|Publication number||US6842097 B2|
|Application number||US 10/844,273|
|Publication date||Jan 11, 2005|
|Filing date||May 11, 2004|
|Priority date||Mar 12, 2001|
|Also published as||US6768403, US6847277, US20020171518, US20040207497, US20040207499|
|Publication number||10844273, 844273, US 6842097 B2, US 6842097B2, US-B2-6842097, US6842097 B2, US6842097B2|
|Inventors||Tsung-Yuan Hsu, Robert Loo, Adele Schmitz|
|Original Assignee||Hrl Laboratories, Llc|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (19), Referenced by (21), Classifications (16), Legal Events (4)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application claims the benefit of priority to the provisional Application Ser. No. 60/275,171, titled “Priority-Based Dynamic Slot Reservation for Airborne Supported Wireless Ad-hoc Networks” filed with the United States Patent and Trademark Office on Mar. 12, 2001 and is a divisional of the utility application Ser. No. 10/097,632, titled “Torsion Spring For Electro-Mechanical Switches And A Cantilever-Type RF Micro-Electromechanical Switch Incorporating The Torsion Spring” filed with the United States Patent and Trademark Office on Mar. 12, 2002 now U.S. Pat. No. 6768403.
(a) Technical Field of the Invention
The present invention generally relates to electro-mechanical switches, more particularly to micro-electromechanical switches (MEMS), and most particularly to high power RF MEMS.
(b) Description of Related Art
In communications applications, switches are often designed with semiconductor elements such as transistors or pin diodes. At microwave frequencies, however, these devices suffer from several shortcomings. Pin diodes and transistors typically have an insertion loss greater than 1 dB, which is the loss across the switch when the switch is closed. Transistors operating at microwave frequencies tend to have an isolation value less than 20 dB. This allows a signal to ‘bleed’ across the switch even when the switch is open. Pin diodes and transistors have a limited frequency response and typically only respond to frequencies below 20 GHz. In addition, the insertion losses and high isolation value for these switches vary depending on the frequency of the signal passing through the switches. These characteristics make semiconductor transistors and pin diodes a poor choice for switches in microwave applications.
U.S. Pat. No. 5,121,089, to Larson, disclosed a new class of microwave switch—the micro-electro-mechanical (MEM) switch. The MEM switch has a very low insertion loss (less than 0.2 dB at 45 GHz) and a high isolation when open (greater than 30 dB). In addition, the switch has a large frequency response and a large bandwidth compared to semiconductor transistors and pin diodes. These characteristics give the MEM switch the potential to replace traditional narrow-bandwidth PIN diodes and transistor switches in microwave circuits.
The Larson MEM switch utilizes an armature design. One end of a metal armature is affixed to an output line, and the other end of the armature rests above an input line. The armature is electrically isolated from the input line when the switch is in an open position. When a voltage is applied to an electrode below the armature, the armature is pulled downward and contacts the input line. This creates a conducting path between the input line and the output line through the metal armature.
Micro-electromechanical switches of the general type described above are, however, prone to premature failure. The cause of the premature failure is linked to the damage resulting from the impact of the armature contact with the substrate contact. This damage is exacerbated by the fact that conventional MEM switches have armature contacts that impinge on the substrate contact surface at an angle. The angled impact results in all the impact energy being transferred to a relatively small area, thereby ultimately causing premature failure due to both increased impact per unit area and heat caused by resistive heating due to increased current density through the small area of actual contact.
The present invention solves this and other problems by providing a torsion spring which is configured to result in a substantially conformal contact between the contact plates. The resultant MEMS has increased durability, and because the substantially conformal contact results in a better electrical contact, there is less heating and the MEM switch can handle more power. Thus, a more durable and versatile MEM switch results.
One embodiment of the present invention provides an armature mounted torsion spring, wherein the torsion spring is configured to provide sufficient flexibility such that when an armature electrode is electromechanically brought into contact with a substrate electrode the electrodes provide substantial conformity with one another and thus maximize contact area, reduce wear and reduce Ohmic resistance.
