|Publication number||US6642738 B2|
|Application number||US 10/044,664|
|Publication date||Nov 4, 2003|
|Filing date||Oct 23, 2001|
|Priority date||Oct 23, 2001|
|Also published as||US20030076084|
|Publication number||044664, 10044664, US 6642738 B2, US 6642738B2, US-B2-6642738, US6642738 B2, US6642738B2|
|Original Assignee||Fairchild Semiconductor Corporation|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (9), Non-Patent Citations (1), Referenced by (40), Classifications (7), Legal Events (6)|
|External Links: USPTO, USPTO Assignment, Espacenet|
FIG. 1 illustrates a switched power supply 100 that may be used to provide power to a computer system. Switched power supply 100 includes a power supply 102, a transformer 104, a diode 106, a capacitor 110, and a field effect transistor (FET) 112. Transformer 104 in turn includes a primary coil 114 and a secondary coil 116. The capacitor 110 operates as an output filter. The switched power supply 100 shown in FIG. 1 may be a portion of a so-called fly back converter that provides power to a computer system.
Switched power supplies of computer systems are monitored to insure that a proper amount of current is provided to the computer systems. Switched power supplies are monitored by measuring the current flowing through the primary coil. The current flow through the primary coil can be monitored by monitoring the current flow IL through FET 112. IL can be measured via the voltage VD at the drain of FET 112. More particularly, IL can be measured in accordance with the following equation:
where RDSON represents the source to drain resistance of FET 112 when FET 112 is in the on state. IL can be compared against predetermined current values to determine whether IL is operating in an acceptable range. For example, IL may be compared to IM where IM represents a maximum limit of the acceptable range of current flowing through FET 112.
The value of RDSON in equation 1 above can be calculated as follows:
where RDSON(25) represents the resistance of FET 112 between the drain and source at 25░ C. when FET 112 operates in the on state, A is a well-known temperature coefficient of RDSON, and T is the temperature measured in centigrade of FET 112 operating in the on state at the time voltage VS is compared with the voltage VM. Using equation (2), equation (1) can be translated into:
Several problems exist with the prior art method of monitoring current via equation (3) above. The first problem is that the temperature T of FET 112 is difficult to measure. A thermocouple for generating a signal indicative of temperature, could be attached to FET 112, and the output of the thermocouple could be input into a circuit that generates IL as a function of the temperature output of the thermocouple, a calculated value for RDSON(25), and VS in accordance with equation (3) above. Attaching a thermocouple to FET 112 will be expensive and would give rise to reliability issues. Alternatively, T could be presumed. In other words, a presumption could be made that FET 112 will operate in the on state at a predetermined temperature TP. Under this presumption, IL could be generated as a function of:
If the presumption for TP is inaccurate, comparing IL to IM may not be a reliable means of determining whether current flowing through FET 112 is operating below a predetermined maximum.
The second problem with equation (3) above relates to differences between the actual and calculated values of RDSON(25). The actual value of RDSON(25) is subject to a statistical distribution. In practice, RDSON(25) varies from FET to FET due to fabrication variances. For example, one FET fabricated on a first wafer may have an RDSON(25) which differs from that of another FET fabricated on a different part of the wafer or on another wafer. The variances may be due to, for example, variances in doping density. The accuracy of equation (3) is dependent upon how close the actual RDSON(25) value is to the calculated value of RDSON(25). If the calculated and actual values of RDSON(25) differ significantly, than comparing IL to IM may not be a reliable means of determining whether current flowing through FET 112 is operating below a predetermined maximum.
