the invention will be readily apparent to those of ordinary skill in the art. For example, the invention has been illustrated in the context of a chemical vapor deposition (CVD) chamber. The invention may also be applied in a physical vapor deposition (PVD) chamber, an etching chamber, a photolithography chamber, a loadlock chamber, a degassing chamber, a heating chamber, a cooling chamber or at any location where substrates are exchanged. The invention may also be employed in connection with substrates other than semiconductor wafers (e.g., glass plates and the like). [0032]
  • It will be understood that the embodiment shown in FIGS. [0033] 1-3(l) is merely exemplary and that the configuration of the lift pin/actuating assembly may vary and still function in accordance with the invention. For instance, a horizontal actuator may move the lift pin to the retracted position, contact a motion stop and translate further horizontal actuation into vertical motion. Further the specific operation of the assembly may change and still function in accordance with the invention. For example, the position of the stop and the motion translator may be reversed such that the motion translator is raised to contact the stop, rather than lowered to contact the stop, etc.
  • Accordingly, while the present invention has been disclosed in connection with the preferred embodiments thereof, it should be understood that other embodiments may fall within the spirit and scope of the invention, as defined by the following claims. [0034]

Claims (34)

The invention claimed is:
1. A lift pin/actuating assembly, comprising:
a lift pin; and
an actuating mechanism having an actuator configured to generate movement of the lift pin along a first axis, and a translation mechanism coupled to the actuator and configured to translate movement of the actuator along the first axis into movement of the lift pin along a second axis.
2. The assembly of claim 1, wherein the movement of the lift pin along the first axis is a vertical movement, and the movement of the lift pin along the second axis is a horizontally pivoting movement about the second axis.
3. The assembly of claim 1, wherein the translation mechanism comprises a motion stop configured to stop movement of the lift pin along the first axis at a predetermined point, and a motion translator configured to translate actuation of the lift pin along the first axis into movement of the lift pin along the second axis, after the predetermined point is reached.
4. The assembly of claim 2, wherein the translation mechanism comprises a motion stop configured to stop movement of the lift pin along the first axis at a predetermined point, and a motion translator configured to translate actuation of the lift pin along the first axis into movement of the lift pin along the second axis, after the predetermined point is reached.
5. The assembly of claim 3, wherein the motion translator comprises a lever.
6. The assembly of claim 4, wherein the motion translator comprises a lever.
7. A method of operating a substrate lift pin, comprising:
applying vertical actuation to the pin;
moving the pin vertically a first distance;
contacting a vertical motion stop after moving the first distance; and
translating further vertical actuation into horizontal movement of the pin.
8. The method of claim 7, wherein the horizontal movement is a horizontal pivoting movement.
9. The method of claim 8, wherein translating further vertical actuation into horizontal movement comprises employing a lever.
10. A lift pin/actuating assembly for a substrate processing chamber, comprising:
a lift pin adapted to hold a substrate in the processing chamber;
a base on which the lift pin is mounted;
a first mechanism adapted to raise and lower the base; and
a second mechanism adapted to convert vertical motion of the base into pivoting motion of the lift pin.
11. The assembly of claim 10, wherein the second mechanism pivots the lift pin outwardly as the base is lowered.
12. The assembly of claim 10, wherein the lift pin has a horizontally extending upper section on which the substrate is held.
13. The assembly of claim 10, further comprising a spring mounted on the base to bias the lift pin toward a storage position.
14. The assembly of claim 13, wherein the second mechanism pivots the lift pin away from the storage position as the base is lowered.
15. A lift pin/actuating assembly for a substrate processing chamber, comprising:
a base;
a mechanism adapted to raise and lower the base;
a lever pivotally mounted on the base;
a lift pin adapted to hold a substrate in the processing chamber, the lift pin mounted on the lever; and
a stop adjacent the base and adapted to engage the lever to pivot the lever as the base moves vertically.
