|Publication number||US6975030 B1|
|Application number||US 10/660,367|
|Publication date||Dec 13, 2005|
|Filing date||Sep 11, 2003|
|Priority date||Jan 10, 2000|
|Publication number||10660367, 660367, US 6975030 B1, US 6975030B1, US-B1-6975030, US6975030 B1, US6975030B1|
|Inventors||Salman Akram, Alan G. Wood|
|Original Assignee||Micron Technology, Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (70), Non-Patent Citations (2), Referenced by (6), Classifications (47), Legal Events (4)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application is a continuation of Ser. No. 10/351,742, filed Jan. 27, 2003 now U.S. Pat. No. 6,670,634, which is a continuation of Ser. No. 09/480,027, filed Jan. 10, 2000, U.S. Pat. No. 6,563,215 B1.
This application is related to Ser. No. 10/187,915, filed Jul. 1, 2002.
This invention relates generally to semiconductor manufacture and specifically to an improved interconnect for electrically engaging semiconductor components such as dice, packages, wafers, panels, boards, and electronic assemblies containing dice or packages.
Different types of semiconductor components include terminal contacts which provide electrical connection points for applying electronic signals to the integrated circuits contained on the components. For example, bare dice and semiconductor wafers typically include bond pads which function as terminal contacts. Chip scale packages typically include solder balls, which function as terminal contacts. Electronic assemblies, such as circuit boards and field emission displays, can include pads, solder balls or pins which function as terminal contacts.
Typically, an interconnect must be provided for making electrical connections to the terminal contacts on the contacts. For example, semiconductor test systems include an interconnect that makes temporary electrical connections with the terminal contacts on the components. Depending on the system, the interconnect can be die sized, or wafer sized. U.S. Pat. No. 5,686,317 entitled “Method For Forming An Interconnect Having A Penetration Limited Contact Structure For Establishing A Temporary Electrical Connection With A Semiconductor Die”, describes a die level interconnect configured for use with a carrier. U.S. Pat. No. 5,869,974 entitled “Micromachined Probe Card Having Compliant Contact Members For Testing Semiconductor Wafers”, describes a wafer level interconnect configured for use with a wafer prober.
Interconnects are also used to provide permanent electrical connections to a semiconductor component for various electronic assemblies. For example, U.S. Pat. No. 5,578,526 entitled “Method For Forming A Multi Chip Module”, and U.S. Pat. No. 5,789,278 entitled “Method For Fabricating Chip Modules”, describe multi chip modules having interconnects which form permanent electrical connections to the terminal contacts on components.
One material that can be used to fabricate interconnects is silicon. Silicon can be used as a substrate material, and also to form contacts for the interconnect. With silicon, a coefficient of thermal expansion (CTE) of the interconnect matches the CTE of the component. In test systems, the matching CTEs minimize thermal stresses during test procedures, such as burn-in, which are conducted at elevated temperatures. In electronic assemblies, the matching CTEs minimize thermal stresses due to heat generated by the semiconductor component, or by the operating environment.
One aspect of silicon is that it is a semiconductor material, and does not have sufficient electrical conductivity to permit signal transmission. Accordingly, the silicon must be coated with electrically conductive materials to form contacts, conductive traces and bond pads for the interconnect. The conductive materials can include metals, such as copper and aluminum, or metal silicides, such as TiSi2.
Some of the conductive materials used in interconnects do not possess sufficient strength to resist deformation during fabrication or use of electronic assemblies. For example, in test systems, some conductive materials, such as metals, are prone to wear and oxidation with continued usage. Also, some conductive materials, such as metal silicides, do not possess a thermal conductivity which permits efficient heat dissipation from the component.
In accordance with the present invention, an improved interconnect for semiconductor components, and a method for fabricating the interconnect are provided. The interconnect comprises a substrate, and a pattern of interconnect contacts on the substrate configured to electrically engage component contacts on the components.
In an illustrative embodiment, the substrate comprises silicon, and the interconnect contacts comprise silicon projections, or alternately indentations in the substrate, at least partially covered with silicon carbide (SiC) layers. The interconnect also includes a pattern of conductors (conductive traces) in electrical communication with the silicon carbide layers, and a pattern of terminal contacts, such as bonding pads, in electrical communication with the silicon carbide layers. The conductors provide electrical paths for signal transmission to and from the interconnect contacts. The terminal contacts provide an electrical connections points for external circuitry, such as test circuitry to the interconnect.
As silicon carbide has a mechanical hardness similar to diamond, the silicon carbide layers provide a wear-resistant surface for the interconnect contacts. The wear resistant surface makes the interconnect particularly suitable to testing applications wherein the interconnect contacts are used to perform multiple test procedures on many different components. The silicon carbide layer also has a relatively high strength and a high maximum working temperature, such that the interconnect contacts can resist deformation at temperature.
In addition, as silicon carbide has a high thermal conductivity, the silicon carbide layers provide efficient heat transfer from the component contacts to the interconnect contacts, and better temperature control at the interface of the interconnect contacts with the component contacts. Further, the silicon carbide layers can be configured to substantially cover the area on the substrate between the interconnect contacts to provide a large surface area for dissipating heat generated by the component.
Although silicon carbide has a relatively low electrical conductivity, a sufficient electrical conductivity can be provided by doping a silicon carbide layer with selected dopants having either a P-type, or a N-type conductivity. Doping can be accomplished during CVD deposition of silicon carbide, or following deposition by implanting the dopants (e.g., ion implantation) and then annealing to activate the dopant. Electrical conductivity can also be provided by oxidation of the silicon carbide conductive layers using localized thermal heating. One method for performing the localized thermal heating is with a focused laser beam. Using a doping or oxidation process, the interconnect contacts can have an electrical conductivity similar to contacts covered with a metal.
Preferably, the conductors on the interconnect are fabricated from a highly conductive metal, such as aluminum or copper, to provide low resistance signal paths for the interconnect contacts. In addition, conductive vias and backside contacts can be formed on the substrate in electrical contact with the conductors, or directly with the silicon carbide conductive layers.
Alternately, rather than forming the conductors of a separate metal, a blanket deposited silicon carbide layer can be patterned to provide the silicon carbide conductive layers, as well as the conductors for the interconnect contacts. In this case a circuit side surface of the interconnect is substantially covered with silicon carbide, such that the interconnect possesses improved heat dissipation characteristics. As another alternative, a blanket deposited silicon carbide layer can be selectively doped to form the silicon carbide conductive layers, and a separate metallization process can be used to form conductors on the blanket deposited silicon carbide layer.
The interconnect can be configured for die level testing of discrete components, such as bare dice or chip scale packages, or alternately for wafer level testing of multiple components contained on a common substrate, such as a wafer, a panel, a circuit board, or an electronic assembly. In addition, the interconnect contacts can be configured to electrically engage either planar component contacts (e.g., bond pads, test pads, land pads), or bumped component contacts (e.g., solder balls, metal bumps, conductive polymer bumps). For engaging planar component contacts, the interconnect contacts can comprise etched members with projections for penetrating the component contacts to a limited penetration depth. For engaging bumped component contacts, the interconnect contacts can comprise projections configured to penetrate the bumped component contacts, or alternately recesses sized and shaped to retain the bumped component contacts.
For a die level test system, the interconnect is configured for assembly in a testing apparatus, such as a carrier, configured to retain one or more components in electrical communication with testing circuitry. The testing apparatus includes a base on which the interconnect is mounted, and a force applying mechanism for biasing the components against the interconnect. For a wafer level test system, the interconnect is configured for use with a wafer testing apparatus such as a wafer prober. In the wafer level test system the interconnect can take the place of a conventional probe card.
The interconnect can also be configured to make permanent electrical connections with components for constructing electronic assemblies, semiconductor packages, and multi chip modules.
The method for fabricating the interconnect, broadly stated, includes the steps of: providing a substrate, forming interconnect contacts on the substrate, forming an insulating layer on the substrate and on the interconnect contacts, forming silicon carbide conductive layers on the interconnect contacts and on select portions of the substrate, and then forming conductors and terminal contacts in electrical communication with the silicon carbide conductive layers.
The silicon carbide conductive layers can be deposited on the interconnect contacts by chemical vapor deposition through a mask, or by conformal deposition of a layer of silicon carbide on the substrate followed by etching. Also, the silicon carbide conductive layers can be doped during deposition, or implanted following deposition. Alternately, the “as deposited” silicon carbide conductive layers can be subjected to localized heat with a laser beam to improve the electrical conductivity of the interconnect contacts. A silicon carbide layer can also be deposited, or patterned, to form the conductors and the terminal contacts as well as a large area heat transfer surface on the interconnect.
As used herein, the term “semiconductor component” refers to an electrical element or assembly that contains a semiconductor die. Exemplary semiconductor components include bare semiconductor dice, chip scale packages, conventional semiconductor packages, wafers containing dice or chip scale packages, panels containing chip scale packages, boards containing semiconductor dice, and electronic assemblies, such as field emission displays, containing semiconductor dice.
As shown in
The interconnect 10D (or the interconnect 10W) also includes conductors 18A, 18B, 18C in electrical communication with the interconnect contacts 14A, 14B, 14C. In addition, the interconnect 10D (or the interconnect 10W) includes terminal contacts in the form of bonding pads 20A, 20B, 20C in electrical communication with the interconnect contacts 14A, 14B, 14C.
As shown in
As also shown in
In the illustrative embodiment, the substrate 16 comprises silicon, and the interconnect contacts 14A comprise etched projections formed integrally with the substrate 16 using a fabrication process to be hereinafter described. With the substrate comprising silicon, a coefficient of thermal expansion (CTE) of the substrate 16 substantially matches that of semiconductor components such as bare dice and wafers. However, the substrate 16 can also comprise ceramic, plastic, silicon-on-glass, silicon-on-sapphire, or another semiconductor material such as gallium arsenide or germanium.
The interconnect contacts 14A are formed in a pattern that matches a pattern of the planar contacts 22A on the component 24. In addition, the interconnect contacts 14A include penetrating projections 28 adapted to penetrate the planar contacts 22A to a limited penetration depth. With the planar contacts 22A comprising thin film bond pads, the penetration depth will be less than about 1 μm. Accordingly, the penetrating projections 28 can be formed with a height of less than about 1 μm.
As also shown in
Still referring to
As also shown in
Suitable methods for etching the substrate 16A to form the interconnect contacts 14A are described in U.S. Pat. No. 5,483,741, entitled “Method For Fabricating A Self Limiting Silicon Based Interconnect For Testing Bare Semiconductor Dice”, and in U.S. Pat. No. 5,686,317 entitled “Method For Forming An Interconnect Having A Penetration Limited Contact Structure For Establishing A Temporary Electrical Connection With A Semiconductor Die” which are incorporated herein by reference.
The silicon carbide conductive layers 30A, can comprise a layer of silicon carbide that is patterned to cover the interconnect contacts 14A and select portions of the substrate 16A proximate to the interconnect contacts 14A. As will be further explained, the layer of silicon carbide can be chemically vapor deposited through a mask in a required pattern on the surface 17A of the substrate 16A. Alternately, the layer of silicon carbide can be conformally deposited on the surface 17A of the substrate 16A and then etched to cover the interconnect contacts 14A. In either case, the silicon carbide conductive layers 30A can be either doped, or oxidized using localized thermal heating to increase the electrical conductivity of the layers 30A.
The conductors 18A and the bonding pads 20A can comprise a different material than the silicon carbide conductive layers 30A, such as a separately deposited and patterned highly conductive metal layer. Suitable materials include aluminum, chromium, titanium, nickel, iridium, copper, gold, tungsten, silver, platinum, palladium, tantalum, molybdenum or alloys of these metals such as TiSi2. Alternately, the conductors 18A and the bonding pads 20A can comprise a same layer of silicon carbide as is used to form the silicon carbide conductive layers 30A.
The interconnect contact 14B comprises a projection on a surface 17B of a substrate 16B which can be formed using an etching process to be hereinafter described. As with the interconnect contacts 14A, the interconnect contacts 14B, and portions of the substrate 16B proximate to the contacts 14B, are at least partially covered with silicon carbide conductive layers 30B. The silicon carbide conductive layers 30B are in electrical communication with conductors 18B and bonding pads 20B on the surface 17B of the substrate 16B. In addition, an electrically insulating layer 32B electrically insulates the silicon carbide conductive layers 30B and the conductors 18B from the substrate 16B. As with the previous embodiment, the silicon carbide conductive layers 30B, the conductors 18B and the bonding pads 20B can comprise different materials, or a same patterned layer of silicon carbide.
As with the previous embodiments, the silicon carbide conductive layers 30C, the conductors 18C and the bonding pads 20C can comprise different layers of material, or a same layer of silicon carbide formed using a process to be hereinafter described. Also with the substrate 16C comprising silicon, an electrically insulating layer 32C can be formed on the surface 17C of the substrate 16C to provide electrical insulation for the silicon carbide conductive layers 30C, the conductors 18C and the bonding pads 20C, as previously described.
The recesses 38 for the contacts 14C can be etched into the surface 17C by forming a mask (not shown) on the substrate 16C, such as a photo patterned resist mask, and then etching the substrate 16C through openings in the mask, using an etchant. With the substrate 16C comprising silicon, a suitable etchant for performing the etch process comprises a solution of KOH.
A size and shape of the recesses 38 will be determined by the openings in the etch mask used to etch the substrate 16C. Each recess 38 is sized and shaped to retain and electrically engage a single bumped contact 22B. A representative diameter, or width, of the recesses 38 can be from 0.002 inches (0.051 mm) to 0.050 inches (1.27 mm) or more. This diameter can be less than a diameter of the bumped contacts 22B so that only portions thereof will be contacted. A depth of the recesses 38 can be equal to or less than the diameter thereof. A pitch or spacing of the recesses 38 will exactly match a pitch of the bumped contacts 22B.
As also shown in
Initially as shown in
Next, as shown in
Next, as shown in
Next, as shown in
Next, as shown in
Using the deposition mask 48A, 48B, 48C a silicon carbide (SiC) layer can be deposited through openings in the mask 48A, 48B, 48C to form the silicon carbide conductive layers 30A, 30B, 30C, the conductors 18A, 18B, 18C, and the bonding pads 20A, 20B, 20C. The arrows in
A preferred method for depositing silicon carbide to form the silicon carbide conductive layers 30A, 30B, 30C, the conductors 18A, 18B, 18C, and the bonding pads 20A, 20B, 20C. is chemical vapor deposition (CVD). Conventional processes for chemical vapor deposition of silicon carbide are known in the art. The silicon carbide can be deposited in a single step or in multiple steps to achieve a desired thickness. In general, the CVD process comprises heating the substrate 16 to a suitable temperature in a CVD reactor as a gas, or combination of gases, containing silicon and carbon atoms are introduced and reacted to form a silicon carbide layer. One suitable silicon containing gas comprises methyltrichlorosilane which undergoes pyrolysis at a temperature of about 1200° C. to 1300° C.
Also during the CVD process, a dopant gas species can be introduced into the process chamber, such that the silicon carbide layers 30A, 30B, 30C, the conductors 18A, 18B, 18C, and the bonding pads 20A, 20B, 20C contain a dopant for increased electrical conductivity. The dopant can comprise a P-type dopant such as B, Al, Ga In or Tl. Alternately the dopant can comprise a N-type dopant such as P. As, Sb or Bi. A representative dopant concentration can be from about 1×1015 atoms/cm3 to 1×1021 atoms/cm3.
As shown in
If doping is not performed during the CVD process an ion implantation process can be performed on the silicon carbide conductive layers 30A, 30B, 30C, the conductors 18A, 18B, 18C, and the bonding pads 20A, 20B, 20C to increase the electrical conductivity thereof. In this case an annealing step can be also be performed to activate the dopant. Ion implantation and annealing can be performed using equipment and techniques that are known in the art.
As another alternative, following formation of the silicon carbide conductive layers 30A, 30B, 30C, the conductors 18A, 18B, 18C, and the bonding pads 20A, 20B, 20C, an oxidation process using localized thermal heating with a laser can be performed to increase the conductivity of the silicon carbide material. If the conductors 18A, 18B, 18C and the bonding pads 20A, 20B, 20C are not formed of silicon carbide, then the oxidation process only needs to be performed on the silicon carbide conductive layers 30A, 30B, 30C.
A suitable process for performing the thermal oxidation process is described in U.S. Pat. No. 5,145,741 to Quick, which is incorporated herein by reference. Briefly, the thermal oxidation process involves focusing a laser beam produced by a Nd:YAG laser on the silicon carbide material to produce localized heating. This localized heating converts the silicon carbide to an electroconductive ternary ceramic compound. Using such a process the oxidized silicon carbide has a resistivity of about 10−4 ohm-cm at 21° C. This compares to the resistivity of an as deposited, non-doped silicon carbide which is about 1011 ohm-cm. If only the silicon carbide conductive layers 30A, 30B, 30C require oxidation, the substrate 16 can be held stationary and the laser beam focused on the individual interconnect contacts 14A, 14B, 14C.
The conductive vias 49A, 49B, 49C comprise openings filled with a conductive material in electrical communication with the silicon carbide conductive layers 30A, 30B, 30C, or with the conductors 18A, 18B, 18C on the circuit side surface 17 of the substrate 16. One method for forming the openings for the conductive vias 49A, 49B, 49C is with a laser machining process. A suitable laser machining apparatus is manufactured by General Scanning of Sommerville, Mass. and is designated a Model No. 670-W. Another suitable laser machining apparatus is manufactured by Synova S. A., Lausanne, Switzerland. To complete the conductive vias 49A, 49B, 49C, a metal can be deposited within the openings using a deposition process, such as CVD, electrolytic deposition or electroless deposition. Alternately, rather than being a metal, the conductive material for the conductive vias 49A, 49B, 49C can comprise a conductive polymer, such as a metal filled silicone, a carbon filled ink, or an isotropic or anisotropic adhesive.
At the same time the conductive material is deposited in the openings to form the conductive vias 49A, 49B, 49C the backside contacts 51A, 51B, 51C can be formed on the backside surface 52 of the substrate 16. A suitable mask (not shown) can be used during deposition of the conductive material to form the backside contacts 51A, 51B, 51C with a desired thickness and peripheral shape. Alternately, the backside contacts 51A, 51B, 51C can comprise a different material than the conductive vias 49A, 49B, 49C formed using a separate deposition or metallization process. For example, the backside contacts 51A, 51B, 51C can comprise a wire bondable or solderable metal, such as copper or aluminum, while the conductive vias 49A, 49B, 49C can comprise a material such as nickel.
Next, as shown in
Next, as shown in
One suitable resist for forming the etch masks 54A, 54B, 54C comprises a thick film resist sold by Shell Chemical under the trademark “EPON RESIN SU-8”. The resist can be deposited in layers to a thickness of from about 3–50 mils. The resist also includes an organic solvent (e.g., gamma-butyloracton), and a photoinitiator. A conventional resist coating apparatus, such as a spin coater, or a meniscus coater, along with a mask or stencil, can be used to deposit the resist in viscous form onto the circuit side surface 17 of the substrate 16. The deposited resist can then be partially hardened by heating to about 95° C. for about 15 minutes or longer. In addition, the deposited resist can be exposed and developed prior to further hardening such that only selected portions (e.g., interconnect contacts 14A, 14B, 14C) of the substrate 16 will be covered.
Exposure of the etch masks 54A, 54B, 54C can be with a conventional UV mask writer using a suitable UV dose. A representative UV dose for the previously described resist formulation is about 165 mJ/cm2. A suitable wet etchant for etching (i.e., developing) the resist is a solution of PGMEA (propyleneglycol-monomethylether-acetate). Following development the resist can be fully hardened. A “full cure” can be performed with a hard bake at about 200° C. for about 30 minutes.
The silicon carbide layer 50 can then be etched through openings in the etch masks 54A, 54B, 54C to define the silicon carbide conductive layers 30A, 30B, 30C. A suitable etchant for etching the silicon carbide layer comprises a solution of tetrahydrofurfuryl alcohol and potassium nitrite (THFFA/KNO2).
Following the etching step, and as shown in
If the silicon carbide layer 50 (
As also shown in
Alternately, the conductors 18A1, 18B1, 18C1 and the bonding pads 20A, 20B, 20C can comprise portions of the silicon carbide layer 50 (
Next, as shown in
Next, as shown in
Next, as shown in
Alternately, rather than an ion implantation process, an oxidation process, using a focused laser beam as previously described, can be used to form the silicon carbide conductive layers 30A, 30B, 30C. In this case the laser beam can be focused through openings in a mask aligned with the interconnect contacts 14A, 14B, 14C substantially as shown in
Wafer Level Test System
The wafer level test system 84W includes an interconnect 10W constructed in accordance with the invention as previously described, and mounted to a testing apparatus 86W. The testing apparatus 86W includes, or is in electrical communication with test circuitry 88. The testing apparatus 86W can comprise a conventional wafer probe handler, or probe tester, modified for use with the interconnect 10W. The testing apparatus 86W can also comprise a wafer level burn-in system. Wafer probe handlers and associated test equipment are commercially available from Electroglass, Advantest, Teradyne, Megatest, Hewlett-Packard and others. In this system 84W, the interconnect 10W takes the place of a conventional probe card.
The interconnect 10W includes the previously described interconnect contacts 14C configured to establish electrical communication with the bumped component contacts 22B. The interconnect 10W also includes the previously described conductive vias 49C in electrical communication with the contacts 14C and the backside contacts 51C. Alternately, the interconnect 10W can be configured with previously described contacts 14A or 14B.
The testing apparatus 86W also includes a wafer chuck 90 configured to support and move the component 24W in x, y and z directions as required. In particular, the wafer chuck 90 can be used to step the component 24W so that the semiconductor dice or semiconductor packages on the component 24W can be tested in groups. Alternately, the interconnect 10W can be configured to contact all of the bumped component contacts 22B for all of the dice on the component 24W at the same time. Test signals can then be selectively applied and electronically switched as required, to selected dice on the component 24W.
As also shown in
The spring loaded electrical connectors 94 can be formed in a variety of configurations. One suitable configuration is known as a “POGO PIN” connector. This type of electrical connector includes a spring loaded pin adapted to contact and press against a flat or bumped surface to form an electrical connection. Pogo pin connectors are manufactured by Pogo Instruments, Inc., Kansas City, Kans. The spring loaded electrical connectors 94 can also comprise wires, pins or cables formed as spring segments or other resilient members.
In this embodiment the spring loaded electrical connectors 94 electrically contact the contact backside contacts 51C on the interconnect 10W. This arrangement provides separate electrical paths from the testing circuitry 88, through the spring loaded electrical connectors 94, through the backside contacts 51C, through the conductive vias 49C and through the contacts 14C to the bumped component contacts 22B. During a test procedure, test signals can be applied to the integrated circuits on the component 18W using these separate electrical paths.
In addition to establishing electrical communication with the interconnect 10W, the spring loaded electrical connectors 94 also provide a mechanical force necessary for biasing the interconnect 10W against the component 24W. Further details of a wafer level system similar to the system 86W are contained in U.S. patent application Ser. No. 08/797,719, filed Feb. 10, 1997, now U.S. Pat. No. 6,060,891, entitled “Probe Card For Semiconductor Wafers and Method and System For Testing Wafers” which is incorporated herein by reference.
Die Level Test System
The test system 84D includes a base 96, and the interconnect 10D mounted to the base 96. The test system 84D also includes a force applying mechanism 98 comprising a biasing member 100, a pressure plate 102, and a clamp 104. In addition, the base 96 includes a plurality of terminal leads 106 in electrical communication with the interconnect contacts 14A (
The terminal leads 106 are adapted for electrical communication with a test apparatus 108 (
In the illustrative embodiment, the terminal leads 106 comprise pins formed in a pin grid array (PGA) on a backside of the base 96. Alternately, other configurations for the terminal leads 106 can be provided. For example, the carrier base 96 can include ball contacts in a ball grid array (BGA) or fine ball grid array (FBGA).
The base 96 can comprise a laminated ceramic material fabricated using a ceramic lamination process with a desired geometry, and with metal features such as internal conductors and external pads. U.S. Pat. No. 5,519,332, entitled “Carrier For Testing An Unpackaged Semiconductor Die”, which is incorporated herein by reference, describes a ceramic lamination process for fabricating the base 96. Alternately, rather than ceramic, the base 96 can comprise plastic, and the metal features formed using a 3-D molding process. Previously cited U.S. Pat. No. 5,519,332 describes a 3-D molding process for fabricating the base 96.
The base 96 includes internal conductors (not shown) in electrical communication with the terminal leads 106. In addition, bond wires 34 are wire bonded to bond pads on the base 96 in electrical communication with the internal conductors in the base 96. The bond wires 44 are also wire bonded to the bonding pads 20A, 20B, 20C (
The base 96 also includes a clamp ring 110 for attaching the clamp 104 of the force applying mechanism 98 to the base 96 during assembly of the test system 84D. The clamp ring 110 is attached to the base 96, and as shown in
The clamp 104 comprises a flexible bridge-like structure formed of a resilient material such as steel. The clamp 104 includes tabs 114 that physically engage the grooves 112 on the clamp ring 110. In addition, the clamp 104 includes opposed sides 116 movable towards one another to permit engagement of the tabs 114 on the clamp 104, with the grooves 112 on the clamp ring 110. The clamp 104 also includes an opening 118 which provides access to the component 24D for a vacuum assembly tool during assembly of the test system 84D. The biasing member 100 also includes an opening 120, and the pressure plate 102 includes an opening 122 for the vacuum assembly tool. A pair of openings 124 (
The pressure plate 102 can comprise a metal, a plastic, or a ceramic material. A peripheral shape and thickness of the pressure plate 102 can be selected as required.
Assembly of the test system 84D can be accomplished manually, or using an automated assembly apparatus. U.S. Pat. No. 5,796,264, entitled “Apparatus For Manufacturing Known Good Semiconductor Dice”, which is incorporated herein by reference, describes a method and apparatus for assembling the carrier. In the illustrative embodiment, alignment of the component 24D with the interconnect 10D can be performed using an optical alignment technique. Such an optical alignment technique is described in the above cited U.S. Pat. No. 5,796,264. Alignment of the component 24D with the interconnect 10D can also be performed using a mechanical alignment fence. Using the test system 84D the component 24D can be tested as required.
The electronic assembly 126 also includes a plurality of semiconductor components 24D attached to the interconnect contacts 14A. Attachment of the semiconductor components 24D can be accomplished by bonding the silicon carbide conductive layers 30A (
Thus the invention provides an improved interconnect for semiconductor components and a method for fabricating the interconnect. While the invention has been described with reference to certain preferred embodiments, as will be apparent to those skilled in the art, certain changes and modifications can be made without departing from the scope of the invention as defined by the following claims.
|Cited Patent||Filing date||Publication date||Applicant||Title|
|US3962391||Mar 20, 1974||Jun 8, 1976||Siemens Aktiengesellschaft||Disc support structure and method of producing the same|
|US4093201||Dec 8, 1975||Jun 6, 1978||Siemens Aktiengesellschaft||Disc support structure|
|US4203940||Sep 27, 1974||May 20, 1980||Siemens Aktiengesellschaft||Crystal wafer rack structures and the method of producing the same|
|US4585991||Mar 13, 1985||Apr 29, 1986||Texas Instruments Incorporated||Solid state multiprobe testing apparatus|
|US4754316||Jun 3, 1982||Jun 28, 1988||Texas Instruments Incorporated||Solid state interconnection system for three dimensional integrated circuit structures|
|US4954458||Apr 4, 1988||Sep 4, 1990||Texas Instruments Incorporated||Method of forming a three dimensional integrated circuit structure|
|US4978567||Mar 31, 1988||Dec 18, 1990||Materials Technology Corporation, Subsidiary Of The Carbon/Graphite Group, Inc.||Wafer holding fixture for chemical reaction processes in rapid thermal processing equipment and method for making same|
|US5031072||Jan 31, 1990||Jul 9, 1991||Texas Instruments Incorporated||Baseboard for orthogonal chip mount|
|US5145741||Feb 28, 1991||Sep 8, 1992||Quick Nathaniel R||Converting ceramic materials to electrical conductors and semiconductors|
|US5296258||Sep 30, 1992||Mar 22, 1994||Northern Telecom Limited||Method of forming silicon carbide|
|US5419807||Apr 6, 1994||May 30, 1995||Micron Technology, Inc.||Method of providing electrical interconnect between two layers within a silicon substrate, semiconductor apparatus, and method of forming apparatus for testing semiconductor circuitry for operability|
|US5425860||Apr 7, 1993||Jun 20, 1995||The Regents Of The University Of California||Pulsed energy synthesis and doping of silicon carbide|
|US5478779||Mar 7, 1994||Dec 26, 1995||Micron Technology, Inc.||Electrically conductive projections and semiconductor processing method of forming same|
|US5483741||Nov 7, 1994||Jan 16, 1996||Micron Technology, Inc.||Method for fabricating a self limiting silicon based interconnect for testing bare semiconductor dice|
|US5519332||Mar 1, 1995||May 21, 1996||Micron Technology, Inc.||Carrier for testing an unpackaged semiconductor die|