This invention provides a new RF MEM switch in which the RF line is loaded with a torsion spring to achieve a conformal metal to metal contact. A conformal metal to metal contact assures a maximum contact area and lowest contact resistance, and, therefore, provides for critical long term reliability and good heat dissipation thus allowing for improved high-power handling.
In another embodiment, the present invention provides a torsion spring for an electro-mechanical switch. The torsion spring comprises a set of tines with the set of tines having at least one tine. The set of tines extends from a free end of the armature of the switch, and includes a terminus portion rotatably suspended between the tines. The terminus portion includes a conducting transmission line, at least a portion of which is exposed for electrical contact. The conducting transmission line have a length selected such that the exposed portion of the transmission line forms a circuit between the input and output of the micro-electro-mechanical switch when the micro-electro-mechanical switch is urged into a closed position. When the switch closes, the terminus portion rotates via the tines to form a conformal connection between the exposed portion of the conducting transmission line and the input and output of the switch, thus optimizing the electrical flow therebetween.
In another embodiment of the torsion spring, the portion of the conducting transmission line exposed for electrical contact is in the form of a plurality of dimples. Each dimple corresponds to the contact to be made with the input and the output, respectively. The dimples combined with the rotatable nature of the terminus provide a conformal contact between the conducting transmission line and the input and the output to form a circuit therebetween.
The torsion spring is preferably constructed of a material selected from a group consisting of silicon nitride, Type III-V semiconductor materials, and silicon dioxide. The conducting transmission line is preferably formed from a titanium adhesive layer and a gold conductor layer.
The set of tines of the torsion spring preferably includes a plurality of tines, and more preferably includes two tines.
In another embodiment, the present invention provides a micro-electro-mechanical switch comprising a substrate with an input line, an output line, and a substrate electrode formed on the top of the substrate, all separated from each other. The switch further includes an armature having a first beam structural layer with a first end mechanically connected with the substrate and a second end including a set of tines with at least one tine. A terminus portion is suspended between the tines, and includes a conducting transmission line positioned over the input and output lines. At least a portion of the conducting transmission line is exposed for conformal contact with the input and output lines. The armature further includes an armature electrode positioned directly above the substrate electrode and suspended on the armature. An insulating layer is positioned between the armature electrode and the substrate electrode to prevent short-circuiting therebetween. Thus, when the switch is actuated into a “closed” position, the terminus is free to rotate to ensure a conformal contact between the exposed portion of the conducting transmission line and the input and output lines in order to form a circuit therebetween to permit the flow of electricity.
The armature of the switch is preferably modified with the same enhancements discussed relative to the torsion spring embodiment above.
In another embodiment of the micro-electro-mechanical switch, the insulating layer is formed as a second beam structural layer under the armature electrode. The first and the second beam structural layers are formed of materials selected such that their mechanical and thermal properties provide a desired amount of bowing when the switch is activated.
Another embodiment of the present invention provides an armature for a micro-electro-mechanical switch having a torsion spring. The armature comprises a first beam structural layer having a first end for mechanically connecting with a substrate of a micro-electro-mechanical switch and a second end including a set of tines including at least one tine. A terminus portion is suspended between the tines, and includes a conducting transmission line configured to be positioned over the input and output lines of a micro-electro-mechanical switch. At least a portion of the conducting transmission line is exposed for conformal contact with the input and output lines. An armature electrode is directly above a substrate electrode of the micro-electro-mechanical switch and suspended on the armature, and an insulating layer is positioned between the armature electrode and the substrate electrode to prevent short-circuiting therebetween when the armature is assembled in a micro-electro-mechanical switch and actuated into a closed position. When the armature is assembled in a micro-electro-mechanical switch and is actuated into a “closed” position, the terminus is free to rotate to ensure a conformal contact between the exposed portion of the conducting transmission line and the input and output lines in order to form a circuit therebetween to permit the flow of electricity.
The armature is preferably modified with the same enhancements discussed relative to the torsion spring embodiment above.
In another embodiment of the armature, the insulating layer is formed as a second beam structural layer under the armature electrode, with the first and the second beam structural layers formed of materials selected such that their mechanical and thermal properties provide a desired amount of bowing when the switch is activated.