The temperature dependency of RDSON could be up to 30 to 40% over the span of ambient temperature to max operating temperature. The statistical distribution of RDSON(25) due to fabrication variances could be as large as plus or minus 30%. Accordingly, the model above may not lead to an accurate monitoring of current provided by switched power supply 100
Disclosed is a method and apparatus for FET current sensing using the voltage drop across the drain to source resistance that eliminates dependencies on temperature of the FET and/or statistical distribution of the initial value of drain to source resistance of the FET. In one embodiment, first and second FETs are provided. Each of the first and second FETs include a gate, a source, and a drain. The gate of the first FET is configured to receive a first voltage, and the source of the first FET is configured to be coupled to ground. The gate of the second FET is configured to receive a second voltage, and the source of the second FET is configured to be coupled to ground. A circuit is also provided and includes first and second input nodes coupled to the drains of the first and second FETs, respectively. The circuit is configured to generate a signal as a function of a voltage measured at the drain of the first FET with respect to ground, wherein the signal is proportional to a current flowing into or out of the drain of the first FET.
In one embodiment, the first and second FETs are formed adjacent to each other on a semiconductor wafer ensuring close matching of their electrical characteristics so that the first and second FETs operate in the on state at substantially the same temperature.
In one embodiment, the signal generated by the circuit is proportional to a ratio of substrate areas over which the first and second FETs are respectively formed.
The present invention may be better understood, and it's numerous objects, features and advantages made apparent to those skilled in the art by referencing the accompanying drawings. The use of the same reference number throughout the figures designates a like or similar element.
FIG. 1 is a schematic drawing of a prior art method of monitoring current in a transformer;
FIG. 2 is a schematic drawing of monitoring current through a FET in accordance with an embodiment of the present invention;
FIGS. 3a and 3 b are plots showing exemplary embodiments of first and second FETs, and;
FIG. 4 is a schematic drawing of monitoring current through a FET in accordance with an embodiment of the present invention.
While the invention is susceptible to various modifications and alternative forms, specific embodiments thereof are shown by way of example in the drawings and will herein be described in detail, it should be understood, however, that the drawings and detailed description thereto are not intended to limit the invention to the particular form disclosed but on the contrary, the intention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the present invention as defined by the appended claims.
FIG. 2 illustrates the switched power supply 200 coupled to a circuit 202. Switched power supply 200 includes a power supply 204, a transformer 206, a diode 210, and a capacitor 212. The transformer 206 consists of a primary coil 214 and a secondary coil 216. The primary coil 214 includes first and second nodes 220 and 222, the latter of which is coupled to circuit 202. Capacitor 212 constitutes an output filter. Switched power supply 200 may be a part of a fly back converter used for providing current to a computer system (not shown).
Circuit 202 includes a first FET 224, a second FET 226, resistor 230 coupled between a reference voltage Vref and second FET 226, an analog divider 232, a compare circuit 234, and a programmable memory 236. The source of FET 224 is connected to one node which, as depicted, can be ground. The source of FET 226 is connected to a node which is the same or different from the node to which the source of FET 224 is connected; as depicted, the source of FET 226 is also connected to ground. Analog divider 232 includes a pair of inputs 240 and 242 coupled to the drains of FETs 224 and 226, respectively. The resistance seen at input 240 is so large, current ID1 into or out of the drain FET 224 is substantially equal to the current into or out of primary coil 214. Likewise, the resistance seen at input 242 is so large, current ID2 flowing into or out of the source of FET 226 is substantially equal to the current flowing into or out of resistor 230. Analog divider 232 includes an output 244 coupled to compare circuit 234. Compare circuit is also coupled to a programmable memory 236. Compare circuit 234 compares the output of analog divider 232 with the contents of programmable memory 236.
FETs 224 and 226 may be fabricated on separate wafer 250 and 252, respectively, and positioned adjacent to each other. In one embodiment, FETs 224 and 226 may be initially fabricated adjacent each other on a common wafer, and subsequently cut into separate devices. In this embodiment, FETs 224 and 226 may be placed in the same package or in separate packages. In operation, FETs 224 and 226 should be positioned as close together as possible to insure that FETs 224 and 226 operate at substantially the same temperature. Alternatively, FETs 224 and 226 may be fabricated adjacent to each other on the same wafer 254 and packaged as an integrated unit. It is noted that with FETs 224 and 226 fabricated on the same wafer 254 and positioned side-by-side thereon, FETs 224 and 226 are subjected to substantially the same fabrication variances. It is also noted that with FETs 224 and 226 initially fabricated adjacent each other on a common wafer and subsequently cut and separately packaged, FETs 224 and 226 are likewise subjected to substantially the same fabrication variances. For example, the doping density of FETs 224 and 226 are equal but potentially different than a target doping density. The remaining description will discuss FETs 224 and 226 fabricated side by side on a common wafer, and subsequently cut and separately packaged.
