Meter for testing electronic compo- nents, including transistors, diodes and other solid state electronic devices
US D197414 S
Description (OCR text may contain errors)
- D 197,414 O Patented J31. 28, 1964 METER FOR TESTING ELECTRONIC COMPO- NENTS, INCLUDING TRANSISTORS, DIODES AND OTHER SOLID STATE ELECTRONIC DEVICES Louis W. Erath, Houston, Tex., assiguor to Test Equipmeut Corporation, Houston, Tex., a corporation of Texas Filed Sept. 12, 1962, Ser. No. 71,663
Term of patent 14 years (Cl. D52-6) FIG. 1 is a perspective view of a meter for testing electronic components, including transistors, diodes and other solid state electronic devices, taken from the front and one side, showing my new design.
FIG. 2 is a bottom view of the meter.
FIG. 3 is a back view of the meter.
FIG. 4 is a plan view of the meter.
FIG. 5 is a perspective view from the rear of the meter.
FIG. 6 is an elevational view of the front of the meter.
The ornamental design or a meter for testing electronic Des. 197,414
PAGE 2 components, including transistors, diodes and other solid state electronic devices, substantially as shown.
References Cited in the file of this patent Electronic Technician, August 1959, bottom meter on page 21.
Television Retailing, February 1953, meter on page 36.
Electronic Technician, March 1962, testor at left bottom of page 3; April 1962, tester on page 39; and June 1962, meter on cover page.