US D213025 S
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United States Patent 0 "ice Patented Dec. 24, 1968 EXPOSURE METER Toshihiko Sakow, Fort Lee, N.J., assignor to Weston Instruments, Inc., Newark, N.J., a corporation of Delaware Filed Feb. 5, 1968, Ser. No. 10,425
Term of patent 14 years FIG.1 FIG.2
FIGURE 1 is a front view of an exposure meter illus- References Cited rating my design; UNITED STATES PATENTS FIGURE 2 1s a rear view of the exposure meter shown in FIGURE 1; and D. 112,999 1/1939 Hutehinson 135 -2 FIGURE 3 is a side view of the exposure meter shown 139694 12/1944 oidnch D522 in 1. D. Kmg SIIOI'th I claim: D. 160,292 9/1950 WilllaIl'lS D611 The ornamental design for an exposure meter, substan- 3/1955 Crandell D61'1 as shown. Dunn 2,948,259 8/1960 FIOSI; 8823 3,063,336 11/1962 Winklel 8823 JOEL STEARMAN, Primary Examiner.
NELSON C. HOLTJE, Assistant Examiner.