|Publication number||US7221593 B2|
|Application number||US 11/402,549|
|Publication date||May 22, 2007|
|Filing date||Apr 12, 2006|
|Priority date||Mar 9, 2001|
|Also published as||US6549467, US6646921, US6654289, US6657900, US6788582, US6862222, US7057933, US20020126539, US20030031057, US20030039144, US20030067805, US20040057306, US20040062082, US20040062098, US20060193178|
|Publication number||11402549, 402549, US 7221593 B2, US 7221593B2, US-B2-7221593, US7221593 B2, US7221593B2|
|Inventors||Frankie F. Roohparvar|
|Original Assignee||Micron Technology, Inc.|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (24), Non-Patent Citations (1), Referenced by (10), Classifications (14), Legal Events (3)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application is a continuation of U.S. patent application Ser. No. 10/672,122 filed Sep. 26, 2003 now U.S. Pat. No. 7,057,933 issued Jun. 6, 2006 and titled, “NON-VOLATILE MEMORY DEVICE WITH ERASE ADDRESS REGISTER,”, which is a divisional of U.S. patent application Ser. No. 10/265,560 filed Oct. 7, 2002, now U.S. Pat. No. 6,657,900, issued Dec. 2, 2003 and titled, “NON-VOLATILE MEMORY DEVICE WITH ERASE ADDRESS REGISTER,”, which is a Divisional of U.S. patent application Ser. No. 09/802,612 filed Mar. 9, 2001, now U.S. Pat. No. 6,549,467, issued Apr. 15, 2003 and titled, “NON-VOLATILE MEMORY DEVICE WITH ERASE ADDRESS REGISTER,” which is commonly assigned and incorporated herein by reference.
The present invention relates generally to non-volatile memories and in particular the present invention relates to erase operations in a non-volatile memory device.
Memory devices are typically provided as internal storage areas in the computer. There are several different types of memory. One type of memory is random access memory (RAM) that is typically used as main memory in a computer environment. Most RAM is volatile, which means that it requires a steady flow of electricity to maintain its contents. Computers often contain a small amount of read-only memory (ROM) that holds instructions for starting up the computer. An EEPROM (electrically erasable programmable read-only memory) is a special type non-volatile ROM that can be erased by exposing it to an electrical charge. Like other types of ROM, EEPROM is traditionally not as fast as RAM. EEPROM comprise a large number of memory cells having electrically isolated gates (floating gates). Data is stored in the memory cells in the form of charge on the floating gates. Charge is transported to or removed from the floating gates by programming and erase operations, respectively.
Yet another type of non-volatile memory is a Flash memory. A Flash memory is a type of EEPROM that can be erased and reprogrammed in blocks instead of one byte at a time.
A typical Flash memory comprises a memory array that includes a large number of memory cells arranged in a row and column fashion. Each memory cell includes a floating gate field-effect transistor capable of holding a charge. The cells are usually grouped into erasable blocks. Each of the memory cells can be electrically programmed on a random basis by charging the floating gate. The charge can be removed from the floating gate by an erase operation. Thus, the data in a cell is determined by the presence or absence of the charge in the floating gate.
To program a memory cell, a high positive voltage Vg is applied to the control gate of the cell. In addition, a moderate positive voltage is applied to the drain (Vd) and the source voltage (Vs) and the substrate voltage (Vsub) are at ground level. These conditions result in the inducement of hot electron injection in the channel region near the drain region of the memory cell. These high-energy electrons travel through the thin gate oxide towards the positive voltage present on the control gate and collect on the floating gate. The electrons remain on the floating gate and function to reduce the effective threshold voltage of the cell as compared to a cell that has not been programmed.
In flash memories, blocks of memory cells are erased as in groups. This is achieved by putting a negative voltage on the wordlines of an entire block and coupling the source connection of the entire block to Vcc (power supply), or higher. This creates a field that removes electrons from the floating gates of the memory elements. In an erased state, the memory cells can be activated using a lower control gate voltage.
