|Publication number||US5980270 A|
|Application number||US 08/753,539|
|Publication date||Nov 9, 1999|
|Filing date||Nov 26, 1996|
|Priority date||Jun 7, 1994|
|Also published as||DE69533063D1, DE69533063T2, EP0764352A1, EP0764352A4, EP0764352B1, EP1424748A2, EP1424748A3, US5615824, WO1995034106A1|
|Publication number||08753539, 753539, US 5980270 A, US 5980270A, US-A-5980270, US5980270 A, US5980270A|
|Inventors||Joseph Fjelstad, Thomas H. DiStefano, John W. Smith|
|Original Assignee||Tessera, Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (68), Non-Patent Citations (13), Referenced by (161), Classifications (113), Legal Events (5)|
|External Links: USPTO, USPTO Assignment, Espacenet|
The present application is a division of Ser. No. 08/410,324, filed Mar. 24, 1995 now U.S. Pat. No. 5,615,824, which is a continuation-in-part of application Ser. No. 08/306,205 filed Sep. 14, 1994, now U.S. Pat. No. 5,632,631, which is a continuation-in-part of application Ser. No. 08/254,991 filed on Jun. 7, 1994 now U.S. Pat. No. 5,802,699. The disclosures of the aforesaid patents and patent application are hereby incorporated by reference herein.
The present invention relates to soldered connections for microelectronic devices such as semiconductor chips and the associated circuit panels, and to methods of making and using such connections.
Microelectronic circuits require numerous connections between elements. For example, a semiconductor chip may be connected to a small circuit panel or substrate, whereas the substrate may in turn be connected to a larger circuit panel. The chip to substrate or "first level" interconnection requires a large number of individual electrical input and output ("I/O") as well as power and ground connections. As chips have become progressively more complex, the number of I/O connections per chip has grown so that hundreds of connections or more may be needed for a single chip. To provide a compact assembly, all of these connections must be made within a relatively small area, desirably an area about the area of the chip itself. Thus, the connections must be densely packed, preferably in an array of contacts on a regular grid, commonly referred to as a "Bump Grid Array" or "BGA". The preferred center-to-center distance between contacts or "contact pitch" for chip mountings is on the order of 1.5 mm or less, and in some cases as small as 0.5 mm. These contact pitches are expected to decrease further. Likewise, chip mounting substrates and other circuit panels used in microelectronics have become progressively more miniaturized, with progressively greater numbers of electrical conductors per unit area. Connectors for these miniaturized panel structures desirably also have very small contact pitch. Connections of chip mounting substrates to other elements are referred to as "second-level" interconnections.
Microelectronic connections must meet numerous, often conflicting requirements. As mentioned above, the size of the device poses a major concern. Further, such connections often are subject to thermal cycling strains as temperatures within the assembly change. The electrical power dissipated within a chip or other microelectronic element tends to heat the elements so that the temperatures of the mating elements rise and fall each time the device is turned on and off. As the temperatures change, the various connected elements expand and contract by different amounts, tending to move the contacts on one element relative to the mating contacts on the other element. Changes in the temperature of the surrounding environment can cause similar effects which produce mechanical stress in the connected components.
The connections must also accommodate manufacturing tolerances in the contacts themselves and in the connected elements. Such tolerances may cause varying degrees of misalignment. Additionally, contamination on the surfaces of the mating contact parts can interfere with the connection. Therefore, the contact system should be arranged to counteract the effects of such contaminants. For example, in making soldered connections, oxides and other contaminants must be removed by fluxes. These fluxes in turn can contaminate the finished product. Although these fluxes can be removed by additional cleaning steps, or can be formulated to minimize ill-effects on the finished product, it would be desirable to provide soldered connections which minimize or eliminate the need for such fluxes. All of these requirements, taken together, present a formidable engineering challenge.
Various approaches have been adopted towards meeting these challenges.
Certain preferred embodiments disclosed in our aforementioned U.S. patent application Ser. No. 08/254,991 provide connectors for mounting a microelectronic element such as a semi-conductor chip or other element. Connectors according to these embodiments include a planar dielectric body having first and second surfaces and also having a plurality of holes open to the first surface. The holes are disposed in an array corresponding to an array of bump leads on the device to be mounted. The connector further includes an array of resilient contacts secured to the first surface of the dielectric body in registration with the holes so that each such contact extends over one hole. Each contact is adapted to resiliently engage a bump lead inserted into the associated hole. A chip or other microelectronic component with the bump leads thereon can be connected to the contacts by superposing the microelectronic element on the dielectric body of the connector so that the microelectronic element overlies the first surface and so that the bump leads on the element protrude into the holes and are engaged by the resilient contacts. Preferred connector components according to this aspect of the invention will establish electrical connection with the bump leads by mechanical inter-engagement of the bump leads and contacts.
Each contact may include a structure such as a ring of a sheet-like metallic contact material overlying the first surface of the dielectric body and fully or partially encircling the opening of the associated hole, and each contact may also include one or more projections or tabs formed integrally with the ring and extending inwardly therefrom over the hole. Preferably, a plurality of such projections are provided at circumferentially-spaced locations around the hole. These projections are arranged so that when a bump lead enters the hole, it tends to force the projections downwardly and outwardly, away from one another. The projections tend to center the bump in the hole. The chip or other microelectronic component can be reliably connected simply by pressing the chip against the connector in proper alignment with the holes. This reliable interconnection can be used either as a temporary interconnection for testing purposes or as a permanent connection.
As set forth in the '991 application, the motion of the bump leads entering the holes as the microelectronic element is engaged with the connector causes the bump leads to wipe across the contacts so as to clean debris, oxides and other contaminants from the surfaces of the contact and bump lead. The bump leads may include a bonding material such as a solder, to form a permanent metallurgical connection with the contacts. Thus, the microelectronic component can be engaged with the connector and tested using the mechanically-made electrical interconnections. If the results are satisfactory, the permanent metallurgical bond can be formed by heating to melt the solder.
Certain aspects of our U.S. Pat. No. 5,632,631 provide contacts for a microelectronic device, which contacts can be used in the connectors of the '991 application and in other structures. According to these aspects of the '631 Patent, each contact includes a base portion defining a base surface, and one or more asperities preferably integral with the base portion and protruding upwardly from the base surface. Each such asperity desirably defines a tip remote from the base surface and a substantially sharp feature at the tip. The base portion of each contact may include one or more metallic layers such as copper or copper-bearing alloys, and may also include a polymeric structural layer in addition to a conductive, desirably metallic, layer.
The base portion of each contact may include an anchor region and at least one tab or projection formed integrally with the anchor region. The asperity or asperities may be disposed on each tab at a distal end, remote from the anchor region. In use, the anchor region of such a contact is fixed to a connector body or other support, whereas the tab is free to bend. When a bump lead is engaged with the tab, the tab bends and the mating bump lead and tab move relative to one another to provide a wiping motion. The resilience of the tab causes the sharp feature of the asperity to bear on the mating element and scrape the mating element. The scraping action promotes reliable contact before bonding, as well as reliable bonding. The anchor region of each contact may be part of a substantially ring-like common anchor region. A contact unit may include such common anchor region and a plurality of tabs extending inwardly from the ring-like anchor region towards a common center.
One aspect of the present invention provides methods of making an electrical connection. A method according to this aspect of the invention preferably includes the step of forcibly engaging a first element bearing one or more masses of an electrically conductive fusible bonding material such as a solder or other fusible conductive composition and a second element bearing one or more resilient, electrically conductive contacts so that the contact wipes the surface of the mass and so that the contact is deformed and bears against the wiped surface. The method further includes the step of bringing the contact and the mass to an elevated bonding temperature sufficient to soften the fusible bonding material, so that the contact penetrates into the mass under the influence of its own resilience and then cooling the engaged contact and mass. The heating step typically is performed after the engaging step, during the engaging step the solder mass is cool and solid. Most preferably, the engaging step is performed so that the contacts wipe the surfaces of the masses during the engagement step. Most preferably, each contact has one or more asperities on its surface. Typically, the heating and cooling steps are performed by heating and cooling the entire assembly, including both elements.
