US D218850 S
Description (OCR text may contain errors)
Patented Sept. 29, 1970 TEMPERATURE PROBE Stephens N. Sato, San Diego, Calif., assignor to Ivac Corporation, San Diego, Calif., a corporation of California Filed June 2, 1969, Ser. No. 17,477
Term of patent 14 years Int. Cl. D10-09 US. Cl. D527 FIG. 1 is a perspective view of a temperature probe embodying my new design. showing the probe cover installed;
FIG. 2 is an elevational view along the length of the temperature probe shown in FIG. 1;
FIG. 3 is a right end elevational view of the probe shown in FIG. 1;
FIG. 4 is a left end e1evationa1 view of the probe shown in FIG. 1;
FIG. 5 is an elevational view along the length of the probe shown in HO. 1 with the probe cover removed;
FIG. 6 is a right end elevational view of the probe shown in FIG. 5; and
'FIG. 7 is a left end elevational view of the probe shown I claim: The ornamental design for a temperature probe. as shown.
References Cited UNITED STATES PATENTS D. 212,124 8/1968 Feldman D52-7 3,254,533 6/1966 Tongret. 3,295,087 lZ/1966 Landis et :11. 3,356,980 12/1967 Roberts. 3,402,378 9/1968 Catlin et a1.
BERNARD ANSHER. Primary Examiner