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Publication numberUSD271568 S
Publication typeGrant
Application numberUS 06/248,545
Publication dateNov 29, 1983
Filing dateMar 27, 1981
Priority dateOct 31, 1980
Publication number06248545, 248545, US D271568 S, US D271568S, US-S-D271568, USD271568 S, USD271568S
InventorsToyohiko Kitada, Minoru Tamura, Takanori Arioka
Original AssigneeTokyo Keiki Company Limited
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Ultrasonic wave thickness meter
US D271568 S
Abstract  available in
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  1. The ornamental design for an ultrasonic wave thickness meter, as shown and described.

FIG. 1 is a front elevational view of an ultrasonic wave thickness meter showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a right side elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a top plan view thereof; and

FIG. 6 is a bottom plan view thereof.

Non-Patent Citations
1Krautkamer-Brochure-2/76-"D-Meter" Wall Thickness Gauge.
2Metrifast-Flyer-5/24/77-Metal Detector.
3Product Engineering-10/78-p. 106-Thickness Gauge at top left.
U.S. ClassificationD10/46