When the fusible material is heated and softened, and the contacts penetrate into the masses, each contact is exposed to substantially pure fusible material. For example, where the fusible material is a solder, each contact is exposed to substantially pure solder, free of oxides and other impurities found at the solder mass surfaces. This facilitates formation of a sound, metallurgical bond between the solder and the contact. Fluxes need not be utilized to remove the impurities from the surfaces of the solder masses. The contacts may incorporate oxidation-resistant materials at the regions which penetrate into the solder during the process. This further facilitates formation of the solder joint without the use of fluxes.
Although the present invention is not limited by any theory of operation, it is believed that the wiping action tends to rupture the film or layer of oxide which may be present on the surfaces of the solder masses, and thus facilitates penetration of the contacts into the underlying pure solder during the subsequent heating and softening steps. These contacts desirably are provided with sharp-featured asperities in the region which scrape the surfaces of the solder masses.
Further aspects of the present invention include bonded articles. An article according to this aspect of the invention includes a first element having a structure with at least one terminal thereon, masses of a bonding material such as a solder and a second element having a body with one or more contacts thereon, each such contact including an anchor portion secured to the body and at least one tab projecting from the anchor portion and having a distal end remote therefrom. The distal end of each such tab projects into one mass of bonding material on the first element and is bonded thereto. Preferably, the bonding material is a solder and the distal end of each tab is metallurgically bonded to the mass. Each tab desirably is bonded to a portion of the mass remote from the surface of the mass. Most preferably, each contact incorporates an annular anchor region defining a central axis and a plurality of tabs projecting inwardly towards such central axis. Each mass is received within the annular anchor portion of one such contact and is penetrated by the radially inwardly extending tabs of such contact. Desirably, tabs penetrate into each mass into many directions, so that the tabs substantially surround the mass. As further discussed below, connections according to this aspect of the invention provide particularly strong interconnections, even where the individual tabs are quite small and hence quite fragile.
These and other objects, features and advantages of the present invention will be more readily apparent from the detailed description of the preferred embodiments set forth below, taken in conjunction with the accompany drawings
FIG. 1 is a fragmentary, diagrammatic perspective view depicting portions of a connector used in one embodiment of the present invention.
FIG. 2 is a fragmentary, diagrammatic partially sectional view on an enlarged scale along lines 2--2 in FIG. 1.
FIG. 3 is a view similar to FIG. 2 but illustrating the connector during one state of a process in accordance with one embodiment of the invention.
FIG. 4 is a view similar to FIG. 3 but depicting a later stage of the process.
FIG. 5 is a fragmentary elevational view depicting components used in a further embodiment of the invention.
A connector useful in one embodiment of the invention may be substantially in accordance with certain embodiments of the aforementioned co-pending applications. The connectors include a plurality of independent, electrical contact units 29. Each contact unit includes four contacts 20. Each contact 20 includes a small metallic tab incorporating a base layer 22 (FIG. 2) defining an upwardly facing base surface 24. The base portion of each contact desirably is formed from a resilient metal selected from the group consisting of copper, copper-bearing alloys, stainless steel and nickel. Beryllium copper is particularly preferred. The base portion desirably may be between about 10 and about 25 microns thick. A layer 25 of an etch-resistant metal such as nickel or gold used in the contact formation process may be disposed on base surface 24. Layer 25 desirably is between about 0.5 and 2.0 microns thick. Each such tab is joined to a generally square, ring-like anchor portion 26 integral with the tab. Each tab has a tip 28 at the distal end of the tab remote from the anchor portion.
Four tabs extend inwardly from each anchor portion 26, the tabs being separated from one another by channels 23. Each contact or tab 20 has an asperity 30 projecting upwardly from the base surface 24 adjacent the tip 28 or distal end of the tab, remote from the anchor portion. Each asperity includes a column 32 of a first or base metal integral with base portion 22 and further includes a cap 34 overlying the column 32 at the uppermost tip of the asperity, remote from base surface 24. Each column 32 is generally cylindrical or frustoconical in shape, so that the tip of each column is substantially circular. The cap of each column defines a flat, circular tip surface and substantially sharp edge 36 encircling the tip surface. Each asperity desirably protrudes upwardly from the base surface less than about 100 microns, more preferably between about 5 microns and about 40 microns, and most preferably between about 12 microns and about 25 microns. Each asperity may be between about 12 and about 75 microns in diameter, more preferably about 12 to about 35 microns in diameter. The cap metal 34 may be selected from the group consisting of metals resistant to etching by etchants which etch the first or base metal. Cap metals selected from the group consisting of gold, silver, platinum, palladium, osmium, rhenium, nickel, tin and combinations thereof are preferred. As discussed in detail in the aforementioned '631 Patent, such etch-resistant metals aid in formation of sharp edges 36. Thus, in formation of the contact, the etch-resistant metal may act as an etch mask during etching of the base layer to form columns 32. Moreover, the harder etch-resistant metals, particularly nickel, osmium and rhenium, aid in preserving the edge during use. The contact surface which will engage the solder mass in use includes the surface of the base portion adjacent the contact tip and also includes the cap metal. Desirably, the contact surface includes one or more metals solderable metals selected from the group including tin copper, silver, lead, palladium, gold and alloys and combinations thereof. For example, the contact surface may include alloys such as copper-silver, lead-tin, and gold-tin.
The contact units are disposed on the top surface 38 of a connector body 40, and spaced apart from one another so that there are slots 42 between adjacent connector units. Connector body 40 incorporates a sheet-like structural support layer 44 having holes 46 therein. Support layer 44 can be formed from a metal such as copper or from a dielectric material such as fiber reinforced polymers, or unreinforced polymers. The structural support is covered by a bottom dielectric layer 48 and a top dielectric layer 50, which merge with one another within holes 46, so that the dielectric layer cooperatively lines the holes as well. A conductive metallic via liner 52 extends through each hole 46 from the top surface 38 of the connector body to the opposite, bottom surface 54. Each via liner 52 flares radially outwardly, away from the central axis 56 of the associated hole at the bottom surface so as to form an annular terminal 58 at such bottom surface. Each via liner also flares outwardly, away from the central axis at the top surface 38 so as to form a contact support structure 60. The periphery of each contact support is generally square.
One contact unit 29 is disposed on each contact support structure 60, substantially in alignment with the square boundary thereof. Each contact unit is secured to the associated contact support by four posts 66 formed integrally with the contact support 60 and extending upwardly through holes 64 in the contact unit. Each post 92 has a bulbous portion 68 at the end of the post remote from the contact support 60, overlying base surface 24. These posts and bulbous portions thus secure each contact unit 29 to the corresponding contact support 60 so that the individual contacts or tabs 20, and particularly the tips 28 thereof, protrude radially inwardly, toward the axis 56 of the associated hole 46 in the connector body and so that tips of the contacts or tabs 20 overly the hole 46. The posts and the contact supports 60 also electrically connect each contact unit to the associated via liner and thus to the terminal 58 on the bottom surface.
Contact units 29, and hence the individual contacts or tabs 20 are disposed in a regular pattern corresponding to the patterns of holes 46 in body 40. The asperities 30 on the contacts are also disposed in a regular pattern, in registration with the pattern of contacts 20, so that the same number of asperities are disposed on each contact. In the embodiment of FIGS. 1 and 2, only one asperity is disposed on each contact. However, because both the asperities and the contacts are disposed in regular patterns, all of the contacts are provided with asperities. Also, the asperity on each contact is at the same location namely, adjacent the tip of the tab or contact, remote from the anchor region of the contact unit. A layer of a conventional photographically patternable solder mask material 67, shown in broken-line phantom view in FIG. 2 for clarity of illustration, covers the top surfaces of the connector body and contact unit. Solder mask layer 67 is provided with holes aligned with the holes 46 in the connector body and with the central axes 56 of the holes and contact units. The tips or distal ends 28 of the contact tabs are exposed within the holes 65 of the solder mask layer, whereas the anchor portions of the contact units, and the proximal ends of the tabs adjacent-the anchor portions are covered by the solder mask layer. The solder mask layer may be formed from photoimagable polymers or from other polymers such as epoxies and polyimide. Thermoplastic materials such as polyetherimide (available under the registered trademark Ultem) and fluorocarbons, particularly fluorinated ethylene-propylene ("FEP") may also be used.