|US5543637 *||Nov 14, 1994||Aug 6, 1996||North Carolina State University||Silicon carbide semiconductor devices having buried silicon carbide conduction barrier layers therein|
|US5556530||Jun 5, 1995||Sep 17, 1996||Walter J. Finklestein||Flat panel display having improved electrode array|
|US5578526||May 1, 1995||Nov 26, 1996||Micron Technology, Inc.||Method for forming a multi chip module (MCM)|
|US5592736||Jan 5, 1995||Jan 14, 1997||Micron Technology, Inc.||Fabricating an interconnect for testing unpackaged semiconductor dice having raised bond pads|
|US5686317||Feb 13, 1995||Nov 11, 1997||Micron Technology, Inc.||Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die|
|US5716218||Sep 5, 1995||Feb 10, 1998||Micron Technology, Inc.||Process for manufacturing an interconnect for testing a semiconductor die|
|US5776391||Jun 18, 1996||Jul 7, 1998||Sibley; Thomas||Silicon carbide carrier for wafer processing and method for making same|
|US5789278||Jul 30, 1996||Aug 4, 1998||Micron Technology, Inc.||Method for fabricating chip modules|
|US5818071||Feb 2, 1995||Oct 6, 1998||Dow Corning Corporation||Silicon carbide metal diffusion barrier layer|
|US5869974||Apr 1, 1996||Feb 9, 1999||Micron Technology, Inc.||Micromachined probe card having compliant contact members for testing semiconductor wafers|
|US5877516||Mar 20, 1998||Mar 2, 1999||The United States Of America As Represented By The Secretary Of The Army||Bonding of silicon carbide directly to a semiconductor substrate by using silicon to silicon bonding|
|US5911864||Nov 8, 1996||Jun 15, 1999||Northrop Grumman Corporation||Method of fabricating a semiconductor structure|
|US5915977||Aug 24, 1998||Jun 29, 1999||Micron Technology, Inc.||System and interconnect for making temporary electrical connections with bumped semiconductor components|
|US5931685||Jun 2, 1997||Aug 3, 1999||Micron Technology, Inc.||Interconnect for making temporary electrical connections with bumped semiconductor components|
|US5962921||Mar 31, 1997||Oct 5, 1999||Micron Technology, Inc.||Interconnect having recessed contact members with penetrating blades for testing semiconductor dice and packages with contact bumps|
|US6040702||Jul 3, 1997||Mar 21, 2000||Micron Technology, Inc.||Carrier and system for testing bumped semiconductor components|
|US6060891||Feb 11, 1997||May 9, 2000||Micron Technology, Inc.||Probe card for semiconductor wafers and method and system for testing wafers|
|US6068669||Nov 28, 1997||May 30, 2000||Micron Technology, Inc.||Compliant interconnect for testing a semiconductor die|
|US6078186||Dec 31, 1997||Jun 20, 2000||Micron Technology, Inc.||Force applying probe card and test system for semiconductor wafers|
|US6091250||Feb 3, 1994||Jul 18, 2000||Micron Technology, Inc.||Discrete die burn-in for nonpackaged die|
|US6091251||Jul 7, 1997||Jul 18, 2000||Wood; Alan G.||Discrete die burn-in for nonpackaged die|
|US6091252||May 14, 1999||Jul 18, 2000||Micron Technolopgy, Inc.||Method, apparatus and system for testing bumped semiconductor components|
|US6094058||Oct 14, 1997||Jul 25, 2000||Micron Technology, Inc.||Temporary semiconductor package having dense array external contacts|
|US6107109||Dec 18, 1997||Aug 22, 2000||Micron Technology, Inc.||Method for fabricating a semiconductor interconnect with laser machined electrical paths through substrate|
|US6215322||Jul 7, 1997||Apr 10, 2001||Micron Technology, Inc.||Conventionally sized temporary package for testing semiconductor dice|
|US6222379||Jun 8, 1998||Apr 24, 2001||Micron Technology, Inc.||Conventionally sized temporary package for testing semiconductor dice|
|US6229324||Aug 2, 1999||May 8, 2001||Micron Technology, Inc.||Test system with mechanical alignment for semiconductor chip scale packages and dice|
|US6232243||Jan 5, 1999||May 15, 2001||Micron Technology, Inc.||Interconnect having recessed contact members with penetrating blades for testing semiconductor dice and packages with contact bumps|
|US6242935||Jan 21, 1999||Jun 5, 2001||Micron Technology, Inc.||Interconnect for testing semiconductor components and method of fabrication|
|US6255833||Jun 17, 1998||Jul 3, 2001||Micron Technology, Inc.||Method for testing semiconductor dice and chip scale packages|
|US6258609||Sep 30, 1996||Jul 10, 2001||Micron Technology, Inc.||Method and system for making known good semiconductor dice|
|US6259036||Apr 13, 1998||Jul 10, 2001||Micron Technology, Inc.||Method for fabricating electronic assemblies using semi-cured conductive elastomeric bumps|
|US6263566||May 3, 1999||Jul 24, 2001||Micron Technology, Inc.||Flexible semiconductor interconnect fabricated by backslide thinning|
|US6265245||May 26, 2000||Jul 24, 2001||Micron Technology, Inc.||Compliant interconnect for testing a semiconductor die|
|US6275052||Apr 30, 1999||Aug 14, 2001||Micron Technology, Inc.||Probe card and testing method for semiconductor wafers|
