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Publication numberUS3806361 A
Publication typeGrant
Publication dateApr 23, 1974
Filing dateJan 24, 1972
Priority dateJan 24, 1972
Publication numberUS 3806361 A, US 3806361A, US-A-3806361, US3806361 A, US3806361A
InventorsL Lehner
Original AssigneeMotorola Inc
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Method of making electrical contacts for and passivating a semiconductor device
US 3806361 A
Abstract  available in
Previous page
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Claims  available in
Description  (OCR text may contain errors)

"UnitedStates Patent Omce 3,806,361 Patented Apr. 23, 1974 U.S. Cl. 117-212 7 Claims ABSTRACT OF THE DISCLOSURE The method of making electrical contacts for and passivating a semiconductor device includes the steps of depositing thereover a layer of polycrystalline silicon material and selectively doping the polycrystalline silicon material at locations whereat the electrical connections are to be made to render it conductive thereat. In the case of semiconductor devices having a passivating layer of SiO2 or the like thereover, the SiO'z must rst be removed in those areas whereat the electrical contacts are to be formed.

BACKGROUND OF THE INVENTION This invention relates generally to methods for making electrical contacts for semiconductor devices and more particularly to such methods for `making electrical connections to semiconductor devices which have been passivated.

Presently, when making electrical contacts for a semiconductor device having an SiO2 or the like passivation layer deposited thereover, a section of the SiOZ layer is first removed. Thereafter, the area from which the SiOz material was removed is lled With a conductive material such as, for example, aluminum, to which an electrical connection can be made.

While the above described technique provides an adequate electrical contact for the semiconductor device, the area whereat the aluminum is deposited, is not passivated and is susceptible to contamination by foreign particles. Contamination of the area can cause malfunction of the semiconductor device at a later time.

SUMMARY OF THE INVENTION Accordingly, it is a general object of the present invention to provide a new and improved method for making electrical contacts for semiconductor devices, which overcomes the drawbacks of the prior art.

It is another object of the present invention to provide a new and improved method for forming electrical contacts for semiconductor devices wherein the sites of the electrical contacts are passivated.

Briefly, the method according to the invention comprises the steps of removing from a passivated semiconductor device, an area of passivating material to expose the semiconductor material therebeneath whereat an electrical contact is to be formed, Thereafter, a layer of polycrystalline silicone is deposited over the semiconductor device including the exposed area. Subsequent to the deposition of the last-mentioned material, aluminum or the like metal is sintered in to dope the polycrystalline silicon covering the exposed area, thereby providing a conductive area through the polycrystalline silicon whereat an electrical connection may be made to the semiconductor material therebeneath. The polycrystalline silicone serves both as a conductor for making the electrical contact and as a passivating material for the device.

It is not necessary that a passivation layer of material be applied prior to the application of the polycrystalline silicon, however, it is advantageous since the gain of the semiconductor device may be alected vw'thout the highly resistive passivating layer such as, SiO2, being provided beneath the polycrystalline silicone.


FIGS. 1-7 are cross-sectional, fragmentary views of a semiconductor device as it appears during the various stages of the method according to the invention for preparing electrical contacts therefor and for passivating the contact areas.

DETAILED DESCRIPTION Referring now to the drawing in greater detail, FIGS. 1-7 illustrate a semiconductor device, designated generally `by the numeral 10, herein shown as a transistor component having a lower substrate or wafer 12 of silicon or the like material. Deposited over the wafer 12, are layers 14, 16 of P and N type semiconductor material, respectively. A P type area 18 is diffused into the upper N type layer. In the case of the device shown, area 18 forms the emitter portion of the transistor while areas 16 and 14 form the base and collectors thereof, respectively. The use of a transistor component in the drawing of the instant application is for illustrative purposes only since the method according to the invention may be applied to semiconductor devices other than transistors.

During the formation of the devices, a passivation layer 22 of SiO2 or the like material may be deposited over the surface of the device. The highly resistive passivation material maintains the device contaminant free. In the production of semiconductor devices of the type shown, i.e., mesa type semiconductor devices, the semiconductor material of the various layers is etched away to form valleys, such as 20, which separate the remaining semiconductor devices. The etching also removes the passivation material from the junction in the valley.