The advantages set forth in the SUMMARY above, and other features and advantages will become more apparent from a detailed consideration of the invention when taken in conjunction with the drawings in which:
The present invention generally relates to electro and micro-electromechanical switches (MEMS), and more particularly to a torsion spring for providing improved input/output contact in high power RF MEMS. The following description, taken in conjunction with the referenced drawings, is presented to enable one of ordinary skill in the art to make and use the invention and to incorporate it in the context of particular applications. Various modifications, as well as a variety of uses in different applications, will be readily apparent to those skilled in the art, and the general principles defined herein, may be applied to a wide range of embodiments. Thus, the present invention is not intended to be limited to the embodiments presented, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein. Furthermore it should be noted that unless explicitly stated otherwise, the figures included herein are illustrated diagrammatically and without any specific scale, as they are provided as qualitative illustrations of the concept of the present invention.
This invention teaches a torsion spring to assure a conformal contact between the armature contact and the electrodes in electro-mechanical switches, and has particular use with MEMS. The conforming nature of the contact provided by the present invention is intended to maximize the available contact area so that the contact resistance is minimized, and heat dissipation is improved. The existing simple cantilever beam type of RF MEMS switch such as the RF switch disclosed in U.S. Pat. No. 6,046,659 which is herein incorporated for all that it discloses, is an example of a switch having the disadvantages of making edge contact as the switch is snapped down. The contact area in this older switch is usually around 10 microns2 of the total dimple (contact plate) size of greater than 100 microns2. The impact of the contact of the electrode with the edge of the dimple can result in excessive wear and premature failure. This excessive wear is the primary limiting factor to the number of cycles that the switch will accommodate prior to failure. The present invention simultaneously increases the switch cycle-lifespan and substantially increases the switch's power handling capacity, as compared to conventional RF switches.
The switch can be fabricated using existing fabrication processes including those disclosed in U.S. Pat. No. 6,046,659. Reliability studies on existing RF MEM switches indicate that a dominant factor limiting the switch cycling times is the nature of the edge contact of dimples upon actuation. Edge contact allowed less than 10% of the dimple surface to touch the electrode. This limitation on contact area results in a two-fold problem: First, a smaller contact area necessarily results in greater impact related damage on the switching system, resulting in part from a concentrated point of impact, and second, the smaller contact area results in an inferior connection and an associated increase in Joule (resistive) heating, which can also contribute to premature failure and inferior performance. The larger contact area provided by the present invention results in superior contact, better heat dissipation and power handling and simultaneously reduces the impact related damage at the point of contact.
The improved reliability and power handling capability of the present design is achieved with the addition of a torsion spring, configured to provide the dimple contact with a freedom of rotation. Experimental results have shown that this structure reduces the likelihood of premature impact-related failure and also assures conformal dimple contact, thus minimizing contact resistance. Additionally, this type of switch has an improved power-handling capability, as heat dissipation is improved by the much larger contact area.
It is worth noting that metallic switches that do not have contact dimples have contacts that depend on armature flexibility and bias strength, factors which vary with the temperature, age, and the amount of use of the MEM switch. In addition to improving repeatability, the quality of the contact itself is improved by the addition of the dimple because the dimple has a controllable size and surface texture, characteristics that are dependent on the fabrication rather than on the environment. Thus, MEM switches without the dimple 24 are more likely to have time-varying contact characteristics, a feature that may make them difficult or impossible to use in some circuit implementations.
Next, as shown in
Another advantage of using SiO2 as the sacrificial layer 46 is that SiO2 can withstand high temperatures. Other types of sacrificial layers, such as organic polyimides, harden considerably if exposed to high temperatures. This makes the polyimide sacrificial layer difficult to later remove. The sacrificial layer 46 is exposed to high temperatures when the silicon nitride for the beam structural layer is deposited, as a high temperature deposition is desired when depositing the silicon nitride to give the silicon nitride a lower BOE etch rate. A low BOE etch rate minimizes the amount of the first beam structural layer 26 that is lost when the SiO2 is etched away.