The connector of FIGS. 1 and 2 may be engaged with a larger substrate, such as a multilayer substrate 68 having leads 69. The terminals 58 of the connector, and thus the contact units 29, may be electrically connected to the internal leads 69 of the substrate by conventional lamination and/or solder bonding methods, or by the lamination and interconnection methods taught in U.S. Pat. No. 5,282,312, the disclosure which is hereby incorporated by reference herein.
After assembly to the substrate, the connector of FIGS. 1 and 2 is engaged with a mating microelectronic element 70. Microelectronic element 70 may be an active microelectronic device such as a semiconductor chip, or may be a circuit-bearing substrate or panel or other device. The microelectronic element has a body having a rear surface 75 with terminal 73 thereon connected to other electronic circuitry or components of the microelectronic element (not shown). Terminals 73 are disposed in an array matching the array of contact units 29 and holes 46 on the connector. A mass of solder 72 is disposed on each terminal 73. The solder masses are in the form of bumps protruding upwardly from surface 75. The solder masses desirably include one or more metals selected from the group consisting of lead, tin, silver, indium and bismuth. Lead-tin alloys; lead-in-silver alloys; or indium-bismuth alloys may be used.
In a process according to one embodiment of the invention, the rear surface 75 of microelectronic element 70 is placed adjacent the front surface 38 of the connector body 40.
The terminal 73 and solder mass 72 on the microelectronic element are aligned with the hole 46 in the connector body and hence with the central axes 56 of the contact units and holes. During this stage of the process, the solder mass are at a temperature substantially below the melting temperature of the solder and therefore are in a substantially solid, rigid condition. The surface of each solder mass bears on the tabs of the associated contact unit adjacent the tip or distal end of the tab. At least during some portions of this engagement step, the solder units engage each tab by means of the asperity 30 on the tab. The microelectronic element is then forcibly engaged with the connector by forcing the microelectronic element toward the top surface of the connector body. As illustrated in FIG. 3, the anchor portion or periphery 26 of each contact unit remains substantially in fixed position, whereas the distal regions of each tab 20, adjacent the tips 28 of the tabs, bend downwardly, in the direction of motion of the engaged solder mass 72. In this condition, a part of each sharp edge 36 faces upwardly, in the direction opposite to the downward motion of microelectronic element 70 and solder masses 72. The tip 28 of each tab, and the asperity on such tip are biased inwardly, towards the central axis 56 of the hole, by the resilience of the tab 20. The upwardly facing portion of each edge 36 tends to dig into the surface of a solder mass 72. The sharp-edged asperity on each tab thus scrapes a path along the surface of the solder mass 72.
This scraping action effectively removes oxides and other contaminants from the scraped paths. This assures reliable electrical contact between contacts 20 and the solder masses 72. In particular, the tips of the asperities aid in making contact with the solder masses 72. Because the cap metal in layer 34 on the tip of each asperity is a substantially oxidation resistant metal, it normally does not have any substantial oxide or contaminant layer. Thus, the solder masses and contacts form a firm, reliable electrical interconnection. This action is repeated at each contact unit and with each solder mass 72 on the surface of the microelectronic element, so that reliable interconnections are formed simultaneously between all of the solder masses 72 and all of the internal conductors 69 of substrate 68. The electrical connection achieved by mechanical interengagement of the element may be used as a test connection, so that microelectronic element 70, its connections to substrate 68 and the other elements connected to the same substrate can be tested and operated under power. This test also serves to test electrical continuity between the solder masses 72 and contacts 20. If a defective connection or component is identified during the test, the same can be removed and replaced readily. Ordinarily, the connector and contacts can be reused.
Following completion of the testing step, the engaged solder masses and contacts are heated to an elevated bonding temperature sufficient to soften the solder. Preferably, this heating is accomplished without disengaging the solder masses from the contacts. The solder masses remain in engagement with the contacts from completion of the testing step throughout the remainder of the process. The bonding temperature is sufficient to soften the solder, as by converting some or all of the solder to a liquid phase. The solder masses and contacts may be heated by exposing the entire assembly to any suitable heating medium, such as a hot gas, radiant energy or the like. As the solder softens, each tab 20 springs back from the deformed condition of FIG. 3 towards its original, undeformed shape. As shown in FIG. 4, the distal ends or tips of the tabs penetrate into the solder mass. Although the present invention is not limited by any theory of operation, it is believed that the wiping action between the contacts and the surface of the solder mass during the engagement step, and particularly, the scraping action of the asperities on the contacts facilitates penetration of the solder mass surface by the contacts. It is believed that disruption of the oxide layer during the wiping and scraping action materially reduces the coherence of the oxide layer after softening of the solder masses. This in turn allows the contact tips to break through the oxide layer readily and to enter into the substantially pure, unoxidized solder beneath the oxide layer. The wiping action also tends to remove oxides or other contaminants from the surfaces of the contact tips.
Because the tips of the contacts are immersed in the pure, unoxidized solder, they are readily wetted by the solder. Provided that at least some portions of the contact tips are substantially free of oxidational or other impurities at this stage of the process, the pure solder can effectively wet the contact tips. No fluxes or other extraneous chemical agents are required. The assembly desirably is held at the elevated bonding temperature for a period sufficient to ensure that all parts of the assembly reach the bonding temperature. The contacts tend to recover and penetrate into the solder masses to substantially instantaneously after the solder masses soften. When the solder wets the contact tips, it tends to flow along the surfaces of the contacts under the influence of capillary action. This tends to draw the solder outwardly, away from the tips of the contacts and towards the anchor regions of the contacts. The solder mask layer 67 blocks such outward flow. Where the solder mask layer includes a material such as a thermoplastic material or other material which can be softened by heat, the solder mask may be brought to a flowable condition when the assembly is heated to the bonding temperature. The solder mask layer thus flows into conforming contact with the surface 75 of the microelectronic element and bonds to the surface. This forms a seal which encloses each contact and solder mass in an individual cavity, thus protecting the connections from the environment. Alternatively or additionally, the solder mask layer may include an adhesive, such as an acrylate adhesive, which bonds to surface 75.
After the assembly has been heated to the bonding temperature, it is cooled to a temperature below the bonding temperature, typically to room temperature, so as to resolidify the solder. The resulting assembly includes solid solder masses 72 penetrated by the contact tabs 20 and metallurgically bonded to the contact tabs. Each solder mass protrudes generally in an axial or Z direction, generally perpendicular to the top surface 38 of the connector body and generally parallel to the axis 56 of the associated hole 46 in the connector body. Thus, each solder mass extends axially through the center of one ring-like anchor region 26. The contact tabs associated with such tabs associated with such ring-like anchor region extend generally radially inwardly into the solder mass. This configuration provides a particularly strong bond. Most preferably, the array of contact tabs penetrating into each solder mass substantially surrounds the solder mass in all radial directions. Thus, movement of the solder masses relative to the contacts in any radial or X-Y direction tends to force the contact into even more intimate engagement with one or more of the contact tabs. Although the contact tabs are illustrated in FIG. 4 as being fully restored to the original, undeformed condition, this is not essential. Thus, the contact tabs, after the softening and cooling steps, may have some residual deformation in the axial direction, into the hole, so that each contact tab slopes both axially and radially.
