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Publication numberUSD307724 S
Publication typeGrant
Application numberUS 07/134,892
Publication dateMay 8, 1990
Filing dateDec 18, 1987
Priority dateJun 25, 1987
Publication number07134892, 134892, US D307724 S, US D307724S, US-S-D307724, USD307724 S, USD307724S
InventorsYoshiaki Nishida
Original AssigneeKabushiki Kaisha Toshiba
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Defect inspection device for semiconductors
US D307724 S
Abstract  available in
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  1. The ornamental design for a defect inspection device for semiconductors, as shown.

FIG. 1 is a front, top and left side perspective view of a defect inspection device for semiconductors showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a rear elevational view thereof; and

FIG. 7 is a bottom plan view thereof.

Non-Patent Citations
1Toshiba, "A Defect Inspection Device for Semiconductors", Dec. 5, 1961.
U.S. ClassificationD10/46