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Publication numberUS20060138431 A1
Publication typeApplication
Application numberUS 10/514,638
PCT numberPCT/JP2002/012969
Publication dateJun 29, 2006
Filing dateDec 11, 2002
Priority dateMay 17, 2002
Also published asUS7871843, US20090315012
Publication number10514638, 514638, PCT/2002/12969, PCT/JP/2/012969, PCT/JP/2/12969, PCT/JP/2002/012969, PCT/JP/2002/12969, PCT/JP2/012969, PCT/JP2/12969, PCT/JP2002/012969, PCT/JP2002/12969, PCT/JP2002012969, PCT/JP200212969, PCT/JP2012969, PCT/JP212969, US 2006/0138431 A1, US 2006/138431 A1, US 20060138431 A1, US 20060138431A1, US 2006138431 A1, US 2006138431A1, US-A1-20060138431, US-A1-2006138431, US2006/0138431A1, US2006/138431A1, US20060138431 A1, US20060138431A1, US2006138431 A1, US2006138431A1
InventorsRobert Dwilinski, Roman Doradzinski, Jerzy Garczynski, Leszek Sierzputowski, Yasuo Kanbara
Original AssigneeRobert Dwilinski, Roman Doradzinski, Jerzy Garczynski, Leszek Sierzputowski, Yasuo Kanbara
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Light emitting device structure having nitride bulk single crystal layer
US 20060138431 A1
Abstract
The object of this invention is to provide a high-output type nitride light emitting device. The nitride light emitting device comprises an n-type nitride semiconductor layer, a p-type nitride semiconductor layer and an active layer therebetween, wherein the light emitting device comprises a gallium-containing nitride semiconductor layer prepared by crystallization from supercritical ammonia-containing solution in the nitride semiconductor layer.
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Claims(11)
1. A light emitting device structure comprising an n-type nitride semiconductor layer, an active layer comprising an In-containing nitride semiconductor, and a p-type nitride semiconductor layer, formed on a substrate for growth,
wherein said light emitting device structure comprises a gallium-containing nitride semiconductor layer prepared by crystallization from supercritical ammonia-containing solution formed on ternary or quaternary nitride layer in said nitride semiconductor layer.
2. The light emitting device structure according to claim 1, wherein said substrate is a gallium-containing nitride bulk single crystal prepared by crystallization from supercritical ammonia-containing solution.
3. The light emitting device structure according to claim 1, wherein said substrate has at least one plane selected from the group comprising A-plane, M-plane, R-plane, C-plane, {1-10n (n is a natural number)}, and {11-2m (m is a natural number)} of the gallium-containing nitride bulk single crystal, as its own surface.
4. The light emitting device structure according to claim 1, wherein said substrate is not a substrate of nitride semiconductor.
5. The light emitting device structure according to claim 1, wherein said substrate has dislocation density of 106/cm2 or less.
6. The light emitting device structure according to claim 1, wherein said n-type nitride semiconductor layer is deposited on the substrate directly or through the AlxGa1-xN (0≦x≦1) buffer layer.
7. The light emitting device structure according to claim 1, wherein said substrate is a composite substrate (template), which comprises gallium-containing nitride grown on a heterogeneous substrate by crystallization from supercritical ammonia-containing solution.
8. The light emitting device structure comprising an n-type nitride semiconductor layer, an active layer comprising an In-containing nitride semiconductor, and a p-type nitride semiconductor layer, formed on a substrate for growth,
wherein said light emitting device structure comprises a single crystal AlxGa1-xN (0≦x≦1) layer doped with impurities prepared by crystallization from supercritical ammonia-containing solution.
9. The light emitting device structure comprising an n-type nitride semiconductor layer, an active layer comprising an In-containing nitride semiconductor, and a p-type nitride semiconductor layer, formed on a substrate for growth,
wherein said light emitting device structure comprises a high-resistance single crystal AlxGa1-xN (0≦x≦1) layer prepared by crystallization from supercritical ammonia-containing solution as a current confinement layer.
10. The light emitting device structure according to claim 8, wherein said active layer is a quantum well layer structure comprising at least one of InGaN well layer or InAlGaN well layer.
11. The light emitting device structure according to claim 1, wherein said light emitting device structure is used for a semiconductor laser device and formed on A-plane or M-plane of the bulk single crystal gallium-containing nitride semiconductor substrate, and the light emitting surface of the resonator is M-plane of A-plane.
Description
TECHNICAL FIELD

The present invention relates to a structure wherein a single crystal nitride layer prepared by crystallization from supercritical ammonia-containing solution is used as a substrate or an intermediate layer of light emitting devices such as a laser structure etc.

BACKGROUND ART

In the nitride semiconductor laser, crystal defect or dislocation of a waveguide causes electron-hole pairs to make non-radiative recombination therein. Ideally, considering the laser function, the dislocation density in the waveguide may be 106/cm2 or less, preferably 104/cm2 or less. However, in the present situation, the dislocation density can not be reduced to less than 106/cm2 by using a vapor phase epitaxial growth (MOCVD and HVPE) or by using a repeated ELOG (Epitaxial lateral overgrowth), because the waveguide is grown on a heterogeneous substrate, such as sapphire substrate or SiC substrate.

To form a light emitting device comprising nitride semiconductor on a sapphire substrate or a SiC substrate without crack, the nitride semiconductor having the reduced dislocation density is required to be grown in the form of a thin layer on a sapphire substrate or a SiC substrate. If the nitride semiconductor is grown in the form of a thick layer on the substrate such as sapphire substrate etc, the curving of the substrate will be bigger, which leads to higher probability of crack occurrence. However, the nitride semiconductor in the form of a thin layer, in which the dislocation density is reduced, has not been realized by the vapor phase epitaxial growth.

To summarize the above, there has been a limitation to form a nitride semiconductor light emitting device (especially a laser device) by the vapor phase growth. Moreover, regarding the light emitting diode, in case that the higher luminance and higher output are required, the crystal dislocation of the substrate and of the intermediate layer will be a serious problem.