To provide electrical contacts for the various layers of the semiconductor device, areas of the SiOz beneath which such contacts are to be provided, are removed to expose the semiconductor layers (see FIG. 3). Conventionally, metal is deposited in the openings, such as 24, formed in the Si02 to make physical contact with the semiconductor material. In the latter technique, however, the valleys and contact areas remain unpassivated and therefore are susceptible to contamination which could aiect the operation of the semiconductor device.

In the method according to the invention, subsequent to the removal of the SiOZ passivating material to form openings 24 (FIG. 3), a layer 26 of polycrystalline semiconductor material, preferably polycrystalline silicon, is deposited over the Si02 layer (FIG. 4). The last-mentioned layer can be deposited over the semiconductor device by passing the device through a heated chamber having an atmosphere of SiCl4 and H2. The polycrystalline silicon layer formed over the semiconductor device further passivates the device including the areas 24 and 20 exposed by the removal of the semiconductor material and SiOz prior thereto.

Subsequent to the deposition of the polycrystalline silicon, a layer 28 of aluminum or the like conductive metal is provided thereover (FIG. 5). The metallized layer can be sputtered or vacuum deposited onto the semiconductor device in a `well known manner, or any other suitable technique may be used if desired. Thereafter, the conductive layer provided over the areas adjacent those areas to be used as electrical contact areas, is etched away, leaving only the metallized areas, such as 30 on the polycrystalline silicon, which are in alignment with the openings 24 in the SiO2 therebeneath. The removal of the unwanted metallized areas may be accomplished by overlaying the aluminum after deposition thereover, with a layer of impervious material'such as wax, or the like. Thereafter, the

wai is removed Vat those areas vvhichareA not to be"usedV polycrystalline silicon areas, such as 32, beneaththe sites of conductive metal, rendering those areas conductive, thereby making an electricall connection possible to the semiconductor material therebeneath.

The doped polycrystalline silicon serves both as a conductive contact area whereat electrical connections to the semiconductor device may be made as well as passivating material to maintain the area contaminant free.

While the above description was given in conjunction with a semiconductor device having a passivation layer of SiOz thereover, it is not necessary to provide sucha layer in addition to the polycrystalline silicon layer. Instead, the polycrystalline silicon layer may be deposited over the semiconductor device 10 as shown in FIG. l. Thereafter, the steps illustrated in FIGS. 5-7 may be taken to provide electrical contacts for the device'.

I claim: 1. The method of making electrical contacts for semiconductor devices comprising the steps of:

depositing a layer of polycrcystalline silicon material over said semiconductor device; depositinng an aluminum layer at locations whereat electrical contacts are to be formed; and heating said semiconductor device to causesaid aluminum to be sintered into said polycrystalline material thereat thereby rendering said area conductive and making electrical connections with said semiconduc-` tor material. i 2. The method of claim 1 wherein said semiconductor device includes a passivation layer providedthereover `and further including the step of removing said passivation' material at said desired locations prior to the deposition of said polycrystalline material over said semiconductoriy device.

3. The method of makingelectrical contacts for a semi-1u conductor device having a highly resistiveupassivating material deposited thereover, comprising the steps '0f: removing said passivating material at predetermined locaing material has been removed, and ydoping said polycrys-I talline material at locations alignedwith said predetermined locations to render the polycrystalline vmaterial thereat electrically conductive, thereby to make electrical Vcontact with said semiconductor material"thereb'eneath.l

4. The method of claim 3 wherein the doping of said polycrystalline material comprises the steps of depositing metallic material over said polycrystalline layer at loca- 'tions aligned with said predeterminedl locations and heat-A comprises the steps of: depositing said lmetallic materialy over said polycrystalline layer, applying an impervious layer of material over predetermined areas of said metallic material, etching away. thegmetallic material -not covered by said impervious layer, removing said impervious layer over the remaining metallic material subsequent to etching, and heating said semiconductor device for sintering said metal into said polycrystalline material at said predetermined locations.

6. The method of claim 5 wherein said semiconductor"I device is heated at a temperature in the range of 40G-500 C. for sintering the conductive metal into said polycrystalline material.

