US 20050098895 A1
Provided are methods and composition for forming diamond metal-filled patterns above an integrated circuit substrate. A metal layer is formed above the integrated circuit substrate, which is then patterned such that a metal line is created. A plurality of diamond-shaped metal regions are then formed at least one of above and adjacent to the metal line formed on the integrated circuit substrate such that the density of metal on the integrated circuit substrate is greater than a specified density, thereby ensuring that a surface of dielectric formed above the metal line remains substantially planar after application of CMP to the dielectric layer.
14. An integrated circuit formed on an integrated circuit substrate, comprising:
at least one metal line formed above the integrated circuit substrate; and
a plurality of diamond-shaped metal regions formed at least one of above and adjacent to the metal line formed above the integrated circuit substrate such that the density of metal on the integrated circuit substrate is greater than a specified density; and
a dielectric layer formed above the plurality of diamond-shaped metal regions.
15. The integrated circuit as recited in
16. The integrated circuit as recited in
17. The integrated circuit as recited in
18. The integrated circuit as recited in
19. The integrated circuit as recited in
20. The integrated circuit as recited in
21. The integrated circuit as recited in
22. The integrated circuit as recited in
23. The integrated circuit as recited in
24. The integrated circuit as recited in
25. The integrated circuit as recited on
1. Field of the Invention
The present invention relates to the formation of metal-filled patterns in semiconductor wafer fabrication. More particularly, the present invention relates to the formation of a diamond metal-filled patterns achieving low parasitic coupling capacitance.
2. Description of the Related Art
In recent years, chemical-mechanical polishing (CMP) has become the primary technique for planarizing interlayer dielectrics. Although CMP is effective at planarization, CMP processes are hampered by layout pattern sensitivities which cause certain regions on a chip to have thicker dielectric layers than other regions due to differences in the underlying topography. This problem has become particularly severe as performance requirements have increased, dimensions have scaled, and larger die sizes have appeared. CMP has also been widely used in VLSI technology development as a tool for creating shallow trench isolation and in damascene processes.
In order to reduce layout pattern dependent dielectric thickness variation, the layout pattern itself is changed via the introduction of metal-fill patterning. Metal-fill patterning is the process of filling the large open areas on each metal layer with a metal pattern, which is either grounded or left floating, to compensate for pattern-driven variations. Unfortunately, due to the confidential nature of metal-fill patterning practices and design rules, relatively little information about metal-fill patterning practices has been available to the public.
In addition to reducing layout pattern dependent dielectric thickness variation, metal-fill patterning practice should also minimize the parasitic capacitance associated with the metal-fill. However, conventional metal-fill generally introduces a substantial amount of parasitic capacitance due to capacitance between the metal-fill and metal lines of the integrated circuit formed on an integrated circuit substrate. In view of the above, it would be beneficial if metal-fill patterning with reduced parasitic coupling capacitance could be achieved.
Methods and apparatus for forming metal-fill on an integrated circuit substrate are disclosed. Specifically, the metal-fill is formed in diamond patterns. In this manner, advantages of metal-fill are achieved while achieving low parasitic coupling capacitance.
In accordance with one aspect, methods and composition for forming diamond metal-filled patterns above an integrated circuit substrate. A metal layer is formed above the integrated circuit substrate, which is then patterned such that a metal line is created. A plurality of diamond-shaped metal regions are then formed at least one of above and adjacent to the metal line formed on the integrated circuit substrate such that the density of metal on the integrated circuit substrate is greater than a specified density, thereby ensuring that a surface of dielectric formed above the metal line remains substantially planar after application of CMP to the dielectric layer.
In accordance with another aspect of the invention, the diamond metal-filled patterned regions are oriented at 45 degrees with respect to the metal line(s), as well as with respect to the substrate. The patterned regions may be 3-dimensional, 6-sided blocks, as well as substantially planar, 2-dimensional regions. Since the diamond-shaped regions are oriented at 45 degrees from the metal line(s) and the y-axis, the parasitic coupling capacitance is reduced while providing advantages of conventional metal-fill techniques.
These and other features and advantages of the present invention are described below with reference to the drawings.
In the following description, numerous specific details are set forth in order to fully illustrate preferred embodiments of the present invention. It will be apparent, however, that the present invention may be practiced without limitation to some specific details presented herein. For example, the metal-fill may be formed using various numbers of patterned regions as well as from different metals.
