US 20070209684 A1
Embodiments of the invention generally provide apparatus and method for detecting and controlling edge bevel removal of a semiconductor substrate. One embodiment of the present invention provides an apparatus for inspecting a rotating substrate. The apparatus comprises a substrate support configured to support the rotating substrate on a back side and rotate the substrate about a central axis, and a sensor positioned above the substrate support, the sensor being configured to inspect a front side of the rotating substrate while moving simultaneously radially across the substrate.
1. An apparatus for inspecting a rotating substrate, comprising:
a substrate support configured to support the substrate on a back side and rotate the substrate about a central axis; and
a sensor positioned above the substrate support, the sensor being configured to inspect a front side of the rotating substrate while moving simultaneously radially across the rotating substrate.
2. The apparatus of
3. The apparatus of
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6. The apparatus of
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8. The apparatus of
9. An apparatus for processing a bevel edge of a rotating substrate, comprising:
a chamber body defining a processing volume;
a rotatable substrate support member positioned in the processing volume and configured to support the rotating substrate on a backside;
a pivoting arm positioned above the rotatable substrate support member and connected to the chamber body;
a fluid dispensing nozzle mounted on the pivoting arm for dispensing a processing fluid a front side of the rotating substrate; and
a sensor mounted on the pivoting arm configured to inspect the front side of the rotating substrate simultaneously with processing the rotating substrate.
10. The apparatus of
11. The apparatus of
12. The apparatus of
13. The apparatus of
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17. The apparatus of
18. A method for inspecting a substrate, comprising:
providing a rotatable substrate support member;
providing a sensor pivotably positioned above the substrate support member;
positioning the substrate on the substrate support member; and
inspecting a front side of the substrate in a spiral motion by pivoting the sensor while rotating the substrate.
19. The method of
projecting an optical beam onto the front side of the substrate; and
measuring a reflected optical beam from the front side of the substrate.
20. The method of
21. The method of
22. The method of
23. The method of
24. The method of
25. The method of
providing a chemical nozzle configured to dispensing a processing fluid to the front side to the substrate, wherein the sensor is mounted on a side of the chemical nozzle; and
processing the substrate while inspecting simultaneously.
1. Field of the Invention
Embodiments of the invention generally relate to an apparatus and method for processing a substrate. More particularly, the present invention relates to detecting and controlling edge bevel removal of a semiconductor substrate.
2. Description of the Related Art
In semiconductor device manufacturing, a multilayer pattern of conductive, semiconductive, and/or insulating materials is usually generated on a substrate. Multiple deposition processes, such as chemical vapor deposition (CVD), physical vapor deposition (PVD), electrochemical plating (ECP), electroless plating, and/other deposition processes, are generally conducted in a process series to generate the multiplayer pattern.
During a deposition process, a conductive material is deposited on a front surface of a substrate. However, the conductive material may also deposit on edges, and sides, i.e. bevel, of the substrate where no pattern is located. For a metal layer deposited by a PVD process, the bevel and edge region is usually thin and unevenly deposited; therefore, the metal has poor adhesion and becomes a source of particle contamination. Some materials, e.g. copper, may also migrate from the edge and bevel region to neighboring active regions, especially during an annealing step.
For a conductive layer deposited by an ECP process, an excess amount of deposition, typically referred to as an edge bead, is formed near the edge region because plating current density is higher near the edge than the remainder of the substrate surface. The edge bead is particularly undesirable. The edge bead may be pulled up and away from the edge of the substrate due to mechanical stress.
Typically, a planarization process, such as chemical mechanical polishing (CMP) or electro-chemical mechanical polishing (ECMP), is conducted after plating to remove excessive deposit and/or polish the substrate surface between individual layer deposition steps to provide a relatively flat surface for the next deposition. The edge bead is easily torn off from the substrate, damaging the adjacent portion of the substrate. The broken bead may cause further damage to the devices when it becomes loose. To control edge beads, and other unwanted deposition near the edge and bevel region, an edge bevel removal (EBR) process is generally performed after a deposition step.
An EBR process may be conducted in an EBR system which is configured to dispense an etchant on the perimeter or bevel of a substrate to remove unwanted metal deposited thereon. After an EBR process, a rinse cell is generally used to rinse the surface of the substrate (front and/or back) with a rinsing solution to remove any contaminants and/or residual chemicals therefrom. The rinse cells are generally configured to spin the substrate at a high rate of speed to spin off any remaining rinsing solution droplets adhering to the substrate surface. Once the remaining fluid droplets are spun off, the substrate is generally clean and dray, and therefore, ready for the next process, e.g. chemical mechanical polishing.