A common problem with flash memory cells is over-erasure. A cell that is erased past a certain point becomes depleted and cannot be fully turned off. That is, too many electrons are removed from the floating gate, and the memory cell floating gate voltage becomes more positive than the threshold of the cell. The cell, therefore, cannot be turned off even if the control gate is at a ground potential. An over-erased memory cell can cause all memory cells coupled to the same column to be read as erased cells, even though they may be programmed.
In current flash memory cells, a pre-program cycle is performed on the block of memory cells prior to performing an erase cycle. As such, all the cells in a block are first programmed. The cells are then erased until all the cells are completely erased. A threshold voltage (Vt) distribution tightening operation is performed following the erase operation to recover memory cells that are over erased. As flash memory devices increase in memory cell density, the time needed to perform a complete erase operation also increases.
In flash memories, a substantial part of the erase cycle time is spent on the erase cycle. Out of a typical 1-second erase operation, about one-half of the time is spent on pre-programming the memory cells, and the other half is used on the erase cycle. An erase pulse requires about 10 ms, while an erase verification operation requires less than 1 μs. With the density of flash memories increasing, the total time to verify all the locations is becoming a substantial part of the cycle. For instance, in a 64 Megabit flash device organized in 16 erasable blocks, there are four million locations that need to be verified during an erase operation. A typical 1 μs time for each verify cycle results in a verify time of 4 seconds. Further, memory cells are being verified for levels that are much tighter than their regular read levels. Thus, they need to be sensed much slower. For instance, a normal read is verifying that an erased cell has a threshold level (Vt) that is less than 4.5V. During erase verification, the memory verifies that the cell has a Vt that is less than 3V. This margin is smaller than prior memories and is more susceptible to noise.
For the reasons stated above, and for other reasons stated below which will become apparent to those skilled in the art upon reading and understanding the present specification, there is a need in the art for a flash memory with an improved process for erasing and verifying memory cells.
In the following detailed description of the preferred embodiments, reference is made to the accompanying drawings, which form a part hereof, and in which is shown by way of illustration specific preferred embodiments in which the inventions may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention, and it is to be understood that other embodiments may be utilized and that logical, mechanical and electrical changes may be made without departing from the spirit and scope of the present invention. The following detailed description is, therefore, not to be taken in a limiting sense, and the scope of the present invention is defined only by the claims.
The memory includes a pulse counter circuit to keep track of voltage pulses applied to the memory cells during erase and programming operations. The pulse counter is typically used to monitor a total number of pulses applied. In an embodiment of the present invention, the pulse counter is used in conjunction with a pulse register to improve erase operation performance, as explained below.
The memory cell array of a flash memory is typically arranged in erasable blocks. In one embodiment of the present invention, the erasable blocks are further arranged in sub-blocks. For example, a 16 Meg memory array can be arranged in four erasable blocks of 4 Meg where each of these blocks contain 16 sub-blocks.
During a typical prior art erase operation, an erase pulse, or series of erase pulses, is coupled to an addressed array block. The memory internal control, or state machine, then steps through each memory cell of the block to determine if data in the cells are erased (logical 1). The control circuitry stops verifying when it reaches a memory cell location that is not erased. The memory then applies another erase pulse to the block and begins another verification operation at the first memory cell location of the block. This process is repeated until all cells in the erasable block are verified as being in an erased state. A problem with this prior art erase/verify operation is that the slowest bit in the block dictates the level of erasure of all the memory cells in the block. Further, repeated erase pulses can over-erase a memory cell by removing too much charge from its floating gate. In an example memory, the fastest memory cell requires 5 erase pulses to fully erase the cell, typical memory cells require 10 pulses to erase, and the slowest memory cell in an erasable block requires 30 pulses to erase. With the prior art erase algorithm, the memory cells that are erased after 5 pulses are subjected to an extra 25 erase pulses that could potentially make them over-erased.
The present invention performs an erase operation on a block of memory cells uses a forward-looking scan algorithm. After applying erase pulses to the memory block during a verification operation, the memory begins forward scanning the memory cells in the block to determine if the cells are erased. As explained below, the memory does not begin scanning until a predetermined number of erase pulses have been applied to the memory array.