As depicted by the embodiment of
The beam structural layer may also be formed both above and below the armature bias electrode 30, as previously discussed relative to
Next, a second metal layer forming the suspended armature bias electrode 30, the conducting line 28, and the dimples 24 is deposited onto the first beam structural layer 26. In the preferred embodiment, the metal layer is comprised of a sputter deposition of a thin film (200 angstroms) of Ti followed by a 1000 angstrom deposition of Au. The metal layer must be conformal across the wafer and acts as a plating plane for the Au. The plating is done by using metal lithography to open up the areas of the switch that are to be plated. The Au is electroplated by electrically contacting the membrane metal on the edge of the wafer and placing the metal patterned wafer in the plating solution. The plating occurs only where the membrane metal is exposed to the plating solution to complete the electrical circuit and not where the electrically insulating resist is left on the wafer. After 2 microns of Au is plated, the rest is stripped off of the wafer and the whole surface is ion milled to remove the membrane metal. Some Au will also be removed from the top of the plated Au during the ion milling, but the loss is minimal because the membrane is only 1200 angstroms thick.
The result of this process is that the armature bias electrode 30, the conducting transmission line 28, and the dimple 24 are created in the second metal layer, primarily Au in the preferred embodiment. In addition, the Au fills the via hole 52 and connects the armature bias electrode 30 to the armature bias pad 34. Au is a preferred choice for second metal layer because of its low resistivity. When choosing the metal for the second layer and the material for the beam structural layers 26 and 28, it is important to select the materials such that the stress of the beam structural layers 26 and 28 match the stress of the armature bias electrode 30 and the conducting transmission line 28 so that the armature 16 will not bow upwards or downwards when actuating. This is done by carefully determining the deposition parameters for the structural layer. Silicon nitride was chosen for this structural layer not only for its insulating characteristics but in large part because of the controllability of these deposition parameters and the resultant stress levels of the film. Also note that in order to electrically isolate the armature bias electrode 30 from the conducting transmission line 28, a portion of the second metal layer therebetween must be removed. In cases where both a first beam structural layer 26 and a second beam structural layer 27 are used, this process must be performed before depositing the second beam structural layer 27 on the armature bias electrode 30.
After deposition of the second beam structural layer 27, it is lithographically defined and etched to complete the switch fabrication. Finally, the sacrificial layer 46 is removed to release the armature 16. Furthermore, the portion of the beam structural layers 26 and 27 forming the tines 40 and the terminus portion 42 is etched in order to provide a desired thickness.
If the sacrificial layer is comprised of SiO2, then it will typically be wet etched away in the final fabrication sequence by using a hydrofluoric acid (HF) solution. It is noteworthy that small fluid-flow holes may be formed through the layers, particularly where the armature bias electrode 30 portion of the armature 16 has a large area and in the terminus portion 42 of the armature 16 in order to permit smooth and even flow of the removal liquids to the sacrificial layer 46 to optimize the removal process. The etch and rinses are performed with post-processing in a critical point dryer to ensure that the armature 16 does not come into contact with the substrate 14 when the sacrificial layer 46 is removed. If contact occurs during this process, device sticking and switch failure are likely. Contact is prevented by transferring the switch from a liquid phase (e.g. HF) environment to a gaseous phase (e.g. air) environment not directly, but by introducing a supercritical phase in between the liquid and gaseous phases. The sample is etched in HF and rinsed with DI water by dilution, so that the switch is not removed from a liquid during the process. DI water is similarly replaced with methanol. The sample is transferred to the critical point dryer and the chamber is sealed. High pressure liquid CO2 replaces the methanol in the chamber, so that there is only CO2 surrounding the sample. The chamber is heated so that the CO2 changes into the supercritical phase. Pressure is then released so that the CO2 changes into the gaseous phase. Once the sample is surrounded only by gas, it may be removed from the chamber into room air. A side elevational view of the MEM switch after the sacrificial layer 46 has been removed is shown in FIG. 4F.
In summary, in traditional armature MEMs, when the armature 16 flexes toward the input and output lines 18 and 20, drawn by a substrate bias electrode 22, the dimples 24 are unable to conformably contact the input and output lines 18 and 20 due to the angular deflection caused by bending of the armature 16. As a result, the dimples 24 have relatively poor contact with the input and output lines 18 and 20, with only about 10% of the surface area of the dimples 24 actually making contact. This poor contact results in mechanical wear as well as heading due to the flow of electricity through a small area. The present invention overcomes this problem by providing an armature-mounted torsion spring comprising a plurality of tines 40, attached with a terminus portion 42. The tines 40 permit rotation of the terminus portion 42 in order to maximize the conformal contact of dimples 24 on the terminus portion 42 with the an input line 18 and an output line 20 when the device is actuated in order to allow electricity to pass therethrough.