16. The assembly of claim 15, wherein a pedestal is mounted for vertical movement in the processing chamber, and the lift pin is moveable to pivot between a first position in which the lift pin obstructs a path of movement of the pedestal and a second position in which the lift pin does not obstruct the path of movement of the pedestal.
17. The assembly of claim 16, further comprising a spring adapted to bias the lift pin toward the first position.
18. The assembly of claim 17, wherein the base includes a step against which the spring biases the lever when the lever is not engaged by the stop.
19. The assembly of claim 18, wherein the spring biases the lever in a downward direction, and the stop engages the lever from below as the base is lowered.
20. The assembly of claim 15, wherein the lift pin has a horizontally extending upper section on which the substrate is held.
21. A method of operating a semiconductor processing chamber, comprising:
providing a lift pin;
mounting the lift pin so that it extends upwardly into the processing chamber;
lowering a base on which the lift pin is mounted; and
converting the lowering motion of the base into pivoting motion of the lift pin.
22. The method of claim 21, wherein the lift pin is pivoted outwardly as the base is lowered.
23. The method of claim 21, wherein the lift pin is pivoted between a storage position in which the lift pin is positioned to hold a substrate and a retracted position in which the lift pin is not positioned to hold the substrate.
24. The method of claim 23, further comprising raising the lift pin to lift the substrate from another lift pin provided in the processing chamber.
25. The method of claim 24, wherein the raising of the lift pin is performed by raising the base.
26. The method of claim 24, further comprising lowering the lift pin which lifted the substrate to place the substrate on a robot blade that has entered the processing chamber.
27. The method of claim 26, wherein the lowering of the lift pin is performed by lowering the base.
28. A processing chamber, comprising:
a chamber enclosure;
a lift pin adapted to hold a semiconductor substrate in the chamber enclosure;
a base on which the lift pin is mounted;
a first mechanism arranged to raise and lower the base; and
a second mechanism adapted to convert vertical motion of the base into pivoting motion of the lift pin.
29. The processing chamber of claim 28, wherein the second mechanism includes a stop adjacent the base and adapted to engage a lever on which the lift pin is mounted, the lever being mounted on the base.
30. The processing chamber of claim 28, further comprising a pedestal that is movable between a transfer position and a processing position, the lift pin being movable between a storage position in which the lift pin obstructs a path of movement of the pedestal and a retracted position in which the lift pin does not obstruct the path of travel of the pedestal.
31. The processing chamber of claim 30, further comprising a spring adapted to bias the lift pin toward the storage position.
32. A lift pin/actuating assembly for a semiconductor processing chamber, comprising:
a lift pin adapted to hold a substrate in the processing chamber; and
a movement mechanism on which the lift pin is mounted, the movement mechanism having a first range of movement in which lowering of the movement mechanism causes the lift pin to be lowered without pivoting and having a second range of movement in which lowering of the movement mechanism causes the lift pin to pivot.
33. The assembly of claim 32, wherein the first range of movement of the movement mechanism is above the second range of movement of the movement mechanism.
34. The assembly of claim 32, wherein the movement mechanism pivots the lift pin between a storage position in which the lift pin is positioned to hold the substrate and a retracted position in which the lift pin is not positioned to hold the substrate.
US09/895,441 2001-06-29 2001-06-29 Lift pin actuating mechanism for semiconductor processing chamber Expired - Fee Related US6767176B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US09/895,441 US6767176B2 (en) 2001-06-29 2001-06-29 Lift pin actuating mechanism for semiconductor processing chamber

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/895,441 US6767176B2 (en) 2001-06-29 2001-06-29 Lift pin actuating mechanism for semiconductor processing chamber

Publications (2)

Publication Number Publication Date
US20030000775A1 true US20030000775A1 (en) 2003-01-02
US6767176B2 US6767176B2 (en) 2004-07-27

Family

ID=25404515

Family Applications (1)

Application Number Title Priority Date Filing Date
US09/895,441 Expired - Fee Related US6767176B2 (en) 2001-06-29 2001-06-29 Lift pin actuating mechanism for semiconductor processing chamber