DISCLOSURE OF INVENTION

The first object of the present invention is to provide a light emitting device structure, which comprises a light emitting device comprising an n-type nitride semiconductor layer, an active layer comprising an In-containing nitride semiconductor, and a p-type nitride semiconductor layer, formed on a substrate for growth, wherein the light emitting device comprises a gallium-containing nitride semiconductor layer prepared by crystallization from supercritical ammonia-containing solution, instead of the so-far used vapor phase growth. The gallium-containing nitride semiconductor layer as one of the layers in the light emitting device is prepared by crystallization from supercritical ammonia-containing solution so that the crystalline quality of the layers formed on the gallium-containing nitride semiconductor layer can be recovered.

The second object of the present invention is to form a substrate for growth having low dislocation density by using a gallium-containing nitride bulk single crystal prepared by crystallization from supercritical ammonia-containing solution. Accordingly, the nitride semiconductor device formed on the substrate can be a nitride semiconductor with lower dislocation density. Concretely, this object is to form a nitride substrate having a lower dislocation density, i.e. 105/cm2 or less and more preferably 104/cm2 or less and to form thereon a light emitting device (laser structure etc.) having less crystal dislocation causing non-radiative recombination.

The third object of the present invention is to provide a light emitting device structure, such as a laser device etc, which comprises a high-resistance layer prepared by crystallization from supercritical ammonia-containing solution as a current confinement layer.

The inventors of the present invention found the following matters by using a technique wherein a gallium-containing nitride is recrystallized by crystallization from supercritical ammonia-containing solution, so-called AMMONO method:

the ratio of Ga/NH3 can remarkably be improved (over 20 times), compared with the ratio set by MOCVD vapor phase growth,

the bulk single crystal having a lower dislocation density can be obtained by AMMONO method at a very low temperature (600° C. or less), while the bulk single crystal is prepared by the vapor phase growth of the nitride at 1000° C. or more,

the lower dislocation density and recovery of the crystalline quality thereof can be realized despite the thin layer growth of the gallium-containing nitride, and

the single crystal substrate wherein the single crystal substrate is formed on A-plane or M-plane as an epitaxial growth face can be obtained, while such substrate would not be prepared by the so-far vapor phase growth.

The first invention is to provide a light emitting device structure comprising a gallium-containing nitride single crystal substrate, an n-type nitride semiconductor layer, an active layer comprising an In-containing nitride semiconductor, and a p-type nitride semiconductor layer, formed on the substrate, for growth prepared by the vapor phase growth, wherein a gallium-containing nitride semiconductor layer is formed to preserve the crystalline quality which would be degraded during the deposition of the layers in the light emitting device in the form of quaternary or ternary compound, such as InAlGaN, InGaN or AlGaN etc. on the substrate. Moreover, it is possible to recover the crystalline quality which would be detracted by newly occurred dislocation or impurity dopants during the depositing process of nitride semiconductor. The first invention is characterized in that the gallium-containing nitride semiconductor layer is formed by crystallization from supercritical ammonia-containing solution, so that the layer can become an epitaxial growth plane whose dislocation density thereon is 106/cm2 or less, preferably 104/cm2.

Specifically, the gallium-containing nitride has to be grown at the temperature which does not damage the active layer comprising an In-containing nitride semiconductor. In the AMMONO method, the nitride is grown at 600° C. or less, preferably 550° C. or less, therefore the single crystal GaN or AlGaN layer can be deposited on the active In-containing layer without the detraction of the active layer, although the growth temperature of 1000° C. or more is required in the vapor phase growth. The active layer comprising an In-containing nitride semiconductor is usually formed at 900° C., as lower temperature does not damage to the active layer from degradation etc. Furthermore, the crystalline quality can be recovered by the thin layer of less than several am, preferably several hundreds Å and the dislocation density can also be reduced, so that the resulting laser device etc. is not subject to the stress.

The second invention is characterized in that the substrate is the gallium-containing nitride bulk single crystal prepared by crystallization from supercritical ammonia-containing solution, which leads to a light emitting device with lower dislocation density by the combination of the first invention and the second invention. Moreover, the substrate in the light emitting device structure has at least one plane selected from the group comprising A-plane, M-plane, R-plane, C-plane, {1-10n (n is a natural number)}, and {11-2m (m is a natural number)} of the gallium-containing nitride bulk single crystal, as its own surface.

According to the present invention, a nitride bulk single crystal shown in Drawings can be prepared by applying the AMMONO method, therefore A-plane or M-plane which is parallel to C-axis of hexagonal structure for an epitaxial growth can be obtained. (FIG. 9) In the present invention, an epitaxial growth required by a device structure can be carried out in case that the plane has the area of 100 mm2. A-plane and M-plane are non-polar, unlike C-plane. In case that A-plane or M-plane of the gallium-containing nitride is used as a plane for depositing of layers, there can be obtained a laser device having no cause of the deterioration of the performance such as the red shift of light emitting, recombination degradation and increase of the threshold current. According to the present invention, when the nitride semiconductor laser device is grown on A-plane of the GaN substrate prepared by crystallization from supercritical ammonia-containing solution, the active layer of the laser device is not subject to the polarization effect. In such a case, the light emitting face of the resonator will be M-plane, on which M-plane end face film can be formed and thus cleavage is easily performed. In case that the nitride semiconductor laser device is grown on M-plane of the GaN substrate prepared by crystallization from supercritical ammonia-containing solution, the active layer is not subject to the polarization effect and A-plane end face film being non-polar can be obtained on the light emitting face of the resonator.

According to the present invention, a substrate for growth means not only a substrate of only gallium-containing nitride but also a composite substrate (template) which comprises gallium-containing nitride grown on a heterogeneous substrate. In case that the gallium-containing nitride is formed on a heterogeneous substrate by crystallization from supercritical ammonia-containing solution, first GaN, AlN or AlGaN layer is preformed on the heterogeneous substrate and then the gallium-containing nitride is formed thereon.