The present invention also contains an address verify register that is used to manage the erase verification operation. Referring to
After the initial erase pulses are applied, a verification of each sub-block is performed (264). The verification operation includes reading the memory cells of the sub-block to determine that the cells have been erased. Memory cells are considered erased if they have a floating gate charge (threshold voltage) that is below a predetermined level. When a programmed memory cell is located in a sub-block during the verification operation, the memory programs a register bit corresponding to the sub-block to a first state, such as logic 0 (266). It will be appreciated that the register may be pre-programmed to the first state and a subsequent program operation is not required. After locating a cell that is not erased, the memory jumps to the next sub-block of that erasable block. The memory verifies the next sub-block and if it finds all the cells in that block are erased, the corresponding location of the sub-block register is set to a second state (such as logic 1) indicating that the sub-block does not require any further erase pulses. The memory control then continues to verify all of the sub-blocks of the erasable block.
After all of the sub-blocks in an erase block have been verified, one or more additional erase pulses are applied to the sub-blocks that have a register bit indicating that all of the memory cells have not been erased (268). Additional verify operations are then performed on the sub-blocks that have a register bit programmed to the first state. That is, sub-blocks that do not contain programmed memory cells are not subjected to additional erase pulses. As such, the slowest cell to erase in a block only subjects a small sub-block of memory cells to possible over-erasure. The erase pulses and verification operations are repeated until all of the sub-blocks are fully erased, or a maximum number of erase pulses have been applied.
The threshold voltage (Vt) distribution of the memory cells of the present flash memory, relative to prior flash memory cells, is much tighter. Further, erasing non-volatile memory cells to a very negative threshold level and then bringing the threshold level back to a higher level using recovery methods is not good for memory cell reliability. The present invention provides for a better overall threshold distribution and improves both the reliability and performance of the erase operation. The above described erase/verify operation can reduce the time needed to perform an erase operation by using registers to identify a condition of the sub-blocks. The erase operation can be further improved by tracking a location of the programmed memory cells.
The present invention provides an address pointer for each of the sub-blocks of the memory array. The address pointers are used in conjunction with the memory address counter that is used to step throughout the memory array location. During the verification and scan operations, the memory advances through each memory location and checks for proper erasure. If the memory finds a location that is not erased, it copies the content of the address counter into the address pointer for that sub-block. Since there is at least one location in this sub-block that needs further erase pulses, there is no need to continue verifying or scanning that block. As such, the state machine issues a command to jump to the next sub-block. The memory then jumps to the next sub-block to continue the proper operation.
The contents of the address pointer for the next sub-block are copied to the address counter. The address pointer is initially set to a beginning address of its corresponding sub-block. The sub-block verification or scan continues until all the cells of the block have been checked by the erase verification operation. On subsequent checks of a sub-block, the memory begins at the location of the first programmed memory cell of the previous verification check. That is, the address pointer is copied to the address counter as the start location for each sub-block. When the full sub-block has been erased, the sub-block register can be set, as explained above, to indicate that further erase operations are not required. By re-starting the address location from the last programmed location and jumping to the next sub-block when a programmed cell has been detected within a sub-block, the present invention reduces overhead time.
As explained above, the flash memory applies an initial erase pulse to the memory block prior to performing the verification operation. As explained above, during the verification operation additional erase pulses are applied to the memory block. It will be appreciated that a memory cell encountered early in the verification operation could result in numerous erase pulses being applied to the entire block. The present invention reduces the risk that a memory cell subjects the memory block to erases pulses that could result in over-erasure, by using programmable pulse registers.
The present invention provides non-volatile register 240 that can be programmed to instruct the memory to begin scan operations when a predetermined number of erase pulses have been applied to the memory block. For example, a statistical evaluation may indicate that X-pulses will erase a significant number of the memory cells. When the predetermined number of pulses (X) has been applied to the block during a verification operation, the memory begins the first scan operation. The register can be programmed based upon a statistical analysis of the memory device during fabrication. Likewise, the register can be modified after fabrication if the memory device characteristics change.