Country Status (1)

Country Link
US (1) US6767176B2 (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005069352A1 (en) * 2004-01-16 2005-07-28 Icos Vision Systems N.V. Lifting device and method for lifting and changing wafers
US20080295771A1 (en) * 2007-05-30 2008-12-04 Industrial Technology Research Institute Power-delivery mechanism and apparatus of plasma-enhanced chemical vapor deposition using the same
US20090155025A1 (en) * 2007-12-12 2009-06-18 Applied Materials, Inc. Lift pin for substrate processing
US20090314211A1 (en) * 2008-06-24 2009-12-24 Applied Materials, Inc. Big foot lift pin
US10192774B2 (en) * 2014-10-09 2019-01-29 Tokyo Electron Limited Temperature control device for processing target object and method of selectively etching nitride film from multilayer film
CN110164812A (en) * 2018-02-14 2019-08-23 万润科技股份有限公司 Microscope carrier and the wafer method for measurement and device for using microscope carrier
TWI712103B (en) * 2017-11-29 2020-12-01 南韓商Tes股份有限公司 Method of moving a lift pin unit and a substrate processing apparatus
US11004722B2 (en) 2017-07-20 2021-05-11 Applied Materials, Inc. Lift pin assembly
US20220100096A1 (en) * 2020-09-29 2022-03-31 Semes Co., Ltd. Cooling unit, substrate treating apparatus including the same, and substrate treating method using the same
US20220208595A1 (en) * 2020-12-31 2022-06-30 Piotech Inc. Wafer support pin lifting device

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4121413B2 (en) * 2003-03-31 2008-07-23 株式会社神戸製鋼所 High-pressure processing equipment for plate-like products
KR100829923B1 (en) * 2006-08-30 2008-05-16 세메스 주식회사 Spin head and method using the same for treating substrate
CN107871681B (en) 2016-09-27 2019-10-08 北京北方华创微电子装备有限公司 One kind going to gas chamber and semiconductor processing device
US9960068B1 (en) * 2016-12-02 2018-05-01 Lam Research Corporation Moment cancelling pad raising mechanism in wafer positioning pedestal for semiconductor processing
US11183418B2 (en) * 2017-06-01 2021-11-23 Applied Materials, Inc. Two axis goniometer to accomplish fine, permanent, calibration of lift pin hoop orientation

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4861222A (en) * 1984-03-09 1989-08-29 Tegal Corporation Cassette elevator for use in a modular article processing machine
US4859137A (en) * 1987-10-21 1989-08-22 Asyst Technologies Apparatus for transporting a holder between a port opening of a standardized mechanical interface system and a loading and unloading station
US5100502A (en) 1990-03-19 1992-03-31 Applied Materials, Inc. Semiconductor wafer transfer in processing systems
JPH09213772A (en) * 1996-01-30 1997-08-15 Dainippon Screen Mfg Co Ltd Board holder
US6102164A (en) 1996-02-28 2000-08-15 Applied Materials, Inc. Multiple independent robot assembly and apparatus for processing and transferring semiconductor wafers
US5879128A (en) 1996-07-24 1999-03-09 Applied Materials, Inc. Lift pin and support pin apparatus for a processing chamber
US6190113B1 (en) * 1997-04-30 2001-02-20 Applied Materials, Inc. Quartz pin lift for single wafer chemical vapor deposition/etch process chamber
US5899653A (en) * 1997-06-23 1999-05-04 Applied Materials, Inc. Two-stage vacuum bellows
US6309163B1 (en) * 1997-10-30 2001-10-30 Applied Materials, Inc. Wafer positioning device with storage capability
US6151446A (en) * 1999-07-06 2000-11-21 Applied Materials, Inc. Apparatus and method for thermally processing substrates including a processor using multiple detection signals
US6485248B1 (en) * 2000-10-10 2002-11-26 Applied Materials, Inc. Multiple wafer lift apparatus and associated method