The third invention is characterized by a light emitting device structure which comprises a light emitting device comprising an n-type nitride semiconductor layer, an active layer comprising an In-containing nitride semiconductor, and a p-type nitride semiconductor layer, formed on a substrate for growth, wherein the light emitting device comprises a layer in the form of high-resistance single crystal having a general formula AlxGa1-xN (0≦x≦1), prepared by crystallization from supercritical ammonia-containing solution as a current confinement layer. Accordingly, it is possible to limit the flowing position of the electric current and confine the current without forming the ridge in the laser device. Higher mixture ratio of Al in the crystal leads to the lower refraction index so as to confine the light efficiently. The current confinement layer made of AlN is preferred.

According to the present invention, aforementioned single crystal layer is usually in the form of a non-doped crystal. Even if AlGaN layer has non-uniform mixture ratio of crystal in direction of the thickness and then a tendency of decreased mixture ratio from the beginning of forming step is shown, there is no hindrance to the function as a current confinement layer. Furthermore, the layer can attain its function in the form of thin layer, i.e. several to several tens nm. Accordingly, when the AMMONO method is applied, alkali metal such as Na, K or Li etc, or alkali metal compound such as azide, amide, imide, amide-imide or hydride may be used as a mineralizer. Considering dissolving of the current confinement layer with the supercritical ammonia at the beginning of the AMMONO method, it is preferable that the thickness of the lower layer of the current confinement layer is set thicker than usual. When the current confinement layer or gallium-containing nitride semiconductor layer is prepared by the AMMONO method, it is recommended that a mask may be formed having the lower or same solubility in the supercritical ammonia. The formation of the mask can prevent the dissolution in the supercritical ammonia from the end face of the other layers of the nitride semiconductor, especially the dissolution of the active layer. The mask may be selected from the group consisting of SiO, SiN, AlN, Mo, W, and Ag. In the supercritical ammonia these materials for mask are more stable than GaN and the contact surface covered with the mask material can be prevented from the dissolution. In a later process, i.e. the process of formation of a ridge, the mask can be easily removed.

In the AMMONO method using the supercritical ammonia, a nitride semiconductor is grown in the supercritical ammonia wherein a gallium-containing nitride has the negative solubility curve. Detailed explanation of the method is disclosed in Polish Patent Application Nos. P-347918, P-350375 and PCT Application No. PCT/IB02/04185, so that those skilled in the art can easily carry out the present invention with reference to the abstract and examples explained below.

In the present invention, gallium-containing nitride or nitride is defined as below and as the general formula AlxGa1-x-yInyN, where 0≦x<1, 0≦y<1, and 0≦x+y<1, and may contain a donor, an acceptor, or a magnetic dopant, as required. For example, if the donor is doped, the nitride can be changed into n-type, so that the gallium-containing nitride semiconductor layer can be formed on a part of n-type nitride semiconductor layer. If acceptor is doped, the nitride can be changed into p-type, so that the gallium-containing nitride semiconductor layer is formed on a part of p-type nitride semiconductor layer. If a substrate for growth is a conductive substrate, a laser device (FIG. 1) or LED device (FIG. 4) having a pair of opposite electrodes can be obtained. It enables to introduce the huge electric current thereto.

As will be defined later, the supercritical solvent may contain NH3 and/or a derivative thereof. The mineralizer may contain alkali metal ions, at least, ions of lithium, sodium or potassium. On the other hand, the gallium-containing feedstock can be mainly composed of gallium-containing nitride or a precursor thereof. The precursor can be selected from an azide, imide, amidoimide, amide, hydride, intermetallic compound, alloy or metal gallium, each of which may contain gallium, as it is defined later.

According to the present invention, seeds for forming the substrate for growth can be comprised with GaN prepared by HVPE, crystals formed on the wall in the autoclave by spontaneous growth during crystallization from supercritical ammonia-containing solution, crystals prepared by flux method or crystals prepared by high-pressure method. It is preferable that a heterogeneous seed has a lattice constant of 2.8 to 3.6 with respect to ao-axis and a nitride semiconductor having a surface dislocation density of 106/cm2 or less is formed on the seed. Such a seed is selected from a body-centered cubic crystal system Mo or W, a hexagonal closest packing crystal system α-Hf or α-Zr, a tetragonal system diamond, a WC structure crystal system WC or W2C, a ZnO structure crystal system SiC, especially α-SiC, TaN, NbN or AlN, a hexagonal (P6/mmm) system AgB2, AuB2, HfB2 or ZrB2, and a hexagonal (P63/mmc) system γ-MoC ε-MbN or ZrB2. In order to make the surface property, the appropriate condition for crystal growth, Ga irradiation, NH3 process and Oxygen plasma process may be carried out as required, so that the heterogeneous seed has the Ga-polarity or N-polarity. Moreover, HCl process, HF process may be carried out, as required, to purify the surface. Or a GaN or AlN layer is formed on the heterogeneous seed by the vapor phase growth, so that the crystallization can effectively be carried out by crystallization from supercritical ammonia-containing solution. After such processes, gallium-containing nitride grown on the seed by polishing or wire saw, so as to prepare by a wafer for a substrate for growth.

In the present invention, the crystallization of gallium-containing nitride is carried out at a temperature of 100 to 800° C., preferably 300 to 600° C., more preferably 400 to 550° C. Also, the crystallization of gallium-containing nitride is carried out under a pressure of 100 to 10,000 bar, preferably 1,000 to 5,500 bar, more preferably 1,500 to 3,000 bar.

The concentration of alkali metal ions in the supercritical solvent is adjusted so as to ensure the specified solubilities of feedstock and gallium-containing nitride, and the molar ratio of the alkali metal ions to other components of the supercritical solution is controlled within a range from 1:200 to 1:2, preferably from 1:100 to 1:5, more preferably from 1:20 to 1:8.

The present invention relates to a technique of an ammono-basic growth of crystal which comprises a chemical transport in a supercritical ammonia-containing solvent containing at least one mineralizer for imparting an ammono-basic property, to grow a single crystal of gallium-containing nitride. This technique has a very high originality, and therefore, the terms herein used should be understood as having the meanings defined as below in the present specification.