Generally, there are two primary types of EBR systems which operate to remove the over deposited conductive layers from the substrate: nozzle-type and capillary-type. A nozzle-type EBR system generally rotates a substrate below a nozzle that dispenses a metal removing solution onto the edge and possibly backside of the substrate to remove the edge bead and over-deposited metal layer. Details of an exemplary nozzle-type EBR system may be found in U.S. Pat. No. 6,516,815 granted to Joe Stevens et al, titled “Edge Bead Removal/Spin Rise Dry (EBR/SRD) Module”. A capillary-type EBR system generally floats a substrate immediately above a plastic capillary ring configured to direct a metal removing solution dispensing on the back side of the substrate around the bevel area proximate the edge bead.
Although both types of EBR systems are generally effective in removing the edge bead and over deposited metal layer from the substrate, both systems suffer from inherent disadvantages: for example, the EBR systems have difficulty accurately centering substrates for processing without bowing or even breaking the substrate. Processing an off-centered substrate may cause uneven bevel edge, too thin or too wide bevel edge, incomplete removal, and decrease of valuable surface.
A fluid dispensing assembly 110 is positioned above the substrate support member 105. Referring to
The EBR system 100 is configured to remove deposited metal from an edge region 104 of the substrate 102. During process, the substrate 102 is first positioned on the lifting pins 106 while the lifting pins 106 are on the up position and the substrate support member 105 is on the down position. The substrate 102 is then picked up by the substrate support member 105 and rotates about the rotating axis 121. A processing fluid, e.g. an etchant, is dispensed onto the substrate 102 from the dispensing nozzle 109 while the substrate 102 is rotating. The rotating movement spins the processing fluid outwards so that the deposited metal on the edge region 104 of the substrate 102 is removed and deposited metal on a surface area 103 available for patterning (hereafter available surface area 103) remains intact. The size of the edge region 104 may be adjusted by pivoting the pivoting arm 112.
Ideally, the available surface area 103 is a circle centered at the rotating axis 121 and the edge region 104 is an outer band of the substrate 102. As feature size decreases, maximization of available surface area 103 on the substrate 102 becomes important. Improper or inaccurate substrate centering can substantially limit the available surface area. Centering the substrate 102 at the rotating axis 121 and positioning the dispensing nozzle 109 in an accurate location are crucial to get an even and accurate edge region 104. However, EBR systems similar to the EBR system 100 have difficulties centering the substrate to be processed and accurately positioning the dispensing nozzle.
Therefore, there exists a need for an apparatus and method for detecting substrate conditions during an edge bevel removing process.
Embodiments of the invention generally provide apparatus and method for detecting and controlling edge bevel removal of a semiconductor substrate.
One embodiment of the present invention provides an apparatus for inspecting a rotating substrate. The apparatus comprises a substrate support configured to support the rotating substrate on a back side and rotate the substrate about a central axis, and a sensor positioned above the substrate support, the sensor being configured to inspect a front side of the rotating substrate while moving simultaneously radially across the substrate.
Another embodiment of the present invention provides an apparatus for processing a bevel edge of a rotating substrate. The apparatus comprises a chamber body defining a processing volume, a rotatable substrate support member positioned in the processing volume and configured to support the rotating substrate on a backside, a pivoting arm positioned above the rotatable substrate support member and connected to the chamber body, a fluid dispensing nozzle mounted on the pivoting arm for dispensing a processing fluid a front side of the rotating substrate, and a sensor mounted on the pivoting arm configured to inspect the front side of the rotating substrate simultaneously with processing the rotating substrate.
Yet another embodiment of the present invention provides a method for inspecting a substrate. The method comprises providing a rotatable substrate support member, providing a sensor pivotably positioned above the substrate support member, positioning the substrate on the substrate support member, and inspecting a front side of the substrate in a spiral motion by pivoting the sensor while rotating the substrate.
So that the manner in which the above recited features of the present invention can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments.
Embodiments of the invention generally provide an edge bevel removal system capable of monitoring substrates being processed in real-time. The invention is illustratively described below in reference to modification of a SlimCell™ system, available from Applied Materials, Inc., Santa Clara, Calif.