A memory device of the present invention can also include a second non-volatile register 250. The second register defines the number of erase pulses that are applied to the memory array sub-blocks that contain non-erased memory cells. As explained above, only sub-blocks that require additional erase pulses are subjected to additional erase pulses during verification operations. The second register is used to initiate subsequent scan operations when conducting the next verification operations of the sub-blocks. The contents of the register can be programmed based upon testing or statistical analysis, as explained above. The contents of the second register are compared to the pulse counter during verification operations. One skilled in the art with the benefit of the present disclosure will appreciate that additional registers, or processing circuitry, can be used to control the number of erase pulses between each verification operation. For example, it may be desired to apply up to X-erase pulses during the second erase verification operation, while less pulses (such as up to X−1) are desired during a third erase verification operation.
A non-volatile memory device includes an array of non-volatile memory cells. The memory has control circuitry to erase the non-volatile memory cells and perform erase verification operations. The memory can be arranged in numerous erasable blocks and/or sub-blocks. An erase register stores data indicating an erase state of corresponding memory sub-blocks. During erase verification, the memory programs the erase register when a non-erased memory cell is located in a corresponding sub-block. Additional erase pulses can be selectively applied to sub-blocks based upon the erase register data. Likewise, erase verification operations can be selectively performed on sub-blocks based upon the erase register data. An address register is provided to store an address of a non-erased memory cell identified during verification and scanning operations. The address from the register is used as a start address for subsequent verification operations on the same array location.
Although specific embodiments have been illustrated and described herein, it will be appreciated by those of ordinary skill in the art that any arrangement, which is calculated to achieve the same purpose, may be substituted for the specific embodiment shown. This application is intended to cover any adaptations or variations of the present invention. Therefore, it is manifestly intended that this invention be limited only by the claims and the equivalents thereof.
|Cited Patent||Filing date||Publication date||Applicant||Title|
|US5371702||Mar 5, 1993||Dec 6, 1994||Kabushiki Kaisha Toshiba||Block erasable nonvolatile memory device|
|US5568426||Jul 26, 1995||Oct 22, 1996||Micron Quantum Devices, Inc.||Method and apparatus for performing memory cell verification on a nonvolatile memory circuit|
|US5579262||Feb 5, 1996||Nov 26, 1996||Integrated Silicon Solution, Inc.||Program verify and erase verify control circuit for EPROM/flash|
|US5581503||Jul 31, 1995||Dec 3, 1996||Hitachi, Ltd.||Data line disturbance free memory block divided flash memory and microcomputer having flash memory therein|
|US5583809||May 12, 1995||Dec 10, 1996||Mitsubishi Denki Kabushiki Kaisha||Semiconductor memory capable of reducing erase time|
|US5600595||Sep 12, 1995||Feb 4, 1997||Nec Corporation||Non-volatile semiconductor device with an electrically erasable and programmable read only memory showing an extremely high speed batch erasure operation|
|US5615159||Nov 28, 1995||Mar 25, 1997||Micron Quantum Devices, Inc.||Memory system with non-volatile data storage unit and method of initializing same|
|US5621687||May 31, 1995||Apr 15, 1997||Intel Corporation||Programmable erasure and programming time for a flash memory|
|US5627784||Jul 28, 1995||May 6, 1997||Micron Quantum Devices, Inc.||Memory system having non-volatile data storage structure for memory control parameters and method|