Other contact configurations may be employed. For example, as illustrated in FIG. 5, a microelectronic element or first element 170 having terminals 173 on its rear surface 175 and solder masses 172 on the terminals may be engaged with a connector or second element 140 having contacts 122 in the form of elongated strips on the front surface 138 of the element body. Each contact 122 has an anchor portion 126 connected to the internal electrical element or circuitry (not shown) of second element 140 and also has a cantilevered elongated tab 120 having a sharp asperity 130 at the distal end or tip 128 of the tab remote from the anchor portion 126. In its undeformed condition, each tab extends oblique to surface 138. When the first element 170 is forced towards the second element 140, solder masses 172 bend the tabs downwardly to the deformed position shown at 120' in broken lines in FIG. 5. This action causes the tips of the tabs, and particularly the asperities 130, to move in horizontal directions generally parallel to the surface 138 of the second element and generally transverse to the motion of the solder masses and first element 170, thus causing the tips of the tabs and particularly the aperities, to wipe the surfaces of the solder masses. Here again, the solder masses are heated, as by heating both elements. The contact tabs 120 spring back at least partially towards their undeformed positions and thus penetrate into the solder masses. Once again, after the assembly is cooled and the solder masses resolidified, each solder mass has a contact tab penetrating into it and metallurgically bonded to it.
The contacts described above can be adapted to provide various levels of interengagement force between each contact and the engaged mating electrical element. Interengagement forces between about 0.5 and about 5 grams force per engaged contact or tab are preferred in typical microelectronic applications. The total interengagement force per contact unit, and hence the total interengagement force per solder mass, desirably is between about 2 and about 20 grams force. With the sharp-edged asperity structures discussed above, these relatively small interengagement forces nonetheless provide effective scraping and wiping action. The ability to provide effective scraping action at relatively low force levels is especially significant where numerous contacts must be engaged with numerous solder masses. The degree of wipe or relative movement between the asperity edge and the mating surface during contact engagement can be relatively small, typically less than about 20 microns and usually between about 5 and 10 microns. Even this small relative movement however is enough for the sharp features of the asperity tips to break through the contaminants on the surface of the solder masses.
In the embodiments discussed above, the bonding material in the masses 72 is a solder. Other softenable bonding materials can be employed, such as polymeric materials filled with conductive particles. For example, partially-cured or "B-staged" epoxy resins, polyimide-siloxane resins or thermoplastic polymers filled with metallic particles may be employed. The metallic particles may be formed from metals such as silver, gold, palladium and combinations and alloys thereof, such as silver-palladium, silver alloys and gold alloys.
As these and other variations and combinations of the features set forth above can be utilized without departing from the invention, the foregoing description of the preferred embodiments should be taken by way of illustration rather than by way of limitation of the invention as defined by the claims.
|Cited Patent||Filing date||Publication date||Applicant||Title|
|US3275736 *||Apr 12, 1965||Sep 27, 1966||Gen Dynamics Corp||Apparatus for interconnecting elements|
|US3509270 *||Apr 8, 1968||Apr 28, 1970||Ney Co J M||Interconnection for printed circuits and method of making same|
|US3616532 *||Feb 2, 1970||Nov 2, 1971||Sperry Rand Corp||Multilayer printed circuit electrical interconnection device|
|US3670409 *||Nov 19, 1970||Jun 20, 1972||Gte Automatic Electric Lab Inc||Planar receptacle|
|US3797103 *||Nov 10, 1971||Mar 19, 1974||Gen Electric||Machine and process for semiconductor device assembly|
|US3818415 *||Feb 16, 1973||Jun 18, 1974||Amp Inc||Electrical connections to conductors having thin film insulation|
|US3937386 *||Nov 9, 1973||Feb 10, 1976||General Motors Corporation||Flip chip cartridge loader|
|US3998377 *||Mar 29, 1976||Dec 21, 1976||Teletype Corporation||Method of and apparatus for bonding workpieces|
|US4283839 *||Jul 7, 1980||Aug 18, 1981||Western Electric Co., Inc.||Method of bonding semiconductor devices to carrier tapes|
|US4295596 *||Dec 19, 1979||Oct 20, 1981||Western Electric Company, Inc.||Methods and apparatus for bonding an article to a metallized substrate|
|US4597617 *||Mar 19, 1984||Jul 1, 1986||Tektronix, Inc.||Pressure interconnect package for integrated circuits|
|US4655519 *||Oct 16, 1985||Apr 7, 1987||Amp Incorporated||Electrical connector for interconnecting arrays of conductive areas|
|US4695870 *||Mar 27, 1986||Sep 22, 1987||Hughes Aircraft Company||Inverted chip carrier|
|US4696096 *||Feb 21, 1986||Sep 29, 1987||Micro Electronic Systems, Inc.||Reworking methods and apparatus for surface mounted technology circuit boards|
|US4716049 *||Jun 30, 1986||Dec 29, 1987||Hughes Aircraft Company||Compressive pedestal for microminiature connections|
|US4783719 *||Jan 20, 1987||Nov 8, 1988||Hughes Aircraft Company||Test connector for electrical devices|
|US4818728 *||Dec 3, 1987||Apr 4, 1989||Sharp Kabushiki Kaisha||Method of making a hybrid semiconductor device|
|US4821947 *||Feb 8, 1988||Apr 18, 1989||Union Carbide Corporation||Fluxless application of a metal-comprising coating|
|US4846704 *||May 4, 1988||Jul 11, 1989||Texas Instruments Incorporated||Test socket with improved contact engagement|
|US4887760 *||Aug 27, 1987||Dec 19, 1989||Kabushiki Kaisha Toshiba||Bonding sheet for electronic component and method of bonding electronic component using the same|
|US4893172 *||Jan 13, 1988||Jan 9, 1990||Hitachi, Ltd.||Connecting structure for electronic part and method of manufacturing the same|
|US4902606 *||Aug 1, 1988||Feb 20, 1990||Hughes Aircraft Company||Compressive pedestal for microminiature connections|
|US4913336 *||Jan 31, 1989||Apr 3, 1990||Kabushiki Kaisha Shinkawa||Method of tape bonding|
|US4924353 *||Aug 1, 1988||May 8, 1990||Hughes Aircraft Company||Connector system for coupling to an integrated circuit chip|
|US4937006 *||Jul 29, 1988||Jun 26, 1990||International Business Machines Corporation||Method and apparatus for fluxless solder bonding|
|US4950173 *||Mar 24, 1986||Aug 21, 1990||Hitachi, Ltd.||Service temperature connector and packaging structure of semiconductor device employing the same|