The term “gallium-containing nitride” in the specification means a compound which includes at least gallium and nitrogen atom as a consistent element. It includes the binary compound GaN, ternary compounds such as AlGaN, InGaN or also quaternary compounds AlInGaN, where the range of the other elements to gallium can vary, in so far as the crystallization growth technique of ammonobasic is not hindered.

The term “gallium-containing nitride bulk single crystal” means a gallium-containing nitride single crystal substrate on which an optic or electronic device such as LED or LD can be prepared by an epitaxial growth process such as MOCVD, HVPE or the like.

The term “a precursor of gallium-containing nitride” means a substance which may contain at least gallium, and if needed, an alkali metal, an element of the Group XIII, nitrogen and/or hydrogen, or a mixture thereof, and examples of such a precursor include metallic Ga, an alloy or an intermetallic compound of Ga, and a hydride, amide, imide, amido-imide or azide of Ga, which can form a gallium compound soluble in a supercritical ammonia-containing solvent as defined below.

The term “gallium-containing feedstock” means a gallium-containing nitride or a precursor thereof.

The term “supercritical ammonia-containing solvent” means a supercritical solvent which may contain at least ammonia, and ion or ions of at least one alkali metal for dissolving gallium-containing nitride.

The term “mineralizer” means a supplier for supplying one or more of alkali metal ions (Li, K, Na or Cs) for dissolving gallium-containing nitride in the supercritical ammonia-containing solvent. Concretely, the mineralizer is selected from the group consisting of Li, K, Na, Cs, LiNH2, KNH2, NaNH2, CsNH2, LiH, KH, NaH, CsH, Li3N, K3N, Na3N, CS3N, Li2NH, K2NH, Na2NH, Cs2NH, LiNH2, KNH2, NaNH2, CsNH2, LiN3, KN3, NaN3 and CsN3.

The phrase “dissolution of gallium-containing feedstock” means a reversible or irreversible process in which the feedstock takes the form of a gallium compound soluble in the supercritical solvent such as a gallium complex compound. The gallium complex compound means a complex compound in which a gallium atom as a coordination center is surrounded by ligands, e.g., NH3 or derivatives thereof such as NH2 and NH2−.

The term “supercritical ammonia-containing solution” means a solution including a soluble gallium-containing compound formed by dissolution of gallium-containing feedstock in the supercritical ammonia-containing solvent. Based on our experiments, we have found that there is an equilibrium relationship between the gallium-containing nitride solid and the supercritical solution under a sufficiently high temperature and pressure conditions. Accordingly, the solubility of the soluble gallium-containing nitride can be defined as the equilibrium concentration of the above soluble gallium-containing compound in the presence of solid gallium-containing nitride. In such a process, it is possible to shift this equilibrium by changing in temperature and/or pressure.

The phrase “negative temperature coefficient of solubility” shown in the gallium-containing nitride in the supercritical ammonia means that the solubility is expressed by a monotonically decreasing function of the temperature, when all other parameters are kept constant. Similarly, the phrase “positive pressure coefficient of solubility” means that the solubility is expressed by a monotonically increasing function of the temperature, when all other parameters are kept constant. Based on our research, the solubility of gallium-containing nitride in the supercritical ammonia-containing solvent has a negative temperature coefficient at least within the range of 300 to 550° C., and a positive pressure coefficient at least within the range of 1 to 5.5 kbar.

The phrase “supersaturation of the supercritical ammonia-containing solution of gallium-containing nitride” means that the concentration of the soluble gallium compounds in the above supercritical ammonia-containing solution is higher than the concentration in the equilibrium state, i.e., the solubility of gallium-containing nitride. In case of the dissolution of gallium-containing nitride in a closed system, such supersaturation can be achieved, according to the negative temperature coefficient or a positive pressure coefficient of solubility, by raising the temperature or reducing the pressure.

The chemical transport from the lower temperature dissolution zone to higher temperature crystallization zone is important for gallium-containing nitride in the supercritical ammonia-containing solution. The phrase “the chemical transport” means a sequential process including the dissolution of gallium-containing feedstock, the transfer of the soluble gallium compound through the supercritical ammonia-containing solution, and the crystallization of gallium-containing nitride from the supersaturated supercritical ammonia-containing solution. In general, a chemical transport process is carried out by a certain driving force such as a temperature gradient, a pressure gradient, a concentration gradient, difference in chemical or physical properties between the dissolved feedstock and the crystallized product, or the like. Preferably, the chemical transport in the process of the present invention is achieved by carrying out the dissolution step and the crystallization step in separate zones, provided that the temperature of the crystallization zone is maintained higher than that of the dissolution zone, so that the gallium-containing nitride bulk single crystal can be obtained by the processes of this invention.

The term “seed” has been described above. According to the present invention, the seed provides a region or area on which the crystallization of gallium-containing nitride is allowed to take place. Seed may be a laser device or LED device, whose surface is exposed for forming a current confinement layer. Moreover, the growth quality of the crystal depends on the quality of the seed for forming the substrate for growth. Thus, the seed of a high quality should be selected.

The term “spontaneous crystallization” means an undesirable phenomenon in which the formation and the growth of the core of gallium-containing nitride from the supersaturated supercritical ammonia-containing solution occur at any site inside the autoclave, and the spontaneous crystallization also includes disoriented growth of the crystal on the surface of the seed.

The term “selective crystallization on the seed” means a step of allowing the crystallization to take place on the surface of the seed, accompanied by substantially no spontaneous growth. This selective crystallization on the seed is essential for the growth of a bulk single crystal, it is also one of the conditions to form aforementioned gallium-containing nitride semiconductor layer, electric current confinement layer and a substrate for growth by applying crystallization from supercritical ammonia-containing solution.

The autoclave to be used in the present invention is a closed system reaction chamber for carrying out the ammono-basic growth of the crystal and any form of the autoclave is applicable.

In this regard, the temperature distribution in the autoclave, as described later in the part of Examples, is determined by using an empty autoclave, i.e. without the supercritical ammonia, and thus, the supercritical temperature is not the one actually measured. On the other hand, the pressure in the autoclave is directly measured, or it is determined by the calculation from the amount of ammonia initially introduced, and the temperature and the volume of the autoclave.