The dimensions of the diamond shaped regions are such that they preferably form a 6-sided, 3-dimensional diamond shape. In other words, a 3-dimensional shape such as a square (or rectangular) block metal-fill region may be rotated 45 degrees to generate a diamond shaped block. In alternative embodiments, the diamond shaped region is a four-sided substantially planar surface, with four sides that are equivalent in length. The diamond-shaped patterned regions are preferably 3-dimensional.
Alternatively, a rectangular shaped 3-dimensional block or substantially planar patterned region may also be rotated 45 degrees with respect to the x-axis to generate an oblong diamond shaped region (not shown). In other words, the four lengths of the sides of the patterned region would include two opposing sides of a first length and two opposing sides of a second length different from the first length.
The buffer space between the diamonds, and between the diamonds and metal lines, is preferably approximately from 0.7 to 1.00 micro-meters. It is important to note that this spacing may be altered in order to increase or decrease the metal density.
In accordance with one embodiment, the metal-fill is grounded rather than floating. In other words, the diamond metal-fill regions are connected to the nearest ground connection. Alternatively, the diamond metal-fill regions may be left unconnected (i.e., floating). Grounded metal-fill is preferable, since capacitive coupling is minimized. In addition, metal-fill regions are at a known potential, and therefore layout-parasitic extraction tools can be used to re-verify and simulate a layout after the metal-fill has been placed.
As can be seen from Equation 1, the capacitance is proportional to the dielectric constant and inversely proportional to the separation distance S between two conductors. Thus, it would be desirable to increase the separation distance S.
The parasitic capacitance resulting from the diamond metal-fill may be ascertained by computing capacitance associated with a single diamond region 214 having an associated coupling length Ld 216 and spacing Sd 218 between the diamond 214 and the metal layer 202 (i.e., signal net). The equation for computing the capacitance 220 resulting from the parasitic coupling between the metal layer 202 and the diamond metal-fill regions 214 is as follows:
As shown in
The metal-fill regions are preferably designed using a pattern generation tool such as Hercules, available from SYNOPSYS Inc., located in Mountain View, Calif. The diamond shaped metal-filled regions can then be formed through conventional patterning techniques. Specifically, chip fabrication typically involves the basic operations of layering and patterning. Layering is an operation used to add thin layers of material (typically insulator, semi-conductor or conductor) to the surface of the semiconductor wafer. Layers are typically either grown (for example, thermal oxidation of silicon to grow a silicon dioxide dielectric layer) or deposited by a variety of techniques such as chemical vapor deposition (CVD) and physical vapor deposition (PVD), including evaporation and sputtering. Patterning, is an operation that is used to remove specific portions of the top layer or layers on the wafer surface. Patterning is usually accomplished through the use of photolithography (also known as photo-masking) to transfer the semiconductor design to the wafer surface. Patterning is often used to expose an area to be etched. The diamond shaped regions or blocks may be formed from any metal at various metal layers, including but not limited to, metal layer 1 or above.
Currently, for 0.13 micrometer, 90 nanometer, and below process technologies, the metal density of a chip fabricated on a silicon substrate must meet criteria specified by semiconductor foundries to ensure the silicon surface remains flat after the CMP process step has been completed. Those requirements are currently that for a ratio of total metal area of 40000 um2 (e.g., the area of a 200 um by 200 um window), the metal density must be greater than 20 percent. In order to meet the above criteria, metal-fill patterns are added to the chip locations where the metal density is below 20 percent within the 200 um by 200 um window size. This may be accomplished by using a design tool such as that described above.
Once the diamond shaped metal-fill regions are formed above the metal layer, a dielectric is formed above the metal-fill. The dielectric layer is then planarized using CMP. In this manner, the present invention enables the silicon surface to remain substantially planar, thereby controlling intra-level dielectric thickness variation.
The present invention enables metal-fill to be formed such that parasitic capacitance is reduced. This is accomplished through the formation of diamond shaped metal-fill regions across an integrated circuit. In this manner, advantages provided by conventional metal-fill techniques are preserved while reducing the parasitic capacitance introduced by the metal-fill.
Although the foregoing invention has been described in some detail for purposes of clarity of understanding, it will be apparent that certain changes and modifications may be practiced within the scope of the appended claims. Therefore, the present embodiments are to be considered as illustrative and not restrictive, and the invention is not to be limited to the details given herein, but may be modified within the scope of the appended claims.