The edge bevel removal system 200 may further comprises a substrate centering mechanism configured to adjust a substrate to be processed so that the substrate is substantially centered at a rotating axis of the substrate chuck 205. In one embodiment, the edge bevel removal system 200 comprises three rotatable centering members 206 configured to receive and center the substrate to be processed. The centering members 206 extend upwardly from the bottom of the basin 201 and are positioned radially outward of the substrate chuck 205 in an equal spacing arrangement. A centering pin 207 extending from an off centered position of each centering members 206 is configured to engage the substrate by the edge. When the centering members 206 rotate inwardly, the centering pins 207 move toward the substrate chuck 205 pushing and holding the substrate in a centered position. A detailed description of an exemplary centering assembly may be found in paragraphs 0037-0041 and FIGS. 6, 7A and 7B of U.S. patent application Ser. No. 10/826,492, titled “Integrated Bevel Clean Chamber”, filed on Apr. 16, 2004, which is herein incorporated by reference.
The edge bevel removal system 200 further comprises a chemical arm 212 and a rinsing arm 242. Both arms 212 and 242 are pivotally mounted to a perimeter portion of the edge bevel removal system 200, and include a longitudinally extending arm configured to support at least one fluid dispensing nozzle positioned on a distal end thereof. The chemical arm 212 is configured to facilitate dispensing a processing solution precisely to a radial position of the substrate being processed. The rinsing arm 242 is configured to facilitate dispensing of a rinsing solution onto the substrate. The operation of arms 212 and 242 may be controlled by two separate motorized actuator assemblies, which are configured to precisely position the distal end of the respective arm 212 or 242 over a specified radial position of the substrate being processed via pivotal actuation and/or vertical actuation. In one embodiment, the chemical arm 212 and the rinsing arm 242 may be pivoted by servo motors. A chemical nozzle 209 is mounted on a distal end of the chemical arm 212. In one embodiment, the chemical nozzle 209 is radially pointing outward to prevent the processing solution from flowing towards central part of the substrate. The chemical nozzle 209 is configured to supply the processing solution from a processing solution reservoir 214 via a solution supply channel 210.
A sensor 220 configured to detect surface conditions of the substrate being processed is mounted on the distal end of the chemical arm 212, which is configured to precisely position the chemical nozzle 209. The sensor 220 is configured to survey the upper surface of the substrate being processed via a pivoting movement carried out by the chemical arm 212 and the rotating movement of the substrate driven by the substrate chuck 205. Mounting the sensor 220 on the chemical arm 212 is economical because the sensor 220 and the chemical nozzle 209 share one high precision positioning mechanism of the chemical arm 212, and no extra movement is required. Additionally, mounting the sensor 220 and the chemical nozzle 209 together also enables simultaneous edge removal and detecting without affecting throughput of the edge bevel removal system 200. The detecting process can be performed when the chemical arm 212 is moving out at a constant speed after finishing the edge removing process.
In one embodiment, the sensor 220 is an optical sensor which projects a light beam to the upper surface of the substrate and measures the light beam reflected by the upper surface of the substrate. Because different surfaces are different in reflectivity, characteristics of the reflected light beam, such as intensity, can be used to determine the nature of the reflecting surface. For example, a surface of plated copper has a higher reflectivity than a surface of a semiconductor substrate without plated copper, such as an edge area after plated copper has been removed, and the edge area therefore has a higher reflectivity than areas outside the substrate. The reflected light from plated copper surface has a higher intensity than that from an edge area. Therefore, the sensor 220 configured to measure a reflected light beam from a point of a surface can be used to determine if the point being measured is within a plated surface, an edge removal area or outside the substrate.
The sensor 220 is further connected to a detection box 223 via an input cable 221 and an output cable 222. If the sensor 220 is an optical sensor, the detection box 223 may comprise a light source connected to the input cable 221, a light receiver connected to the output cable 222, and an amplifier circuit. The configuration of the detection box 223 will be described in detail in
In one aspect, the data acquisition box 230 may include a programming logic controller (PLC). In one aspect, the data acquisition box 230 may take analog signal from the detection box 223 and convert the analog signals to edge bevel removal (EBR) width information, which will be fed into the system controller 240 in the form of 0-5 volt output. The output is linearly proportional to the EBR width. In another aspect, the data acquisition box 230 may provide EBR width and non-concentricity information via RS232 or Ethernet to the system controller 240 or other related controllers. The data acquisition box 230 may further incorporate a hardware or software noise filter to minimize or eliminate possible noise in the incoming singals. In another embodiment, the data acquisition box 230 may have a have a serial port (USB) to for displaying raw data for diagnostic proposes.