Analog divider 232 generates a signal representing the result of dividing drain voltage VD1 by drain voltage VD2. The signal generated by divider 232 is provided to compare circuit 234. Compare circuit 234, in turn, compares the divider signal with the contents of memory 236 to determine whether the divider signal is within a range of values. For purposes of explanation, the contents of memory 236 will be limited to one predetermined value, it being understood that compare circuit 234 may compare the signal generated by divider 232 with a plurality of values stored in memory 236. In one embodiment, if the output of divider 232 exceeds the contents of 236, then compare circuit 234 generates a signal that the current provided to the computer system (not shown) by switched power supply 200, exceeds the predetermined value.
The drain voltages VD1 and VD2 can be calculated based upon the following equations
where RDSON1 is the resistance between the drain and source of FET 224 when FET 224 operates in the on state, and RDSON2 is the resistance between the drain and source of FET 226 when FET 226 operates in the on state. Using equation (2) above, equations (5) and (6) can be translated into:
Resistor 230 can be selected with a substantially large resistance Rref when compared to RDSON2 so that ID2 reduces to:
where Rref is the resistance of resistor 230. Accordingly, when analog divider 232 divides VD1 by VD2, the output signal VOUT generated by analog divider 232 represents:
Since FETs 224 and 226 are positioned adjacent each other in a common package, FET 224 and 226 will operate at substantially the same temperature T. Substituting equation (9) into equation (10) and canceling common terms (1+AT) leaves VOUT representing the following:
Accordingly, VOUT is a function of variable ID1 and constants Rref, Vref and n, where n represents the ratio of RDSON1(25) and RDSON2(25).
The value n can be readily calculated by dividing the active areas of FETs 224 and 226. In the illustrated example, an area A1, representing the active area of FET 224 that conducts current, is divided by area A2, representing the active area of FET 226 that conducts current, to obtain n.
FIG. 3a shows a portion of a wafer on which exemplary FETs 224 and 226 are fabricated, and will be used to exemplify a calculation of n. FIG. 3b shows the FETs of FIG. 3a with cut lines 258. Once FETs 224 and 226 are formed, FETs 224 and 226 are cut from the wafer along cut lines 258 and separately packaged. With continuing reference to FIG. 3a, FET 224 includes a source defined by areas 262-266. A drain and a gate of FET 224 underlie its source. A1 in this illustrative embodiment is calculated by adding areas 262-266. FET 226 includes a source defined by area 272. A drain and a gate of FET 226 underlie its source. A2 in this illustrative embodiment is calculated to be the area 272.
Returning to FIG. 2, programmable memory 236 may store a value VM1 that relates to a predetermined maximum current IM1 under which ID1 should operate. More particularly, IM1 can be predetermined and used to generate value VM1 according to the following equation:
It is noted that the outputs of analog divider 232 may be provided to an analog-to-digital (A/D) converter, the output of which is provided to compare circuit 234. In this alternative embodiment, programmable memory 236 may store a digital representation of VM1 as defined by equation (12). It is also noted that analog divider 232 could be replaced by a digital divider. In this embodiment, however, VD1 and VD2 would be converted into digital form prior to input into the digital divider.
In one embodiment, if the output of analog dividers 232 exceeds VM1 stored in programmable memory 236, then compare circuit generates a signal indicating that current ID1 exceeds the predetermined value IM1.
