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Publication numberUSD334147 S
Publication typeGrant
Application numberUS 07/538,941
Publication dateMar 23, 1993
Filing dateJun 13, 1990
Publication number07538941, 538941, US D334147 S, US D334147S, US-S-D334147, USD334147 S, USD334147S
InventorsGlen Aukstikalnis, Mark Nightingale
Original AssigneeTektronix, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Electrical test probe
US D334147 S
Images(2)
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Claims(1)
  1. The ornamental design for an electrical test probe, as shown.
Description

FIG. 1 is a perspective view of an electrical test probe showing our new design;

FIG. 2 is a left side elevational view thereof, the right side elevational view being a mirror image;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevational view thereof; and,

FIG. 6 is a rear elevational view thereof.

Non-Patent Citations
Reference
1Tegam Inc., Thermocouple Probes, Aug. 1987; cover page.
2Tektronix, Inc., Tek Accessories; Minature Modular Passive Probes; Subminiature Passive Probes; etc.: 1989; pp. 4, 6, 8, 10, 12, 14, 18-20, 24.
Classifications
U.S. ClassificationD10/80