The optical sensor system 300 comprises a light emission source 328 configured to emit an electromagnetic radiation. In one embodiment, the light emission source 328 emits a broad spectrum of radiation across the range of wavelengths from about 200 nm to about 1100 nm. Examples of possible electromagnetic radiation sources might be a tungsten filament lamp, a laser (e.g., yttrium aluminum garnet(YAG), excimer, etc), a laser diode, a xenon lamp, a mercury arc lamp, a metal halide lamp, a carbon arc lamp, a neon lamp, a sulfur lamp, or a combination thereof.
The light emission source 328 is connected to an optic assembly 320 via an input cable 321. In one aspect, the input cable 321 is an optic fiber wrapped in a coaxial cable sheath made of polylefin. The electromagnetic radiation emitted by the light emission source 328 travels through the input cable 321 to the optic assembly 320. The optic assembly 320 is configured to collimate, focus, and/or direct the electromagnetic radiation from the light emission source 328 and project a signal beam 326 to a processing surface 302 at a pinpoint spot 325.
After hitting the processing surface 302, the signal beam 326 is reflected by the processing surface 302 back to the optic assembly 320. A detector 324 is connected to an output cable 322. In one embodiment, the detector 324 is configured to measure the intensity of electromagnetic radiation across one or more wavelengths of the reflected signal beam 326. The detector 324 may be selected from the following classes of sensors, for example, a photovoltaic, a photoconductive, a photoconductive-junction, a photoemissive diode, a photomultiplier tube, a thermopile, a bolometer, a pyroelectric sensor or other like detectors.
The detector 324 converts the reflected signal beam to an electrical signal which is then transferred to an amplifier assembly 329. The amplifier assembly 329 amplifies the electrical signal from the sensor to a level recognizable by a data processing unit 330 connected thereon. In one embodiment, the amplifier assembly 329 is an analogy amplifier for high precision without introducing A/D error.
In one embodiment, a filter may be used to dim noises in the electrical signal from the sensor.
An edge bevel processing system of the present invention, for example the edge bevel removal system 200 of
A spiral curve 421 illustrates the trajectory of the pinpoint spot 425 on the substrate due to the linear movement of the sensor and the spinning movement of the substrate. In one embodiment, both the rotating speed ω and the linear speed v are constant. The sensor signal may be sampled at a period dt. Spots 426 represents locations on the substrate 402 where the sensor signal are sampled. Spots 426 sampled immediately next to each other have an angle of α (α=ω*dt). Adjusting dt and ω appropriately, the spots 426 may distribute in groups along a plurality of radii R that are α degrees away from one another. In one aspect, properties of the substrate 402 along a radius may be measured by analyzing sensor signals from spots 426 along the radius. The properties may include width of edge bevel area along the radius, surface conditions along the radius, and contaminations. In one embodiment, the spot 426 may overlap with its immediate neighboring spot 426 along the same radius for a precise measurement. In one aspect, the spots 426 may be circles having a diameter of about 0.15 mm and neighboring spots 426 may overlap by about 0.05 mm along the diameter, which is about 30%. The overlapping may be realized by adjusting linear speed v, and/or spot size, and/or rotation speed ω.
FIGS. 10A-B illustrates another exemplary substrate 1001 and its measurement. The substrate 1001 has a bevel edge region 1003 and a central region 1004. Curve 1002 indicates the boundary between the bevel edge region 1003 and the central region 1004. A contamination 1005, such as a metal spot due to an incomplete bevel edge removal, is located in the bevel edge region 1003. The distance between the contamination 1005 and an edge of the substrate 1001 is w3. Similar to
As discussed, the apparatus and method of the present invention provide build-in quality control in a bevel edge removing system. Measuring an edge region of a substrate being processed can be performed simultaneously as bevel edge removal, thus shortening inspection time. Misprocessing of a system, for example bevel edge too wide or too thin, may be detected immediately, thus minimizing damage. Contaminations and incomplete removal may be detected while the substrate is still in the chamber, providing opportunities to fix problems in-situ. Further, eccentricity of the substrate and/or bevel edge region can be measured, thus, providing means to calibrate the fluid dispensing nozzles, centering assemblies, and transferring robots.
Although, the above discussion is focused on processing a semiconductor substrate, the present invention may also be used in processing various substrates, such as a glass substrate for a liquid crystal display, a plasma display panel, or a ceramic substrate for magnetic discs.
While the foregoing is directed to embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow.