|Publication number||US7714427 B2|
|Application number||US 11/554,528|
|Publication date||May 11, 2010|
|Filing date||Oct 30, 2006|
|Priority date||Oct 29, 2004|
|Also published as||US7341887, US20060094222, US20070057381|
|Publication number||11554528, 554528, US 7714427 B2, US 7714427B2, US-B2-7714427, US7714427 B2, US7714427B2|
|Inventors||Chee Wai Wong, Chee Hoo Lee|
|Original Assignee||Intel Corporation|
|Export Citation||BiBTeX, EndNote, RefMan|
|Patent Citations (22), Referenced by (9), Classifications (29), Legal Events (1)|
|External Links: USPTO, USPTO Assignment, Espacenet|
This application is a divisional application of U.S. application Ser. No. 10/977,157, filed Oct. 29, 2004, now U.S. Pat. No. 7,341,887, currently pending.
At least some embodiments of the invention relate to microelectronic design and packaging, and more specifically, to high speed devices.
A typical packaged integrated circuit unit includes a die on which the integrated circuit is formed and a package substrate on which the die is mounted on. An interconnect structure connects the terminals of the die from the integrated circuit in the die to the terminals of the package, which can be further connected to other components through a circuit board. The package may be directly mounted on the circuit board, or through a socket or an interposer.
A sophisticated Integrated Circuit (IC) chip such as a microprocessor uses a large number of terminals for connection to a circuit board. Various packaging techniques have been developed to provide the terminals for connection to the circuit board with an increasing number of terminals on a small size package. A grid array type of packaging technique arranges the terminals in a grid array pattern on one side of the package, such as a Pin Grid Array (PGA) package, a Ball Grid Array (BGA) package, a Column Grid Array (CGA) package, or a Land Grid Array (LGA) package. These terminals are typically based on flat pads formed on a dielectric layer of the package. For example, in a land grid array package a solder resist opening defines the land out of a portion of a pad; in a ball/column grid array package a solder ball/column is attached to the pad through a solder resist opening. Other types of terminals, such as pins, can also be used.
When a flip chip packaging technique is used, a die is flipped so that the terminal side of the die faces the substrate and the terminal side of the package. An interconnect structure is typically formed on the substrate to connect the terminals of the die to the terminals of the package. Underfill materials are typically used between the die and the substrate to provide bonding strength and physical protection for the connection between the die and the substrate against external force, moisture, etc.
Mismatch in coefficients of thermal expansion of the die, the underfill and the package substrate can lead to warpage of the package substrate. Typically, the underfill materials are applied at an elevated temperature to fill in the space between the die and the substrate, surrounding the electric connections (e.g., solder connections) between the die and the substrate. When the package is cooled down to a room temperature, differences in thermal expansion in the die, the underfill and the substrate can cause the package to bend toward one side.
The accompanying drawings illustrate by way of example and not limitation, in which like references indicate similar elements.
In the following description, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In other instances, well-known circuits, structures and techniques have not been shown in detail in order to avoid obscuring the understanding of the disclosure. References to one or an embodiment in the present disclosure are not necessarily references to the same embodiment; and, such references mean at least one.
In the example of
In a typical packaging configuration (102), the die is not rotated with respect to the substrate and mounted at the center of the substrate; the edges of the die are parallel to the corresponding edges of the substrate; and the corners of the die point to the corresponding corners of the substrate. When compared to the typical configuration (102), the corners of the integrated circuit chip die (103) are closer to the corresponding edges of the package substrate (101) pointed at by the corresponding corners.
For example, in
In one embodiment of the present invention, the terminals of high speed signals are arranged at the corners of the die so that, when a die is mounted on a substrate in a rotated configuration as illustrated in
For example, when a terminal is placed at a corner area, trace distance from the terminal on the die to the edge of the package substrate pointed at by the corner can be reduced by up to approximately 0.2a (see, e.g., distance 105).
In one embodiment, the signals from the die are routed through the interconnect structure on the package substrate to the terminals of the package, to the circuit board and to the region outside the area of the package substrate in the top view The reduction in the distance between the points on the die to the edges of the packages corresponds to the reduction in package transmission path and corresponds to the reduction in trace length outside the die for connecting the signals to other components in the circuit board.
As shown in
In one embodiment, mounting a die in an angle with respect to a substrate does not significantly change the warpage of the package. In one example, the overall warpage of a package as illustrated in
In one example of an embodiment, the package and die sizes are 37.5×37.5 mm and 12×12 mm respectively. The substrate warpage of the typically non-rotated die mounting configuration is about 105.1 microns and 103.6 microns for a 45-degree rotated die mounting configuration. Thus, there is insignificant difference in substrate warpage between a typical non-rotated die mounting configuration and a 45-degree rotated die mounting configuration.
An alternatively embodiment, the warpage of the package can be significantly reduced through mounting the die in an angle with respect to the substrate. For example, when the substrate is of a flexible material, such as an organic material, mounting the die in an angle with respect to the substrate can significantly reduce overall warpage.
In one embodiment, the integrated circuit chip die (207) is flipped so that the terminal side faces the package substrate (205) and the package terminals, such as the lands (213) of the packages. The integrated circuit chip die (207) is electrically connected to the interconnect structure in the substrate (205) through solder balls (e.g., 223). The underfill (225) protects the solder ball connection between the integrated circuit chip die and the package substrate (205).
In one embodiment, the terminals of the integrated circuit chip die (207) are arranged in an array; and a grid array of solder balls (e.g., 223) is typically used to electrically connect the integrated circuit through the die terminals to the package substrate (205).
In one embodiment, the underfill (225) is thermally curable. Mismatch in coefficients of thermal expansion and curing the underfill material at an elevated temperature can cause warpage at a room temperature. In one embodiment of the present invention, the overall warpage in the substrate is substantially the same regardless of the angle of the integrated circuit chip die with respect to the package substrate in the top view.
A socket (203) is used to mount the package on the circuit board (201). The socket has contacts (e.g., 221) to contact the lands of the land grid array package and make electric connections to the circuit on the circuit board (201). The contacts (e.g., 221) and the socket (203) may use bunched wire, metal particles in polymer, metal wires in polymer, or stamped metal springs or contact pins.
The circuit board (201) further connects the terminals of the package, such as lands (213), to other components (not shown in
One embodiment of the present invention adjusts the orientation and/or the position of the die with respect to the substrate and adjusts the location of the terminals on the die to reduce the package transmission paths.
In the configuration of
For example, in
Thus, offsetting the die from the center position on the package substrate in a way as illustrated in
When compared to the arrangement in
In general, the die and the substrate can have other overall shapes, such as rectangles. The die can be mounted in an angle different from 45 degrees with respect to the substrate. Further, the die can be offset from the center of the package substrate.
For example, in
It is understood that there is generally a distance between the boundary of a die and the outmost row of terminals. A bounding box of the die terminal array is typically proportional to the boundary of the die. To better illustrate the areas of the terminals, the centered position (132) and the box for the integrated circuit chip die (133) can be considered as illustrating the bounding box of the arrays of die terminals. For example, in
Further, the angle θ can be adjusted so that the corners can point at different portions of the edges. In general, the corners point at middle portions of the edges so that the traces lengths between the corresponding middle portions and the corners are reduced. The angle θ can be adjusted to point one or more corners at the center of one or more edges of the substrate or off the center of the edges of the substrate.
In the top view of
In the foregoing specification, specific exemplary embodiments have been described. It will be evident that various modifications may be made thereto without departing from the broader spirit and scope of the disclosure. The specification and drawings are, accordingly, to be regarded in an illustrative sense rather than a restrictive sense.
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|U.S. Classification||257/693, 257/E23.07, 257/773, 257/786, 257/730, 257/E23.01, 257/692|
|Cooperative Classification||H01L2924/00014, Y02P70/611, H01L2224/73204, H01L2224/32225, H01L2224/16225, H01L23/562, H01L2924/14, H01L2924/3511, H05K2201/09227, H01L2924/15311, H01L23/66, H05K2201/10719, H01L23/5286, H01L23/49838, H05K1/181, H05K2201/09418|
|European Classification||H01L23/562, H05K1/18B, H01L23/528P, H01L23/66, H01L23/498G|