It is preferable to use an apparatus as described below, to carry out the above process. An apparatus according to the present invention provides an autoclave for preparing the supercritical solvent, characterized in that a convection control means for establishing a convention flow is arranged in the autoclave, and a furnace unit is equipped with a heater or a cooler.

The furnace unit includes a higher temperature zone, equipped with a heater, which corresponds to the crystallization zone in the autoclave, and a lower temperature zone, equipped with a heater or a cooler, which corresponds to the dissolution zone in the autoclave. The convection control means may be composed of at least one horizontal baffle having a central opening and/or a periphery space and dividing the crystallization zone from the dissolution zone. Inside the autoclave, the feedstock is located in the dissolution zone, and the seed is located in the crystallization zone, and convection flow in the supercritical solution between two zones is controlled by the convection control means. It is to be noted that the dissolution zone is located above the horizontal baffle, and the crystallization zone, below the horizontal baffle.

Crystallization from supercritical ammonia-containing solution (AMMONO method) is summarized as follows. In the reaction system, the negative dissolution curve (negative temperature coefficient of solubility) means that the solubility of the nitride semiconductor is lower in the higher temperature zone and the solubility thereof is higher in the lower temperature zone. When the temperature difference is controlled properly in the higher temperature zone and the lower temperature zone inside the autoclave, the nitride are dissolved in the lower temperature zone and it is recrystallized in the higher temperature zone. Due to the generated convection flow from the lower temperature zone to the higher temperature zone, a predetermined concentration of nitrides can be kept in the higher temperature zone and the nitrides can be selectively grown on the seed. Moreover, the aspect ratio (longitudinal direction/lateral direction) in the reaction system inside the autoclave is preferably set 10 or more, so that the convection flow does not stop. The convection control means is located within the range from ⅓ to ⅔ of the total length of the inner chamber of the autoclave. The ratio of opening in the horizontal baffle on the cross-sectional area is set at 30% or less, so that the spontaneous crystallization can be prevented.

The wafer is thus placed in the higher temperature zone, and the feedstock in the lower temperature zone in the reaction system inside the autoclave. Dissolution of the feedstock in the lower temperature zone leads to the supersaturation. In the reaction system, a convection flow is generated, due to which the dissolved feedstock flows to the higher temperature zone. Due to a lower solubility at the higher temperature zone, the dissolved feedstock becomes recrystallized on the wafer which is the seed. Recrystallization carried out in this way results in forming a bulk single crystal layer. Moreover, a characteristic feature of this method, as compared to the methods by which nitride semiconductor is formed from the vapor phase growth at temperature over 900° C., is the fact that it allows growth of nitride semiconductor at a temperature preferably 600° C. or less, and more preferably 550° C. or less. Due to this, in the wafer placed in the higher temperature zone a thermal degradation of the active In-containing layer does not occur.

The material of the feedstock depends on the composition of the single crystal layer. In case that GaN is used, GaN single crystal, GaN poly crystal, GaN precursor or metallic Ga can generally be used, GaN single crystal or GaN poly crystal can be formed and then recrystallized. GaN prepared by the vapor phase growth, such as HVPE method or MOCVD method, by AMMONO method, by flux method or by high pressure method can be used. GaN powder in the form of a pellet can also be used. The precursor of GaN may contain gallium azide, gallium imide, gallium amide or the mixture thereof. In case of AlN—similarly as GaN—AlN single crystal, AlN poly crystal, AlN precursor or metallic Al is used, AlN single crystal or AlN poly crystal can be formed and then recrystallized. AlGaN is a mixed crystal of AlN and GaN, and the feedstock thereof may be mixed appropriately. Moreover, the usage of metal and single crystal or poly crystal (for example, metallic Al and GaN single crystal or poly crystal) and preferably adding more than two kinds of mineralizer etc. can lead to a predetermined composition.

It is possible to use alkali metals, such as Li, Na, K, Cs or complexes of alkali metals, such as alkali metal azide, alkali metal amide, alkali metal imide as a mineralizer. A molar ratio of the alkali metal to ammonia ranges from 1:200 to 1:2. Li is preferably used. Li is a mineralizer, for which the solubility of nitride is low, which leads to restraint of dissolution of the uncovered nitride semiconductor device, preventing the spontaneous crystallization and effective formation of the thin layers of the thickness from ten to several tens nm.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a schematic cross-sectional view of the end face of the nitride semiconductor laser device according to the present invention.

FIG. 2A-2E represent the schematic cross-sectional view illustrating a manufacturing process of the nitride semiconductor laser device, in case of the preferred embodiment according to the present invention.

FIGS. 3A and 3B represent the schematic cross-sectional view of the end face of the nitride semiconductor laser device according to the present invention.

FIG. 4A to 4F represent the schematic cross-sectional view illustrating a manufacturing process of the nitride semiconductor laser device, in case of the preferred embodiment according to the present invention.

FIG. 5 is a schematic cross-sectional view of the nitride semiconductor LED device according to the present invention.

FIG. 6 is a schematic view of the nitride semiconductor LED device according to the present invention.

FIG. 7 is a schematic view of the nitride semiconductor LED device according to the present invention.

FIG. 8 is a schematic view of the nitride semiconductor LED device according to the present invention.

FIG. 9 presents a frame format of the substrate in which A-plane being parallel to c-axis is cut out from the bulk single crystal and a light emitting end face is formed on M-plane.

BEST MODE FOR CARRYING OUT THE INVENTION

Further herein a detailed description of the embodiments of the present invention is provided.

