Search Images Maps Play YouTube News Gmail Drive More »
Sign in
Screen reader users: click this link for accessible mode. Accessible mode has the same essential features but works better with your reader.


  1. Advanced Patent Search
Publication numberUSD335463 S
Publication typeGrant
Application numberUS 07/636,974
Publication dateMay 11, 1993
Filing dateJan 2, 1991
Priority dateJul 10, 1990
Publication number07636974, 636974, US D335463 S, US D335463S, US-S-D335463, USD335463 S, USD335463S
InventorsNorbert Nix
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Portable electronic thickness measuring instrument
US D335463 S
Abstract  available in
Previous page
Next page
  1. The ornamental design for a portable electronic thickness measuring instrument, as shown and described.

FIG. 1 is a front elevational view of a portable electronic thickness measuring instrument showing my new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a right side elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a bottom plan view; and,

FIG. 6 is a rear elevational view thereof.

Non-Patent Citations
1Mono-Check, Schichtdickenmessung auf Eisen, Lixt-Magnetik, Dipl.-lng. Heinrich List GmbH., Max-Lang-Strasse 56, D-7033 Leinfelden-Echterdingen.
2Permascope® MPO, Helmut Fischer GmbH & Company, Institute fur Elektronik und Messtechnik, Postfach 4, D-7032 Sindelfingen 6.
3PosiTector® 2000, 3000, 300, Automation Ko, Dr. Nix GmbH, Robert-Perthel Strass 2, 500 Koln 60.
4PosiTest™, Das Schichtdicken-Bessgerat, daskaum zu *schlagen ist, Der Messkopf ist mit einer Hartmetall-Kugel bestuckt.
U.S. ClassificationD10/78