|Publication number||US7214566 B1|
|Application number||US 09/594,510|
|Publication date||May 8, 2007|
|Filing date||Jun 16, 2000|
|Priority date||Jun 16, 2000|
|Also published as||US6911737, US20010052642|
|Publication number||09594510, 594510, US 7214566 B1, US 7214566B1, US-B1-7214566, US7214566 B1, US7214566B1|
|Inventors||Alan G. Wood, Larry D. Kinsman|
|Original Assignee||Micron Technology, Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (40), Referenced by (7), Classifications (42), Legal Events (5)|
|External Links: USPTO, USPTO Assignment, Espacenet|
The present invention relates to a method of packaging semiconductor devices. The present invention also relates to semiconductor device packages, including ball grid array (BGA) packages.
A method of making ball grid array packages is described in U.S. patent application Ser. No. 09/317,957, filed May 25, 1999. According to that method, individual semiconductor devices are attached to a patterned strip, and then the devices are electrically connected to ball grid arrays on the opposite side of the strip, and then the strip is segmented to produce finished packages. A disadvantage associated with the method described in the '957 application is that each semiconductor device must be individually positioned with respect to the strip. The devices are spaced apart from each other along the length of the strip. Consequently, a separate alignment step is required for each package. In addition, since the semiconductor devices are separated from each other before they are connected to the ball grid arrays, the devices must be tested and burned-in separately. The entire disclosure of U.S. patent application Ser. No. 09/317,957 is expressly incorporated herein by reference.
Another method of making ball grid array packages is described in U.S. Pat. No. 5,858,815 (Heo). According to the Heo method, a wafer is attached to a film such that bond pads are exposed through openings in the film, and then the bond pads are connected to solder balls on the opposite side of the film, and then the layered assembly is sawed into chip-sized packages. There are numerous disadvantages associated with the Heo method. Among them is that the packages do not have sufficient stiffness. In addition, the prior art does not provide a satisfactory method of testing the Heo packages, and the prior art does not provide a suitable method of aligning the wafer with respect to the film.
The term “ball grid array” is used herein in a broad sense to include fine pitch ball grid arrays (FBGAs) within its definition.
The present invention overcomes many of the disadvantages of the prior art. The present invention relates to a method of making semiconductor device packages. The method includes the steps of forming a layered assembly by attaching a wafer to a dielectric layer, testing semiconductor devices in the wafer, and then dicing the layered assembly. The dielectric layer may be, for example, a flexible tape. The semiconductor devices may be chips containing integrated circuits or memory devices. The dicing operation may be performed by a circular saw or by another suitable dicing apparatus.
According to one aspect of the invention, the semiconductor devices are connected to input/output devices on the dielectric layer, before the testing and dicing steps. The input/output devices may be ball grid arrays (BGA) for board-on-chip (BOC) packages, if desired. The full wafer testing may be conducted through the ball grid arrays.
According to another aspect of the invention, defective packages identified during the testing step may be marked, segregated from the other packages, and discarded. The present invention should not be limited, however, to the specific methods and devices described in detail herein.
According to another aspect of the invention, a metal sheet may be included in the layered assembly before the testing and dicing steps. The metal sheet forms stiff metal layers in each of the finished packages. The metal layers may be used as heat spreaders and/or as electrical ground planes.
If desired, wire bonds may be used to connect the semiconductor devices to the ball grid arrays. In another embodiment of the invention, flip chip bumps on the semiconductor devices and conductive vias in the dielectric substrates are used to connect the semiconductor devices to the ball grid arrays. In either case, the electrical connections may be made after the wafer is adhered to the dielectric tape and before the layered assembly is diced into separate finished packages.
Alignment of the wafer with respect to the dielectric tape may be accomplished by an optical device or by a magnetic system. In a preferred embodiment of the invention, the active components of all of the semiconductor devices are simultaneously aligned to the respective connection devices on the tape.
The present invention also relates to a ball grid array package formed of a semiconductor device and a dielectric substrate. The edges of the device and the substrate are formed by a common sawing operation and as a consequence are aligned with each other. The package may also be provided with a stiff metal layer. The package may be tested before it is singulated from a wafer-tape assembly.
These and other features and advantages of the invention will be more clearly understood from the following detailed description of the invention which is provided in connection with the accompanying drawings.
Referring now to the drawings, where like reference numerals designate like elements, there is shown in
The ball grid array 16 may be used to mechanically and electrically connect the package 10 to a circuit board (not shown). Wire bonds 26, bond pads 28, circuit traces 30, and ball pads 32 may be used to provide electrical communication between the semiconductor device 12 and the ball grid array 16. The wire bonds 26 extend through a slot-shaped opening 34. The traces 30 may be printed on the top surface 36 of the substrate 14 (before the semiconductor device 12 is adhered to the substrate 14). An insulative solder mask 38 extends over the traces 30. The mask 38 has openings 40 for receiving the individual balls of the ball grid array 16. A screen printing process may be used to apply the solder mask 38 as a paste to the entire surface of the substrate 14 except for the slot-shaped opening 34 and the ball pads 32. The wire bonds 26 and the bond pads 28 may be encapsulated in a suitable liquid encapsulant 42.