The schematic cross-sectional view of the semiconductor laser according to the present invention is shown in FIG. 1. On the substrate 1 for growth, the n-type nitride semiconductor layer 2 and the p-type nitride semiconductor layer 4 are formed. Between them there is the active layer 3 of a single quantum well or a multi quantum well structure in the form of an In-containing nitride semiconductor. This results in the laser device having a good light emitting efficiency at the wavelength region between near-ultraviolet and green visible light (from 370 nm to 550 nm). The n-type nitride semiconductor layer 2 is composed of an n-type contact layer 21, a InGaN crack-preventing layer 22, an n-type AlGaN clad layer 23 and an n-type GaN optical guide layer 24. The n-type contact layer 21 and the crack-preventing layer 22 can be omitted. The p-type nitride semiconductor layer 4 is composed of a cap layer 41, a p-type AlGaN optical guide layer 42, a p-type AlGaN clad layer 43 and a p-type GaN contact layer 44. According to the present invention, gallium-containing nitride semiconductor layer prepared by the crystallization from supercritical ammonia-containing solution can be used in the n-type nitride semiconductor layer 2 or p-type nitride semiconductor layer 4. The substrate 1 is comprised with a bulk single crystal and the dislocation thereof is remarkably low, i.e. about 104/cm2. Therefore, the n-type contact layer 21 can be formed without ELO layer for decreasing dislocation, AlGaN layer for decreasing the pits or buffer layer. The substrate is a conductive substrate and n-type electrode is formed below the substrate so that the p-type electrode and the n-type electrode compose a face-type electrodes structure. In the above embodiment, the resonator of the semiconductor laser device is composed of the active layer 3, the p-type optical guide layer 24, n-type optical guide layer 42 and the cap layer 41.

Further herein the typical manufacturing method of the nitride semiconductor laser device of the present embodiment is provided.

FIG. 2A to 2E illustrate the process which comprises the steps of forming a laser device on the C-plane using a conductive GaN substrate as a substrate for growth and a n-type electrode below the substrate.

FIG. 4A to 4E illustrate the process which comprises the steps of forming a n-type nitride semiconductor layer 2, an active layer 3 and a first p-type nitride semiconductor layer 4A of a laser device, and then forming a current confinement layer 5 by crystallization from supercritical ammonia-containing solution, and finally forming a second p-type nitride semiconductor layer 4B. Next, after growing a nitride semiconductor layer, a p-type electrode is formed on the second p-type nitride semiconductor layer 4B and n-type electrode is formed below the substrate for growth so that a laser device can be obtained.

The first method shown in FIG. 2, the conductive substrate for growth is first prepared. (FIG. 2A) Next, the wafer is prepared on the C-plane of Substrate 1 by depositing successively the n-type nitride semiconductor layer 2 composed of an n-type contact layer 21, a crack-preventing layer 22, an n-type clad layer 23 and an n-type optical guide layer 24, then the active layer 3 and finally the p-type nitride semiconductor layer 4 composed of a protective layer 41, a p-type optical guide layer 42, a p-type clad layer 43 and a p-type contact layer 44. (FIG. 2B) According to the present invention, a gallium-containing nitride semiconductor layer prepared by crystallization from supercritical ammonia-containing solution is intercalated in the n-type nitride semiconductor layer and/or the p-type nitride semiconductor layer so that the crystalline quality of the laser device can be recovered. In this process, since the substrate for growth is used, the dislocation of the epitaxial layer can be decreased without forming the n-type nitride semiconductor layer 2 through a buffer layer prepared at the low temperature an ELO layer. The n-type contact layer 21 or the crack preventing layer 22 can be omitted.

Next, the wafer is etched and a ridge is formed. Then the buried layer 70 is formed to cover the ridge and next the p-type electrode 80 is formed. The ridge stripe which performs the optical wave guide is formed in the direction of the resonator. The width of the ridge is from 1.0 μm to 20 μm and the ridge reaches the p-type clad layer or the p-type guide layer. The buried layer is made of SiO2 film or ZrO2 film etc. A p-type ohmic electrode 80 is formed to be in contact with the p-type contact layer 43 which is on the top surface of the ridge. Both of single ridge and plural ridges can be used. A multi-stripe-type laser device can be obtained by plural ridges. Next, a p-type pad electrode is formed. Moreover, a SiO2/TiO2 serves as a reflecting film for laser oscillation due to an alternate arrangement and a patterning of the SiO2 and TiO2 layers. Finally, each nitride semiconductor laser device is cut out from the wafer by scribing. In this way a finished nitride semiconductor laser device is obtained. (FIG. 2E, FIG. 1)

FIG. 4A to 4E illustrate the process of manufacturing a laser device comprising a current confinement layer. A-plane of the substrate 1 is cut out from the bulk single crystal as illustrated in FIG. 9 and used as a substrate, and a light emitting end face is M-plane so that a laser device can be obtained by cleavage. On the substrate 1 for growth the n-type nitride semiconductor layer 2 and the active layer 3 are deposited successively. Next, the first p-type nitride semiconductor layer 4A is formed. (FIG. 4A) The same reference numeral is given to the same element to omit the explanation. Next, the first p-type nitride semiconductor layer 4A is prepared by etching in the form of convex-shape. (FIG. 4B) Then, the current confinement layer 5 is prepared by crystallization from supercritical ammonia-containing solution using the gallium-containing nitride semiconductor layer. (FIG. 4C) Further, the second p-type nitride semiconductor layer 4B is formed. (FIG. 4D) The p-type ohmic electrode 80 is formed to be in contact with the second p-type nitride semiconductor layer 4B. Next, the n-type electrode 90 is formed below the substrate 1. (FIG. 4E) Next, the p-type pad electrode 110 is formed. Next, the light emitting end face is formed by cleavage, so that the wafer becomes in the form of a bar. After such process, the light emitting film may be formed on the light emitting end face so as to obtain a laser device by cleaving. The current confinement layer 5 can be arranged at the side of the p-type nitride semiconductor layer (FIG. 3A) or n-type nitride semiconductor layer (FIG. 3B)

In case that the current confinement layer 5 is formed, the single crystal AlGaN layer can be formed at a low temperature, i.e. from 500° C. to 600° C., by applying crystallization from supercritical ammonia-containing solution. P-type nitride layer can be formed without degradation of the active In-containing layer.

FIG. 5 illustrates the obtained LED device having a gallium-containing nitride semiconductor layer prepared by crystallization from supercritical ammonia-containing solution.

