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Publication numberUSD323628 S
Publication typeGrant
Application numberUS 07/343,124
Publication dateFeb 4, 1992
Filing dateApr 25, 1989
Publication number07343124, 343124, US D323628 S, US D323628S, US-S-D323628, USD323628 S, USD323628S
InventorsItaru Takao
Original AssigneeTokyo Electron Limited
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Semiconductor wafer measuring instrument
US D323628 S
Images(4)
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Claims(1)
  1. The ornamental design for a semiconductor wafer measuring instrument, as shown and described.
Description

FIG. 1 is a top, front and right side perspective view of a semiconductor wafer measuring instrument showing my new design;

FIG. 2 is a front elevational view;

FIG. 3 is a right side elevational view, the left side elevational view being a mirror image;

FIG. 4 is a top plan view;

FIG. 5 is a rear elevational view; and

FIG. 6 is a bottom plan view thereof.

Classifications
U.S. ClassificationD10/46