US D223050 S
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United States Patent 0 Des. 223,050 Patented Mar. 7, 1972 TEMPERATURE PROBE Stephens N. Sato, San Diego, Calif., assignor to Ivac Corporation, San Diego, Calif.
Filed Dec. 15, 1969, Ser. No. 20,507
Term of patent 14 years The portion of the term of the patent subsequent to Sept. 29, 1984, has been disclaimer] Int. Cl. D1004 US. Cl. D527 FIG. 1 is a perspective view.of temperature probe showing my new design;
FIG. 2 is an elevational view along the length of the temperature probe shown in FIG. 1;
FIG. 3 is a right end elevational view of the probe shown in FIG. 1; and
FIG. 4 is a left end elevational view of the probe shown in FIG. 1.
The ornamental design for a temperature probe, as shown.
References Cited UNITED STATES PATENTS D 92,351 5/1934 Hiergesell D527 D. 212,124 8/1968 Feldman D527 D. 218,850 9/1970 Sato D527 D. 218,851 9/1970 Sato D527 OTHER REFERENCES Digiec Instrumentation-United Systems Corporation,
Recd May 9, 1969, p. 14, Item No. 417, shown second' down from top right.
JOEL STEARMAN, Primary Examiner