After the gallium-containing nitride semiconductor layer 202 is formed directly on the conductive substrate 201 without forming buffer layer prepared at low temperature, a modulation doped layer 203 composed of undoped GaN/Si doped GaN/undoped GaN and an active layer 205 composed of InGaN well layer/GaN barrier layer through a superlattice layer 204 are formed. LED is obtained by successively depositing a p-type clad layer 206, an undoped AlGaN layer 207 and a p-type contact layer 208 on the top surface of the active layer 205. The p-type electrode 209 and n-type electrode 210 are simultaneously formed on the p-type contact layer 208 and below the substrate 201, respectively.

According to the present invention, the gallium-containing nitride semiconductor layer 202 can be formed instead of the modulation doped layer 203 and the superlattice layer 204, while the n-type contact layer is formed on one bottom side, and the gallium-containing nitride semiconductor layer 202 can be formed on the active layer. As described above, AMMONO method which enables to form the single crystal at a low temperature allows simplifying the device structure as well as recovering the crystalline quality and decreasing the dislocation density.

The following examples are intended to illustrate the present invention and should not be construed as being limiting.

EXAMPLE 1

The GaN substrate 1 doped with Si of 2 inch diameter on C-plane as a growth face is placed in a MOCVD reactor. Temperature is set at 1050° C. Hydrogen is used as a carrier gas, and ammonia and TMG (thrimethylgallium) are used as gaseous materials.

On the substrate, the following layers are deposited one after the other:

(1) 4 μm thickness n-type GaN contact layer, doped with Si at the level of 3×1018/cm3.

(2) n-type clad layer, in the form of the superlattice of the total thickness being 1.2 μm, formed by alternate deposition of 25 angstroms thickness undoped Al0.1Ga0.9N layer and n-type GaN layer doped with Si at the level of 1×1019/cm3.

(3) a wafer is introduced into the reactor (autoclave), inside which is filled with the supercritical ammonia. Having been filled with the feedstock in the form of GaN of 0.5 g, ammonia of 14.7 g and mineralizer in the form of Li of 0.036 g, the autoclave (36 cm3) is tightly closed at a temperature 500° C. or less inside the autoclave. The internal chamber of the autoclave is divided into two zones: the higher temperature zone and the lower temperature zone. In the higher temperature zone of 550° C. there is a wafer, whereas in the lower temperature zone of 450° C. there is feedstock in the form of GaN and Ga metal. The sealed autoclave is left for three days. Under the low temperature condition, the layer for recovering the crystalline quality of 100 angstrom thickness in the form of single crystal GaN is grown in supercritical ammonia.

(4) Then the wafer is taken out from the autoclave and set in the MOCVD reactor device at a temperature of 1050° C. 0.2 μm thickness undoped GaN n-type optical guide layer.

(5) an active layer of the total thickness being 380 angstroms in the form of layers alternately arranged, i.e. barrier layer/well layer/barrier layer/well layer/barrier layer, wherein 100 angstroms thickness with Si doped In0.05Ga0.95N layer forms a barrier layer, and 40 angstroms thickness undoped In0.1Ga0.9N layer forms a quantum well layer.

(6) 0.2 μm thickness undoped GaN p-type optical guide layer.

(7) p-type clad layer in the form of the superlattice of the total thickness being 0.6 μm, formed by alternate deposition of 25 angstroms thickness undoped Al0.16Ga0.84N layer and 25 angstroms thickness undoped GaN layer.

(8) 150 angstroms thickness p-type contact layer of p-type GaN doped with Mg at the level of 1×1020/cm3.

After the above layers are deposited, the formed wafer is subject to annealing at 700° C. in the MOCVD reactor device under the nitrogen atmosphere, due to which the resistance of the p-type nitride semiconductor layer is additionally reduced.

After annealing, the wafer is taken out from the reactor and a protective film (mask) in the form of SiO2 stripe is deposited on the surface of the top p-type contact layer. Next, by using RIE method, the wafer is etched and a stripe is formed, uncovering thereby end faces of the resonator and the surface of the n-type contact layer. The SiO2 protective film (mask) formed on the surface of the p-type contact layer is removed by using the wet etching method.

Next, under the low temperature condition, in the supercritical ammonia 100, angstrom thick single crystal GaN end face film is grown on the stripe end face, stripe lateral face and uncovered surfaces of the p-type contact layer.

After a single crystal GaN end face film, which can be omitted, is formed, the single crystal GaN formed on the surface of the top p-type contact layer is removed by etching. Next, the surface of the p-type contact layer is covered with the SiO2 mask in the form of 1.5 μm wide strips and etching of the p-type clad layer is continued until a ridge is formed on the strip part. Etching is carried out until thickness of the p-type clad layer becomes 0.1 μm on both sides of ridge.

In this way a ridge part of 1.5 μm width is formed.

Next, by use of the ion sputtering method, a 0.5 μm thickness ZrO2 film is formed so that it would cover stripe surfaces over the SiO2 mask.

After the thermal processing, the buried layer 70 in the form of the ZrO2 film is deposited on the top stripe surface, on the lateral face of ridge and on the surface of the p-type clad layer located on both sides of ridge. This ZrO2 film allows stabilizing a lateral mode at the moment of laser oscillation.

Next the p-type electrode 80 in the form of Ni/Au is formed on the p-type contact layer, so that an ohmic contact would appear, and the n-type electrode 90 in the form of Ti/Al below the substrate 1. Then, the wafer is subject to the thermal processing at 600° C. Next, pad electrode in the form of Ni(1000 Å)-Ti(1000 Å)-Au(8000 Å) is laid on the p-type electrode. After a reflecting film 100 in the form of SiO2 and TiO2 is formed, each nitride semiconductor laser device is cut out from the wafer by scribing.

Each nitride semiconductor laser device manufactured in this way is equipped with a heat sink and the laser oscillation is carried out. Due to an increased COD level, prolonged continuous oscillation time is expected—with threshold current density: 2.0 kA/cm2, power output: 100 mW, preferably 200 mW, and 405 nm oscillation wavelength.

EXAMPLE 2

GaN substrate 1 for growth doped with Si is prepared by crystallization from supercritical ammonia-containing solution, whereas other stages of production of the nitride semiconductor laser device are carried out similarly as in Example 1.