|US4950623 *||Aug 2, 1988||Aug 21, 1990||Microelectronics Center Of North Carolina||Method of building solder bumps|
|US4975079 *||Feb 23, 1990||Dec 4, 1990||International Business Machines Corp.||Connector assembly for chip testing|
|US5006792 *||Mar 30, 1989||Apr 9, 1991||Texas Instruments Incorporated||Flip-chip test socket adaptor and method|
|US5006917 *||Aug 25, 1989||Apr 9, 1991||International Business Machines Corporation||Thermocompression bonding in integrated circuit packaging|
|US5046953 *||May 25, 1990||Sep 10, 1991||Hewlett-Packard Company||Method and apparatus for mounting an integrated circuit on a printed circuit board|
|US5046957 *||Jun 25, 1990||Sep 10, 1991||Amp Incorporated||Solder plate assembly and method|
|US5048746 *||Dec 8, 1989||Sep 17, 1991||Electrovert Ltd.||Tunnel for fluxless soldering|
|US5053922 *||Aug 31, 1989||Oct 1, 1991||Hewlett-Packard Company||Demountable tape-automated bonding system|
|US5057969 *||Sep 7, 1990||Oct 15, 1991||International Business Machines Corporation||Thin film electronic device|
|US5086337 *||Sep 13, 1988||Feb 4, 1992||Hitachi, Ltd.||Connecting structure of electronic part and electronic device using the structure|
|US5092034 *||Jun 27, 1990||Mar 3, 1992||Hewlett-Packard Company||Soldering interconnect method for semiconductor packages|
|US5115964 *||Jul 1, 1991||May 26, 1992||International Business Machines Corporation||Method for bonding thin film electronic device|
|US5123850 *||Jun 7, 1991||Jun 23, 1992||Texas Instruments Incorporated||Non-destructive burn-in test socket for integrated circuit die|
|US5131852 *||Aug 23, 1991||Jul 21, 1992||Amp Incorporated||Electrical socket|
|US5133495 *||Aug 12, 1991||Jul 28, 1992||International Business Machines Corporation||Method of bonding flexible circuit to circuitized substrate to provide electrical connection therebetween|
|US5152695 *||Oct 10, 1991||Oct 6, 1992||Amp Incorporated||Surface mount electrical connector|
|US5154341 *||Dec 6, 1990||Oct 13, 1992||Motorola Inc.||Noncollapsing multisolder interconnection|
|US5173055 *||Aug 8, 1991||Dec 22, 1992||Amp Incorporated||Area array connector|
|US5181859 *||Jun 5, 1992||Jan 26, 1993||Trw Inc.||Electrical connector circuit wafer|
|US5196726 *||Jan 23, 1991||Mar 23, 1993||Sumitomo Electric Industries, Ltd.||Substrate for packaging a semiconductor device having particular terminal and bump structure|
|US5199879 *||Feb 24, 1992||Apr 6, 1993||International Business Machines Corporation||Electrical assembly with flexible circuit|
|US5203075 *||Aug 12, 1991||Apr 20, 1993||Inernational Business Machines||Method of bonding flexible circuit to cicuitized substrate to provide electrical connection therebetween using different solders|
|US5207585 *||Oct 31, 1990||May 4, 1993||International Business Machines Corporation||Thin interface pellicle for dense arrays of electrical interconnects|
|US5228861 *||Jun 12, 1992||Jul 20, 1993||Amp Incorporated||High density electrical connector system|
|US5230632 *||Dec 19, 1991||Jul 27, 1993||International Business Machines Corporation||Dual element electrical contact and connector assembly utilizing same|
|US5261155 *||Feb 5, 1993||Nov 16, 1993||International Business Machines Corporation||Method for bonding flexible circuit to circuitized substrate to provide electrical connection therebetween using different solders|
|US5261593 *||Aug 19, 1992||Nov 16, 1993||Sheldahl, Inc.||Direct application of unpackaged integrated circuit to flexible printed circuit|
|US5281684 *||Apr 30, 1992||Jan 25, 1994||Motorola, Inc.||Solder bumping of integrated circuit die|
|US5282312 *||Dec 31, 1991||Feb 1, 1994||Tessera, Inc.||Multi-layer circuit construction methods with customization features|
|US5282565 *||Dec 29, 1992||Feb 1, 1994||Motorola, Inc.||Solder bump interconnection formed using spaced solder deposit and consumable path|
|US5311402 *||Feb 12, 1993||May 10, 1994||Nec Corporation||Semiconductor device package having locating mechanism for properly positioning semiconductor device within package|
|US5328087 *||Mar 29, 1993||Jul 12, 1994||Microelectronics And Computer Technology Corporation||Thermally and electrically conductive adhesive material and method of bonding with same|
|US5346118 *||Sep 28, 1993||Sep 13, 1994||At&T Bell Laboratories||Surface mount solder assembly of leadless integrated circuit packages to substrates|
|US5349495 *||Oct 4, 1990||Sep 20, 1994||Vlsi Technology, Inc.||System for securing and electrically connecting a semiconductor chip to a substrate|
|US5349500 *||Jun 23, 1993||Sep 20, 1994||Sheldahl, Inc.||Direct application of unpackaged integrated circuit to flexible printed circuit|
|US5354205 *||Apr 23, 1993||Oct 11, 1994||Hughes Aircraft Company||Electrical connections with shaped contacts|
|US5417362 *||Mar 4, 1994||May 23, 1995||Fujitsu Limited||Electrical connecting method|
|US5430614 *||Nov 8, 1993||Jul 4, 1995||Particle Interconnect Inc.||Electrical interconnect using particle enhanced joining of metal surfaces|
|US5475241 *||Oct 27, 1993||Dec 12, 1995||Hewlett-Packard Company||Light source and technique for mounting light emitting diodes|
|US5489750 *||Jun 1, 1995||Feb 6, 1996||Matsushita Electric Industrial Co., Ltd.||Method of mounting an electronic part with bumps on a circuit board|
|US5500605 *||Sep 17, 1993||Mar 19, 1996||At&T Corp.||Electrical test apparatus and method|
|WO1985002751A1 *||Dec 12, 1984||Jun 20, 1985||Laserpath Corporation||Partially aligned multi-layered circuitry|
|1||1994 ITAP & Flip Chip Proceedings, "A Tab Tape-Based bare Chip Test and Burn-In Carrier", Nolan et al. (pp. 173-179).|
|2||1994 ITAP & Flip Chip Proceedings, "Mechanical Interconnection System For Solder Bump Dice", Hill et al. (pp. 82-86).|
|3||*||1994 ITAP & Flip Chip Proceedings, A Tab Tape Based bare Chip Test and Burn In Carrier , Nolan et al. (pp. 173 179).|
|4||*||1994 ITAP & Flip Chip Proceedings, Mechanical Interconnection System For Solder Bump Dice , Hill et al. (pp. 82 86).|
|5||Design News, Jan. 17, 1994, "Tiny Filter Quashes EMI".|
|6||*||Design News, Jan. 17, 1994, Tiny Filter Quashes EMI .|
|7||Electronic Buyers' News, Issue 867, Aug. 16, 1993, "Quieting Connectors Down" by David Gabel.|
|8||*||Electronic Buyers News, Issue 867, Aug. 16, 1993, Quieting Connectors Down by David Gabel.|
|9||IEEE Transaction on Components, Packaging and Manufacturing Technology, Part A, vol. 18, No. 2, Jun. 1995, "Constriction Resistance of Microcone-Based Contacts".|
|10||*||IEEE Transaction on Components, Packaging and Manufacturing Technology, Part A, vol. 18, No. 2, Jun. 1995, Constriction Resistance of Microcone Based Contacts .|
|11||*||Multichip Module Technologies and Alternatives: The Basics, Alan D. Knight, (pp. 504 509; 521 523).|