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005069352A1 (en) * 2004-01-16 2005-07-28 Icos Vision Systems N.V. Lifting device and method for lifting and changing wafers
US20080295771A1 (en) * 2007-05-30 2008-12-04 Industrial Technology Research Institute Power-delivery mechanism and apparatus of plasma-enhanced chemical vapor deposition using the same
US7927425B2 (en) * 2007-05-30 2011-04-19 Industrial Technology Research Institute Power-delivery mechanism and apparatus of plasma-enhanced chemical vapor deposition using the same
US20090155025A1 (en) * 2007-12-12 2009-06-18 Applied Materials, Inc. Lift pin for substrate processing
US8256754B2 (en) 2007-12-12 2012-09-04 Applied Materials, Inc. Lift pin for substrate processing
US20090314211A1 (en) * 2008-06-24 2009-12-24 Applied Materials, Inc. Big foot lift pin
US10192774B2 (en) * 2014-10-09 2019-01-29 Tokyo Electron Limited Temperature control device for processing target object and method of selectively etching nitride film from multilayer film
US11004722B2 (en) 2017-07-20 2021-05-11 Applied Materials, Inc. Lift pin assembly
TWI712103B (en) * 2017-11-29 2020-12-01 南韓商Tes股份有限公司 Method of moving a lift pin unit and a substrate processing apparatus
CN110164812A (en) * 2018-02-14 2019-08-23 万润科技股份有限公司 Microscope carrier and the wafer method for measurement and device for using microscope carrier
US20220100096A1 (en) * 2020-09-29 2022-03-31 Semes Co., Ltd. Cooling unit, substrate treating apparatus including the same, and substrate treating method using the same
US20220208595A1 (en) * 2020-12-31 2022-06-30 Piotech Inc. Wafer support pin lifting device

Also Published As

Publication number Publication date
US6767176B2 (en) 2004-07-27

Similar Documents

Publication Publication Date Title
US6767176B2 (en) Lift pin actuating mechanism for semiconductor processing chamber
JP4386603B2 (en) Cell, substrate transfer method and substrate exchange method
US6575737B1 (en) Method and apparatus for improved substrate handling
US6468353B1 (en) Method and apparatus for improved substrate handling
JP4244555B2 (en) Support mechanism for workpiece
US8382088B2 (en) Substrate processing apparatus
US20110000232A1 (en) Load lock apparatus and substrate cooling method
US6331095B1 (en) Transportation system and processing apparatus employing the transportation system
JP4753224B2 (en) Gas line system
US20030000647A1 (en) Substrate processing chamber
KR20010108426A (en) Perimeter wafer lifting
US11784075B2 (en) Batch substrate support with warped substrate capability
US9302358B2 (en) Chamber elements and a method for placing a chamber at a load position
US8545158B2 (en) Loading unit and processing system
US20100247274A1 (en) Substrate exchanging mechanism and method of exchanging substrates
US6860711B2 (en) Semiconductor-manufacturing device having buffer mechanism and method for buffering semiconductor wafers
US11791180B2 (en) Substrate transfer system and load lock module
US7091496B2 (en) Electron microscopic inspection apparatus
JP7321095B2 (en) pod opener
US20010041121A1 (en) Single chamber vacuum processing tool
US6969841B2 (en) Method and apparatus for securing microelectronic workpiece containers
WO2002005322A2 (en) Automatic slit/gate valve
JP2005251881A (en) Carrying device
TW202401639A (en) Abnormality detection method and transfer device
JP2002164403A (en) Method and apparatus for transferring surface treated substrate

Legal Events

Date Code Title Description
AS Assignment

Owner name: APPLIED MATERIALS, INC., CALIFORNIA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:YUDOVSKY, JOSEPH;UMOTOY, SALVADOR P.;REEL/FRAME:011976/0739

Effective date: 20010625

REMI Maintenance fee reminder mailed
LAPS Lapse for failure to pay maintenance fees
STCH Information on status: patent discontinuation

Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

FP Expired due to failure to pay maintenance fee

Effective date: 20080727