Each laser device manufactured in this way is equipped with a heat sink and the laser oscillation is carried out. Prolonged laser lifetime in continuous oscillation mode is expected—with threshold current density: 2.0 kA/cm2, power output: 100 mW and 405 nm oscillation wavelength—similar as in Example 1.

EXAMPLE 3

First, a GaN substrate 1 doped with Si of 2 inch diameter on C-plane as a growth face is placed in a MOCVD reactor. Temperature is set at 1050° C. Hydrogen is used as a carrier gas, and ammonia and TMG (thrimethylgallium) are used as gaseous materials.

On the substrate, the following layers are deposited one after the other:

(1) 4 μm thickness n-type GaN contact layer, doped with Si at the level of 3×1018/cm3.

(2) n-type clad layer, in the form of the superlattice of the total thickness being 1.2 μm, formed by alternate deposition of 25 angstroms thickness undoped Al0.1Ga0.9N layers and n-type GaN layers doped with Si at the level of 1×1019/cm3.

(3) 0.2 μm thickness undoped GaN n-type optical guide layer.

(4) an active layer of the total thickness being 380 angstroms in the form of layers alternately arranged, i.e. barrier layer/well layer/barrier layer/well layer/barrier layer, wherein 100 angstroms thickness with Si doped In0.05Ga0.95N layer forms a barrier layer, and 40 angstroms thickness undoped In0.1Ga0.9N layer forms a quantum well layer.

(5) the p-type optical guide layer undoped GaN of 0.2 μm as a first p-type nitride semiconductor layer.

(6) Next, the first p-type nitride semiconductor layer except the area for the passage of a current is removed by etching. (FIG. 4B)

(7) the wafer is introduced into the reactor (autoclave), inside which is filled with supercritical ammonia. Having been filled with the feedstock in the form of Al of 0.5 g, ammonia of 14.7 g and mineralizer in the form of Li of 0.036 g, the autoclave (36 cm3) is tightly closed at a temperature 500° C. or less inside the autoclave. The internal chamber of the autoclave is divided into two zones: the higher temperature zone and the lower temperature zone. In the higher temperature zone of 550° C. there is a wafer, whereas in the lower temperature zone of 450° C. there is feedstock in the form of Al metal. The sealed autoclave is left for three days. Under the low temperature condition the current confinement layer 5 of 100 angstrom thickness in the form of Al is grown in supercritical ammonia.

(8) the wafer is taken out from the autoclave and set in the MOCVD reactor device at a temperature of 1050° C. The p-type clad layer as the second p-type nitride semiconductor layer in the form of the superlattice of the total thickness being 0.6 μm, formed by alternate deposition of 25 angstroms thickness undoped Al0.16Ga0.84N layer and 25 angstroms thickness undoped GaN layer.

(9) 150 angstroms thick p-type contact layer of p-type GaN doped with Mg at the level of 1×1020/cm3.

After the above layers are deposited, the formed wafer is subject to annealing at 700° C. in the MOCVD reactor device under the nitrogen atmosphere, due to which the resistance of the p-type nitride semiconductor layer is additionally reduced.

After annealing, the wafer is taken out from the reactor.

After a single crystal GaN end face film, which can be omitted, is formed on the light emitting face, the single crystal GaN formed on the surface of the top p-type contact layer is removed by etching. Next, the p-type electrode 80 in the form of Ni/Au is formed on the surface of the p-type contact layer so that an ohmic contact would appear, and the n-type electrode 90 in the form of Ti/Al below the substrate 1. Then, the wafer is subject to the thermal processing at 600° C. Next, pad electrode in the form of Ni(1000 Å)-Ti(1000 Å)-Au(8000 Å) are laid on the p-type electrode. After a reflecting film 100 in the form of SiO2 and TiO2 is formed, each nitride semiconductor laser device is cut out from the wafer by scribing.

Each nitride semiconductor laser device manufactured in this way is equipped with a heat sink and the laser oscillation is carried out. Due to the increase of a COD level, prolonged continuous oscillation time is expected—with threshold current density: 2.0 kA/cm2, power output: 100 mW, preferably 200 mW, and 405 nm oscillation wavelength.

Each laser device manufactured in this way is equipped with a heat sink and the laser oscillation is carried out. Prolonged laser lifetime in continuous oscillation mode is expected—with threshold current density: 2.0 kA/cm2, power output: 100 mW and 405 nm oscillation wavelength—similar as in Example 1.

INDUSTRIAL APPLICABILITY

As described above, since the nitride semiconductor light emitting device according to the present invention comprises a gallium-containing nitride semiconductor layer prepared by crystallization from supercritical ammonia-containing solution, the crystalline quality can be recovered, while otherwise it would be degraded after forming the layer of quaternary or ternary compound. As the result there can be provided a laser device which is excellent in the lifetime property and current resistant property.

Moreover, non-polar nitride A-plane or non-polar nitride M-plane is cut out from the bulk single crystal, the substrate for growth is prepared in this way, and the laser device can be formed on the A-plane or M-plane as an epitaxial growth face. Thus, there can be obtained the laser device wherein the active layer is not influenced by the polarization and there is no cause of the deterioration of the performance such as the red shift of light emitting, recombination degradation and increase of the threshold current.

Furthermore, in case that the current confinement layer is formed at a lower temperature, the laser device can be obtained without the device degradation, and the process for forming the ridge can be omitted.

Moreover, the nitride layer can be formed in the form of single crystal at low temperature, so that the active In-containing layer is not influenced by degradation or damaged. Therefore the function and lifetime of the device can be improved.

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Classifications
U.S. Classification257/79, 257/E33.003
International ClassificationH01L33/00, H01L33/38, H01L33/16
Cooperative ClassificationH01S5/2206, H01S5/22, H01S5/3216, H01L33/16, H01S5/34333, H01S5/2232, H01S2304/00, H01L33/38, B82Y20/00, H01L33/007, H01S5/2231
European ClassificationB82Y20/00, H01L33/00G3B2, H01S5/343G
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