FIG. 4 illustrates a circuit 300 for monitoring current flowing through the primary coil 214 of the switched power supply 200 shown in FIG. 3. Circuit 300 includes FETs 224 and 226, an operational amplifier (opamp) 302, compare circuit 234, and programmable memory 236. FIGS. 2-4 employ like reference numerals to designate like components.
Opamp 302 includes a non-inverting input node 304, an inverting input node 306, and an output node 310. A resistor 308 is coupled between inverting input node 306 and output node 310. The drain of FET 224 is coupled to both non-inverting input node 304 and the second node 222 of the primary coil 114. The non-inverting input node 304 has an input resistance of sufficient magnitude that ID1 flowing into or out of the source FET 224 is substantially equal to the current flowing into or out of primary coil 214.
Output voltage of VOUT of opamp 302 is generated as a function of the voltage VD1 at the drain of FET 224 and the gain (Gain) of opamp 302. More particularly, VOUT is calculated as:
where R represents the resistance of resistor 308. R can be selected to be substantially large when compared to RDSON2 such that equation (13) reduces to:
By substituting equation (5) for VD1 in equation (14), equation (14) reduces to:
V OUT =I D1 ĚRDSON 1 ĚR/RDSON 2 =I D1 ĚnĚR (15)
As can be seen form equation (15), the output of opamp 302 is a function of the variable ID1 and constants R and n, where n is the ratio of RDSON1 and RDSON2. The value n can be calculated as shown above.
The contents of programmable memory 236 as shown in FIG. 4 can relate to current IM1 under which ID1 should operate. More particularly, programmable memory 236 shown in FIG. 4 may store value VL1 where VL1 equals:
Should Vout exceed VL1, then compare circuit 234 will generate a corresponding signal.
It is noted that circuit 202 shown in FIG. 2 or circuit 300 shown in FIG. 4 can be employed to monitor current devices other than switched power supplies. The present should not be limited for use in monitoring current provided by switched power supplies shown above.
In the preferred embodiments, FETs 224 and 226 are formed adjacent to each other on a wafer. As such, any operational deviations due to variances in manufacturing will be common between FETs 224 and 226. By virtue of the operation of the analog divider 232 or opamp 302, the common variances will cancel each other out. Further, equation (16) is independent of temperature. Accordingly, the problems in the prior art mentioned above, are alleviated.
It is noted within FIG. 4 that FET 226 may be driven synchronously with FET 224, biased on continuously, or switched on at any time while FET 224 is on. In one mode, VG1 and VG2 are identical and provided by the same voltage source. Opamp 302 should be gated at a suitable time while FET 224 is on with suitable delay to avoid high ringing voltage at the input thereof. Resistor 308 ideally will be a precision resistor with low thermal coefficient.
Lastly, it is noted that with FIG. 4 compare circuit may be configured to compare digital values. In the alternative embodiment, an A/D converter should be placed between OpAmp 302 and 234. It is also noted that compare circuit 234 and memory 236 can be eliminated so the VOUT may be used for other applications including precision current sensing in multiphase applications or simple current monitoring.
Although the present invention have been described in connection with several embodiments, the invention is not intended to be limited to the specific forms set forth herein, but on the contrary, it is intended to cover such alternatives, modifications, and equivalents as can be reasonably included with in the spirit and scope of the invention as defined by the appended claims.
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|U.S. Classification||324/764.01, 324/713, 324/522, 324/762.09|
|Oct 23, 2001||AS||Assignment|
Owner name: FAIRCHILD SEMICONDUCTOR CORPORATION, MAINE
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:ELBANHAWY, ALAA;REEL/FRAME:012504/0931
Effective date: 20011019
|May 4, 2007||FPAY||Fee payment|
Year of fee payment: 4
|May 4, 2011||FPAY||Fee payment|
Year of fee payment: 8
|Jun 12, 2015||REMI||Maintenance fee reminder mailed|
|Nov 4, 2015||LAPS||Lapse for failure to pay maintenance fees|
|Dec 22, 2015||FP||Expired due to failure to pay maintenance fee|
Effective date: 20151104