|12||Multichip Module Technologies and Alternatives: The Basics, Alan D. Knight, (pp. 504-509; 521-523).|
|13||*||TRW Data Technologies 1994 Brochure.|
|Citing Patent||Filing date||Publication date||Applicant||Title|
|US6142792 *||Jul 6, 1999||Nov 7, 2000||Hon Hai Precision Ind. Co., Ltd.||Socket connector|
|US6196852 *||Mar 3, 1998||Mar 6, 2001||Siemens Nixdorf Informationssysteme Aktiengesellschaft||Contact arrangement|
|US6300679 *||Jun 1, 1998||Oct 9, 2001||Semiconductor Components Industries, Llc||Flexible substrate for packaging a semiconductor component|
|US6317974 *||Oct 8, 1998||Nov 20, 2001||Tessera, Inc.||Methods for creating wear resistant contact edges|
|US6407666 *||Jul 10, 2001||Jun 18, 2002||Transguard Industries, Inc.||Electrical connector for a cylindrical member|
|US6565364 *||Dec 22, 1999||May 20, 2003||Mirae Corporation||Wafer formed with CSP device and test socket of BGA device|
|US6627980||Apr 12, 2001||Sep 30, 2003||Formfactor, Inc.||Stacked semiconductor device assembly with microelectronic spring contacts|
|US6661247||Apr 9, 2001||Dec 9, 2003||Fujitsu Limited||Semiconductor testing device|
|US6765288 *||Sep 6, 2002||Jul 20, 2004||Tessera, Inc.||Microelectronic adaptors, assemblies and methods|
|US6882169||Oct 16, 2003||Apr 19, 2005||Fujitsu Limited||Semiconductor testing device|
|US6940158||May 30, 2003||Sep 6, 2005||Tessera, Inc.||Assemblies having stacked semiconductor chips and methods of making same|
|US7161370||Feb 1, 2005||Jan 9, 2007||Fujitsu Limited||Semiconductor testing device|
|US7176043||Dec 16, 2004||Feb 13, 2007||Tessera, Inc.||Microelectronic packages and methods therefor|
|US7221058 *||Sep 28, 2004||May 22, 2007||Denso Corporation||Substrate for mounting semiconductor chip, mounting structure of semiconductor chip, and mounting method of semiconductor chip|
|US7265315 *||Oct 14, 2004||Sep 4, 2007||Mitsubishi Denki Kabushiki Kaisha||Method of joining terminals by soldering|
|US7384289 *||Nov 21, 2005||Jun 10, 2008||Fci Americas Technology, Inc.||Surface-mount connector|
|US7462936||Oct 6, 2004||Dec 9, 2008||Tessera, Inc.||Formation of circuitry with modification of feature height|
|US7495179||Jun 24, 2005||Feb 24, 2009||Tessera, Inc.||Components with posts and pads|
|US7554206||Dec 1, 2006||Jun 30, 2009||Tessera, Inc.||Microelectronic packages and methods therefor|
|US7690937||Jun 16, 2008||Apr 6, 2010||Fci Americas Technology, Inc.||Electrical power contacts and connectors comprising same|
|US7709968||Nov 10, 2004||May 4, 2010||Tessera, Inc.||Micro pin grid array with pin motion isolation|
|US7726982||May 4, 2007||Jun 1, 2010||Fci Americas Technology, Inc.||Electrical connectors with air-circulation features|
|US7749009||May 12, 2008||Jul 6, 2010||Fci Americas Technology, Inc.||Surface-mount connector|
|US7762857||Apr 25, 2008||Jul 27, 2010||Fci Americas Technology, Inc.||Power connectors with contact-retention features|
|US7775822||Oct 23, 2008||Aug 17, 2010||Fci Americas Technology, Inc.||Electrical connectors having power contacts with alignment/or restraining features|
|US7810701 *||Mar 25, 2009||Oct 12, 2010||Alps Electric Co., Ltd.||Method for bonding metallic terminals by using elastic contact|
|US7816251||Nov 14, 2008||Oct 19, 2010||Tessera, Inc.||Formation of circuitry with modification of feature height|
|US7862359||Nov 3, 2009||Jan 4, 2011||Fci Americas Technology Llc||Electrical power contacts and connectors comprising same|
|US7905731||May 21, 2007||Mar 15, 2011||Fci Americas Technology, Inc.||Electrical connector with stress-distribution features|
|US7932613 *||Mar 27, 2009||Apr 26, 2011||Globalfoundries Inc.||Interconnect structure for a semiconductor device|
|US7939934||Dec 22, 2005||May 10, 2011||Tessera, Inc.||Microelectronic packages and methods therefor|
|US8046912||Jan 16, 2009||Nov 1, 2011||Tessera, Inc.||Method of making a connection component with posts and pads|
|US8058101||Dec 23, 2005||Nov 15, 2011||Tessera, Inc.||Microelectronic packages and methods therefor|
|US8062046||Dec 17, 2010||Nov 22, 2011||Fci Americas Technology Llc||Electrical power contacts and connectors comprising same|
|US8062051||Jul 8, 2009||Nov 22, 2011||Fci Americas Technology Llc||Electrical communication system having latching and strain relief features|
|US8067267||Dec 23, 2005||Nov 29, 2011||Tessera, Inc.||Microelectronic assemblies having very fine pitch stacking|
|US8093697||Apr 29, 2010||Jan 10, 2012||Tessera, Inc.||Microelectronic packages and methods therefor|
|US8148806||Nov 12, 2008||Apr 3, 2012||Megica Corporation||Multiple chips bonded to packaging structure with low noise and multiple selectable functions|
|US8187017||Nov 2, 2011||May 29, 2012||Fci Americas Technology Llc||Electrical power contacts and connectors comprising same|
|US8207604||Nov 10, 2004||Jun 26, 2012||Tessera, Inc.||Microelectronic package comprising offset conductive posts on compliant layer|
|US8323049||Jan 26, 2010||Dec 4, 2012||Fci Americas Technology Llc||Electrical connector having power contacts|
|US8330272||Jul 8, 2010||Dec 11, 2012||Tessera, Inc.||Microelectronic packages with dual or multiple-etched flip-chip connectors|
|US8404520||Feb 24, 2012||Mar 26, 2013||Invensas Corporation||Package-on-package assembly with wire bond vias|
|US8482111||Jul 19, 2010||Jul 9, 2013||Tessera, Inc.||Stackable molded microelectronic packages|
|US8513109||Mar 21, 2011||Aug 20, 2013||GlobalFoundries, Inc.||Method of manufacturing an interconnect structure for a semiconductor device|
|US8525314||Nov 3, 2005||Sep 3, 2013||Tessera, Inc.||Stacked packaging improvements|
|US8531020||Nov 2, 2010||Sep 10, 2013||Tessera, Inc.||Stacked packaging improvements|
|US8531039||Apr 13, 2010||Sep 10, 2013||Tessera, Inc.||Micro pin grid array with pin motion isolation|
|US8558383||Nov 4, 2008||Oct 15, 2013||Megica Corporation||Post passivation structure for a semiconductor device and packaging process for same|
|US8580607||Jul 27, 2010||Nov 12, 2013||Tessera, Inc.||Microelectronic packages with nanoparticle joining|
|US8604348||Jun 8, 2011||Dec 10, 2013||Tessera, Inc.||Method of making a connection component with posts and pads|
|US8623706||Nov 14, 2011||Jan 7, 2014||Tessera, Inc.||Microelectronic package with terminals on dielectric mass|
|US8637991||Nov 14, 2011||Jan 28, 2014||Tessera, Inc.||Microelectronic package with terminals on dielectric mass|
|US8641913||Mar 13, 2007||Feb 4, 2014||Tessera, Inc.||Fine pitch microcontacts and method for forming thereof|
|US8659164||Oct 10, 2012||Feb 25, 2014||Tessera, Inc.||Microelectronic package with terminals on dielectric mass|
|US8723318||Dec 11, 2012||May 13, 2014||Tessera, Inc.||Microelectronic packages with dual or multiple-etched flip-chip connectors|
|US8728865||Jan 25, 2011||May 20, 2014||Tessera, Inc.||Microelectronic packages and methods therefor|