As can be surmised by one skilled in the art, there are many more configurations of the present invention that may be used beyond those presented herein. For example, other metals can be used to form the conducting transmission line layer, the bias electrodes and pads, and the input and output lines. The beam structural layers 26 and 27 and the sacrificial layer 46 may be fabricated with materials other than silicon nitride and silicon dioxide as long as suitable counterpart materials are selected. Other impedance-matching networks or circuitry can also be substituted for the radial stub embodiment shown. It is therefore intended that the foregoing detailed description be regarded as illustrative rather than limiting and that it be understood that it is the following claims, including all equivalents, are intended to define the scope of this invention.
|Cited Patent||Filing date||Publication date||Applicant||Title|
|US4959515 *||Feb 6, 1987||Sep 25, 1990||The Foxboro Company||Micromechanical electric shunt and encoding devices made therefrom|
|US5121089||Nov 1, 1990||Jun 9, 1992||Hughes Aircraft Company||Micro-machined switch and method of fabrication|
|US5578976 *||Jun 22, 1995||Nov 26, 1996||Rockwell International Corporation||Micro electromechanical RF switch|
|US5629565 *||Oct 3, 1995||May 13, 1997||Siemens Aktiengesellschaft||Micromechanical electrostatic relay with geometric discontinuity|
|US5638946 *||Jan 11, 1996||Jun 17, 1997||Northeastern University||Micromechanical switch with insulated switch contact|
|US6040748||Apr 10, 1998||Mar 21, 2000||Asulab S.A.||Magnetic microswitch|
|US6046659||May 15, 1998||Apr 4, 2000||Hughes Electronics Corporation||Design and fabrication of broadband surface-micromachined micro-electro-mechanical switches for microwave and millimeter-wave applications|
|US6057520 *||Jun 30, 1999||May 2, 2000||Mcnc||Arc resistant high voltage micromachined electrostatic switch|
|US6115231||Nov 20, 1998||Sep 5, 2000||Tdk Corporation||Electrostatic relay|
|US6153839 *||Oct 22, 1998||Nov 28, 2000||Northeastern University||Micromechanical switching devices|
|US6229683 *||Jun 30, 1999||May 8, 2001||Mcnc||High voltage micromachined electrostatic switch|
|US6331257 *||Nov 30, 1999||Dec 18, 2001||Hughes Electronics Corporation||Fabrication of broadband surface-micromachined micro-electro-mechanical switches for microwave and millimeter-wave applications|
|US6440767 *||Jan 23, 2001||Aug 27, 2002||Hrl Laboratories, Llc||Monolithic single pole double throw RF MEMS switch|
|US6624720 *||Aug 15, 2002||Sep 23, 2003||Raytheon Company||Micro electro-mechanical system (MEMS) transfer switch for wideband device|
|US6646215 *||Jun 29, 2001||Nov 11, 2003||Teravicin Technologies, Inc.||Device adapted to pull a cantilever away from a contact structure|
|US6768403 *||Mar 12, 2002||Jul 27, 2004||Hrl Laboratories, Llc||Torsion spring for electro-mechanical switches and a cantilever-type RF micro-electromechanical switch incorporating the torsion spring|
|DE19807214A1||Feb 20, 1998||Sep 16, 1999||Siemens Ag||Mikromechanisches elektrostatisches Relais|
|DE19820821A||Title not available|
|WO2001009911A1||Jul 28, 2000||Feb 8, 2001||Tyco Electronics Logistics Ag||Microelectromechanic relay and method for the production thereof|
|Citing Patent||Filing date||Publication date||Applicant||Title|
|US6962832||Feb 20, 2004||Nov 8, 2005||Wireless Mems, Inc.||Fabrication method for making a planar cantilever, low surface leakage, reproducible and reliable metal dimple contact micro-relay MEMS switch|