` prising the steps of 7. The method of making electrical contact for and passivating a semiconductor device which includes thereover a layer of highly resistive passivating material comremoving said highly resistive passivating material at predetermined locations; depositing a layer of polycrystalline silicon material overv the surface of said semiconductor device and said remaining passivating material; forming a layer of aluminum over said predetermined locations; and heating said semiconductor device to sinter the aluminum into said polycrystalline material to render the polycrystalline material conductive thereat, thereby to complete an electrical connection `with said semiconductor device.

References Cited UNITED'STATES PATENTS Y 3,189,973 t 6/1965 Edwards 117-201 3,481,776 :l2/1969 Manchester ll7212 3,653,120 4/1972 ySireine v 317-234 L 3,667,008 ,V5/1972 Kartack 317-235 AT 3,703,420 11/1972 Vora 117-212 LEN D. 'RosDoL, Primary Examiner ESPOSITO, Assistant `Examiner Us. C1. XR. i

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US3970487 *Jun 16, 1975Jul 20, 1976International Business Machines CorporationMethod of manufacturing a power transistor
US4001762 *Jun 2, 1975Jan 4, 1977Sony CorporationThin film resistor
US4022930 *May 30, 1975May 10, 1977Bell Telephone Laboratories, IncorporatedMultilevel metallization for integrated circuits
US4040877 *Aug 24, 1976Aug 9, 1977Westinghouse Electric CorporationMethod of making a transistor device
US4046607 *Jun 9, 1976Sep 6, 1977Nippon Electric Co., Ltd.Method of manufacturing a semiconductor device
US4061510 *Feb 2, 1976Dec 6, 1977General Electric CompanyProducing glass passivated gold diffused rectifier pellets
US4074304 *Mar 2, 1977Feb 14, 1978Nippon Electric Company, Ltd.Semiconductor device having a miniature junction area and process for fabricating same
US4109273 *Jun 29, 1977Aug 22, 1978Siemens AktiengesellschaftContact electrode for semiconductor component
US4132813 *Oct 22, 1976Jan 2, 1979Robert Bosch GmbhMethod for producing solderable metallized layer on a semiconducting or insulating substrate
US4199379 *Sep 15, 1978Apr 22, 1980Bbc Brown Boveri & Company, LimitedMethod for producing metal patterns on silicon wafers for thermomigration
US4322452 *Aug 18, 1980Mar 30, 1982Siemens AktiengesellschaftProcess for passivating semiconductor members
US4473597 *Feb 2, 1983Sep 25, 1984Rca CorporationMethod and structure for passivating a PN junction
US4489479 *Sep 1, 1983Dec 25, 1984Hughes Aircraft CompanyMethod for repair of buried contacts in MOSFET devices
US4742384 *Mar 18, 1983May 3, 1988Rca CorporationStructure for passivating a PN junction
US4761386 *Jul 21, 1986Aug 2, 1988National Semiconductor CorporationMethod of fabricating conductive non-metallic self-passivating non-corrodable IC bonding pads
US4785341 *Dec 24, 1987Nov 15, 1988International Business Machines CorporationInterconnection of opposite conductivity type semiconductor regions
US4843034 *May 23, 1988Jun 27, 1989Massachusetts Institute Of TechnologyFabrication of interlayer conductive paths in integrated circuits
US4914057 *Jul 15, 1988Apr 3, 1990Sgs-Thomson Microelectronics S.A.Contacting method and structure for integrated circuit pads
US5366928 *Jun 4, 1993Nov 22, 1994U.S. Philips CorporationMethod of manufacturing a semiconductor device, in which a metal conductor track is provided on a surface of a semiconductor body
WO1988010008A1 *Jun 9, 1988Dec 15, 1988Massachusetts Institute Of TechnologyFabrication of interlayer conductive paths in integrated circuits
U.S. Classification438/657, 257/771, 148/DIG.510, 427/383.3, 148/DIG.300, 148/DIG.850, 148/DIG.125, 148/DIG.280, 257/E21.573, 438/658, 148/DIG.122, 438/684, 148/DIG.200
International ClassificationH01L21/764, H01L23/485, H01L21/00
Cooperative ClassificationY10S148/122, Y10S148/125, Y10S148/02, Y10S148/051, Y10S148/085, H01L21/764, H01L23/485, H01L21/00, Y10S148/028, Y10S148/03
European ClassificationH01L23/485, H01L21/00, H01L21/764