|US8835228||May 22, 2012||Sep 16, 2014||Invensas Corporation||Substrate-less stackable package with wire-bond interconnect|
|US8836136||Feb 24, 2012||Sep 16, 2014||Invensas Corporation||Package-on-package assembly with wire bond vias|
|US8853558||Dec 10, 2010||Oct 7, 2014||Tessera, Inc.||Interconnect structure|
|US8872318||Aug 24, 2011||Oct 28, 2014||Tessera, Inc.||Through interposer wire bond using low CTE interposer with coarse slot apertures|
|US8878353||Dec 20, 2012||Nov 4, 2014||Invensas Corporation||Structure for microelectronic packaging with bond elements to encapsulation surface|
|US8883563||Mar 31, 2014||Nov 11, 2014||Invensas Corporation||Fabrication of microelectronic assemblies having stack terminals coupled by connectors extending through encapsulation|
|US8884433||Aug 24, 2009||Nov 11, 2014||Qualcomm Incorporated||Circuitry component and method for forming the same|
|US8884437 *||Nov 27, 2012||Nov 11, 2014||Infineon Technologies Ag||Electrical device with protruding contact elements and overhang regions over a cavity|
|US8884448||Dec 10, 2010||Nov 11, 2014||Tessera, Inc.||Flip chip interconnection with double post|
|US8905651||Jan 28, 2013||Dec 9, 2014||Fci||Dismountable optical coupling device|
|US8907466||Jun 25, 2013||Dec 9, 2014||Tessera, Inc.||Stackable molded microelectronic packages|
|US8927337||Aug 27, 2013||Jan 6, 2015||Tessera, Inc.||Stacked packaging improvements|
|US8944831||Mar 15, 2013||Feb 3, 2015||Fci Americas Technology Llc||Electrical connector having ribbed ground plate with engagement members|
|US8957527||Feb 10, 2014||Feb 17, 2015||Tessera, Inc.||Microelectronic package with terminals on dielectric mass|
|US8975738||Nov 12, 2012||Mar 10, 2015||Invensas Corporation||Structure for microelectronic packaging with terminals on dielectric mass|
|US9023691||Jul 15, 2013||May 5, 2015||Invensas Corporation||Microelectronic assemblies with stack terminals coupled by connectors extending through encapsulation|
|US9030001||Oct 21, 2013||May 12, 2015||Tessera, Inc.||Microelectronic packages with nanoparticle joining|
|US9034696||Jul 15, 2013||May 19, 2015||Invensas Corporation||Microelectronic assemblies having reinforcing collars on connectors extending through encapsulation|
|US9041227||Mar 12, 2013||May 26, 2015||Invensas Corporation||Package-on-package assembly with wire bond vias|
|US9048583||Jan 31, 2013||Jun 2, 2015||Fci Americas Technology Llc||Electrical connector having ribbed ground plate|
|US9082753||Jun 6, 2014||Jul 14, 2015||Invensas Corporation||Severing bond wire by kinking and twisting|
|US9087815||Nov 12, 2013||Jul 21, 2015||Invensas Corporation||Off substrate kinking of bond wire|
|US9093435||Mar 11, 2013||Jul 28, 2015||Tessera, Inc.||Package-on-package assembly with wire bonds to encapsulation surface|
|US9095074||Oct 17, 2014||Jul 28, 2015||Invensas Corporation||Structure for microelectronic packaging with bond elements to encapsulation surface|
|US9105483||Feb 24, 2012||Aug 11, 2015||Invensas Corporation||Package-on-package assembly with wire bond vias|
|US9123664||Dec 3, 2014||Sep 1, 2015||Tessera, Inc.||Stackable molded microelectronic packages|
|US9153562||Dec 18, 2014||Oct 6, 2015||Tessera, Inc.||Stacked packaging improvements|
|US9159708||Jul 19, 2010||Oct 13, 2015||Tessera, Inc.||Stackable molded microelectronic packages with area array unit connectors|
|US9214454||Mar 31, 2014||Dec 15, 2015||Invensas Corporation||Batch process fabrication of package-on-package microelectronic assemblies|
|US9218988||Apr 1, 2014||Dec 22, 2015||Tessera, Inc.||Microelectronic packages and methods therefor|
|US9224717||Dec 9, 2014||Dec 29, 2015||Tessera, Inc.||Package-on-package assembly with wire bonds to encapsulation surface|
|US9252122||Aug 14, 2013||Feb 2, 2016||Invensas Corporation||Package-on-package assembly with wire bond vias|
|US9257778||Mar 15, 2013||Feb 9, 2016||Fci Americas Technology||High speed electrical connector|
|US9324681||Sep 26, 2014||Apr 26, 2016||Tessera, Inc.||Pin attachment|
|US9349706||Feb 14, 2013||May 24, 2016||Invensas Corporation||Method for package-on-package assembly with wire bonds to encapsulation surface|
|US9356006||Nov 30, 2015||May 31, 2016||Invensas Corporation||Batch process fabrication of package-on-package microelectronic assemblies|
|US9391008||Jul 31, 2012||Jul 12, 2016||Invensas Corporation||Reconstituted wafer-level package DRAM|
|US9397063||May 8, 2015||Jul 19, 2016||Tessera, Inc.||Microelectronic packages with nanoparticle joining|
|US9412714||May 30, 2014||Aug 9, 2016||Invensas Corporation||Wire bond support structure and microelectronic package including wire bonds therefrom|
|US9461410||Jul 24, 2014||Oct 4, 2016||Fci Americas Technology Llc||Electrical connector having ribbed ground plate|
|US9496236||Sep 30, 2014||Nov 15, 2016||Tessera, Inc.||Interconnect structure|
|US9502390||Mar 12, 2013||Nov 22, 2016||Invensas Corporation||BVA interposer|
|US20040124866 *||Oct 16, 2003||Jul 1, 2004||Fujitsu Limited||Semiconductor testing device|
|US20040238931 *||May 30, 2003||Dec 2, 2004||Tessera, Inc.||Assemblies having stacked semiconductor chips and methods of making same|
|US20050116326 *||Oct 6, 2004||Jun 2, 2005||Tessera, Inc.||Formation of circuitry with modification of feature height|
|US20050116354 *||Sep 28, 2004||Jun 2, 2005||Denso Corporation||Substrate for mounting semiconductor chip, mounting structure of semiconductor chip, and mounting method of semiconductor chip|
|US20050162180 *||Feb 1, 2005||Jul 28, 2005||Fijitsu Limited||Semiconductor testing device|
|US20050167817 *||Jan 19, 2005||Aug 4, 2005||Tessera, Inc.||Microelectronic adaptors, assemblies and methods|
|US20050173805 *||Nov 10, 2004||Aug 11, 2005||Tessera, Inc.||Micro pin grid array with pin motion isolation|
|US20050181544 *||Dec 16, 2004||Aug 18, 2005||Tessera, Inc.||Microelectronic packages and methods therefor|
|US20050181655 *||Nov 10, 2004||Aug 18, 2005||Tessera, Inc.||Micro pin grid array with wiping action|
|US20050274704 *||Oct 14, 2004||Dec 15, 2005||Mitsubishi Denki Kabushiki Kaisha||Method of joining terminals by soldering|
|US20050284658 *||Jun 24, 2005||Dec 29, 2005||Tessera, Inc.||Components with posts and pads|
|US20060249857 *||Dec 22, 2005||Nov 9, 2006||Tessera, Inc.||Microelectronic packages and methods therefor|
|US20070148819 *||Dec 23, 2005||Jun 28, 2007||Tessera, Inc.||Microelectronic assemblies having very fine pitch stacking|
|US20070148822 *||Dec 23, 2005||Jun 28, 2007||Tessera, Inc.||Microelectronic packages and methods therefor|
|US20080003402 *||Mar 13, 2007||Jan 3, 2008||Tessera, Inc.||Fine pitch microcontacts and method for forming thereof|
|US20090057895 *||Nov 4, 2008||Mar 5, 2009||Megica Corporation||Post passivation structure for a semiconductor device and packaging process for same|
|US20090104736 *||Nov 3, 2005||Apr 23, 2009||Tessera, Inc.||Stacked Packaging Improvements|