The substrate 14 may be a thin, flexible film. The film may be formed of a variety of dielectric materials, including for example FR-4/BT resins, epoxy, polyimide, KAPTON, UPLEX, and ceramic materials. The wire bonds 26 may be formed of gold, aluminum, copper or another suitable material. The traces 30 are formed of a conductive material such as copper, phosphor bronze, copper-nickel alloy, copper-nickel-tin alloy, or nickel-silver alloy. The adhesive 18 may be formed of a suitable die-attach material such as epoxy, resin, thermoplastic and/or elastomeric material. The ball grid array 16 may be formed of lead and/or tin. Alternatively, the ball grid array 16 may be formed of conductive polymer (metal suspended in a liquid). The present invention should not be limited to the specific materials and instrumentalities described in detail herein.
The wafer-tape assembly 20 shown in
As shown in
Although a slotted tape 52 is shown in the drawings, the present invention should not be limited to the specific structures shown and described in detail herein. In an alternative embodiment of the invention, a circular dielectric sheet having the same diameter as the wafer 50 may be used to form the substrates 14.
After the wafer 50 is adhered to the tape 52, the wire bonds 26 are installed to connect the bond pads 28 of the semiconductor devices 12 to the respective traces 30 on the top surface 36 of the tape 52. The ball grid arrays 16 are then placed on the ball pads 32, and the encapsulant 42 may be molded over the slot-shaped openings 34. Then the semiconductor devices 12 may be tested and burned-in through the ball grid arrays 16. After the full wafer 50 is tested and burned in, the assembly 20 is diced to form the individual packages 10. The dicing process may be accomplished by sawing through the assembly 20 along lines defined by the edges 22, 24 of the semiconductor devices 12 and substrates 14.
An advantageous aspect of the present invention is the ability to determine the functionality of the packages 10 by full wafer testing and burning-in the entire wafer-tape assembly 20, rather than testing and burning-in singulated packages. Specifically, before the individual packages 10 are diced from the assembly 20, all of the packages 10 may be tested, through the respective ball grid arrays 16, by a suitable testing apparatus. If any package 10 is found to be defective, known electronic mapping apparatus and methodologies may be used to electronically mark the defective package(s) 10 such that, subsequent to the dicing operation, the defective package(s) 10 may be discarded or segregated from the non-defective packages 10.
The package 60 may be singulated from a wafer-tape assembly of the type shown in
The interior traces 76 make contact with flip chip bumps 80 on the active surface of the semiconductor device 12, and the exterior traces 78 are connected to the interior traces 76 through the vias 74. If desired, the bumps 80 may be formed of a tin/lead alloy (e.g., 63% Sn/37% Pb). The bumps 80 may be reflowed to connect the semiconductor device 12 to the substrate 72. The area between the substrate 72 and the semiconductor device 12 may be underfilled with adhesive 18 or another suitable material, if desired. The diameter of each metal-plugged via 74 may be, for example, in a range from about 25 microns (0.001 inches) to about 200 microns (0.008 inches). The small vias 74 may be utilized to arrange a large number of circuits in a relatively small area.
As shown in
If desired, a metal layer 90 (
According to an alternative embodiment of the invention, a thin layer of metal 91 (
Referring now to
While the invention has been described in detail in connection with the preferred embodiments known at the time, it should be readily understood that the invention is not limited to such disclosed embodiments. Rather, the invention can be modified to incorporate any number of variations, alterations, substitutions or equivalent arrangements not heretofore described, but which are commensurate with the spirit and scope of the invention. Accordingly, the invention is not to be seen as limited by the foregoing description, but is only limited by the scope of the appended claims.
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|U.S. Classification||438/110, 438/15, 257/E23.065, 438/113, 257/E21.506|
|International Classification||H01L23/498, H01L21/50, H01L21/48, H01L21/44, H01L21/60, H01L21/66|
|Cooperative Classification||H01L2924/00014, H01L2224/85399, H01L2224/45124, H01L2224/45144, H01L24/45, H01L2224/05599, H01L2224/45155, H01L2224/45147, H01L2224/32225, H01L24/97, H01L2224/73215, H01L24/16, H01L2924/01047, H01L2224/48091, H01L2924/01029, H01L2924/01013, H01L24/94, H01L2224/73253, H01L2924/14, H01L2224/4824, H01L2924/01005, H01L23/4985, H01L24/48, H01L2924/15311, H01L24/31, H01L2224/97, H01L2924/01079, H01L2924/01015|
|European Classification||H01L24/97, H01L24/94, H01L23/498J|
|Jul 3, 2000||AS||Assignment|
Owner name: MICRON TECHNOLOGY, INC., IDAHO
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:WOOD, ALAN G.;KINSMAN, LARRY D.;REEL/FRAME:010882/0481;SIGNING DATES FROM 20000602 TO 20000612
|Oct 6, 2010||FPAY||Fee payment|
Year of fee payment: 4
|Dec 19, 2014||REMI||Maintenance fee reminder mailed|
|May 8, 2015||LAPS||Lapse for failure to pay maintenance fees|
|Jun 30, 2015||FP||Expired due to failure to pay maintenance fee|
Effective date: 20150508