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Publication numberUSD271568 S
Publication typeGrant
Application numberUS 06/248,545
Publication dateNov 29, 1983
Filing dateMar 27, 1981
Priority dateOct 31, 1980
Publication number06248545, 248545, US D271568 S, US D271568S, US-S-D271568, USD271568 S, USD271568S
InventorsToyohiko Kitada, Minoru Tamura, Takanori Arioka
Original AssigneeTokyo Keiki Company Limited
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Ultrasonic wave thickness meter
US D271568 S
Abstract  available in
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  1. The ornamental design for an ultrasonic wave thickness meter, as shown and described.

FIG. 1 is a front elevational view of an ultrasonic wave thickness meter showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top plan view thereof; and

FIG. 6 is a bottom plan view thereof.

Non-Patent Citations
1Krautkamer-Brochure-2/76-"D-Meter" Wall Thickness Gauge.
2Metrifast-Flyer-5/24/77-Metal Detector.
3Product Engineering-10/78-p. 106-Thickness Gauge at top left.
Referenced by
Citing PatentFiling datePublication dateApplicantTitle
USD611853Mar 16, 2010Lifescan Scotland LimitedAnalyte test meter
USD612275Mar 23, 2010Lifescan Scotland, Ltd.Analyte test meter
USD615431Mar 21, 2008May 11, 2010Lifescan Scotland LimitedAnalyte test meter
U.S. ClassificationD10/46