Search Images Maps Play YouTube News Gmail Drive More »
Sign in
Screen reader users: click this link for accessible mode. Accessible mode has the same essential features but works better with your reader.


  1. Advanced Patent Search
Publication numberUSD312583 S
Publication typeGrant
Application numberUS 07/167,451
Publication dateDec 4, 1990
Filing dateMar 14, 1988
Publication number07167451, 167451, US D312583 S, US D312583S, US-S-D312583, USD312583 S, USD312583S
InventorsHarold P. Kopp
Original AssigneePolytronics, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Circuit tester
US D312583 S
Abstract  available in
Previous page
Next page
  1. The ornamental design for a circuit tester, as shown.

FIG. 1 is a bottom plan view of a circuit tester showing my new design;

FIG. 2 is a top plan view;

FIG. 3 is a front elevational view;

FIG. 4 is a rear elevational view;

FIG. 5 is a right side elevational view; and

FIG. 6 is a left side elevational view thereof.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US6731217Sep 13, 2002May 4, 2004Michael A. WarnerElectrical circuit tester
U.S. ClassificationD10/78