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Publication numberUSD354923 S
Publication typeGrant
Application numberUS 29/018,212
Publication dateJan 31, 1995
Filing dateJan 31, 1994
Publication number018212, 29018212, US D354923 S, US D354923S, US-S-D354923, USD354923 S, USD354923S
InventorsMark W. Nightingale
Original AssigneeTektronix, Inc.
Export CitationBiBTeX, EndNote, RefMan
External Links: USPTO, USPTO Assignment, Espacenet
Probing head for an electrical test probe
US D354923 S
Images(2)
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Claims(1)
  1. The ornamental design for a probing head for an electrical test probe, as shown and described.
Description

FIG. 1 is a top, front, and left side perspective view of the probing head for an electrical test probe showing my new design;

FIG. 2 is a left side elevation view having a mirrored right side elevation view of the probing head for an electrical test probe showing my new design;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevation view thereof; and,

FIG. 6 is a rear elevation view thereof.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US6400167Sep 22, 2000Jun 4, 2002Tektronix, Inc.Probe tip adapter for a measurement probe
US6603297Sep 22, 2000Aug 5, 2003Tektronix, Inc.Probe tip adapter for a measurement probe
Classifications
U.S. ClassificationD10/80, D10/78