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US D223174 S
Description (OCR text may contain errors)
Des. 223,174 Patented Mar. 21, 1972 United States Patent ()fiice HIGH PRECISION MEASURING MACHINE Jacques Pettavel, Geneva, Switzerland, assignor to Societe Genevoise dlnstruments de Physique Filed Nov. 16, 1970, Ser. No. 25,995
Claims priority, application Switzerland May 19, 1970 Term of patent 14 years Int. Cl. D1004 US. Cl. D551 FIGI WWW"
PAGE 4 FIG. 5
FIG. 1 is a front perspective view showing the high precision measuring machine of the present invention;
FIG. 2 is a side perspective view from the left of FIG. 1;
FIG. 3 is a side perspective view from the right of FIG. 1;
FIG. 4 is atop perspective view; and
FIG. 5 is a rear perspective view of the machine.
The ornamental design for a high precision measuring machine, as shown.
PAGE 5 References Cited UNITED STATES PATENTS D. 208,584 9/1967 Susskind D551 D. 207,026 2/1967 Leach et a1 D551 D. 203,626 2/1966 Donald D551 WALLACE R. BURKE, Primary Examiner A. P. DOUGLAS, Assistant Examiner