|US6278286||Nov 8, 1999||Aug 21, 2001||Micron Technology, Inc.||Interconnect and system for making temporary electrical connections to semiconductor components|
|US6285202||Feb 19, 1999||Sep 4, 2001||Micron Technology, Inc.||Test carrier with force applying mechanism guide and terminal contact protector|
|US6285203||Jun 14, 1999||Sep 4, 2001||Micron Technology, Inc.||Test system having alignment member for aligning semiconductor components|
|US6294837||Aug 30, 1999||Sep 25, 2001||Micron Technology, Inc.||Semiconductor interconnect having laser machined contacts|
|US6297653||Jun 28, 1999||Oct 2, 2001||Micron Technology, Inc.||Interconnect and carrier with resistivity measuring contacts for testing semiconductor components|
|US6297660||Dec 12, 2000||Oct 2, 2001||Micron Technology, Inc.||Test carrier with variable force applying mechanism for testing semiconductor components|
|US6300782||Jun 4, 2001||Oct 9, 2001||Micron Technology, Inc.||System for testing semiconductor components having flexible interconnect|
|US6307394||Jan 13, 1999||Oct 23, 2001||Micron Technology, Inc.||Test carrier with variable force applying mechanism for testing semiconductor components|
|US6310484||Jun 28, 1999||Oct 30, 2001||Micron Technology, Inc.||Semiconductor test interconnect with variable flexure contacts|
|US6313651||May 28, 1999||Nov 6, 2001||Micron Technology, Inc.||Carrier and system for testing bumped semiconductor components|
|US6314641||Aug 16, 2000||Nov 13, 2001||Micron Technology, Inc.||Interconnect for testing semiconductor components and method of fabrication|
|US6340894||Oct 8, 1997||Jan 22, 2002||Micron Technology, Inc.||Semiconductor testing apparatus including substrate with contact members and conductive polymer interconnect|
|US6353326||Aug 28, 1998||Mar 5, 2002||Micron Technology, Inc.||Test carrier with molded interconnect for testing semiconductor components|
|US6359456||Aug 14, 2001||Mar 19, 2002||Micron Technology, Inc.||Probe card and test system for semiconductor wafers|
|US6362637||Feb 1, 1999||Mar 26, 2002||Micron Technology, Inc.||Apparatus for testing semiconductor wafers including base with contact members and terminal contacts|
|US6383825||Jul 10, 2001||May 7, 2002||Micron Technology, Inc.||Method and system for testing semiconductor dice, semiconductor packages and semiconductor wafers|
|US6392429||Jun 14, 2000||May 21, 2002||Micron Technology, Inc.||Temporary semiconductor package having dense array external contacts|
|US6400174||Dec 27, 2000||Jun 4, 2002||Micron Technology, Inc.||Test system having alignment member for aligning semiconductor components|
|US6414506||Dec 17, 1998||Jul 2, 2002||Micron Technology, Inc.||Interconnect for testing semiconductor dice having raised bond pads|
|US6563215||Jan 10, 2000||May 13, 2003||Micron Technology, Inc.||Silicon carbide interconnect for semiconductor components and method of fabrication|
|1||Pierson, Handbook of Chemical Vapor Deposition, Noyes Publications, Park Ridge, New Jersey, 1992, pp. 208-210.|
|2||Wolf, et al., Silicon Processing for the VLSI Era, vol. 1-Process Technology, Lattice Press, Sunset Beach, CA, 1986, pp. 535-536.|
|Citing Patent||Filing date||Publication date||Applicant||Title|
|US7129156||Oct 26, 2005||Oct 31, 2006||Micron Technology, Inc.||Method for fabricating a silicon carbide interconnect for semiconductor components using heating|
|US7855442 *||Jan 8, 2007||Dec 21, 2010||International Business Machines Corporation||Silicon based package|
|US7911068 *||Mar 22, 2011||Infineon Technologies Ag||Component and method for producing a component|
|US8742563||Nov 29, 2010||Jun 3, 2014||Intel Mobile Communications GmbH||Component and method for producing a component|
|US20060046345 *||Oct 26, 2005||Mar 2, 2006||Salman Akram||Method for fabricating a silicon carbide interconnect for semiconductor components using heating and oxidizing|
|US20100018054 *||Sep 16, 2009||Jan 28, 2010||Levante James J||Conductive elastomeric and mechanical pin and contact system|
|U.S. Classification||257/737, 257/E23.004, 257/E23.078, 257/E23.169, 257/778, 257/48|
|International Classification||G01R1/067, G01R3/00, H01L23/13, G01R1/073, H01L23/48, H01L23/538|
|Cooperative Classification||H01L2924/351, H01L2924/19042, H01L2924/09701, H01L2924/01033, H01L2924/01042, H01L2924/01073, H01L23/538, H01L2924/01032, H01L2924/01051, H01L2924/01013, H01L2924/0106, H01L23/13, G01R3/00, H01L2924/14, H01L2924/01006, H01L2924/01005, H01L2924/01024, H01L2924/01047, H01L2924/01029, H01L2924/01015, H01L2924/01019, H01L2924/01077, H01L2924/01078, H01L2924/01087, H01L2924/01079, H01L2924/01046, G01R1/07314, H01L2924/01072, H01L24/72, H01L2924/01074, G01R1/06744|
|European Classification||H01L24/72, G01R1/067C, H01L23/538, H01L23/13|
|May 13, 2009||FPAY||Fee payment|
Year of fee payment: 4
|Jul 26, 2013||REMI||Maintenance fee reminder mailed|
|Dec 13, 2013||LAPS||Lapse for failure to pay maintenance fees|
|Feb 4, 2014||FP||Expired due to failure to pay maintenance fee|
Effective date: 20131213