|US5677879||Oct 1, 1996||Oct 14, 1997||Micron Quantum Devices, Inc.||Method and apparatus for performing memory cell verification on a nonvolatile memory circuit|
|US5677885||Nov 15, 1996||Oct 14, 1997||Micron Quantum Devices, Inc.||Memory system with non-volatile data storage unit and method of initializing same|
|US5719807 *||Jul 25, 1996||Feb 17, 1998||Sgs-Thomson Microelectronics S.R.L.||Flash EEPROM with controlled discharge time of the word lines and source potentials after erase|
|US5801985||Jul 28, 1995||Sep 1, 1998||Micron Technology, Inc.||Memory system having programmable control parameters|
|US5805510||Oct 17, 1997||Sep 8, 1998||Kabushiki Kaisha Toshiba||Data erase mechanism for nonvolatile memory of boot block type|
|US5847996||Apr 26, 1996||Dec 8, 1998||Sandisk Corporation||Eeprom with split gate source side injection|
|US5880996||May 2, 1997||Mar 9, 1999||Micron Technology, Inc.||Memory system having non-volatile data storage structure for memory control parameters and method|
|US5907700||Jun 19, 1997||May 25, 1999||Intel Corporation||Controlling flash memory program and erase pulses|
|US5944837||Aug 18, 1997||Aug 31, 1999||Intel Corporation||Controlling flash memory program and erase pulses|
|US6026465||Jun 18, 1997||Feb 15, 2000||Intel Corporation||Flash memory including a mode register for indicating synchronous or asynchronous mode of operation|
|US6104667||Jul 30, 1999||Aug 15, 2000||Fujitsu Limited||Clock control circuit for generating an internal clock signal with one or more external clock cycles being blocked out and a synchronous flash memory device using the same|
|US6222772||Feb 18, 2000||Apr 24, 2001||Samsung Electronics Co., Ltd.||Methods of performing sector erase operations on non-volatile semiconductor memory devices|
|US6266282||Aug 12, 1999||Jul 24, 2001||Samsung Electronics Co., Ltd.||Write method of synchronous flash memory device sharing a system bus with a synchronous random access memory device|
|US6519691||May 11, 2001||Feb 11, 2003||Micron Technology, Inc.||Method of controlling a memory device by way of a system bus|
|JPH03148877A||Title not available|
|1||Prince "Semiconductor Memories," Electrically Erasable PROM Technology and Architecture 1983, Wiley 2d ed, pp. 185-186.|
|Citing Patent||Filing date||Publication date||Applicant||Title|
|US7835190 *||Aug 12, 2008||Nov 16, 2010||Micron Technology, Inc.||Methods of erase verification for a flash memory device|
|US7916543 *||Oct 22, 2007||Mar 29, 2011||Micron Technology, Inc.||Memory cell operation|
|US8116137||Mar 16, 2011||Feb 14, 2012||Micron Technology, Inc.||Memory cell operation|
|US8169832||Oct 21, 2010||May 1, 2012||Micron Technology, Inc.||Methods of erase verification for a flash memory device|
|US8787090||Feb 14, 2012||Jul 22, 2014||Micron Technology, Inc.||Memory cell operation|
|US20080024503 *||Jul 31, 2006||Jan 31, 2008||Smith Jeffrey D||Rigless retargeting for character animation|
|US20090103371 *||Oct 22, 2007||Apr 23, 2009||Micron Technology, Inc.||Memory cell operation|
|US20100039864 *||Aug 12, 2008||Feb 18, 2010||Micron Technology, Inc.||Methods of erase verification for a flash memory device|
|US20110032761 *||Oct 21, 2010||Feb 10, 2011||Micron Technology Inc.||Methods of erase verification for a flash memory device|
|US20110164455 *||Mar 16, 2011||Jul 7, 2011||Micron Technology, Inc.||Memory cell operation|
|U.S. Classification||365/185.19, 365/185.22, 365/185.29, 365/185.11, 365/185.24|
|International Classification||G11C8/12, G11C16/34, G11C16/04|
|Cooperative Classification||G11C16/16, G11C8/12, G11C16/344|
|European Classification||G11C8/12, G11C16/34V2, G11C16/16|
|Jan 4, 2010||AS||Assignment|
Owner name: ROUND ROCK RESEARCH, LLC,NEW YORK
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Effective date: 20091223
Owner name: ROUND ROCK RESEARCH, LLC, NEW YORK
Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:MICRON TECHNOLOGY, INC.;REEL/FRAME:023786/0416
Effective date: 20091223
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