|US7101724||Nov 20, 2004||Sep 5, 2006||Wireless Mems, Inc.||Method of fabricating semiconductor devices employing at least one modulation doped quantum well structure and one or more etch stop layers for accurate contact formation|
|US7230513||Nov 20, 2004||Jun 12, 2007||Wireless Mems, Inc.||Planarized structure for a reliable metal-to-metal contact micro-relay MEMS switch|
|US7352266||Nov 20, 2004||Apr 1, 2008||Wireless Mems, Inc.||Head electrode region for a reliable metal-to-metal contact micro-relay MEMS switch|
|US7545234 *||Jan 13, 2006||Jun 9, 2009||Wireless Mems, Inc.||Microelectromechanical device having a common ground plane layer and a set of contact teeth and method for making aspects thereof|
|US7782170 *||Apr 4, 2005||Aug 24, 2010||Commissariat A L'energie Atomique||Low consumption and low actuation voltage microswitch|
|US7924122 *||Apr 12, 2011||Intel Corporation||Collapsible contact switch|
|US8779886 *||Nov 30, 2009||Jul 15, 2014||General Electric Company||Switch structures|
|US20040012469 *||Apr 9, 2003||Jan 22, 2004||Hei, Inc.||Low voltage MEM switch|
|US20050062565 *||Sep 18, 2003||Mar 24, 2005||Chia-Shing Chou||Method of using a metal platform for making a highly reliable and reproducible metal contact micro-relay MEMS switch|
|US20050088214 *||Nov 12, 2004||Apr 28, 2005||Morrison Robert D.||Clock adjustment|
|US20050170637 *||Feb 20, 2004||Aug 4, 2005||Chia-Shing Chou||Fabrication method for making a planar cantilever, low surface leakage, reproducible and reliable metal dimple contact micro-relay mems switch|
|US20050183938 *||Nov 20, 2004||Aug 25, 2005||Chia-Shing Chou||Head electrode region for a reliable metal-to-metal contact micro-relay MEMS switch|
|US20050184836 *||Nov 20, 2004||Aug 25, 2005||Chia-Shing Chou||Microelectromechanical device having a common ground plane layer and a set of contact teeth and method for making the same|
|US20060109069 *||Nov 20, 2004||May 25, 2006||Chia-Shing Chou||Planarized structure for a reliable metal-to-metal contact micro-relay mems switch|
|US20060125031 *||Jan 13, 2006||Jun 15, 2006||Chia-Shing Chou||Microelectromechanical device having a common ground plane layer and a set of contact teeth and method for making aspects thereof|
|US20070215447 *||Apr 4, 2005||Sep 20, 2007||Commissariat A L'energie Atomique||Low Consumption and Low Actuation Voltage Microswitch|
|US20090215213 *||Apr 27, 2009||Aug 27, 2009||Chia-Shing Chou||Microelectromechanical device having a common ground plane and method for making aspects thereof|
|US20090266688 *||Oct 29, 2009||Tsung-Kuan Allen Chou||Collapsible contact switch|
|US20100013033 *||Jan 21, 2010||Chia-Shing Chou||Enablement of IC devices during assembly|
|US20110128112 *||Nov 30, 2009||Jun 2, 2011||General Electric Company||Switch structures|
|U.S. Classification||335/78, 200/181, 335/80|
|International Classification||H01H59/00, H01H1/06, H04L12/56, H01P1/12, H01H1/20|
|Cooperative Classification||H01G5/18, H01G5/40, H01H1/06, H01H1/20, H01P1/127, H01H59/0009|
|European Classification||H01H59/00B, H01P1/12D|
|Sep 27, 2004||AS||Assignment|
Owner name: HRL LABORATORIES, LLC, CALIFORNIA
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:HSU, TSUNG-YUAN;SCHMITZ, ADELE;LOO, ROBERT;REEL/FRAME:015827/0232;SIGNING DATES FROM 20040729 TO 20040920
|Jun 19, 2008||FPAY||Fee payment|
Year of fee payment: 4
|Jun 28, 2012||FPAY||Fee payment|
Year of fee payment: 8
|Aug 19, 2016||REMI||Maintenance fee reminder mailed|