|US20090133254 *||Jan 16, 2009||May 28, 2009||Tessera, Inc.||Components with posts and pads|
|US20090250154 *||Mar 25, 2009||Oct 8, 2009||Alps Electric Co., Ltd.||Method for bonding metallic terminals by using elastic contact|
|US20090309224 *||Aug 24, 2009||Dec 17, 2009||Megica Corpporation||Circuitry component and method for forming the same|
|US20100044860 *||Jul 30, 2009||Feb 25, 2010||Tessera Interconnect Materials, Inc.||Microelectronic substrate or element having conductive pads and metal posts joined thereto using bond layer|
|US20100193234 *||Jan 19, 2010||Aug 5, 2010||Albert-Ludwigs-Universitat Freiburg||Method for producing an electrical and mechanical connection and an assembly comprising such a connection|
|US20100193970 *||Apr 13, 2010||Aug 5, 2010||Tessera, Inc.||Micro pin grid array with pin motion isolation|
|US20100232129 *||Apr 29, 2010||Sep 16, 2010||Tessera, Inc.||Microelectronic packages and methods therefor|
|US20100244267 *||Mar 27, 2009||Sep 30, 2010||Advanced Micro Devices, Inc.||Interconnect structure for a semiconductor device and related method of manufacture|
|US20110042810 *||Nov 2, 2010||Feb 24, 2011||Tessera, Inc.||Stacked packaging improvements|
|US20110165733 *||Jan 25, 2011||Jul 7, 2011||Tessera, Inc.||Microelectronic packages and methods therefor|
|US20110171822 *||Mar 21, 2011||Jul 14, 2011||Globalfoundries Inc.||Method of manufacturing an interconnect structure for a semiconductor device|
|US20130082392 *||Nov 27, 2012||Apr 4, 2013||Infineon Technologies Ag||Device with contact elements|
|USD608293||Jan 16, 2009||Jan 19, 2010||Fci Americas Technology, Inc.||Vertical electrical connector|
|USD610548||Jan 16, 2009||Feb 23, 2010||Fci Americas Technology, Inc.||Right-angle electrical connector|
|USD618180||Apr 3, 2009||Jun 22, 2010||Fci Americas Technology, Inc.||Asymmetrical electrical connector|
|USD618181||Apr 3, 2009||Jun 22, 2010||Fci Americas Technology, Inc.||Asymmetrical electrical connector|
|USD619099||Jan 30, 2009||Jul 6, 2010||Fci Americas Technology, Inc.||Electrical connector|
|USD640637||Jun 17, 2010||Jun 28, 2011||Fci Americas Technology Llc||Vertical electrical connector|
|USD641709||Nov 30, 2010||Jul 19, 2011||Fci Americas Technology Llc||Vertical electrical connector|
|USD647058||Apr 6, 2011||Oct 18, 2011||Fci Americas Technology Llc||Vertical electrical connector|
|USD651981||Jul 15, 2011||Jan 10, 2012||Fci Americas Technology Llc||Vertical electrical connector|
|USD653621||Mar 5, 2010||Feb 7, 2012||Fci Americas Technology Llc||Asymmetrical electrical connector|
|USD660245||Oct 3, 2011||May 22, 2012||Fci Americas Technology Llc||Vertical electrical connector|
|USD664096||Dec 14, 2011||Jul 24, 2012||Fci Americas Technology Llc||Vertical electrical connector|
|USD696199||Jul 23, 2012||Dec 24, 2013||Fci Americas Technology Llc||Vertical electrical connector|
|USD718253||Apr 13, 2012||Nov 25, 2014||Fci Americas Technology Llc||Electrical cable connector|
|USD720698||Mar 15, 2013||Jan 6, 2015||Fci Americas Technology Llc||Electrical cable connector|
|USD727268||Apr 13, 2012||Apr 21, 2015||Fci Americas Technology Llc||Vertical electrical connector|
|USD727852||Apr 13, 2012||Apr 28, 2015||Fci Americas Technology Llc||Ground shield for a right angle electrical connector|
|USD733662||Aug 1, 2014||Jul 7, 2015||Fci Americas Technology Llc||Connector housing for electrical connector|
|USD745852||Jan 25, 2013||Dec 22, 2015||Fci Americas Technology Llc||Electrical connector|
|USD746236||Oct 9, 2014||Dec 29, 2015||Fci Americas Technology Llc||Electrical connector housing|
|USD748063||Oct 9, 2014||Jan 26, 2016||Fci Americas Technology Llc||Electrical ground shield|
|USD750025||Feb 12, 2015||Feb 23, 2016||Fci Americas Technology Llc||Vertical electrical connector|
|USD750030||Nov 3, 2014||Feb 23, 2016||Fci Americas Technology Llc||Electrical cable connector|
|USD751507||Jul 11, 2012||Mar 15, 2016||Fci Americas Technology Llc||Electrical connector|
|USD766832||Jul 9, 2015||Sep 20, 2016||Fci Americas Technology Llc||Electrical connector|
|USD772168||Jun 1, 2015||Nov 22, 2016||Fci Americas Technology Llc||Connector housing for electrical connector|
|CN1722535B||Jun 17, 2005||Jun 16, 2010||帕洛阿尔托研究中心公司||Stud bump socket|
|WO2002084716A2 *||Apr 11, 2002||Oct 24, 2002||Formfactor, Inc.||Stacked semiconductor device assembly with microelectronic spring contacts|
|WO2002084716A3 *||Apr 11, 2002||Apr 3, 2003||Formfactor Inc||Stacked semiconductor device assembly with microelectronic spring contacts|
|WO2004013910A1 *||Jul 31, 2003||Feb 12, 2004||Tessera, Inc.||Microelectronic adaptors, assemblies and methods|
|WO2005065238A2 *||Dec 21, 2004||Jul 21, 2005||Tessera, Inc.||Micro pin grid array with pin motion isolation|
|WO2005065238A3 *||Dec 21, 2004||Mar 26, 2009||Tessera Inc||Micro pin grid array with pin motion isolation|
|WO2006083405A2 *||Dec 15, 2005||Aug 10, 2006||Fci Americas Technology, Inc.||Surface-mount connector|
|U.S. Classification||439/71, 257/E23.069, 228/180.22, 257/E23.067, 257/E23.078|
|International Classification||H01R12/71, H01R12/52, H01R12/70, H01R12/57, G01R3/00, H05K7/08, H01R12/00, G01R31/28, B23K1/19, G01R1/04, H01R13/24, H05K1/11, G01R1/067, H01R33/76, G01R1/073, H01L23/32, H01L23/498, H05K7/10, H01L23/48, H01L21/48, H05K3/40, H01R4/02, H05K3/32, H01L21/60, H05K3/34|
|Cooperative Classification||H01R12/58, H01L2224/81899, Y02P70/613, H01L2924/12042, H01L2924/351, H01L2224/8114, H01L2224/16237, Y10T29/49144, Y10T29/49179, G01R1/06738, H01R12/7076, H01L2924/01076, G01R1/06711, H01L2924/01005, H01L2924/01078, H01L23/49827, H01L2924/01074, H05K2201/10734, G01R3/00, H05K3/4092, H01L2924/01322, H05K7/1069, H01R13/2485, H01L2924/01087, H01L2924/30107, H05K1/118, H01L2924/01013, H01L2924/01079, H01L2924/01039, H01R4/028, H01L2924/01061, H05K7/1084, H01L2224/13109, H05K3/326, H01L2224/16, H01R13/2407, H05K3/3431, H01L2924/01033, H05K3/3436, H01L23/49816, H05K2201/1059, H01L2924/01075, H01L2924/01046, H05K2201/0397, H01L21/4853, H01L2924/01047, H01L2924/01049, H01R12/714, H01L2924/01029, H01L2924/01015, H01L2924/14, H01R12/57, H01L2924/01006, H01R9/091, G01R1/0466, H01L2924/01004, G01R1/06744, H01L2924/01032, H01L2924/01082, H01L2924/01027, H05K2201/0382, G01R1/07357, H01R12/52, G01R1/06733, H01R13/2464|
|European Classification||H01L24/72, H01R12/57, H01R13/24P, H01R13/24P5, H05K3/32C2, H01R23/72B, H01L21/48C4C, H05K7/10F3B, H01R9/09B, H05K7/10F2B, H01L23/498C4, G01R1/073B8, H05K3/34C4B, H01R23/68A, H01L23/498E, H01R9/09F, G01R1/04S3D3, H01R13/24A|
|Jul 18, 2000||CC||Certificate of correction|
|May 9, 2003||FPAY||Fee payment|
Year of fee payment: 4
|May 28, 2003||REMI||Maintenance fee reminder mailed|
|Apr 12, 2007||FPAY||Fee payment|
Year of fee payment: 8
|Apr 21, 2011||FPAY||Fee payment|
Year of fee payment: 12